CN102654386A - High precision horizontal vernier device used for measuring - Google Patents

High precision horizontal vernier device used for measuring Download PDF

Info

Publication number
CN102654386A
CN102654386A CN2011104256422A CN201110425642A CN102654386A CN 102654386 A CN102654386 A CN 102654386A CN 2011104256422 A CN2011104256422 A CN 2011104256422A CN 201110425642 A CN201110425642 A CN 201110425642A CN 102654386 A CN102654386 A CN 102654386A
Authority
CN
China
Prior art keywords
prism
adjustable plate
screw
adapting rod
set screw
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN2011104256422A
Other languages
Chinese (zh)
Other versions
CN102654386B (en
Inventor
张弛
邵梁强
汤红涛
李志慧
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Institute of Satellite Equipment
Original Assignee
Shanghai Institute of Satellite Engineering
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Institute of Satellite Engineering filed Critical Shanghai Institute of Satellite Engineering
Priority to CN201110425642.2A priority Critical patent/CN102654386B/en
Publication of CN102654386A publication Critical patent/CN102654386A/en
Application granted granted Critical
Publication of CN102654386B publication Critical patent/CN102654386B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention relates to a high precision horizontal vernier device used for measuring. The high precision horizontal vernier device comprises a prism adjusting plate (1), adjusting screws (2), springs (3), a prism switching rod (4), a screw (5), a steel ball (6), a spherical washer (7), an outside micrometer (8), a gasket (9) and a micrometer mounting plate (10); and the device can adjust a reflecting surface of a reflector to be vertical to a horizontal plane, thereby realizing the advantages of small volume, high precision and simplicity in adjustment.

