CN102662098A

CN102662098A - Method for measuring high voltage and high resistance by means of ratio overlaying

Info

Publication number: CN102662098A
Application number: CN2012101796512A
Authority: CN
Inventors: 呼和; 闫立新; 吕金华
Original assignee: Inner Mongolia Institute Of Metrology Testing And Research
Current assignee: Inner Mongolia Institute Of Metrology Testing And Research
Priority date: 2012-06-04
Filing date: 2012-06-04
Publication date: 2012-09-12
Anticipated expiration: 2032-06-04
Also published as: CN102662098B

Abstract

The invention discloses a method for measuring high voltage and high resistance by means of ratio overlaying, comprising the following steps of: overlaying high-accuracy ratio standards of all known electric parameters in a ratio standard of only-known low-voltage arm reactance value to form a new ratio standard, and when a voltage Vx value applied to an input end of a new ratio standard high-voltage arm or an unknown reactance value Zx of the high-voltage arm needs to be measured, measuring practical values of Vx and Zx due to the measurement that the ratio of the new ratio standard is overlaid with the front and low low-voltage arm output voltage and the computation of a mathematical equation set formed by the known electric parameter; and adjusting a low-voltage arm circuit parameter of the new ratio standard, so that the low-voltage arm output voltage values before and after being overlaid with the ratio standard can be equal to one another, and practical values of Vx and Zx can be measured, and therefore, the method can be used for the design manufacture of a novel precision high resistance meter, a high-voltage voltage-dividing ratio metering standard, and an online self-calibration high-voltage voltage divider in high-voltage power transmission.

Description

Measure high voltage, high-resistance method with the ratio stacked system

Technical field

The present invention relates to a kind of measurement high resistance, high-tension method, refer in particular to and be used for electricity metering, use the ratio stacked system, by a kind of measurement high resistance, the high-tension method of advanced standard when substandard is carried out transmission of quantity value.

Background technology

At present, in electricity metering high resistance, high-tension measuring process, mainly use megohm bridge, high-voltage bleeder, detect with these instruments, wiring is loaded down with trivial details, accuracy is low.Studying the measuring method that a kind of wiring is simple, accuracy is high is that metrological service is badly in need of.

Summary of the invention

The technical matters that the present invention will solve provides a kind of with ratio stacked system measurement high voltage, high-resistance method, and this method is high resistance, the high voltage measuring method that a kind of wiring is simple, accuracy is high.

The technical matters that the present invention will solve is realized by following scheme: ratio stacked system measurement high voltage, high-resistance method are meant the pin-point accuracy ratio criteria K1 of known whole electric parameters in the electricity metering, are superimposed upon and only know low-voltage arm reactance value Z _ΔRatio criteria K2 in, i.e. the high-voltage arm impedance of two ratio criteria is connected into Zx+Z ₁, two low-voltage arm impedances also are connected into Z ₂+ Z _Δ, form a new ratio criteria K ₁₊₂, as said ratio criteria K ₁₊₂When the unknown reactance value Zx of the voltage Vx that the high-voltage arm input end applies or high-voltage arm need measure, through to said ratio criteria K ₁₊₂Ratio stack before and after low-voltage arm output voltage V c1 and the measurement of Vc2 and the math equation group of known electric parameter formation: Vx=Vc1 * (Zx+Z _Δ)/Z _ΔVx=Vc2 * (Zx+Z ₁+ Z ₂+ Z _Δ)/(Z ₂+ Z _Δ) calculating can measure the actual value of Vx and Zx; Also can be through the said ratio criteria K of adjustment ₁₊₂The low-voltage arm circuit in Z _ΔThe reactance value of parameter equates its low-voltage arm output voltage values before and after the ratio criteria stack, at this moment K ₁=K ₂=K ₁₊₂By following mathematical formulae: Vx=Vc * (Z ₁+ Z ₂)/Z ₂Zx=Z _Δ* Z ₁/ Z ₂, also can measure the actual value of Vx and Zx.

Advantage of the present invention is: this method can be used in novel precise megger, high pressure partial pressure ratio measurement standard, the high voltage power transmission can online self-alignment high-voltage bleeder manufacture and design.

