CN102736282B - Method and equipment for inspecting liquid crystal panel - Google Patents

Method and equipment for inspecting liquid crystal panel Download PDF

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CN102736282B
CN102736282B CN201210212458.4A CN201210212458A CN102736282B CN 102736282 B CN102736282 B CN 102736282B CN 201210212458 A CN201210212458 A CN 201210212458A CN 102736282 B CN102736282 B CN 102736282B
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liquid crystal
crystal panel
numerical value
public electrode
common electric
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CN102736282A (en
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张培林
柳在健
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BOE Technology Group Co Ltd
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Engineering & Computer Science (AREA)
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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

The invention provides a method and equipment for inspecting a liquid crystal panel. The inspection method comprises the following steps of: testing the uniformity of common electrodes of the liquid crystal panel; and determining the occurrence probability of residual images of the liquid crystal panel according to a uniformity result of the common electrodes of the liquid crystal panel. The equipment for inspecting the liquid crystal panel comprises a testing device and a determination device, wherein the testing device is used for testing the uniformity of the common electrodes of the liquid crystal panel; and the determination device is used for determining the occurrence probability of the residual images of the liquid crystal panel according to the uniformity result of the common electrodes of the liquid crystal panel. By the method and the equipment for inspecting the liquid crystal panel, the occurrence probability and grades of the residual images of the liquid crystal panel can be accurately determined by testing the uniformity of the common electrodes inside the liquid crystal panel, so that the condition of the residual images of the liquid crystal panel can be quickly determined without the evaluation of the residual images, time is saved, and the working efficiency is improved.

Description

液晶面板的检验方法及设备Inspection method and equipment of liquid crystal panel

技术领域 technical field

本发明涉及液晶显示技术领域，特别是涉及一种关于液晶面板的残像的检验方法及设备。The invention relates to the technical field of liquid crystal display, in particular to a method and equipment for inspecting residual images of liquid crystal panels.

背景技术 Background technique

现如今薄膜场效应晶体管LCD（TFT-LCD）产品已经广泛的应用于人们的生产和生活当中，这其中包括电视、显示器、以及便携式的电子显示产品等，各大液晶面板厂商都在努力提高产品的性能，降低能耗，增大视角，减小响应时间。这其中对于显示液晶面板残像的改善尤为重要。因为它直接影响了显示画面的品质。Nowadays, Thin Film Field Effect Transistor LCD (TFT-LCD) products have been widely used in people's production and life, including TVs, monitors, and portable electronic display products. Major LCD panel manufacturers are working hard to improve their products. Excellent performance, reduced energy consumption, increased viewing angle, and reduced response time. Among them, it is particularly important to improve the afterimage of the display liquid crystal panel. Because it directly affects the quality of the display screen.

残像的是指长时间驱动特定停止画像(High gray)后，变换为其他画像(Low gray）时留有原来画像的图案的现象。残像是发生在液晶盒内部的一种现象，由于长时间显示静止画面后，改变为其他图像时，液晶分子不能即时完全的发生偏转以适应新的画面，从而影响了显示效果。Afterimage refers to the phenomenon that after a certain stop image (High gray) is driven for a long time, the pattern of the original image remains when it is converted to another image (Low gray). Afterimage is a phenomenon that occurs inside the liquid crystal cell. After displaying a static image for a long time, when changing to other images, the liquid crystal molecules cannot be deflected immediately and completely to adapt to the new image, thus affecting the display effect.

残像依据发生的形态和位置不同可以分为面残像（area image sticking）和线残像（line image sticking）两种。对残像机理的研究表明，产生残像的主要原因是残留电荷的影响，这包括外加电场作用下在液晶盒内部产生的极化电荷以及在液晶盒内部杂质电荷的不同分布。这些残留的电荷会影响液晶在液晶盒顶部和底部的取向，从而使得残像发生在整个液晶面板区域，比较严重的分布在具有明显颜色差别的图像交界位置。残像的产生还受其他因素影响，比如外界温度，画面类型和静止时间长短，亮度等级等。Image sticking can be divided into area image sticking and line image sticking according to the shape and location of the image. The research on the mechanism of afterimage shows that the main cause of afterimage is the influence of residual charge, which includes the polarization charge generated inside the liquid crystal cell under the action of an external electric field and the different distribution of impurity charges inside the liquid crystal cell. These residual charges will affect the orientation of the liquid crystal on the top and bottom of the liquid crystal cell, so that afterimages occur in the entire liquid crystal panel area, and are more seriously distributed at the junction of images with obvious color differences. The generation of afterimages is also affected by other factors, such as the outside temperature, the type of picture and the length of still time, brightness level, etc.

