CN102725631B - 改进分类性能的群集分析系统和方法 - Google Patents

改进分类性能的群集分析系统和方法 Download PDF

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Publication number
CN102725631B
CN102725631B CN201080052346.6A CN201080052346A CN102725631B CN 102725631 B CN102725631 B CN 102725631B CN 201080052346 A CN201080052346 A CN 201080052346A CN 102725631 B CN102725631 B CN 102725631B
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China
Prior art keywords
parts
subset
zero defect
defective fru
broadband
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CN201080052346.6A
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Chinese (zh)
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CN102725631A (zh
Inventor
卢卡斯·R·米勒
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Illinois Tool Works Inc
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Illinois Tool Works Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4445—Classification of defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H13/00—Measuring resonant frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4454—Signal recognition, e.g. specific values or portions, signal events, signatures
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/211—Selection of the most significant subset of features
    • G06F18/2115—Selection of the most significant subset of features by evaluating different subsets according to an optimisation criterion, e.g. class separability, forward selection or backward elimination
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07C—TIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G07C3/14—Quality control systems
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2218/00—Aspects of pattern recognition specially adapted for signal processing

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Data Mining & Analysis (AREA)
  • Signal Processing (AREA)
  • Automation & Control Theory (AREA)
  • Artificial Intelligence (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Evolutionary Biology (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
CN201080052346.6A 2009-11-19 2010-11-15 改进分类性能的群集分析系统和方法 Active CN102725631B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US26277509P 2009-11-19 2009-11-19
US61/262,775 2009-11-19
PCT/US2010/056697 WO2011062866A1 (fr) 2009-11-19 2010-11-15 Système d'analyse d'ensembles et méthode améliorant les performances de tris

Publications (2)

Publication Number Publication Date
CN102725631A CN102725631A (zh) 2012-10-10
CN102725631B true CN102725631B (zh) 2015-12-16

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CN201080052346.6A Active CN102725631B (zh) 2009-11-19 2010-11-15 改进分类性能的群集分析系统和方法

Country Status (4)

Country Link
US (1) US8744983B2 (fr)
EP (1) EP2502063B1 (fr)
CN (1) CN102725631B (fr)
WO (1) WO2011062866A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10481104B2 (en) * 2010-10-21 2019-11-19 Vibrant Corporation Utilizing resonance inspection of in-service parts
CN104550046B (zh) * 2013-10-16 2017-01-04 北大方正集团有限公司 电路板的分堆装置和电路板的分堆方法
US9927403B1 (en) 2014-04-28 2018-03-27 Vibrant Corporation Resonance inspection sorting module array
CN114091360B (zh) * 2022-01-21 2022-04-22 武汉格蓝若智能技术有限公司 一种多模型融合的电压互感器误差状态评估方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5062296A (en) * 1990-09-20 1991-11-05 The United States Of America As Represented By The Department Of Energy Resonant ultrasound spectroscopy
DE4207728A1 (de) * 1992-03-11 1993-09-23 Fraunhofer Ges Forschung Verfahren zur qualitaetspruefung von pruefobjekten
US5591913A (en) * 1994-05-12 1997-01-07 Southern Research Institute Apparatus and method for ultrasonic spectroscopy testing of materials
US7132652B1 (en) * 2003-03-25 2006-11-07 Kla-Tencor Technologies Corporation Automatic classification of defects using pattern recognition applied to X-ray spectra
CN101571233A (zh) * 2009-06-15 2009-11-04 北京工业大学 基于相关分析的管道特征智能识别方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5425272A (en) 1993-11-30 1995-06-20 Quatro Corporation Relative resonant frequency shifts to detect cracks
GB2448162A (en) * 2007-04-03 2008-10-08 Bookham Technology Plc Tunable semiconductor laser

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5062296A (en) * 1990-09-20 1991-11-05 The United States Of America As Represented By The Department Of Energy Resonant ultrasound spectroscopy
DE4207728A1 (de) * 1992-03-11 1993-09-23 Fraunhofer Ges Forschung Verfahren zur qualitaetspruefung von pruefobjekten
US5591913A (en) * 1994-05-12 1997-01-07 Southern Research Institute Apparatus and method for ultrasonic spectroscopy testing of materials
US7132652B1 (en) * 2003-03-25 2006-11-07 Kla-Tencor Technologies Corporation Automatic classification of defects using pattern recognition applied to X-ray spectra
CN101571233A (zh) * 2009-06-15 2009-11-04 北京工业大学 基于相关分析的管道特征智能识别方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Process compensated resonant testing in manufacturing process control;Schwarz J et al.;《Materials Evaluation》;20050501;第63卷(第7期);736-739页 *

Also Published As

Publication number Publication date
US8744983B2 (en) 2014-06-03
CN102725631A (zh) 2012-10-10
EP2502063B1 (fr) 2017-09-06
US20120233101A1 (en) 2012-09-13
WO2011062866A1 (fr) 2011-05-26
EP2502063A1 (fr) 2012-09-26

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