Description of drawings

The high-voltage high resistance measurement mechanism electrical structure diagram of Fig. 1 ratio method of superposition.

The high-voltage high resistance measurement mechanism electrical schematic diagram of Fig. 2 ratio method of superposition.

Embodiment

Below in conjunction with Fig. 1, a used high direct voltage high resistance measurement device embodiment of Fig. 2 process in detail, but claim of the present invention is not done any qualification.

This ratio stacked system measurement high voltage, high-resistance method are meant the pin-point accuracy ratio criteria K1 of known whole electric parameters in the electricity metering, are superimposed upon and only know low-voltage arm reactance value Z _ΔRatio criteria K2 in, i.e. the high-voltage arm impedance of two ratio criteria is connected into Zx+Z ₁, two low-voltage arm impedances also are connected into Z ₂+ Z _Δ, form a new ratio criteria K ₁₊₂, as said ratio criteria K ₁₊₂When the unknown reactance value Zx of the voltage Vx that the high-voltage arm input end applies or high-voltage arm need measure, through to said ratio criteria K ₁₊₂Ratio stack before and after low-voltage arm output voltage V c1 and the measurement of Vc2 and the math equation group of known electric parameter formation: Vx=Vc1 * (Zx+Z _Δ)/Z _ΔVx=Vc2 * (Zx+Z ₁+ Z ₂+ Z _Δ)/(Z ₂+ Z _Δ) calculating can measure the actual value of Vx and Zx; Also can be through the said ratio criteria K of adjustment ₁₊₂The low-voltage arm circuit in Z _ΔThe reactance value of parameter equates its low-voltage arm output voltage values before and after the ratio criteria stack, at this moment K ₁=K ₂=K _1-2By following mathematical formulae: Vx=Vc * (Z ₁+ Z ₂)/Z ₂Zx=Z _Δ* Z ₁/ Z ₂, also can measure the actual value of Vx and Zx.

Like Fig. 1; Shown in Figure 2; The casing 1 of high direct voltage high resistance measurement device; Processed by iron sheet metal, the bottom of said casing is equipped with the low-voltage arm 2 that constitutes low accuracy voltage ratio standard, and it processes setting range by six groups of rotation waveres is that the accurate adjustable resistance case of 0.01 Ω～10000M Ω constitutes; Top the first from left of said casing is equipped with and measures input terminal in last, the Rx/Vx measurement port 5 of instrument ground terminal below it; The second from left is the protective device 7 of protection instrument and operator safety when being used to protect the voltage of measurement port 5 to surpass setting; A left side three is pin-point accuracy low pressure ratio criteria 8; It is processed by bilayer rotation waver; Its every layer is made up of 10 precision resistances parallel with one another, and their ends are connected on the different fixing position of rotation waver, the other end the interconnect high-pressure side and the common port of component ratio standard; The resistance of two-layer identical bits is formed totally ten different rate values up and down; Concrete voltage measurement is with four of ratios 10000: 1,5000: 1,2000: 1,1000: 1, and resistance measurement is with 10000/1,1000/1,100/1,10/1,1/1,1/10, six, and the slip position of switch links together as the dividing potential drop output terminal of ratio criteria; A left side four is ratio stack switches 9 of being processed by double-deck SS; It is when cutting out; Make the accurate low pressure ratio criteria 8 of pin-point accuracy high-pressure side, output terminal, with the mutual short circuit of common port; The pin-point accuracy low pressure ratio criteria 8 that be connected on the centre of high voltage withstanding low accuracy ratio criteria this moment cuts out, and promptly accomplishes ratio and cuts out; In when position stack, pin-point accuracy low pressure ratio criteria 8 high-pressure sides, output terminal and common port are opened a way each other, the centre that this moment, pin-point accuracy low pressure ratio criteria 8 was connected on high voltage withstanding low accuracy ratio criteria is promptly accomplished ratio and is superposeed; A left side five is used for selection ratio balance/resistance measurement position and voltage measurement position SS 10 by what two SSes of individual layer were processed; Ratio balance indicator 11 is installed in the right, on Vc voltage measurement port one 3 is installed in the right; Said measurement mechanism has two kinds of forms when measuring the voltage output actual value Vx in actual value Rx and unknown dc high voltage source 4 of unknown high resistance 6.