现有技术中，进行残像评价时间较长，通常为168小时，残像结果只有在评价结束以后才可以判断，如果液晶面板电压设置出现偏差，或者由于设计和工艺等原因使得液晶面板发生残像的几率变大，也只有在残像评价结束以后方可得到相应结论。目前并没有可以通过可测试液晶面板参数来判断残像发生几率的方法和装置。In the prior art, it takes a long time to evaluate the afterimage, usually 168 hours, and the afterimage result can only be judged after the evaluation is completed. If there is a deviation in the voltage setting of the LCD panel, or due to design and process reasons, the probability of afterimage on the LCD panel will occur. become larger, and the corresponding conclusion can only be obtained after the afterimage evaluation is completed. At present, there is no method and device capable of judging the probability of afterimage occurrence by testing the parameters of the liquid crystal panel.

发明内容 Contents of the invention

本发明的目的是提供一种关于液晶面板的残像的液晶面板的检验方法及设备，可以通过测试液晶面板参数来比较快捷的判断残像发生几率。The object of the present invention is to provide a liquid crystal panel inspection method and equipment for the residual image of the liquid crystal panel, which can judge the occurrence probability of the residual image relatively quickly by testing the parameters of the liquid crystal panel.

本发明的液晶面板的检验方法，包括：The inspection method of liquid crystal panel of the present invention comprises:

测试液晶面板的公共电极均匀性；Test the uniformity of the common electrode of the LCD panel;

根据所述液晶面板的公共电极均匀性结果判定所述液晶面板的残像发生几率。The occurrence probability of the afterimage of the liquid crystal panel is determined according to the uniformity result of the common electrode of the liquid crystal panel.

本发明的液晶面板的检验方法，其中，所述测试液晶面板的公共电极均匀性包括：The inspection method of the liquid crystal panel of the present invention, wherein, the uniformity of the common electrode of the test liquid crystal panel comprises:

测量液晶面板上的多个不同位置的最佳公共电压的数值；Measure the value of the optimal common voltage at multiple different positions on the LCD panel;

根据所述最佳公共电压的数值来判断所述液晶面板的公共电极均匀性。The uniformity of the common electrode of the liquid crystal panel is judged according to the value of the optimal common voltage.

本发明的液晶面板的检验方法，其中，所述测量液晶面板上的多个不同位置的最佳公共电压的数值包括：The inspection method of the liquid crystal panel of the present invention, wherein, the numerical value of the optimal common voltage of described measuring a plurality of different positions on the liquid crystal panel comprises:

将液晶面板划分为多个区域；Divide the LCD panel into multiple areas;

对所述液晶面板通电，在闪烁画面下，对所述液晶面板输入逐渐增大的交变的公共电极电压，分别测试所述多个区域的中心点的闪烁强度的大小，分别确定在所述多个区域的中心点的闪烁强度小于一门限值的情况下的外加交变电压的数值，所述多个区域的该电压的数值为所述液晶面板上的多个不同位置的最佳公共电压的数值。The liquid crystal panel is energized, and under the flickering screen, a gradually increasing alternating common electrode voltage is input to the liquid crystal panel, and the flicker intensity of the central points of the multiple regions is tested respectively, and determined respectively in the The value of the applied alternating voltage when the flicker intensity of the central points of the multiple areas is less than a threshold value, the value of the voltage of the multiple areas is the best common value of multiple different positions on the liquid crystal panel The value of the voltage.

本发明的液晶面板的检验方法，其中，所述测量液晶面板上的多个不同位置的最佳公共电压的数值包括：The inspection method of the liquid crystal panel of the present invention, wherein, the numerical value of the optimal common voltage of described measuring a plurality of different positions on the liquid crystal panel comprises:

将液晶面板划分为多个区域；Divide the LCD panel into multiple areas;

对所述液晶面板通电，在闪烁画面下，对所述液晶面板输入逐渐增大的交变的公共电极电压，分别测试所述多个区域的中心点的闪烁强度的大小，分别确定在所述多个区域的中心点的闪烁强度最小的情况下的外加交变电压的数值，所述多个区域的该电压的数值为所述液晶面板上的多个不同位置的最佳公共电压的数值。The liquid crystal panel is energized, and under the flickering screen, a gradually increasing alternating common electrode voltage is input to the liquid crystal panel, and the flicker intensity of the central points of the multiple regions is tested respectively, and determined respectively in the The value of the applied alternating voltage when the flicker intensity of the central points of the multiple areas is the smallest, the value of the voltage in the multiple areas is the value of the optimal common voltage at multiple different positions on the liquid crystal panel.

