CN203101545U - Test system for signal of digital quantity board input and output channel of RTDS simulation platform - Google Patents
Test system for signal of digital quantity board input and output channel of RTDS simulation platform Download PDFInfo
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- CN203101545U CN203101545U CN 201320013394 CN201320013394U CN203101545U CN 203101545 U CN203101545 U CN 203101545U CN 201320013394 CN201320013394 CN 201320013394 CN 201320013394 U CN201320013394 U CN 201320013394U CN 203101545 U CN203101545 U CN 203101545U
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- circuit board
- integrated circuit
- rtds
- switch
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Abstract
The utility model discloses a test system for signals of digital quantity board input and output channels of a RTDS simulation platform. The test system comprises two 32-bit switch elements, two shift modules, a RTDS digital quantity board and indicating lamp elements. The RTDS digital quantity board comprises a digital quantity output board and a digital quantity input board, wherein 16 paths of each 32-bit switch element are correspondingly and directly connected to 16 IOs of the digital quantity output board one by one, and another 16 paths of each 32-bit switch element are connected with one shift module and then are correspondingly connected to the 16 IOs of the digital quantity output board one by one. The digital quantity output board is connected with an input port of the digital quantity input board, and each IO of the digital quantity input board is connected with one indicating lamp element. The test system of the utility model does not need other external oscillographic devices (a wave record device or a signal generation device) and is easy and fast to operate.
Description
Technical field
The utility model relates to a kind of RTDS emulation platform digital quantity integrated circuit board IO channel signal test system.
Background technology
Carrying out RTDS(Real TimeDigital Simulator, real-timedigital simulation instrument) before the l-G simulation test, need the availability of checking R TDS digital quantity integrated circuit board, whether its IO passage can correctly transmit data; In the process of carrying out the RTDS l-G simulation test, digital quantity IO signalling channel often breaks down, can't realize the correct transmission of data, need checking R TDS digital quantity integrated circuit board IO passage this moment, judge by test whether RTDS digital quantity integrated circuit board breaks down, and then fix a breakdown, guarantee carrying out smoothly of RTDS l-G simulation test.The input of RTDS digital quantity integrated circuit board (output of GTDO(digital quantity) integrated circuit board and GTDI(digital quantity) integrated circuit board) the IO lane testing is extremely important test link of electric system RTDS modeling and simulating test, is the important leverage of electric system RTDS Simulation results correctness.
Therefore, prior art has yet to be improved and developed.
The utility model content
The purpose of this utility model is to provide a kind of RTDS emulation platform digital quantity integrated circuit board IO channel signal test system, is intended to solve in the existing RTDS l-G simulation test process because the unnecessary mistake that IO channel signal problem causes.
The technical solution of the utility model is as follows:
A kind of RTDS emulation platform digital quantity integrated circuit board IO channel signal test system, it comprises two 32 bit switch elements, is divided into first switch and second switch; Two shift modules are divided into first shift module and second shift module; RTDS digital quantity integrated circuit board and pilot lamp element, described RTDS digital quantity integrated circuit board comprises digital quantity output integrated circuit board and digital quantity input integrated circuit board, described digital quantity output integrated circuit board and digital quantity input integrated circuit board each have 64 road IO mouths, the output of wherein said each 32 bit switch element is divided into two-way, wherein the 16 tunnel direct corresponding one to one digital quantities that are connected to are exported on 16 IO of integrated circuit board, shift module of 16 tunnel connections in addition, after being shifted by described shift module on corresponding one to one 16 IO that are connected to digital quantity output integrated circuit board, described digital quantity output integrated circuit board adopts RTDS dedicated test wire row to link to each other with the input port of digital quantity input integrated circuit board, is connected with a pilot lamp element respectively on each IO mouth of digital quantity input integrated circuit board.
Described RTDS emulation platform digital quantity integrated circuit board IO channel signal test system, wherein, described 32 bit switch elements and shift module are that the control function component library from the real-timedigital simulation system is transferred.
