CN102710998B - A kind of method of OLT test and device - Google Patents
A kind of method of OLT test and device Download PDFInfo
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Abstract
The invention provides method and the device of a kind of OLT test, described method comprises: descending GTC layer receives the GEM message that GEM layer sends, and by the GTC frame head form preset, described GEM message is encapsulated as GTC frame data; Described GTC frame data are sent to up GTC layer by described descending GTC layer, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and are sent to described GEM layer by resolving the described GEM message obtained.The embodiment of the present invention, from matching downlink frame architecture and matching downstream data rate two aspect, realizes the loopback test process of OLT, and then realizes detecting the whether normal object of OLT function.
Description
Technical field
The present invention relates to communication technical field, be specifically related to method and the device of a kind of OLT test.
Background technology
Existing GPON (Gigabit-Capable PON, Gigabit Passive Optical Network, wherein, PON is the abbreviation of Passive Optical Network) system mainly comprises OLT (the optical line terminal of local side, optical line terminal) and ONU (the Optical Network Unit of user side, optical network unit), the number ratio of OLT and ONU is 1: N, downlink data is distributed to N number of ONU by optical splitter by OLT, and upstream data is converged to OLT by optical splitter by N number of ONU.
In order to ensure OLT can with multiple ONU proper communication, all need to test OLT function in production test stage and engineering test stage, but, because the uplink frame structure of GPON system is different from the form of downlink frame structure, (uplink frame structure is the frame head+GEM message of PLOu+PLOAMu+DBRu form, downlink frame structure is the frame head+GEM message of PCBd form), and upstream data rate and downstream data rate are also possible different, and (the up-downgoing speed defined in GPON system has two patterns: up 1.24416Gbit/s, descending 2.48832Gbit/s; And up 2.48832Gbit/s, descending 2.48832Gbit/s.If adopt the first pattern, then up-downgoing data rate is different, if adopt the second pattern, then up-downgoing data rate is identical), therefore, at present when detecting the function of OLT, directly can not carry out loopback test to GPON chip, test carriage (i.e. many ONU testing equipment can only be hung on each PON mouth of the veneer of application GPON chip, whether the multiple service channels in order to test each ONU corresponding are normal), by hanging 32 ~ 128 test ONU under optical splitter, (so-called test ONU refers to test carriage, be arranged on user side, and only for OLT functional test, and the optical network unit of service is not provided to user).
When carrying out OLT functional test, the ONU that GPON chip is hung under test carriage
0send downlink data, as in fruit chip for ONU
0downlink business passage and uplink service passage all normally work, then data are through ONU
0can loopback to GPON chip; If for ONU
0uplink service passage or downlink business passage there is fault, data then cannot loopback to GPON chip.If the normal loopback of data is to GPON chip, then chip can continue the ONU that hangs under test carriage
1send downlink data, to detect and ONU
1whether corresponding multiple service channels are normal, so move in circles, and the ONU that GPON chip is one by one hung under each test carriage sends downlink data, and final realization detects the whether normal object of its inner corresponding with each ONU service channel.
Though above-mentioned test process can complete OLT Function detection, but, because the service channel quantity of chip internal is far longer than the service channel quantity of single ONU inside, therefore need to arrange a large amount of test ONU at user side, this just causes the significant wastage of ONU resource, adds testing cost.In addition, when judging that whether service channel is normal, chip needs to wait pending data from the test ONU loopback of user side to local side, this makes testing efficiency very low on the one hand, be on the other hand this method of testing can only determine for a certain test ONU multiple service channels whether normally, and the concrete service channel that breaks down can not be determined fast.
Summary of the invention
A kind of method that the embodiment of the present invention provides OLT to test and device, by directly carrying out loopback test to GPON chip, realizing saving testing cost, improving the object of testing efficiency and quick position fault.
For this reason, the embodiment of the present invention provides following technical scheme:
A method for OLT test, described method comprises:
Descending GTC layer receives the GEM message that GEM layer sends, and by the GTC frame head form preset, described GEM message is encapsulated as GTC frame data;
Described GTC frame data are sent to up GTC layer by described descending GTC layer, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and are sent to described GEM layer by resolving the described GEM message obtained.
