CN102590051A - Oblique incident laser particle analyzer - Google Patents
Oblique incident laser particle analyzer Download PDFInfo
- Publication number
- CN102590051A CN102590051A CN2012100358883A CN201210035888A CN102590051A CN 102590051 A CN102590051 A CN 102590051A CN 2012100358883 A CN2012100358883 A CN 2012100358883A CN 201210035888 A CN201210035888 A CN 201210035888A CN 102590051 A CN102590051 A CN 102590051A
- Authority
- CN
- China
- Prior art keywords
- lens
- sample cell
- particle analyzer
- laser particle
- oblique incidence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optical Measuring Cells (AREA)
Abstract
The invention discloses an oblique incident laser particle analyzer for realizing the measurement of a full-range (0-180 degrees) scattering angle. The oblique incident laser particle analyzer comprises a laser, a lens group, a sample cell and viewfinders. The oblique incident laser particle analyzer is characterized in that the lens group consists of a front lens and a rear lens which share the same optical axis; the front lens and the rear lens are respectively arranged at the front side and the rear side of the sample cell, so that the center of the sample cell is positioned on the optical axis; the laser is obliquely arranged at the rear side of the rear lens; emitted laser beams pass through the edge part of the rear lens to form parallel light which obliquely enters the center of the sample cell; and the viewfinders comprise a front viewfinder positioned at the front part of the front lens and a rear viewfinder positioned at the rear lens and can be used for receiving a scattering light signal from particles in the sample cell. According to the oblique incident laser particle analyzer, the problems of low sensitivity and resolution caused by narrow range of the scattering angle received by the lenses are solved; and the oblique incident laser particle analyzer has the characteristics of high sensitivity and resolution, high test accuracy, wide range of measuring the particle size distribution, and the like.
Description
Technical field
The present invention relates to a kind of particle size analyzer, is a kind of oblique incidence laser particle analyzer of realizing that gamut (0-180 degree) scattering angle is measured specifically.
Background technology
In the prior art; Laser particle analyzer generally adopts the vertical incidence laser instrument; Utilize the radius of lens to converge scattered light, the scattered light angular range that it can receive is less, and sample cell rectangular window normally; Receive parallel glass face sound to have the restriction of the angle of total reflection, the scattered light greater than 48 degree can not penetrate from sample cell in the sample cell usually.The angle of the receiving scattered light of traditional like this laser particle analyzer light path is to be very limited.On the theory, bigger its sensitivity of angle of laser particle analyzer ability receiving scattered light is high more, and resolution is good more, and test accuracy is accurate more.Therefore; Scattered light receiving angle for the expansion of laser light particle size analyzer adopts methods such as multiple beam, poly-lens, non-rectangle sample pool structure usually at present, yet, when improving the scattered light receiving angle; Adopt improved structure or technology to introduce new defective again; Like the multiple beam structure, adopt plural laser instrument, original light intensity I0 can not obtain complete unity when test like this; And the scattered signal connectivity problem that each light beam obtains also becomes a screen neck that is difficult to go beyond, and very mistake is all arranged when causing acquired signal and computational data.The defective of many lens constructions is that the camera lens arrangement is angled, when the design detector, has increased the complexity of structure like this, and still can not solve angle of total reflection problem, and practicality is little.The non-rectangle sample pool structure can solve total reflection angle problem theoretically; But the sample cell exiting surface is non-parallel; Its different angles scattered light is inconsistent at the law of refraction of exiting surface like this; Cause the light transmission rate rule also inconsistent, also have the connectivity problem of sample cell parallel surface and non-parallel face scattered light angle all can cause a lot of measuring error, reduced the accuracy of measuring.
Summary of the invention
To the above-mentioned weak point that exists in the prior art; The technical matters that the present invention will solve is to provide a kind of oblique incidence laser particle analyzer, solves little sensitivity that exists of scattered light angular range and the low problem of resolution that laser particle analyzer is accepted owing to lens.
The present invention adopts following technical scheme:
A kind of oblique incidence laser particle analyzer comprises laser instrument, lens combination, sample cell and view-finder, and lens combination is to form with the front lens of optical axis and rear lens, places both sides, sample cell front and back respectively, and the sample cell center is on the optical axis; Laser instrument tilts to place the rear side of rear lens, and the laser beam of sending becomes the center that the directional light rear-inclined is incident to sample cell through the marginal portion of rear lens; View-finder comprises that the back view-finder at the preceding view-finder that is positioned at front lens the place ahead and rear lens rear accepts the scattered light signal from sample cell endoparticle thing.
Laser instrument is between 40 ~ 47 ° along angle between the optical axis of optical path direction and lens combination.
Front lens or rear lens are made up of the same optical axis lens I, lens II, lens III and the lens IV that are arranged in order further, and wherein to be front surface be convex surface for lens I, lens II, lens III and lens IV, and the surface, back is the lens of concave surface.
The front surface radius-of-curvature of lens I is 1.6 ~ 2 with back surface curvature radius ratio; The front surface radius-of-curvature of lens II is 2.5 ~ 4.5 with back surface curvature radius ratio; The front surface radius-of-curvature of lens III is 0.2 ~ 0.4 with back surface curvature radius ratio; The front surface radius-of-curvature of lens IV is 0.4 ~ 0.6 with back surface curvature radius ratio.