Form 1: ratio stack switch 9 is to cutting out the position; SS 10 is to the voltage measurement position; The displayed value that adjustment DC high-voltage power supply 4 output dc voltages need be measured or the withstand voltage of unknown high resistance Rx nominal; The nominal rate value that the resistance of adjustment low-voltage arm 2, the ratio that makes DC high-voltage power supply 4 output voltage values and dc digital voltmeter 12 displayed values are used near resistance measurement is adjusted the nominal rate value to 100/1 of accurate low pressure ratio criteria 8 as 100/1; Ratio stack switch 9 is to the stack position; SS 10 to ratio balance/resistance measurement position, the resistance of adjusting low-voltage arm 2 this moment and adjustment rate stack switch 9 make ratio balance indicator 11 identical at ratio stack indication point of front and back when cutting out; The rate value of the low accuracy voltage ratio standard that be made up of the actual value Rx of low-voltage arm 2 and unknown high resistance 6 this moment equals the indicated value of pin-point accuracy low pressure ratio criteria 8, has promptly accomplished the transmission of quantity value process of pin-point accuracy ratio criteria to the low accuracy ratio criteria; SS 10 writes down the indicated value of digital watch reading and low-voltage arm 2 to the voltage measurement position then; Promptly accomplish actual resistance Rx, the withstand voltage V of unknown high resistance 6 _RVoltage output actual value Vx surveying work with unknown dc high voltage source 4: Rx=rate value (the 100/1) * resistance of low-voltage arm 2, V _R=rate value (100/1) * digital voltmeter 12 displayed values, Vx=(rate value (100/1)+1) * digital voltmeter 12 displayed values.

Form 2: ratio stack switch 9 is Vc1 by the digital watch measured value of low-voltage arm output voltage when cutting out; Digital watch measured value by the low-voltage arm output voltage during ratio stack switch 9 to stack position is Vc2; Promptly accomplish the measuring process of high direct voltage; This moment, actual value and the parameter of said high-voltage high resistance measurement mechanism based on the ratio method of superposition of dc high voltage Vx had following relation: " Vx=Vc1 * (Zx+Z _Δ)/Z _ΔVx=Vc2 * (Zx+Z ₁+ Z ₂+ Z _Δ)/(Z ₂+ Z _Δ) ", separate above-mentioned linear equation in two unknowns group and can calculate V _RActual value with Vx and Rx.

Form 1 is fit to the high pressure ratio criteria that exploitation is used, accurate high resistance measuring instrument etc. in the laboratory; Form 2 is fit to be used with digital watch and computer data acquiring process software, is applicable to the online self-alignment high-voltage bleeder of exploitation, insulating monitoring instrument etc.

Claims

1. the ratio stacked system is measured high voltage, high-resistance method, it is characterized in that: refer to the pin-point accuracy ratio criteria K1 of known whole electric parameters in the electricity metering, be superimposed upon and only know low-voltage arm reactance value Z _ΔRatio criteria K2 in, i.e. the high-voltage arm impedance of two ratio criteria is connected into Zx+Z ₁, two low-voltage arm impedances also are connected into Z ₂+ Z _Δ, form a new ratio criteria K ₁₊₂, as said ratio criteria K ₁₊₂When the unknown reactance value Zx of the voltage Vx that the high-voltage arm input end applies or high-voltage arm need measure, through to said ratio criteria K ₁₊₂Ratio stack before and after low-voltage arm output voltage V c1 and the measurement of Vc2 and the math equation group of known electric parameter formation: Vx=Vc1 * (Zx+Z _Δ)/Z _ΔVx=Vc2 * (Zx+Z ₁+ Z ₂+ Z _Δ)/(Z ₂+ Z _Δ) calculating can measure the actual value of Vx and Zx; Also can be through the said ratio criteria K of adjustment ₁₊₂The low-voltage arm circuit in Z _ΔThe reactance value of parameter equates its low-voltage arm output voltage values before and after the ratio criteria stack, at this moment K ₁=K ₂=K ₁₊₂By following mathematical formulae: Vx=Vc * (Z ₁+ Z ₂)/Z ₂Zx=Z _Δ* Z ₁/ Z ₂, also can measure the actual value of Vx and Zx.