A device for OLT test, described device comprises:
Encapsulation unit, for receiving the GEM message that GEM layer sends, and is encapsulated as GTC frame data by the GTC frame head form preset by described GEM message;
Transmitting element, for described GTC frame data are sent to up GTC layer, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and is sent to described GEM layer by resolving the described GEM message obtained.
The method of embodiment of the present invention OLT test and device, from matching downlink frame architecture and matching downstream data rate two aspect, realize the loopback test process of OLT, and then realize detecting the whether normal object of OLT function.When the up-downgoing data rate of OLT is identical, the embodiment of the present invention only needs to match downlink frame architecture; When up-downgoing data rate is different, then need coupling frame structure format and transmission rate two aspect, ensure that frame data normally from uplink service passage loopback to downlink business passage, can realize the object detecting OLT function with this.Adopt the embodiment of the present invention just not need to arrange multiple test ONU, which saves testing cost, improve testing efficiency; In addition, because the embodiment of the present invention no longer carries out multi-service Air conduct measurement for single test ONU, the quick position of fault is therefore also achieved.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present application or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, the accompanying drawing that the following describes is only some embodiments recorded in the application, for those of ordinary skill in the art, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the flow chart of the embodiment of the method 1 of embodiment of the present invention OLT test;
Fig. 2 is the loop-back path schematic diagram of embodiment of the present invention embodiment of the method 1;
Fig. 3 is the frame structure schematic diagram comprising the first default GTC frame head form in the embodiment of the present invention;
Fig. 4 comprises the frame structure schematic diagram that the second presets GTC frame head form in the embodiment of the present invention;
Fig. 5 is the frame structure schematic diagram comprising the third default GTC frame head form in the embodiment of the present invention;
Fig. 6 is the frame structure schematic diagram comprising the 4th kind of default GTC frame head form in the embodiment of the present invention;
Fig. 7 is the flow chart of the embodiment of the method 2 of embodiment of the present invention OLT test;
Fig. 8 is the loop-back path schematic diagram of embodiment of the present invention embodiment of the method 2;
Fig. 9 is the flow chart of the embodiment of the method 3 of embodiment of the present invention OLT test;
Figure 10 is the loop-back path schematic diagram of embodiment of the present invention embodiment of the method 3;
Figure 11 is the flow chart of the embodiment of the method 4 of embodiment of the present invention OLT test;
Figure 12 is the structural representation of the device embodiment 1 of embodiment of the present invention OLT test;
Figure 13 is the structural representation of the device embodiment 2 of embodiment of the present invention OLT test;
Figure 14 is the structural representation of embodiment of the present invention medium-rate adjustment unit embodiment 1;
Figure 15 is the structural representation of embodiment of the present invention medium-rate adjustment unit embodiment 2.
Embodiment
In order to make those skilled in the art person understand the present invention program better, below in conjunction with drawings and embodiments, the embodiment of the present invention is described in further detail.
The method of embodiment of the present invention OLT test and device, consider uplink/downlink frames architecture and the up-downgoing data rate two aspect factor of OLT: when up-downgoing data rate is identical, match downlink frame architecture, achieve frame data are at the loopback of OLT; When up-downgoing data rate is also different, match descending frame structure format and data rate two factors, achieve frame data are at the loopback of OLT simultaneously.
As shown in Figure 1, be the flow chart of the embodiment of the method 1 of embodiment of the present invention OLT test, comprise:
Step 101, descending GTC (GPON Transmission Convergence) layer receives the GEM message that GEM layer sends, and by the GTC frame head form preset, described GEM message is encapsulated as GTC frame data.
Step 102, described GTC frame data are sent to up GTC layer by described descending GTC layer, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and are sent to described GEM layer by resolving the described GEM message obtained.