本发明的液晶面板的检验方法，其中，所述根据所述最佳公共电压的数值来判断所述液晶面板的公共电极均匀性为：In the inspection method of the liquid crystal panel of the present invention, wherein, the uniformity of the common electrode of the liquid crystal panel is judged according to the numerical value of the optimal common voltage as:

计算所述最佳公共电压的数值的标准差；calculating the standard deviation of the value of said optimum common voltage;

根据所述标准差判定所述液晶面板的公共电极均匀性。The uniformity of the common electrode of the liquid crystal panel is judged according to the standard deviation.

本发明的液晶面板的检验方法，其中，所述根据所述标准差判定所述液晶面板的公共电极均匀性包括：In the inspection method of the liquid crystal panel of the present invention, wherein said determining the uniformity of the common electrode of the liquid crystal panel according to the standard deviation includes:

判断所述最佳公共电压的数值的标准差的是否小于0.03，如果所述最佳公共电压的数值的标准差小于0.03，则判断所述液晶面板的公共电极均匀；如果所述最佳公共电压的数值的标准差大于0.03，则判断所述液晶面板的公共电极不均匀。Judging whether the standard deviation of the value of the optimal common voltage is less than 0.03, if the standard deviation of the value of the optimal common voltage is less than 0.03, it is judged that the common electrode of the liquid crystal panel is uniform; if the optimal common voltage If the standard deviation of the value of is greater than 0.03, it is judged that the common electrode of the liquid crystal panel is not uniform.

本发明的液晶面板的检验设备，包括：The inspection equipment of the liquid crystal panel of the present invention comprises:

用于测试液晶面板的公共电极均匀性的测试装置；A test device for testing the uniformity of common electrodes of liquid crystal panels;

根据所述液晶面板的公共电极均匀性结果判定所述液晶面板的残像发生几率的判断装置，与所述测试装置电连接。The judging device for judging the occurrence probability of the afterimage of the liquid crystal panel according to the uniformity result of the common electrode of the liquid crystal panel is electrically connected to the testing device.

本发明的液晶面板的检验设备，其中，所述测试装置包括：The inspection equipment of liquid crystal panel of the present invention, wherein, described test device comprises:

用于测量液晶面板上的多个不同位置的最佳公共电压的数值的测量装置；A measuring device for measuring the value of the optimum common voltage at a plurality of different positions on the liquid crystal panel;

计算装置，接收所述最佳公共电压的数值并根据所述最佳公共电压的数值来判断所述液晶面板的公共电极均匀性，所述计算装置与所述判断装置电连接。A computing device receives the value of the optimal common voltage and judges the uniformity of the common electrode of the liquid crystal panel according to the value of the optimal common voltage, and the computing device is electrically connected to the judging device.

本发明的液晶面板的检验设备，其中，所述测量装置包括：The inspection equipment of the liquid crystal panel of the present invention, wherein, said measuring device comprises:

用于承载液晶面板的基台，所述基台上安装有可在所述基台上方移动的支架；A base for carrying a liquid crystal panel, the base is equipped with a bracket that can move above the base;

用于分别测量所述液晶面板上多个不同位置的闪烁强度的测试仪，固定于所述支架上；A tester for separately measuring the flicker intensity of multiple different positions on the liquid crystal panel, fixed on the bracket;

直流稳压电源，用于向所述液晶面板加载；DC stabilized power supply, used to load the liquid crystal panel;

程序控制器，与所述直流稳压电源和所述测试仪分别电连接，所述程序控制器控制直流稳压电源对测试液晶面板输入逐渐增大的交变的公共电极电压并控制所述测试仪的开关；A program controller is electrically connected to the DC stabilized power supply and the tester respectively, and the program controller controls the DC stabilized power supply to input a gradually increasing alternating common electrode voltage to the test liquid crystal panel and controls the test Instrument switch;

计算机，与所述程序控制器和所述测试仪分别电连接，所述计算机通过程序控制器控制所述支架在所述区域上方移动，所述计算机接收所述测试仪的所述液晶面板上多个不同位置的闪烁强度的数据并分别确定在所述多个位置的闪烁强度小于一门限值或最小的情况下的外加交变电压的数值，所述多个位置的该电压的数值为所述液晶面板上的多个不同位置的最佳公共电压的数值，所述计算机与所述计算装置电连接。A computer is electrically connected to the program controller and the tester respectively, the computer controls the bracket to move above the area through the program controller, and the computer receives information on the liquid crystal panel of the tester. The data of the flicker intensity of different positions and respectively determine the value of the applied alternating voltage under the condition that the flicker intensity of the plurality of positions is less than a threshold value or the minimum, and the value of the voltage of the plurality of positions is the specified value. The numerical values of the optimal common voltages at multiple different positions on the liquid crystal panel, and the computer is electrically connected with the computing device.

