CN102662813A - IO channel signal test system of digital quantity board card in real-time digital simulation system - Google Patents
IO channel signal test system of digital quantity board card in real-time digital simulation system Download PDFInfo
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- CN102662813A CN102662813A CN 201210061878 CN201210061878A CN102662813A CN 102662813 A CN102662813 A CN 102662813A CN 201210061878 CN201210061878 CN 201210061878 CN 201210061878 A CN201210061878 A CN 201210061878A CN 102662813 A CN102662813 A CN 102662813A
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Abstract
The invention discloses an IO channel signal test system of a digital quantity board card in a real-time digital simulation system. The system comprises two 32-bit switch elements, two shifting modules, an RTDS digital quantity board card and indicator lamp elements. The RTDS digital quantity board card comprises a digital quantity output board card and a digital quantity input board card, wherein 16 circuits of the 32-bit switch elements are connected with 16 IOs of the digital quantity output board card in a one-to- one correspondence manner, and the other 16 circuits which are connected with a shifting module are connected with 16 IOs of the digital quantity output board card in a one-to- one correspondence manner. The digital quantity output board card is connected with the input port of the digital quantity input board card. Each IO port of the digital quantity input board card is connected with an indicator lamp element. The IO channel signal test system is in no need of other external oscillography apparatuses (wave recorder or signal generator), is reliable in realization method, and is simple and quick in operation.
Description
Technical field
The present invention relates to the digital quantity integrated circuit board IO channel signal test macro in a kind of real-timedigital simulation system.
Background technology
Before carrying out RTDS (Real Time Digital Simulator, real-timedigital simulation appearance) l-G simulation test, need the availability of checking R TDS digital quantity integrated circuit board, whether its IO passage can the correct transmission data; In the process of carrying out the RTDS l-G simulation test; Digital quantity IO signalling channel often breaks down; Can't realize the correct transmission of data, need checking R TDS digital quantity integrated circuit board IO passage this moment, judge through test whether RTDS digital quantity integrated circuit board breaks down; And then fix a breakdown, guarantee carrying out smoothly of RTDS l-G simulation test.RTDS digital quantity integrated circuit board (GTDO (digital quantity output) integrated circuit board and GTDI (digital quantity input) integrated circuit board) IO lane testing is extremely important test link of electric system RTDS modeling and simulating test, is the important leverage of electric system RTDS Simulation results correctness.Therefore be necessary to provide a kind of efficient, correct RTDS digital quantity integrated circuit board IO lane testing method.
Therefore, prior art awaits to improve and development.
Summary of the invention
The object of the present invention is to provide the digital quantity integrated circuit board IO channel signal test macro in a kind of real-timedigital simulation system, be intended to solve in the existing RTDS l-G simulation test process because the unnecessary mistake that IO channel signal problem causes.
Technical scheme of the present invention is following:
Digital quantity integrated circuit board IO channel signal test macro in a kind of real-timedigital simulation system, it comprises two 32 bit switch elements, is divided into first switch and second switch; Two shift modules are divided into first shift module and second shift module; RTDS digital quantity integrated circuit board and pilot lamp element; Said RTDS digital quantity integrated circuit board comprises digital quantity output integrated circuit board and digital quantity input integrated circuit board; Said digital quantity output integrated circuit board and digital quantity input integrated circuit board each have 64 road IO mouths; The output of wherein said each 32 bit switch element is divided into two-way; Wherein on 16 tunnel directly corresponding one to one 16 IO that are connected to digital quantities output integrated circuit board, in addition 16 the tunnel connect a shift module, after being shifted through said shift module on corresponding one to one 16 IO that are connected to digital quantity output integrated circuit board; Said digital quantity output integrated circuit board adopts RTDS dedicated test wire row to link to each other with the input port of digital quantity input integrated circuit board, is connected with a pilot lamp element respectively on each IO mouth of digital quantity input integrated circuit board.
Digital quantity integrated circuit board IO channel signal test macro in the described real-timedigital simulation system, wherein, said 32 bit switch elements and shift module are that the control function component library from the real-timedigital simulation system is transferred.