In the present embodiment, in order to when up-downgoing data rate is identical but frame structure is different, realize the object of OLT loopback test, first will preset a up GTC layer and the general GTC frame head form of descending GTC layer.Loop-back path shown in Figure 2, the process of embodiment of the method 1 specific implementation loopback test can be described below:
(1) descending GTC layer (i.e. DOWN_GTC) is after the GEM message receiving the encapsulation of GEM layer, adopts the GTC frame head form preset that GEM message is encapsulated as GTC frame data.Because upstream data rate is identical with downstream data rate, be 2.48832Gbit/s, therefore GTC frame data directly can be sent to up GTC layer by descending GTC layer.
(2) up GTC layer (i.e. UP_GTC) is after the GTC frame data receiving the transmission of descending GTC layer, default GTC frame head format analysis GTC frame data can be adopted, obtain the GEM message wherein comprised, and then GEM message is sent to GEM layer, which achieves the loopback of GTC frame data at OLT.
Above-described embodiment 1 just can realize the object of the GPON chip detecting OLT inside, particularly can realize the object of the GTC logic interfacing detecting GPON chip internal.If GTC logic interfacing all normally works, then GTC frame data can normally loopback be to up GTC layer, and the GEM message that therefrom parses that up GTC layer can be correct is sent to GEM layer.And if up GTC layer does not correctly detect the frame head of looping back data, then think that descending GTC frame head data exists mistake.If up GTC layer can correctly detect looping back data frame head, but looping back data (i.e. GEM message) packet loss, then can think that up GTC layer resolves looping back data mistake.Like this, by detecting the different type of errors of looping back data, just can determine the fault that GTC logic interfacing exists, and then fault location is carried out to it.
It should be noted that, above-mentioned default GTC frame head form can be specially the frame head form in downlink frame structure, frame head form in shown in Figure 3, uplink frame structure, shown in Figure 4, descending GTC layer and up GTC layer reach an agreement on frame head form (namely can self-defined a kind of upper and lower GTC layer all can be general frame head form, as shown in Figure 5; Also can fill fixed field in the fixed position of descending GTC layer, correspondingly up GTC layer will resolve this fixed field to realize mating the object of frame structure, the one as shown in Figure 6) on this fixed position.
As shown in Figure 7, be the flow chart of the embodiment of the method 2 of embodiment of the present invention OLT test, comprise:
Step 201, descending GTC layer receives the GEM message that GEM layer sends, and by the GTC frame head form preset, described GEM message is encapsulated as GTC frame data.
Step 202, described GTC frame data are sent to parallel series and staticizer SerDes by described descending GTC layer.
Step 203, SerDes first carries out parallel-serial conversion to receiving GTC frame data, then before sending data to up GTC layer, serioparallel exchange is carried out again, finally again GTC frame data are sent to up GTC layer, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and be sent to described GEM layer by resolving the described GEM message obtained.
The difference of the present embodiment and embodiment 1 is, after descending GTC layer exports GTC frame data, not directly by GTC frame data loopback extremely up GTC layer, but is sent to up GTC layer again via SerDes.Loop-back path shown in Figure 8, the process that the present embodiment realizes loopback is as follows:
(1) descending GTC layer receives GEM message, and adopts the GTC frame head form preset that GEM message is encapsulated as GTC frame data to be sent to SerDes.Wherein, the GTC frame head form preset can be the form of PCBd form, PLOu form or descending GTC layer and the agreement of up GTC layer.
(2) the SerDes interface (i.e. serializer Serialize) communicated with descending GTC layer receives GTC frame data, and carries out parallel-serial conversion to GTC frame data.
(3) after being converted to serial data, the SerDes interface (i.e. staticizer Deserialize) communicated with up GTC layer carries out serioparallel exchange to serial data again, because upstream data rate is identical with downstream data rate, be 2.48832Gbit/s, therefore GTC frame data directly can be sent to up GTC layer by SerDes.
(4) up GTC layer adopts the GTC frame head format analysis GTC frame data preset, and is sent to GEM layer, which achieves the loopback of GTC frame data at OLT by after the GEM message of acquisition.
Above-described embodiment 2 just achieves in an OLT loopback test, has both detected the object that GTC logic interfacing also detects SerDes.For the detection of GTC logic interfacing and fault location process identical with embodiment 1, for SerDes, if the reception looping back data that up GTC layer can be correctly complete, just think that SerDes and GTC logic interfacing can normally work, if up GTC layer correctly can not receive looping back data, then carry out Data Detection according to the loop back method of the inventive method embodiment 1, correct if (namely GTC logic interfacing is normal), just think that fault has appearred in SerDes, just cause up GTC layer correctly can not receive looping back data.