本发明的液晶面板的检验方法及检验设备，通过测试液晶面板内部公共电极的均匀性可以准确判断液晶面板残像发生的概率和等级，从而不必进行残像评价就可以快捷的判断液晶面板的残像情况，节省了时间，提高了工作效率。The liquid crystal panel inspection method and inspection equipment of the present invention can accurately determine the probability and level of afterimage occurrence of the liquid crystal panel by testing the uniformity of the common electrode inside the liquid crystal panel, so that the afterimage situation of the liquid crystal panel can be quickly judged without performing image afterimage evaluation. Save time and improve work efficiency.

附图说明 Description of drawings

图1为本发明的液晶面板的检验设备的连接示意图；Fig. 1 is the connection schematic diagram of the inspection equipment of liquid crystal panel of the present invention;

图2为本发明的液晶面板的检验设备中的基台以及支架的结构示意图。FIG. 2 is a schematic structural view of a base and a support in the liquid crystal panel inspection equipment of the present invention.

具体实施方式 Detailed ways

本发明提供了一种液晶面板的检验方法，通过采用程序控制的公共电压的信号输入，测试液晶面板内部公共电极的均匀性，通过均匀性的数据可以准确判断液晶面板残像发生的概率和等级，从而不必进行残像评价就可以快捷的判断液晶面板的残像情况，节省了时间，提高了工作效率。The invention provides an inspection method of a liquid crystal panel. By adopting the signal input of a common voltage controlled by a program, the uniformity of the common electrode inside the liquid crystal panel is tested, and the probability and level of afterimage occurrence of the liquid crystal panel can be accurately judged through the uniformity data. Therefore, the afterimage situation of the liquid crystal panel can be quickly judged without performing image afterimage evaluation, which saves time and improves work efficiency.

通过大量实验可知液晶面板的公共电极均匀性和残像等级之间有密切的关系，如果液晶面板公共电极均匀性不好，则残像也会比较严重。因此我们可以在不进行残像评价的前提下预先判断残像的情况，并且可以通过改善液晶面板的公共电极的均匀性来降低残像的等级。Through a large number of experiments, it can be known that there is a close relationship between the uniformity of the common electrode of the liquid crystal panel and the afterimage level. If the uniformity of the common electrode of the liquid crystal panel is not good, the afterimage will be more serious. Therefore, we can pre-judge the situation of the afterimage without evaluating the afterimage, and reduce the level of the afterimage by improving the uniformity of the common electrode of the liquid crystal panel.

本发明的液晶面板的检验方法，包括：The inspection method of liquid crystal panel of the present invention comprises:

测试液晶面板的公共电极均匀性；Test the uniformity of the common electrode of the LCD panel;

根据所述液晶面板的公共电极均匀性结果判定所述液晶面板的残像发生几率。例如，如果所述液晶面板的公共电极均匀，则判断所述液晶面板的残像发生几率为小；如果所述液晶面板的公共电极不均匀，则判断所述液晶面板的残像发生几率为大。The occurrence probability of the afterimage of the liquid crystal panel is determined according to the uniformity result of the common electrode of the liquid crystal panel. For example, if the common electrode of the liquid crystal panel is uniform, it is judged that the occurrence probability of the liquid crystal panel is low; if the common electrode of the liquid crystal panel is uneven, it is judged that the probability of the liquid crystal panel is high.

测试液晶面板的公共电极均匀性可以采用很多种方法。本发明的液晶面板的检验方法的实施例中，测试液晶面板的公共电极均匀性包括：Many methods can be used to test the uniformity of the common electrode of the liquid crystal panel. In an embodiment of the inspection method for a liquid crystal panel of the present invention, testing the uniformity of the common electrode of the liquid crystal panel includes:

测量液晶面板上的多个不同位置的最佳公共电压的数值；Measure the value of the optimal common voltage at multiple different positions on the LCD panel;

根据所述最佳公共电压的数值来判断所述液晶面板的公共电极均匀性。The uniformity of the common electrode of the liquid crystal panel is judged according to the value of the optimal common voltage.

