CN102735700B - X-ray micro-imaging system - Google Patents
X-ray micro-imaging system Download PDFInfo
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- CN102735700B CN102735700B CN201210201782.6A CN201210201782A CN102735700B CN 102735700 B CN102735700 B CN 102735700B CN 201210201782 A CN201210201782 A CN 201210201782A CN 102735700 B CN102735700 B CN 102735700B
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- 238000003384 imaging method Methods 0.000 title claims abstract description 103
- 238000012360 testing method Methods 0.000 claims description 29
- 230000004807 localization Effects 0.000 claims description 10
- 230000000149 penetrating effect Effects 0.000 claims description 6
- 230000000007 visual effect Effects 0.000 abstract description 23
- 238000001514 detection method Methods 0.000 abstract description 6
- 230000004304 visual acuity Effects 0.000 description 7
- 230000007547 defect Effects 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- 230000001105 regulatory effect Effects 0.000 description 4
- 230000001276 controlling effect Effects 0.000 description 3
- 230000003321 amplification Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000004377 microelectronic Methods 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 238000012827 research and development Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000002591 computed tomography Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
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Abstract
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CN201210201782.6A CN102735700B (en) | 2012-06-18 | 2012-06-18 | X-ray micro-imaging system |
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CN201210201782.6A CN102735700B (en) | 2012-06-18 | 2012-06-18 | X-ray micro-imaging system |
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CN102735700A CN102735700A (en) | 2012-10-17 |
CN102735700B true CN102735700B (en) | 2014-08-06 |
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Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
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CN103901060A (en) * | 2014-04-14 | 2014-07-02 | 天津三英精密仪器有限公司 | X-ray microimaging background defect image correction and collection system |
CN106290417B (en) * | 2016-08-29 | 2023-06-13 | 天津三英精密仪器股份有限公司 | Multi-light-path, trans-scale and high-resolution micro CT detector |
CN106501288A (en) * | 2016-12-21 | 2017-03-15 | 北京朗视仪器有限公司 | A kind of cone-beam CT-systems equipped with multi-detector |
CN108287128A (en) * | 2018-01-29 | 2018-07-17 | 中国科学院武汉岩土力学研究所 | A kind of ground drying and watering cycle permeability measurement systems and its method |
CN109297995A (en) * | 2018-11-28 | 2019-02-01 | 江苏康众数字医疗科技股份有限公司 | A kind of resolution ratio adjustable type particle projection imaging system |
CN109827979A (en) * | 2019-01-21 | 2019-05-31 | 天津三英精密仪器股份有限公司 | A kind of efficiently online CT scan imaging method and system |
CN113325010A (en) * | 2020-02-28 | 2021-08-31 | 中国石油天然气股份有限公司 | Amplification imaging device, system and method for micro-bubbles in rock pore space |
CN113325009A (en) * | 2020-02-28 | 2021-08-31 | 中国石油天然气股份有限公司 | Rock slice amplifying imaging device, system and method |
CN111272782A (en) * | 2020-03-13 | 2020-06-12 | 彭晟 | X-ray device with self-adaptive view field and method for self-adaptively adjusting view field |
CN114563429B (en) | 2022-03-25 | 2022-11-29 | 深圳技术大学 | Super-resolution X-ray shadow imaging system and imaging method thereof |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
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JP3942142B2 (en) * | 2000-12-15 | 2007-07-11 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | Radiation tomography apparatus and method |
JP2002357567A (en) * | 2001-06-01 | 2002-12-13 | Shimadzu Corp | Computer tomographic equipment |
JP3977623B2 (en) * | 2001-10-18 | 2007-09-19 | 株式会社東芝 | X-ray computed tomography system |
JP4228821B2 (en) * | 2003-07-24 | 2009-02-25 | 株式会社島津製作所 | X-ray fluoroscope |
JP2005326260A (en) * | 2004-05-14 | 2005-11-24 | Sony Corp | X-ray imaging apparatus |
JP4299806B2 (en) * | 2005-05-11 | 2009-07-22 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | X-ray CT system |
JP4561990B2 (en) * | 2005-05-18 | 2010-10-13 | 株式会社島津製作所 | X-ray equipment |
CN1928537B (en) * | 2005-09-07 | 2010-05-12 | 株式会社岛津制作所 | X-ray detection device |
CN100565336C (en) * | 2005-11-21 | 2009-12-02 | 清华大学 | Imaging system |
CN1979140B (en) * | 2005-12-08 | 2011-10-05 | 张传忠 | Stereo vision radioactive-rays safety detection apparatus |
EP2239560B1 (en) * | 2007-12-27 | 2020-04-22 | Omron Corporation | X-ray examining apparatus and x-ray examining method |
JP2011080971A (en) * | 2009-10-08 | 2011-04-21 | Toshiba It & Control Systems Corp | Ct equipment |
CN202720202U (en) * | 2012-06-18 | 2013-02-06 | 东营市三英精密工程研究中心 | X-ray microscopy imaging system |
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Address after: 300399, No. 1, building 7, East Valley Garden, No. two, 22 weft Road, Tianjin, Dongli Patentee after: TIANJIN SANYING PRECISION INSTRUMENTS CO.,LTD. Address before: 300399 No. 105-17, No. 1, road, Dongli Economic Development Zone, Tianjin, China Patentee before: SANYING PRECISION INSTRUMENTS LTD. |
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