As shown in Figure 9, be the flow chart of the embodiment of the method 3 of embodiment of the present invention OLT test, comprise:
Step 301, descending GTC layer receives the GEM message that GEM layer sends, and by the GTC frame head form preset, described GEM message is encapsulated as GTC frame data.
Step 302, described GTC frame data are sent to parallel series and staticizer SerDes by described descending GTC layer.
Step 303, SerDes is sent to photoelectric conversion component after described GTC frame data are carried out parallel-serial conversion.
Step 304, the serial data received first is converted to light signal by photoelectric conversion component, and then before data ring is back to SerDes, then the signal of telecommunication be converted to by light signal sends to SerDes.
Step 305, the serial signal that photoelectric conversion component sends is converted to parallel signal by SerDes, being sent to up GTC layer again, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and being sent to described GEM layer by resolving the described GEM message obtained.
The difference of the present embodiment and embodiment 2 is, after descending GTC layer exports GTC frame data, via being sent to up GTC layer after SerDes and photoelectric conversion component again.Loop-back path shown in Figure 10, the process that the present embodiment realizes loopback is as follows:
(1) descending GTC layer receives GEM message, and adopts the GTC frame head form preset GEM message to be encapsulated as GTC frame data to be sent to SerDes (i.e. serializer Serialize).
(2) the SerDes interface GTC frame data communicated with descending GTC layer, and parallel-serial conversion is carried out to GTC frame data, and then by conversion after serial data be passed to photoelectric conversion component (i.e. Opt_module), through photoelectric conversion component again loopback to SerDes (i.e. staticizer Deserialize).
(3) serial data that photoelectric conversion component sends is converted to parallel data by SerDes, because upstream data rate is identical with downstream data rate, is 2.48832Gbit/s, and therefore GTC frame data directly can be sent to up GTC layer by SerDes.
(4) up GTC layer adopts the GTC frame head format analysis GTC frame data preset, and is sent to GEM layer, which achieves the loopback of GTC frame data at OLT by after the GEM message of acquisition.
Above-described embodiment 3 just achieves in an OLT loopback test, detects GTC logic interfacing, detects SerDes and detects the object of photoelectric conversion component.Testing process for GTC logic interfacing and SerDes is identical with embodiment 2, for photoelectric conversion component, if the reception looping back data that up GTC layer can be correctly complete, just think photoelectric conversion component, SerDes and GTC logic interfacing bucket can normally work, if up GTC layer correctly can not receive looping back data, then carry out Data Detection according to the loop back method of the inventive method embodiment 2, correct if (namely SerDes and GTC logic interfacing is all normal), just think that fault has appearred in photoelectric conversion component, just cause up GTC layer correctly can not receive looping back data.
Above-mentioned 3 embodiments are all identical for up-downgoing data rate but frame structure different situations, in order to realize the implementation of OLT loopback test, in this case, only need to match downlink data frame structure; But, for up-downgoing data rate and all different situation of frame structure, when realizing OLT loopback test, just need to mate frame structure and data rate two aspects simultaneously.
As shown in figure 11, be the flow chart of the embodiment of the method 4 of embodiment of the present invention OLT test, comprise:
Step 401, descending GTC layer receives the GEM message that GEM layer sends, and by the GTC frame head form preset, described GEM message is encapsulated as GTC frame data.
Step 402, described GTC frame data are sent to up GTC layer according to the speed identical with upstream data rate by described descending GTC layer, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and be sent to described GEM layer by resolving the described GEM message obtained.
In example 4, except will presetting all general GTC frame head form of up-downgoing GTC layer, also need adjustment upstream data rate or downstream data rate, only all identical in the speed two of the form and transmission data that send data, the data loopback of up GTC layer and descending GTC layer could be realized.