本发明的液晶面板的检验方法的实施例中，所述测量液晶面板上的多个不同位置的最佳公共电压的数值包括：In the embodiment of the inspection method of the liquid crystal panel of the present invention, the numerical value of the best common voltage of the described measuring a plurality of different positions on the liquid crystal panel comprises:

将液晶面板划分为多个区域；Divide the LCD panel into multiple areas;

对所述液晶面板通电，在闪烁画面下，对所述液晶面板输入逐渐增大的交变的公共电极电压，分别测试所述多个区域的中心点的闪烁强度的大小，分别确定在所述多个区域的中心点的闪烁强度小于一门限值的情况下的外加交变电压的数值，所述多个区域的该电压的数值为所述液晶面板上的多个不同位置的最佳公共电压的数值。The liquid crystal panel is energized, and under the flickering screen, a gradually increasing alternating common electrode voltage is input to the liquid crystal panel, and the flicker intensity of the central points of the multiple regions is tested respectively, and determined respectively in the The value of the applied alternating voltage when the flicker intensity of the central points of the multiple areas is less than a threshold value, the value of the voltage of the multiple areas is the best common value of multiple different positions on the liquid crystal panel The value of the voltage.

在本发明的液晶面板的检验方法的其他实施例中，也可以按照如下方法测量液晶面板上的多个不同位置的最佳公共电压的数值：In other embodiments of the inspection method of the liquid crystal panel of the present invention, it is also possible to measure the value of the best common voltage at multiple different positions on the liquid crystal panel as follows:

将液晶面板划分为多个区域；Divide the LCD panel into multiple areas;

对所述液晶面板通电，在闪烁画面下，对所述液晶面板输入逐渐增大的交变的公共电极电压，分别测试所述多个区域的中心点的闪烁强度的大小，分别确定在所述多个区域的中心点的闪烁强度最小的情况下的外加交变电压的数值，所述多个区域的该电压的数值为所述液晶面板上的多个不同位置的最佳公共电压的数值。The liquid crystal panel is energized, and under the flickering screen, a gradually increasing alternating common electrode voltage is input to the liquid crystal panel, and the flicker intensity of the central points of the multiple regions is tested respectively, and determined respectively in the The value of the applied alternating voltage when the flicker intensity of the central points of the multiple areas is the smallest, the value of the voltage in the multiple areas is the value of the optimal common voltage at multiple different positions on the liquid crystal panel.

本发明的液晶面板的检验方法的实施例中，所述根据所述最佳公共电压的数值来判断所述液晶面板的公共电极均匀性为：In the embodiment of the inspection method of the liquid crystal panel of the present invention, the determination of the uniformity of the common electrode of the liquid crystal panel according to the value of the optimal common voltage is:

计算所述最佳公共电压的数值的标准差；calculating the standard deviation of the value of said optimum common voltage;

根据所述标准差判定所述液晶面板的公共电极均匀性。例如，通过判断所述最佳公共电压的数值的标准差是否小于某一确定的值来判定所述液晶面板的公共电极均匀性是否为均匀。The uniformity of the common electrode of the liquid crystal panel is judged according to the standard deviation. For example, whether the common electrode uniformity of the liquid crystal panel is uniform is judged by judging whether the standard deviation of the value of the optimal common voltage is smaller than a certain value.

具体来说，本发明的液晶面板的检验方法的实施例中，所述根据所述标准差判定所述液晶面板的公共电极均匀性包括：Specifically, in the embodiment of the inspection method of the liquid crystal panel of the present invention, said determining the uniformity of the common electrode of the liquid crystal panel according to the standard deviation includes:

判断所述最佳公共电压的数值的标准差的是否小于0.03，如果所述最佳公共电压的数值的标准差小于0.03，则判断所述液晶面板的公共电极均匀；如果所述最佳公共电压的数值的标准差大于0.03，则判断所述液晶面板的公共电极不均匀。Judging whether the standard deviation of the value of the optimal common voltage is less than 0.03, if the standard deviation of the value of the optimal common voltage is less than 0.03, it is judged that the common electrode of the liquid crystal panel is uniform; if the optimal common voltage If the standard deviation of the value of is greater than 0.03, it is judged that the common electrode of the liquid crystal panel is not uniform.

如图1、图2所示，本发明的液晶面板的检验设备，包括：As shown in Fig. 1 and Fig. 2, the inspection equipment of the liquid crystal panel of the present invention comprises:

用于测试液晶面板的公共电极均匀性的测试装置；A test device for testing the uniformity of common electrodes of liquid crystal panels;

根据液晶面板的公共电极均匀性结果判定液晶面板的残像发生几率的判断装置2。如果液晶面板的公共电极均匀，则判断液晶面板的残像发生几率为小；如果液晶面板的公共电极不均匀，则判断液晶面板的残像发生几率为大。判断装置2与上述测试装置电连接。A judging device 2 for judging the occurrence probability of afterimage of the liquid crystal panel according to the uniformity result of the common electrode of the liquid crystal panel. If the common electrode of the liquid crystal panel is uniform, it is judged that the occurrence probability of the afterimage of the liquid crystal panel is low; The judging device 2 is electrically connected to the above-mentioned testing device.