Description

The high level of accuracy micromatic setting is used in a kind of measurement
Technical field
The present invention relates to measure and use level(l)ing device, more particularly, relate to a kind of product measurement and use the high level of accuracy micromatic setting.
Background technology
In the product development process, often use the benchmark prism to carry out product structure and measurement of unit assembly precision and precision repetition measurement, thereby guarantee product structure precision and the installation accuracy that the unit of accuracy requirement is arranged.
In the other appropriate location of unit A benchmark prism 45 ° of catoptrons are installed, the cross line of unit A benchmark prism is reflected out, use theodolite reading again, calculate the scheme of unit A at this direction angle of pitch according to the relation that reflects.
The reflecting surface of this scheme requirement catoptron must be vertical with surface level, otherwise will introduce big measuring error, and can't be through calculating error concealment.
So need a kind of high level of accuracy micromatic setting of design, the reflecting surface with catoptron is adjusted to vertical with surface level as far as possible.Because of product interior layout space nervous, this micromatic setting free space 100mm * 80mm size of only having an appointment.
Do not have at present to find explanation or report, do not collect both at home and abroad similarly data as yet yet with similar techniques of the present invention.
Summary of the invention
The technical matters that the present invention will solve provides that a kind of volume is little, precision is high, regulate easy measurement use the high level of accuracy micromatic setting, avoids introducing measuring error greatly because of the mirror reflection surface out of plumb.
Technical scheme of the present invention provides a kind of measurement and uses the high level of accuracy micromatic setting; It comprises prism adjustable plate, set screw, spring, prism adapting rod, screw, steel ball, spheric washer, outside micrometer, packing ring, milscale mount pad, it is characterized in that:
Said prism adjustable plate is used to install catoptron, and counterbore on the prism adjustable plate and screw fit are fixed in catoptron on the prism adjustable plate, and 120 ° of taper holes of its center cooperate with the taper hole on the prism adapting rod, are used for steel ball is located;
Said set screw is used for the levelness coarse adjustment;
Said spring and steel ball are played a supporting role to the prism adjustable plate, and after the levelness adjusting finishes, keep the state of prism adjustable plate;
Said prism adapting rod is consistent the benchmark prism on catoptron height and the unit, and its threaded hole and set screw adopt fine thread, and 120 ° of taper holes of said prism adapting rod center cooperate with 120 ° of taper holes on the prism adjustable plate 1;
Said screw and packing ring are used to install catoptron and milscale mount pad, and screw is fastened on outside micrometer on the milscale mount pad;
The scale division value of said outside micrometer (8) is 0.001mm, and in trim process, every adjusting one lattice are 0.001mm, realizes accurately control adjustment amount.
The invention has the beneficial effects as follows: it is the micromatic setting that a kind of precision can reach 1 μ that said product is measured with the high level of accuracy micromatic setting.This device can be adjusted to the reflecting surface of catoptron vertical with surface level, thereby realizes the advantage that volume is little, precision is high, adjusting is easy.
Description of drawings
Fig. 1 measurement of the present invention is with the structural drawing of high level of accuracy micromatic setting;
Fig. 2 set screw structural drawing of the present invention;
Fig. 3 prism adjustable plate of the present invention structural drawing.
Wherein: 1, prism adjustable plate, 2, set screw, 3, spring, 4, the prism adapting rod, 5, screw, 6, steel ball, 7, spheric washer, 8, outside micrometer, 9, packing ring, 10, the milscale mount pad;
Embodiment
Below will combine accompanying drawing 1-3 that technical scheme of the present invention is described in detail, wherein:
As shown in Figure 1; A kind of product is measured with high level of accuracy micromatic setting wiring layout, is made up of prism adjustable plate 1, set screw 2, spring 3, prism adapting rod 4, screw 5, steel ball 6, spheric washer 7, outside micrometer 8, packing ring 9, milscale mount pad 10.
Said prism adjustable plate 1 is mainly used in the installation catoptron, and for antirust and take into account the nonmagnetic requirement of product, prism adjustable plate 1 selects for use the 1Cr18Ni9Ti corrosion resistant plate to process.φ 3.5/ φ 7.5 counterbores on the prism adjustable plate 1 cooperate with screw 5, and catoptron is fixed on the prism adjustable plate 1, and 120 ° of taper holes of its center cooperate with the taper hole on the prism adapting rod 4, are used for steel ball 6 location.
Said set screw 2 is used for the levelness coarse adjustment, for prevent with prism adapting rod 4 on the M3 threaded hole kill, material selection H62M brass bar processing, screw adopts fine thread, can this this device adjusting level as far as possible be alleviated the workload of finely tuning link.
6 pairs of prism adjustable plates 1 of said spring 3 and steel ball are played a supporting role, and after the levelness adjusting finishes, keep the state of prism adjustable plate 1.
Said prism adapting rod 4 is used to make the benchmark prism basically identical on catoptron height and the unit, and for antirust and take into account the nonmagnetic requirement of product, prism adapting rod 4 selects for use the 1Cr18Ni9Ti stainless steel bar to process.Its M3 threaded hole is consistent with set screw 2, adopts fine thread.120 ° of taper holes of its center cooperate with 120 ° of taper holes on the prism adjustable plate 1.For preventing that outside micrometer 8 biasings from causing rollover, the base thickness of prism adapting rod 4 suitably increases.
Said screw 5 and packing ring 9 are used to install catoptron and milscale mount pad 10, and screw 5 also is used for outside micrometer 8 is fastened on milscale mount pad 10.
Said spheric washer 7 is used for guaranteeing that in adjustment process 1 of set screw 2 and prism adjustable plate do not take place stuck, and it is uniform and stable that set screw 2 and spring 3 act on the power of prism adjustable plate 1.
It is the product of 0.001mm that said outside micrometer 8 is selected scale division value for use, and in trim process, every adjusting one lattice are 0.001mm; Can accurately control adjustment amount; And can pre-estimate adjustment amount according to the levelness measured value, in conjunction with spring 3 and steel ball 6, but the levelness of stabilization control device.
Said milscale mount pad 10 is used for outside micrometer 8 is installed in prism adapting rod 4, prevents that outside micrometer 8 from rocking or making prism adjustable plate 1 pressurized, the accuracy of influence fine setting.
Product is measured with the high level of accuracy micromatic setting and is used when the product accurate measurement, has solved the problem that the benchmark prism on this unit A is blocked and can't measures.In actual use, the skill operation personnel that are responsible for accurate measurement are through operation meticulously, and actual trimming precision has reached and has been superior to 0.5 μ, has guaranteed the completion of this model accurate measurement task preferably.