If upstream data rate is 1.24416Gbit/s, downstream data rate is 2.48832Gbit/s, and so the mode of adapting data rate can be improve upstream data rate, also can be reduce downstream data rate.But it should be noted that, when not transforming up GTC layer, the general object adopting the mode reducing downstream data rate to realize rate matched, this is because improve upstream data rate just mean the ability needing to improve up GTC layered data processing, namely need the performance transforming up GTC layer.
From data rate=clock frequency * bit wide, for the mode reducing downstream data rate, following two specific implementation processes can be comprised:
(1) clock frequency adjusting descending GTC layer is 1/2 times of normal downstream clock frequency.
Particularly, if adopt downward regulating time frequency to reduce the mode of downstream data rate, then realize by phase-locked loop frequency division.A frequency dividing circuit is increased between phase detection discriminator and voltage controlled oscillator, frequency dividing circuit is in order to realize the frequency division to voltage controlled oscillator output clock, and then by the clock feedback after frequency division to phase detection discriminator, and then realize the object of adjustment voltage controlled oscillator output clock.For frequency dividing circuit, mainly by changing the divide ratio of frequency dividing circuit, realize the object of the frequency increasing or reduce output clock.Such as, when GPON system worked well, descending clock frequency is 155.52MHz, outlet data bit wide is 16bit, if make data rate be reduced to 1.24416Gbit/s from 2.48832Gbit/s, the divide ratio then changing frequency dividing circuit is 1/2, and be so just reduced to 77.76MHz at downstream clock frequency after phase-locked loop frequency division, correspondingly downstream data rate is also just reduced to 1.24416Gbit/s.
(2) the transfer of data bit wide adjusting descending GTC layer is 1/2 times of normal downlink transfer bit wide.
Particularly, reduce if adopted the mode that bit wide reduces downstream data rate, then realize by configuration register.Such as, when GPON system worked well, descending clock frequency is 155.52MHz, outlet data bit wide is 16bit, if make data rate be reduced to 1.24416Gbit/s from 2.48832Gbit/s, the then outlet data bit wide of configurable register, the 16bit data exported are divided into two parts, a part is that front 8bit is regarded as effective data and (exports at this time slot, and be effective output), another part is that rear 8bit is regarded as invalid data (it is invalid to be considered as when this time slot exports, but be considered as effective output when next time slot exports), that is, the outlet data bit number of each time slot during GPON system worked well is sent out at twice.When outlet data bit wide is configured to 8bit from 16bit, downstream data rate is also just reduced to 1.24416Gbit/s.
Similarly, from data rate=clock frequency * bit wide, for the mode improving upstream data rate, following two specific implementation processes also can be comprised:
(1) clock frequency adjusting up GTC layer is 2 times of normal upstream clock frequency.
(2) the transfer of data bit wide adjusting up GTC layer is 2 times of normal upstream transmission bit wide.
When GPON system worked well, up clock frequency is 155.52MHz, outlet data bit wide is 8bit, if make data rate rise to 2.48832Gbit/s from 1.24416Gbit/s, the divide ratio that can change frequency dividing circuit is on the one hand 2, clock frequency is risen to 311.04MHz, outlet data bit wide can also be configured to 16bit on the other hand, realize the object improving upstream data rate.Its adjustment principle is identical with the adjustment principle of above-mentioned reduction downstream data rate, repeats no more herein.
Above-described embodiment 4 just can realize the object of the GPON chip detecting OLT inside, particularly can realize the object of the GTC logic interfacing detecting GPON chip internal.Identical with the inventive method embodiment 1, if data loopback detection is correct and complete, just illustrate that GTC logic interfacing can normally work, if data loopback detection exists packet loss or data errors, just illustrate that GTC logic interfacing exists fault, can carry out fault location to it.
As the embodiment 5 of the method for OLT test of the present invention, for up-downgoing data rate and all different situation of frame structure, also can in an OLT loopback test, not only detect GTC logic interfacing but also detect SerDes, now, the upstream data rate of SerDes also will be consistent with downstream data rate.That is, in order to the GTC frame data of the descending GTC layer transmission of reception that can be correct, and correct the GTC frame data received are sent to up GTC layer, also to ensure the consistency of the up-downgoing data rate of SerDes, otherwise the loopback of GTC frame data at OLT cannot be realized.