判断装置2可以是与上述测试装置电连接的计算机，通过接收测试装置的结果，判断液晶面板的残像发生几率。The judging device 2 may be a computer electrically connected to the above-mentioned testing device, and judges the occurrence probability of the afterimage of the liquid crystal panel by receiving the result of the testing device.

本发明的液晶面板的检验设备的实施例中，上述测试装置包括：In an embodiment of the inspection equipment for liquid crystal panels of the present invention, the above-mentioned testing device includes:

用于测量液晶面板上的多个不同位置的最佳公共电压的数值的测量装置11；A measuring device 11 for measuring the value of the optimal common voltage at a plurality of different positions on the liquid crystal panel;

计算装置12，接收上述最佳公共电压的数值并根据上述最佳公共电压的数值来判断液晶面板的公共电极均匀性，计算装置12与上述判断装置电连接。The computing device 12 receives the value of the optimal common voltage and judges the uniformity of the common electrode of the liquid crystal panel according to the value of the optimal common voltage. The computing device 12 is electrically connected to the judging device.

本发明的液晶面板的检验设备的实施例中，测量装置11包括：In an embodiment of the testing equipment for liquid crystal panels of the present invention, the measuring device 11 includes:

用于承载液晶面板的基台111，基台111上安装有可在基台111上方移动的支架112；A base 111 for carrying a liquid crystal panel, on which a bracket 112 movable above the base 111 is installed;

用于测量液晶面板上区域的中心点的闪烁强度的测试仪113，固定于支架112上；A tester 113 for measuring the flicker intensity of the center point of the area on the liquid crystal panel is fixed on the bracket 112;

直流稳压电源116，用于向液晶面板加载；DC stabilized power supply 116, used to load the liquid crystal panel;

程序控制器114，与直流稳压电源116和测试仪113分别电连接，程序控制器114控制直流稳压电源116对测试液晶面板输入逐渐增大的交变的公共电极电压并控制测试仪113的开关；The program controller 114 is electrically connected with the DC stabilized power supply 116 and the tester 113 respectively, and the program controller 114 controls the DC stabilized power supply 116 to test the liquid crystal panel input gradually increasing alternating common electrode voltage and controls the tester 113 switch;

计算机115，与程序控制器114和测试仪113分别电连接，计算机115将液晶面板的表面划分为多个区域，并通过程序控制器114控制支架112在区域上方依次移动，计算机115接收测试仪113的液晶面板上多个不同位置的闪烁强度的数据并分别确定在多个位置的闪烁强度小于一门限值或最小的情况下的外加交变电压的数值，上述多个位置的该电压的数值为所述液晶面板上的多个不同位置的最佳公共电压的数值。计算机115与计算装置12电连接。The computer 115 is electrically connected to the program controller 114 and the tester 113 respectively. The computer 115 divides the surface of the liquid crystal panel into multiple regions, and controls the support 112 to move sequentially above the regions through the program controller 114. The computer 115 receives the tester 113. The data of the flicker intensity of multiple different positions on the liquid crystal panel and respectively determine the value of the applied alternating voltage when the flicker intensity of multiple positions is less than a threshold value or the minimum, and the value of the voltage at the above multiple positions is the value of the optimal common voltage at multiple different positions on the liquid crystal panel. Computer 115 is electrically connected to computing device 12 .

其中，基台111的两侧设置有纵向延伸的第一导轨21，移动架22通过与第一导轨21配合可移动的设置于基台111上方。移动架22上设置有沿横向延伸的第二导轨23。支架112通过与第二导轨23的配合可移动的设置于基台111上方。支架112可以移动至基台111上方的任何区域。程序控制器114与支架112的电机和移动架22的电机分别电连接。Wherein, first guide rails 21 extending longitudinally are arranged on both sides of the base 111 , and the moving frame 22 is movably arranged above the base 111 by cooperating with the first guide rails 21 . A second guide rail 23 extending transversely is arranged on the moving frame 22 . The bracket 112 is movably disposed above the base 111 by cooperating with the second guide rail 23 . The support 112 can be moved to any area above the base 111 . The program controller 114 is electrically connected to the motor of the support 112 and the motor of the moving frame 22 respectively.