Claims (3)

1. the high level of accuracy micromatic setting is used in a measurement; It comprises prism adjustable plate (1), set screw (2), spring (3), prism adapting rod (4), screw (5), steel ball (6), spheric washer (7), outside micrometer (8), packing ring (9), milscale mount pad (10), it is characterized in that:
Said prism adjustable plate (1) is used to install catoptron; Counterbore on the prism adjustable plate (1) cooperates with screw (5); Catoptron is fixed on the prism adjustable plate (1), and 120 ° of taper holes of its center cooperate with the taper hole on the prism adapting rod (4), are used for steel ball (6) is located;
Said set screw is used for the levelness coarse adjustment;
Said spring (3) and steel ball (6) are played a supporting role to prism adjustable plate (1), and after the levelness adjusting finishes, keep the state of prism adjustable plate (1);
Said prism adapting rod (4) is consistent the benchmark prism on catoptron height and the unit, and its threaded hole and set screw adopt fine thread, and 120 ° of taper holes of said prism adapting rod (4) center cooperate with 120 ° of taper holes on the prism adjustable plate (1);
Said screw (5) and packing ring (9) are used to install catoptron and milscale mount pad (10), and screw (5) is fastened on outside micrometer (8) on the milscale mount pad (10);
The scale division value of said outside micrometer (8) is 0.001mm, and in trim process, every adjusting one lattice are 0.001mm, realizes accurately control adjustment amount.
2. the high level of accuracy micromatic setting is used in measurement according to claim 1; It is characterized in that: in adjustment process; Said spheric washer (7) guarantees not take place between set screw and prism adjustable plate (1) stuck, and it is uniform and stable that set screw and spring (3) act on the power of prism adjustable plate (1).
3. the high level of accuracy micromatic setting is used in measurement according to claim 1, it is characterized in that: said milscale mount pad (10) is installed in outside micrometer (8) on the prism adapting rod (4).
CN201110425642.2A 2011-12-15 2011-12-15 High precision horizontal vernier device used for measuring Active CN102654386B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201110425642.2A CN102654386B (en) 2011-12-15 2011-12-15 High precision horizontal vernier device used for measuring

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201110425642.2A CN102654386B (en) 2011-12-15 2011-12-15 High precision horizontal vernier device used for measuring

Publications (2)

Publication Number Publication Date
CN102654386A true CN102654386A (en) 2012-09-05
CN102654386B CN102654386B (en) 2014-12-10

Family

ID=46730050

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201110425642.2A Active CN102654386B (en) 2011-12-15 2011-12-15 High precision horizontal vernier device used for measuring

Country Status (1)

Country Link
CN (1) CN102654386B (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108519653A (en) * 2018-04-03 2018-09-11 中国工程物理研究院激光聚变研究中心 A kind of infrared light focusing device based on annular mirror
CN109163661A (en) * 2018-08-30 2019-01-08 桂林理工大学 A kind of optical lever
CN109238159A (en) * 2018-08-30 2019-01-18 桂林理工大学 A kind of production method of optical lever
CN115026530A (en) * 2022-06-17 2022-09-09 博众精工科技股份有限公司 Horizontal adjusting mechanism, mounting device and adjusting method of mounting device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1041035A (en) * 1988-09-05 1990-04-04 太原工业大学 Laser precision measured object linearity device and measuring method thereof
US6359741B1 (en) * 1999-07-15 2002-03-19 Agency Of Industrial Science And Technology Adjusting device for attitude and position of optical elements
CN1940476A (en) * 2005-09-30 2007-04-04 亚洲光学股份有限公司 Laser level meter
CN201752853U (en) * 2010-07-30 2011-03-02 安徽晶菱机床制造有限公司 Vertical light path adjusting device for laser interferometer of NC (numerical control) machine tool