It should be noted that, if embodiment 4 makes up-downgoing data rate be consistent by the mode adjusting downstream data rate, then the downstream data rate of SerDes also will correspondingly adjust, such as, when the clock frequency of descending GTC layer is reduced to 1/2 (77.76MHz) of normal clock frequency, the downstream clock frequency of SerDes equally also will be reduced to 77.76MHz.If embodiment 4 makes up-downgoing data rate be consistent by the mode adjusting upstream data rate, then SerDes also correspondingly will carry out the adjustment of upstream data rate, such as, when the bit wide of up GTC layer is increased to 2 times (16bit) of normal bit wide, the upstream data bit wide of SerDes also will be increased to 16bit.
As the embodiment 6 of the method for OLT test of the present invention, for up-downgoing data rate and all different situation of frame structure, also can in an OLT loopback test, detect GTC logic interfacing, SerDes and photoelectric conversion component simultaneously, now, the upstream data rate of photoelectric conversion component also will be consistent with downstream data rate.That is, in order to the correct GTC frame data loopback encapsulated by descending GTC layer is to up GTC layer, the consistency of the up-downgoing data rate of photoelectric conversion component to also must be ensured.
It should be noted that, if embodiment 5 makes the up-downgoing data rate of GTC layer and SerDes be consistent by the mode adjusting downstream data rate, then the downstream data rate of photoelectric conversion component also will correspondingly adjust, such as, when the bit wide of descending GTC layer and SerDes is reduced to 1/2 (8bit) of normal bit wide, the outlet data bit wide of photoelectric conversion component equally also will be reduced to 8bit.If embodiment 5 makes the up-downgoing data rate of GTC layer and SerDes be consistent by the mode adjusting upstream data rate, then photoelectric conversion component also correspondingly will carry out the adjustment of upstream data rate, such as, when the data rate of up GTC layer and SerDes is increased to 2 times (2.48832Gbps) of normal data rate, the data rate of photoelectric conversion component also will be increased to 2.48832Gbps.
When production test stage and engineering test stage need to detect OLT function, just can utilize above-mentioned 6 embodiments provided by the invention, be detected by the mode of data loopback.Because the embodiment of the present invention directly can carry out loopback test to GPON chip, therefore just do not need to arrange multiple test ONU at user side again, this just can save testing cost greatly; In addition, directly carry out loopback test and also save the time passing OLT after data are sent to test ONU again back, improve testing efficiency.In addition, the embodiment of the present invention also achieves the function of carrying out fault location fast, this is because the embodiment of the present invention no longer carries out multi-service lane testing for single ONU, but test for each service channel, be embodied as: because service channel is processed by GEM layer, each service channel is to there being a passage ID, i.e. GEM Port ID, scope is 0 ~ 4095, by the different GEM Port ID of configuration loopback business, the object of each service channel being carried out to functional test just can be realized.
It should be noted that, the embodiment of the present invention coupling frame structure even process of adapting data rate are all the schemes adopted at test phase, when practical application, the uplink/downlink frames structure that GPON chip still will specify according to agreement and up-downgoing data rate communicate with the ONU of user side.Adopt which kind of frame structure and data rate can control to switch by CPU about test phase and application stage.That is, at test phase, CPU just control GPON chip is in the state that adjustable frame structure even adjusts data rate; In the application stage, the CPU frame structure that just control GPON chip specifies according to agreement communicates with ONU with data rate, and therefore, the embodiment of the present invention can not affect the normal use of the OLT comprising GPON chip.
Correspondingly, the embodiment of the present invention also provides a kind of OLT device tested, and as shown in figure 12, is a kind of structural representation of this system.
In the embodiment 1 of device, comprising:
Encapsulation unit 501, for receiving the GEM message that GEM layer sends, and is encapsulated as GTC frame data by the GTC frame head form preset by described GEM message;
Transmitting element 502, for described GTC frame data are sent to up GTC layer, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and is sent to described GEM layer by resolving the described GEM message obtained.