Described RTDS emulation platform digital quantity integrated circuit board IO channel signal test system, wherein, preceding 16 1-16 position outputs as digital quantity output integrated circuit board of the switching value of first switch are by back 16 the 17-32 position outputs as digital quantity output integrated circuit board of first shift module with the switching value of first switch 1; With preceding 16 33-48 positions outputs of the switching value of second switch, by of back 16 the 49-64 positions outputs as digital quantity output integrated circuit board of second shift module with the switching value of second switch as digital quantity output integrated circuit board.
The beneficial effects of the utility model: the utility model can be eliminated unnecessary mistake in the RTDS l-G simulation test process by a kind of efficient, correct RTDS digital quantity integrated circuit board IO lane testing system is provided, need not to use other outside oscillography instrument (oscillograph device or signal generating Instrument), simple and quick.Improve the electric system RTDS l-G simulation test duration effectively and guarantee the l-G simulation test quality.
Description of drawings
Fig. 1 is the structure principle chart of the test macro that provides of the utility model;
Fig. 2 is the test signal synoptic diagram of the test macro that provides of the utility model;
Fig. 3 is the test result synoptic diagram of the test macro that provides of the utility model.
Embodiment
For making the purpose of this utility model, technical scheme and advantage clearer, clear and definite, below the utility model is further described with reference to the accompanying drawing embodiment that develops simultaneously.
Referring to Fig. 1, the RTDS emulation platform digital quantity integrated circuit board IO channel signal test system that the utility model provides comprises: two 32 bit switch elements, RTDS digital quantity integrated circuit board, pilot lamp element and two shift modules.Described RTDS digital quantity integrated circuit board comprises GTDO(digital quantity output) integrated circuit board and the input of GTDI(digital quantity) integrated circuit board, described GTDO(digital quantity output) integrated circuit board and the input of GTDI(digital quantity) integrated circuit board each has 64 road IO mouths.The output of wherein said 32 bit switch elements is divided into two-way, wherein 16 the tunnel directly one to one correspondence be connected to GTDO(digital quantity output) on 16 IO of integrated circuit board, in addition 16 the tunnel connect a shift module, after being shifted by described shift module one to one correspondence be connected to the output of GTDO(digital quantity) on 16 IO of integrated circuit board.Two 32 bit switch elements just can fill a GTDO(digital quantity output) 64 IO mouths of integrated circuit board.The output of described GTDO(digital quantity) integrated circuit board adopts RTDS dedicated test wire row to import with the GTDI(digital quantity) input port of integrated circuit board links to each other.The input of GTDI(digital quantity) is connected with a pilot lamp element respectively on each IO mouth of integrated circuit board.
Described 32 bit switch elements and shift module are that the control function component library from the real-timedigital simulation system is transferred.
2 32 bit switch elements are set to the output of GTDO(digital quantity among the utility model embodiment) 64 tunnel outputs of integrated circuit board, as shown in Figure 2, with preceding 16 1-16 positions outputs of the switching value of first switch 1, by of back 16 the 17-32 positions outputs as GTDO integrated circuit board of first shift module with the switching value of first switch 1 as the GTDO integrated circuit board; In like manner, with preceding 16 33-48 positions outputs of the switching value of second switch 2, by of back 16 the 49-64 positions outputs as GTDO integrated circuit board of second shift module with the switching value of second switch 2 as the GTDO integrated circuit board.
GTDI module 1-16 position is set to be input as INPUT1,17-32 position and to be input INPUT4 for input INPUT2,33-48 position for input INPUT3 and 49-64 position.
Test macro connected carry out the test of IO channel signal after finishing.The switching value of described 2 32 bit switch elements is 0 or 1, an input signal is set sees shown in Figure 2.
The pilot lamp element is used to show GTDI input state 0 or 1, and GTDI module 1-16 position is input as that INPUT1,17-32 position are input as INPUT2, the 33-48 position is input as INPUT3 and the 49-64 position is input as INPUT4, sees Fig. 3.When first corresponding among the on off state of first switch among Fig. 2 and second switch and Fig. 3 switch is consistent with the output of second switch element 1-32 position, illustrate that this IO passage is normal.