本实施例中，判断装置2是与上述测试装置中的计算装置12电连接的计算机，通过接收计算装置12的结果，判断液晶面板的残像发生几率。In this embodiment, the judging device 2 is a computer electrically connected to the computing device 12 in the above-mentioned testing device, and judges the occurrence probability of the afterimage of the liquid crystal panel by receiving the result of the computing device 12 .

当利用本发明实施例的液晶面板的检验设备检测液晶面板，将液晶面板置于基台111上，利用计算机115将液晶面板的表面划分为多个区域，利用计算机115将通过程序控制器114控制支架112和移动架22使支架112在上述区域上方依次移动；同时，利用程序控制器114控制直流稳压电源116对测试液晶面板输入逐渐增大的交变的公共电极电压并控制测试仪113测量液晶面板上上述区域的中心点的闪烁强度；计算机115接收测试仪113的上述闪烁强度数据，并判断出闪烁强度小于一门限值（或者最小）的情况下的外加交变电压的数值，该电压的数值就是上述区域的中心点的最佳公共电压的数值。计算机115将上述区域的中心点的最佳公共电压的数值输送给计算装置12，计算装置12计算上述中心点的最佳公共电压的标准差；根据上述标准差判定液晶面板的公共电极是否均匀。本实施例中，计算装置12判断上述中心点的最佳公共电压的标准差的三倍是否小于0.09，如果上述中心点的最佳公共电压的标准差的三倍均小于0.09，则判断所述液晶面板的公共电极均匀；如果上述中心点的最佳公共电压的标准差的三倍大于0.09，则判断所述液晶面板的公共电极不均匀。判断装置2根据计算装置12的数据来判断液晶面板的残像发生几率：如果液晶面板的公共电极均匀，则判断液晶面板的残像发生几率为小；如果液晶面板的公共电极不均匀，则判断液晶面板的残像发生几率为大。When utilizing the inspection equipment of the liquid crystal panel of the embodiment of the present invention to detect the liquid crystal panel, the liquid crystal panel is placed on the base 111, and the surface of the liquid crystal panel is divided into a plurality of regions by the computer 115, which is controlled by the program controller 114 by the computer 115. The support 112 and the moving frame 22 make the support 112 move sequentially above the above-mentioned area; at the same time, utilize the program controller 114 to control the DC stabilized voltage power supply 116 to test the liquid crystal panel input gradually increasing alternating common electrode voltage and control the tester 113 to measure The flicker intensity of the central point of the above-mentioned area on the liquid crystal panel; the computer 115 receives the above-mentioned flicker intensity data of the tester 113, and judges the value of the applied alternating voltage when the flicker intensity is less than a threshold value (or minimum), the The value of the voltage is the value of the optimum common voltage at the center point of the above-mentioned area. The computer 115 sends the value of the optimal common voltage at the central point of the above-mentioned area to the computing device 12, and the computing device 12 calculates the standard deviation of the optimal common voltage at the central point; judges whether the common electrodes of the liquid crystal panel are uniform according to the standard deviation. In this embodiment, the calculation device 12 judges whether the three times of the standard deviation of the optimal public voltage at the center point is less than 0.09, and if the three times of the standard deviation of the optimal public voltage at the center point are all less than 0.09, then it is judged that the The common electrode of the liquid crystal panel is uniform; if three times the standard deviation of the optimal common voltage at the center point is greater than 0.09, it is judged that the common electrode of the liquid crystal panel is not uniform. Judging device 2 judges the afterimage generation probability of the liquid crystal panel according to the data of the computing device 12: if the common electrode of the liquid crystal panel is uniform, then judge that the afterimage occurrence probability of the liquid crystal panel is small; if the common electrode of the liquid crystal panel is uneven, then judge the liquid crystal panel The probability of afterimage occurrence is high.

在实际测试工作中，利用上述液晶面板的检验方法及检验设备大大节省了判断液晶面板的残像发生几率的时间。而通过已检验的液晶面板进行常规方法的复查的结果表明：本发明的检验方法的准确率在97%以上。In the actual test work, using the inspection method and inspection equipment of the above-mentioned liquid crystal panel greatly saves the time for judging the occurrence probability of the afterimage of the liquid crystal panel. And the result of the re-examination of the conventional method by the inspected liquid crystal panel shows that the accuracy rate of the inspection method of the present invention is above 97%.

以上所述仅是本发明的优选实施方式，应当指出，对于本技术领域的普通技术人员来说，在不脱离本发明原理的前提下，还可以做出若干改进和润饰，这些改进和润饰也应视为本发明的保护范围。The above is only a preferred embodiment of the present invention, it should be pointed out that, for those of ordinary skill in the art, without departing from the principle of the present invention, some improvements and modifications can also be made, and these improvements and modifications can also be made. It should be regarded as the protection scope of the present invention.