Digital quantity integrated circuit board IO channel signal test macro in the described real-timedigital simulation system; Wherein, Preceding 16 1-16 position outputs as digital quantity output integrated circuit board of the switching value of first switch are through back 16 the 17-32 position outputs as digital quantity output integrated circuit board of first shift module with the switching value of first switch 1; With preceding 16 33-48 positions outputs of the switching value of second switch, through of back 16 the 49-64 positions outputs as digital quantity output integrated circuit board of second shift module with the switching value of second switch as digital quantity output integrated circuit board.
Digital quantity integrated circuit board IO channel signal test macro in the described real-timedigital simulation system, wherein, its method of testing is: the 1st bit switch amount in the on-off element is 1, then the 1st lamp in the pilot lamp element brightens; The 1st bit switch amount in the on-off element is 0, then the 1st lamp deepening in the pilot lamp element.
Beneficial effect of the present invention: the present invention can eliminate unnecessary mistake in the RTDS l-G simulation test process through a kind of efficient, correct RTDS digital quantity integrated circuit board IO lane testing method is provided; Need not to use other outside oscillography instrument (oscillograph device or signal generating Instrument); Implementation method is reliable, and is simple and quick.Improve the electric system RTDS l-G simulation test duration effectively and guarantee the l-G simulation test quality.
Description of drawings
Fig. 1 is the structure principle chart of test macro provided by the invention.
Fig. 2 is the test signal synoptic diagram of test macro provided by the invention.
Fig. 3 is the test result synoptic diagram of test macro provided by the invention.
Embodiment
For making the object of the invention, technical scheme and advantage clearer, clear and definite, below develop simultaneously embodiment to further explain of the present invention with reference to accompanying drawing.
Referring to Fig. 1, the digital quantity integrated circuit board IO channel signal test macro in the real-timedigital simulation provided by the invention system comprises: two 32 bit switch elements, RTDS digital quantity integrated circuit board, pilot lamp element and two shift modules.Said RTDS digital quantity integrated circuit board comprises GTDO (digital quantity output) integrated circuit board and GTDI (digital quantity input) integrated circuit board, and said GTDO (digital quantity output) integrated circuit board and GTDI (digital quantity input) integrated circuit board each have 64 road IO mouths.The output of wherein said 32 bit switch elements is divided into two-way; Wherein 16 the tunnel directly one to one correspondence be connected on 16 IO of GTDO (digital quantity output) integrated circuit board; In addition 16 the tunnel connect a shift module, after being shifted through said shift module one to one correspondence be connected on 16 IO of GTDO (digital quantity output) integrated circuit board.Two 32 bit switch elements just can fill 64 IO mouths of a GTDO (digital quantity output) integrated circuit board.Said GTDO (digital quantity output) integrated circuit board adopts RTDS dedicated test wire row to link to each other with the input port of GTDI (digital quantity input) integrated circuit board.Be connected with a pilot lamp element respectively on each IO mouth of GTDI (digital quantity input) integrated circuit board.
Said 32 bit switch elements and shift module are that the control function component library from the real-timedigital simulation system is transferred.
2 32 bit switch elements are set to 64 tunnel outputs of GTDO (digital quantity output) integrated circuit board in the embodiment of the invention; As shown in Figure 2; With preceding 16 1-16 positions outputs of the switching value of first switch 1, through of back 16 the 17-32 positions outputs as GTDO integrated circuit board of first shift module with the switching value of first switch 1 as the GTDO integrated circuit board; In like manner, with preceding 16 33-48 positions outputs of the switching value of second switch 2, through of back 16 the 49-64 positions outputs as GTDO integrated circuit board of second shift module with the switching value of second switch 2 as the GTDO integrated circuit board.
GTDI module 1-16 position is set to be input as INPUT1,17-32 position and to be input INPUT4 for input INPUT2,33-48 position for input INPUT3 and 49-64 position.
With carrying out the test of IO channel signal after the test macro connection completion.The switching value of said 2 32 bit switch elements is 0 or 1, an input signal is set sees shown in Figure 2.
The pilot lamp element is used to show GTDI input state 0 or 1, and GTDI module 1-16 position is input as that INPUT1,17-32 position are input as INPUT2, the 33-48 position is input as INPUT3 and the 49-64 position is input as INPUT4, sees Fig. 3.When first corresponding among the on off state of first switch among Fig. 2 and second switch and Fig. 3 switch is consistent with the output of second switch element 1-32 position, explain that this IO passage is normal.