As when the 1st bit switch amount in the 32 bit switch elements is set to 1, then the 1st of INPUT1 the lamp should brighten in the pilot lamp element; When the 1st bit switch amount in the 32 bit switch elements was set to 0, then the 1st of INPUT1 the lamp answered deepening in the pilot lamp element.
The utility model can be eliminated unnecessary mistake in the RTDS l-G simulation test process by a kind of efficient, correct RTDS digital quantity integrated circuit board IO lane testing system is provided, need not to use other outside oscillography instrument (oscillograph device or signal generating Instrument), simple and quick.Improve the electric system RTDS l-G simulation test duration effectively and guarantee the l-G simulation test quality.
Should be understood that; application of the present utility model is not limited to above-mentioned giving an example; for those of ordinary skills, can be improved according to the above description or conversion, all these improvement and conversion all should belong to the protection domain of the utility model claims.
Claims (3)
1.RTDS emulation platform digital quantity integrated circuit board IO channel signal test system is characterized in that, comprises two 32 bit switch elements, is divided into first switch and second switch; Two shift modules are divided into first shift module and second shift module; RTDS digital quantity integrated circuit board and pilot lamp element, described RTDS digital quantity integrated circuit board comprises digital quantity output integrated circuit board and digital quantity input integrated circuit board, described digital quantity output integrated circuit board and digital quantity input integrated circuit board each have 64 road IO mouths, the output of wherein said each 32 bit switch element is divided into two-way, wherein the 16 tunnel direct corresponding one to one digital quantities that are connected to are exported on 16 IO of integrated circuit board, shift module of 16 tunnel connections in addition, after being shifted by described shift module on corresponding one to one 16 IO that are connected to digital quantity output integrated circuit board, described digital quantity output integrated circuit board adopts RTDS dedicated test wire row to link to each other with the input port of digital quantity input integrated circuit board, is connected with a pilot lamp element respectively on each IO mouth of digital quantity input integrated circuit board.
2. RTDS emulation platform digital quantity integrated circuit board IO channel signal test system according to claim 1 is characterized in that described 32 bit switch elements and shift module are that the control function component library from the real-timedigital simulation system is transferred.
3. RTDS emulation platform digital quantity integrated circuit board IO channel signal test system according to claim 1, it is characterized in that, preceding 16 1-16 position outputs as digital quantity output integrated circuit board of the switching value of first switch are by back 16 the 17-32 position outputs as digital quantity output integrated circuit board of first shift module with the switching value of first switch 1; With preceding 16 33-48 positions outputs of the switching value of second switch, by of back 16 the 49-64 positions outputs as digital quantity output integrated circuit board of second shift module with the switching value of second switch as digital quantity output integrated circuit board.
Priority Applications (1)
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CN 201320013394 CN203101545U (en) | 2013-01-10 | 2013-01-10 | Test system for signal of digital quantity board input and output channel of RTDS simulation platform |
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CN 201320013394 CN203101545U (en) | 2013-01-10 | 2013-01-10 | Test system for signal of digital quantity board input and output channel of RTDS simulation platform |
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CN 201320013394 Expired - Lifetime CN203101545U (en) | 2013-01-10 | 2013-01-10 | Test system for signal of digital quantity board input and output channel of RTDS simulation platform |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108732438A (en) * | 2017-04-27 | 2018-11-02 | 研祥智能科技股份有限公司 | One kind being used for the measurement jig and method of general purpose I/O port |
-
2013
- 2013-01-10 CN CN 201320013394 patent/CN203101545U/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108732438A (en) * | 2017-04-27 | 2018-11-02 | 研祥智能科技股份有限公司 | One kind being used for the measurement jig and method of general purpose I/O port |
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GR01 | Patent grant | ||
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CX01 | Expiry of patent term |
Granted publication date: 20130731 |