Above-described embodiment be with embodiment of the method 1,2,3 corresponding apparatus structures, the identical but situation that frame structure is different mainly for up-downgoing data rate.By presetting all general GTC frame head form of about one GTC layer, realizing the loopback of GTC frame data at OLT, specifically comprising:
If GTC frame data are directly sent to up GTC layer by transmitting element, so the present embodiment just achieves the loopback of descending GTC layer and up GTC interlayer;
If GTC frame data are sent to up GTC layer via SerDes by transmitting element again, so the present embodiment just achieves the loopback of descending GTC layer and SerDes and up GTC interlayer;
If GTC frame data are sent to up GTC layer via SerDes and photoelectric conversion component by transmitting element again, so the present embodiment just achieves the loopback of descending GTC layer and SerDes, photoelectric conversion component and up GTC interlayer.
Above-mentioned loop-back process just can realize detecting GTC logic interfacing, SerDes, the whether normal object of photoelectric conversion component.It detects determination methods and Fault Locating Method existing description in embodiment of the method, repeats no more herein.
Correspondingly, the embodiment of the present invention also provides a kind of OLT device tested, and as shown in figure 13, is a kind of structural representation of this system.
In the embodiment 2 of device, comprising:
Encapsulation unit 601, for receiving the GEM message that GEM layer sends, and is encapsulated as GTC frame data by the GTC frame head form preset by described GEM message;
Rate adjustment unit 602, for adjusting the upstream data rate of up GTC layer or adjusting the data rate of descending GTC layer, to make the data rate of the two identical;
Transmitting element 603, for described GTC frame data being sent to up GTC layer according to the speed identical with upstream data rate, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and be sent to described GEM layer by resolving the described GEM message obtained.
Above-described embodiment be with embodiment of the method 4,5,6 corresponding apparatus structures, mainly for the situation that up-downgoing data rate is all different from frame structure.In the present embodiment, except will presetting all general GTC frame head form of up-downgoing GTC layer, also need adjustment upstream data rate or downstream data rate, only all identical in the speed two of the form and transmission data that send data, the data loopback of up GTC layer and descending GTC layer could be realized.
If upstream data rate is 1.24416Gbit/s, downstream data rate is 2.48832Gbit/s, and so the mode of adapting data rate can be improve upstream data rate, also can be reduce downstream data rate.
Particularly, if adopt the mode improving upstream data rate to match downstream data rate, as shown in figure 14, rate adjustment unit specifically comprises:
Uplink clock frequency adjustment unit 701, for adjusting 2 times that the clock frequency of up GTC layer is normal upstream clock frequency; Or,
Described rate adjustment unit specifically comprises:
Uplink bit wide adjustment unit 702, for adjusting 2 times that the transfer of data bit wide of up GTC layer is normal upstream transmission bit wide.
Particularly, if adopt the mode reducing downstream data rate to match downstream data rate, as shown in figure 15, rate adjustment unit specifically comprises:
Downstream clock frequency adjustment unit 801, for adjusting 1/2 times that the clock frequency of descending GTC layer is normal downstream clock frequency; Or,
Described rate adjustment unit specifically comprises:
Downlink transfer bit wide adjustment unit 802, for adjusting 1/2 times that the transfer of data bit wide of descending GTC layer is normal downlink transfer bit wide.
The present invention program can describe in the general context of computer executable instructions, such as program unit.Usually, program unit comprises the routine, program, object, assembly, data structure etc. that perform particular task or realize particular abstract data type.Also can put into practice the present invention program in a distributed computing environment, in these distributed computing environment (DCE), be executed the task by the remote processing devices be connected by communication network.In a distributed computing environment, program unit can be arranged in the local and remote computer-readable storage medium comprising memory device.
Each embodiment in this specification all adopts the mode of going forward one by one to describe, between each embodiment identical similar part mutually see, what each embodiment stressed is the difference with other embodiments.Especially, for device embodiment, because it is substantially similar to embodiment of the method, so describe fairly simple, relevant part illustrates see the part of embodiment of the method.Device embodiment described above is only schematic, the wherein said unit illustrated as separating component or can may not be and physically separates, parts as unit display can be or may not be physical location, namely can be positioned at a place, or also can be distributed in multiple network element.Some or all of module wherein can be selected according to the actual needs to realize the object of the present embodiment scheme.Those of ordinary skill in the art, when not paying creative work, are namely appreciated that and implement.