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1041035A (en) * 1988-09-05 1990-04-04 太原工业大学 Laser precision measured object linearity device and measuring method thereof
US6359741B1 (en) * 1999-07-15 2002-03-19 Agency Of Industrial Science And Technology Adjusting device for attitude and position of optical elements
CN1940476A (en) * 2005-09-30 2007-04-04 亚洲光学股份有限公司 Laser level meter
CN201752853U (en) * 2010-07-30 2011-03-02 安徽晶菱机床制造有限公司 Vertical light path adjusting device for laser interferometer of NC (numerical control) machine tool

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108519653A (en) * 2018-04-03 2018-09-11 中国工程物理研究院激光聚变研究中心 A kind of infrared light focusing device based on annular mirror
CN109163661A (en) * 2018-08-30 2019-01-08 桂林理工大学 A kind of optical lever
CN109238159A (en) * 2018-08-30 2019-01-18 桂林理工大学 A kind of production method of optical lever
CN115026530A (en) * 2022-06-17 2022-09-09 博众精工科技股份有限公司 Horizontal adjusting mechanism, mounting device and adjusting method of mounting device
CN115026530B (en) * 2022-06-17 2023-11-21 博众精工科技股份有限公司 Horizontal adjusting mechanism, mounting device and adjusting method of mounting device

Also Published As

Publication number Publication date
CN102654386B (en) 2014-12-10

Similar Documents

Publication Publication Date Title
CN102654386B (en) High precision horizontal vernier device used for measuring
CN207095594U (en) A kind of multi-faceted adjustable sensor support frame
CN203011294U (en) Device for accurate dimension measurement
CN104483110B (en) High precision fine tuning positioner
CN201163188Y (en) Vertical measuring point marking frame
CN204115694U (en) Bearing ring grooved position measuring instrument
CN104990541A (en) Building engineering measurement system
CN201535963U (en) Simple pendulum experimental apparatus with advantages of convenient operation and high precision
CN103206603A (en) Leveling method of supporting platform
CN103837131B (en) A kind of high precision towing basin track level measurement device
CN209295860U (en) Calipers inside and outside a kind of bearing thin-walled bakelite retainer
CN102278929B (en) Watch earhole measuring instrument
CN210036696U (en) Levelness tester for straight-line open groove track
CN102062597A (en) Porro prism azimuth reference measuring instrument
CN208476131U (en) Fuel injector protrusion height measuring device
CN205644288U (en) Horizontal error of tilt of railway survey gaging rule can adjusting device
CN202532120U (en) Support
CN201909629U (en) Compensator of automatic level with function of temperature compensation
CN102645142A (en) Dial indicator bracket
CN103852024A (en) Visual inspection training platform of gap and jump between machine cover and fender
CN201188022Y (en) Test equipment for accurate floating ball type liquid-level meter
CN111750244A (en) Contact type leveling fixing device and GNSS equipment composed of same
CN208805185U (en) A kind of different-diameter measurement guide sleeve transformation mechanism
CN201133814Y (en) Horizontal display apparatus
CN202532119U (en) Three-point support frame and adjusting tool for adjusting support frame

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
ASS Succession or assignment of patent right

Owner name: SHANGHAI SATELLITE EQUIPMENT INSTITUTE

Free format text: FORMER OWNER: SHANGHAI SATELLITE ENGINEERING RESEARCH INSTITUTE

Effective date: 20130909

C41 Transfer of patent application or patent right or utility model
TA01 Transfer of patent application right

Effective date of registration: 20130909

Address after: 200240 Shanghai city Minhang District Huaning Road No. 251

Applicant after: Shanghai Institute of Satellite Equipment

Address before: 200240 Shanghai city Minhang District Huaning Road No. 251

Applicant before: Shanghai Satellite Engineering Research Institute

C14 Grant of patent or utility model
GR01 Patent grant