As when the 1st bit switch amount in the 32 bit switch elements is set to 1, then the 1st of INPUT1 the lamp should brighten in the pilot lamp element; When the 1st bit switch amount in the 32 bit switch elements was set to 0, then the 1st of INPUT1 the lamp answered deepening in the pilot lamp element.
The present invention can eliminate unnecessary mistake in the RTDS l-G simulation test process through a kind of efficient, correct RTDS digital quantity integrated circuit board IO lane testing method is provided; Need not to use other outside oscillography instrument (oscillograph device or signal generating Instrument); Implementation method is reliable, and is simple and quick.Improve the electric system RTDS l-G simulation test duration effectively and guarantee the l-G simulation test quality.
Should be understood that application of the present invention is not limited to above-mentioned giving an example, concerning those of ordinary skills, can improve or conversion that all these improvement and conversion all should belong to the protection domain of accompanying claims of the present invention according to above-mentioned explanation.
Claims (4)
1. the digital quantity integrated circuit board IO channel signal test macro in the real-timedigital simulation system is characterized in that, comprises two 32 bit switch elements, is divided into first switch and second switch; Two shift modules are divided into first shift module and second shift module; RTDS digital quantity integrated circuit board and pilot lamp element; Said RTDS digital quantity integrated circuit board comprises digital quantity output integrated circuit board and digital quantity input integrated circuit board; Said digital quantity output integrated circuit board and digital quantity input integrated circuit board each have 64 road IO mouths; The output of wherein said each 32 bit switch element is divided into two-way; Wherein on 16 tunnel directly corresponding one to one 16 IO that are connected to digital quantities output integrated circuit board, in addition 16 the tunnel connect a shift module, after being shifted through said shift module on corresponding one to one 16 IO that are connected to digital quantity output integrated circuit board; Said digital quantity output integrated circuit board adopts RTDS dedicated test wire row to link to each other with the input port of digital quantity input integrated circuit board, is connected with a pilot lamp element respectively on each IO mouth of digital quantity input integrated circuit board.
2. the digital quantity integrated circuit board IO channel signal test macro in the real-timedigital simulation according to claim 1 system is characterized in that said 32 bit switch elements and shift module are that the control function component library from the real-timedigital simulation system is transferred.
3. the digital quantity integrated circuit board IO channel signal test macro in the real-timedigital simulation according to claim 1 system; It is characterized in that; Preceding 16 1-16 position outputs as digital quantity output integrated circuit board of the switching value of first switch are through back 16 the 17-32 position outputs as digital quantity output integrated circuit board of first shift module with the switching value of first switch 1; With preceding 16 33-48 positions outputs of the switching value of second switch, through of back 16 the 49-64 positions outputs as digital quantity output integrated circuit board of second shift module with the switching value of second switch as digital quantity output integrated circuit board.
4. the digital quantity integrated circuit board IO channel signal test macro in the real-timedigital simulation according to claim 3 system, it is characterized in that its method of testing is: the 1st bit switch amount in the on-off element is 1, then the 1st lamp in the pilot lamp element brightens; The 1st bit switch amount in the on-off element is 0, then the 1st lamp deepening in the pilot lamp element.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210061878.7A CN102662813B (en) | 2012-03-09 | 2012-03-09 | IO channel signal test system of digital quantity board card in real-time digital simulation system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210061878.7A CN102662813B (en) | 2012-03-09 | 2012-03-09 | IO channel signal test system of digital quantity board card in real-time digital simulation system |
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| CN102662813A true CN102662813A (en) | 2012-09-12 |
| CN102662813B CN102662813B (en) | 2014-11-26 |
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| CN201210061878.7A Active CN102662813B (en) | 2012-03-09 | 2012-03-09 | IO channel signal test system of digital quantity board card in real-time digital simulation system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103354025A (en) * | 2013-06-19 | 2013-10-16 | 许昌开普电器检测研究院 | RTDS data transmission device and method based on serial communication |
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2012
- 2012-03-09 CN CN201210061878.7A patent/CN102662813B/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103354025A (en) * | 2013-06-19 | 2013-10-16 | 许昌开普电器检测研究院 | RTDS data transmission device and method based on serial communication |
| CN103354025B (en) * | 2013-06-19 | 2017-07-14 | 许昌开普检测技术有限公司 | A kind of RTDS data transmission devices and method based on serial communication |
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| CN102662813B (en) | 2014-11-26 |
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