Being described in detail the embodiment of the present invention above, applying embodiment herein to invention has been elaboration, the explanation of above embodiment just understands method and apparatus of the present invention for helping; Meanwhile, for one of ordinary skill in the art, according to thought of the present invention, all will change in specific embodiments and applications, in sum, this description should not be construed as limitation of the present invention.
Claims (11)
1. a method for OLT test, it is characterized in that, described method comprises:
Descending GTC layer receives the GEM message that GEM layer sends, and by the GTC frame head form preset, described GEM message is encapsulated as GTC frame data;
Described GTC frame data are sent to up GTC layer according to the speed identical with upstream data rate by described descending GTC layer, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and be sent to described GEM layer by resolving the described GEM message obtained.
2. method according to claim 1, is characterized in that, described default GTC frame head form is specially the one in the frame head form that descending GTC frame head form, up GTC frame head form, descending GTC layer and up GTC layer reach an agreement on.
3. method according to claim 1, is characterized in that, described descending GTC layer sends described GTC frame data according to the speed identical with upstream data rate and specifically comprises:
Adjust the upstream data rate of up GTC layer or adjust the data rate of descending GTC layer, to make the data rate of the two identical.
4. method according to claim 3, is characterized in that, the upstream data rate of the up GTC layer of described adjustment specifically comprises:
The clock frequency adjusting up GTC layer is 2 times of normal upstream clock frequency; Or,
The transfer of data bit wide adjusting up GTC layer is 2 times of normal upstream transmission bit wide.
5. method according to claim 3, is characterized in that, the downstream data rate of the descending GTC layer of described adjustment specifically comprises:
The clock frequency adjusting descending GTC layer is 1/2 times of normal downstream clock frequency; Or,
The transfer of data bit wide adjusting descending GTC layer is 1/2 times of normal downlink transfer bit wide.
6. the method according to any one of claim 1 to 5, is characterized in that, described GTC frame data are sent to up GTC layer and specifically comprise by described descending GTC layer:
Described GTC frame data are sent to up GTC layer by parallel series and staticizer by described descending GTC layer.
7. the method according to any one of claim 1 to 5, is characterized in that, described GTC frame data are sent to up GTC layer and specifically comprise by described descending GTC layer:
Described GTC frame data are sent to up GTC layer by parallel series and staticizer and photoelectric conversion component by described descending GTC layer.
8. a device for OLT test, it is characterized in that, described device comprises:
Encapsulation unit, for receiving the GEM message that GEM layer sends, and is encapsulated as GTC frame data by the GTC frame head form preset by described GEM message;
Transmitting element, for described GTC frame data being sent to up GTC layer according to the speed identical with upstream data rate, to make described up GTC layer according to GTC frame data described in described default GTC frame head format analysis, and be sent to described GEM layer by resolving the described GEM message obtained.
9. device according to claim 8, is characterized in that, described device also comprises:
Rate adjustment unit, for adjusting the upstream data rate of up GTC layer or adjusting the data rate of descending GTC layer, to make the data rate of the two identical.
10. device according to claim 9, is characterized in that,
Described rate adjustment unit specifically comprises:
Uplink clock frequency adjustment unit, for adjusting 2 times that the clock frequency of up GTC layer is normal upstream clock frequency; Or,
Described rate adjustment unit specifically comprises:
Uplink bit wide adjustment unit, for adjusting 2 times that the transfer of data bit wide of up GTC layer is normal upstream transmission bit wide.
11. devices according to claim 9, is characterized in that,
Described rate adjustment unit specifically comprises:
Downstream clock frequency adjustment unit, for adjusting 1/2 times that the clock frequency of descending GTC layer is normal downstream clock frequency; Or,
Described rate adjustment unit specifically comprises:
Downlink transfer bit wide adjustment unit, for adjusting 1/2 times that the transfer of data bit wide of descending GTC layer is normal downlink transfer bit wide.
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