Claims (6)

1. a method of inspection for liquid crystal panel, is characterized in that, comprising:
The public electrode homogeneity of test fluid crystal panel;
Judge the image retention occurrence probability of described liquid crystal panel according to the public electrode uniformity results of described liquid crystal panel, the public electrode homogeneity of described test fluid crystal panel comprises:
Measure the numerical value of the best common electric voltage of the multiple diverse locations on liquid crystal panel;
Judge the public electrode homogeneity of described liquid crystal panel according to the numerical value of described best common electric voltage, the described numerical value according to described best common electric voltage judges that the public electrode homogeneity of described liquid crystal panel is:
Calculate the standard deviation of the numerical value of described best common electric voltage;
The public electrode homogeneity of described liquid crystal panel is judged according to described standard deviation.
2. the method for inspection of liquid crystal panel according to claim 1, is characterized in that, the numerical value of the best common electric voltage of the multiple diverse locations on described measurement liquid crystal panel comprises:
Liquid crystal panel is divided into multiple region;
Described liquid crystal panel is energized, under flicker picture, to the public electrode voltages of the alternation that the input of described liquid crystal panel increases gradually, test the size of the scintillation intensity of the central point in described multiple region respectively, determine the numerical value of the additional alternating voltage when the scintillation intensity of the central point in described multiple region is less than a threshold value respectively, the numerical value of this voltage in described multiple region is the numerical value of the best common electric voltage of the multiple diverse locations on described liquid crystal panel.
3. the method for inspection of liquid crystal panel according to claim 1, is characterized in that, the numerical value of the best common electric voltage of the multiple diverse locations on described measurement liquid crystal panel comprises:
Liquid crystal panel is divided into multiple region;
Described liquid crystal panel is energized, under flicker picture, to the public electrode voltages of the alternation that the input of described liquid crystal panel increases gradually, test the size of the scintillation intensity of the central point in described multiple region respectively, determine the numerical value of the additional alternating voltage when the scintillation intensity of the central point in described multiple region is minimum respectively, the numerical value of this voltage in described multiple region is the numerical value of the best common electric voltage of the multiple diverse locations on described liquid crystal panel.
4. the method for inspection of liquid crystal panel according to claim 1, is characterized in that, describedly judges that the public electrode homogeneity of described liquid crystal panel comprises according to described standard deviation:
Whether what judge the standard deviation of the numerical value of described best common electric voltage is less than 0.03, if the standard deviation of the numerical value of described best common electric voltage is less than 0.03, then judges that the public electrode of described liquid crystal panel is even; If the standard deviation of the numerical value of described best common electric voltage is greater than 0.03, then judge that the public electrode of described liquid crystal panel is uneven.
5. an inspection machine for liquid crystal panel, is characterized in that, comprising:
For the proving installation of the public electrode homogeneity of test fluid crystal panel;
Judge the judgment means of the image retention occurrence probability of described liquid crystal panel according to the public electrode uniformity results of described liquid crystal panel, be electrically connected with described proving installation, described proving installation comprises:
For measuring the measurement mechanism of the numerical value of the best common electric voltage of the multiple diverse locations on liquid crystal panel;
Calculation element, receive the numerical value of described best common electric voltage and judge the public electrode homogeneity of described liquid crystal panel according to the numerical value of described best common electric voltage, described calculation element is electrically connected with described judgment means.
6. the inspection machine of liquid crystal panel according to claim 5, is characterized in that, described measurement mechanism comprises:
For the base station of bearing liquid crystal display panel, described base station is provided with can the support of movement above described base station;
For measuring the tester of the scintillation intensity of multiple diverse location on described liquid crystal panel respectively, be fixed on described support;
D.C. regulated power supply, for loading to described liquid crystal panel;
Programming controller, is electrically connected respectively with described D.C. regulated power supply and described tester, and described programming controller controls D.C. regulated power supply to the public electrode voltages of the alternation that the input of test fluid crystal panel increases gradually and controls the switch of described tester;
Computing machine, be electrically connected respectively with described programming controller and described tester, the surface of liquid crystal panel is divided into multiple region by described computing machine, described computing machine controls the just movement over the region of described support by programming controller, on the described liquid crystal panel that described computing machine receives described tester the scintillation intensity of multiple diverse location data and determine the numerical value of the additional alternating voltage when the scintillation intensity of described multiple position is less than a threshold value or is minimum respectively, the numerical value of this voltage of described multiple position is the numerical value of the best common electric voltage of the multiple diverse locations on described liquid crystal panel, described computing machine is electrically connected with described calculation element.
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