Lens II, lens III and lens IV are respectively with the diameter ratio of lens I: 1:1,1.3 ~ 1.6:1 and 2 ~ 4:1.
The concave surface subtend sample cell of front lens or rear lens.
Sample cell adopts the rectangle sample pond.
The present invention has following advantage and technique effect:
1. adopt laser instrument that oblique incidence advances sample cell as light source, this diagonal beam irradiation forward scattering light 0-90 degree of particle down can be penetrated from parallel surface before the sample cell, and rear orientation light 90-180 degree can penetrate from parallel surface behind the sample cell.Lens before and after the sample cell can utilize the zone of its diameter range that the scattered light of 0-180 degree is received to converge then; The scattered light receiving angle of expansion of laser light particle size analyzer; Thereby increased sensitivity and resolution, test accuracy and particle size distribution are improved.
2. further, the present invention becomes big problem, the structure of the front and back lens combination of employing in order to overcome the hot spot that converges that oblique incidence brings; It is basic identical that this lens combination cooperates oblique incidence to make that the directional light of different angles incident converges precision; Convergent point is very little, has improved the accuracy of test, has made things convenient for panel detector structure design of the present invention and need not change the structure of detector; Practice thrift expense, simplified the size of particle size analyzer.
3. design of the present invention makes the reception of scattering angle reach maximum; Can realize the measurement (0-180 degree) of gamut angle; Owing to adopt single beam, therefore the rectangle sample pond does not have the influence of some uncertain factors; Drop to measuring error minimum, met the basic theories of laser particle analyzer fully.
4. adopt granularity that equipment of the present invention detects to reach the 0.01-2000 micron.
Description of drawings
Fig. 1 is the structural representation of the embodiment of the invention;
Fig. 2 is the structural representation of front lens of the present invention or rear lens;
Wherein 1 is laser instrument, and 2 is rear lens, and 3 is front lens, and 4 is sample cell, and 5 is the back detector, and 6 is preceding detector, and 21 is lens I, and 22 is lens II, and 23 is lens III, and 24 is the lens IV.
Embodiment
Below in conjunction with accompanying drawing and embodiment the present invention is at length explained.
As shown in Figure 1; The structural representation of oblique incidence laser particle analyzer of the present invention; This particle size analyzer comprises laser instrument 1, lens combination, sample cell 4 and view-finder, and lens combination is to form with rear lens 2 with the front lens 3 of optical axis, and front lens 3 places both sides, sample cell 4 front and back respectively with rear lens 2; Sample cell 4 is the rectangle sample pond, makes the centre of sample cell 4 be on the optical axis of lens combination during arrangement.Laser instrument 1 places optical axis top to tilt to place the rear side of rear lens 2, and laser instrument 1 guarantees that apart from the angle of the height of optical axis and inclination laser that laser instrument 1 is sent passes through the center of marginal portion oblique incidence to the sample cell of rear lens 2; " marginal portion " described here refers to; Laser beam is not a vertical incidence, and the position of laser beam irradiation on lens is not in the center, in order to utilize whole diameter areas of lens; The position of adjustment rear lens, the position that guarantees laser beam irradiation is less than 1/4 of diameter.Laser instrument 1 is between 40 ~ 47 ° along angle between the optical axis of optical path direction and lens combination; Select 45 ° in the present embodiment; At this moment, laser beam irradiation near the edge, makes the angle of incident angle near total reflection in the position of rear lens; Guarantee that the forward scattering light of particle 0-90 ° can be from parallel surface ejaculation before the sample cell in the sample cell under this light beam irradiates, rear orientation light 90-180 ° can be penetrated from parallel surface behind the sample cell; Therefore for signal view-finder before and after accepting is set to the scattered light signal that two back view-finders 5 that comprise the preceding view-finder 6 that is positioned at front lens the place ahead and rear lens rear are accepted from sample cell, on the focal plane before and after preceding view-finder 6 is positioned at back view-finder 5.Preceding view-finder 6 guarantees to accept 0 ~ 180 ° scattered light signal with back view-finder 5 caliber size.
The structure of front lens 3 of the present invention or rear lens 2 is identical; With wherein any one be example; As shown in Figure 2; Front lens is made up of the same optical axis lens I21, lens II22, lens III23 and the lens IV 24 that are arranged in order, and wherein to be front surface be convex surface for lens I21, lens II22, lens III23 and lens IV 24, and the surface, back is the lens of concave surface.
The front surface radius-of-curvature of lens I21 is 1.9 with back surface curvature radius ratio; The front surface radius-of-curvature of lens II is 3.5 with back surface curvature radius ratio; The front surface radius-of-curvature of lens III is 0.35 with back surface curvature radius ratio; The front surface radius-of-curvature of lens IV is 0.55 with back surface curvature radius ratio.
The diameter of lens II and lens I is identical, the diameter of lens III and lens I than be set to 1.4 and the diameter ratio of lens IV and lens I be set to 2.
Front lens and rear lens guarantee that the osculum diametric plane is adjacent with sample cell when placing.
Lens combination cooperates oblique incidence, obtains the convergent point identical with vertical incidence.
Be that with the difference of embodiment 1 laser instrument is 47 ° along angle between the optical axis of optical path direction and lens combination, the front surface radius-of-curvature of lens I is 2 with back surface curvature radius ratio; The front surface radius-of-curvature of lens II is 4.5 with back surface curvature radius ratio; The front surface radius-of-curvature of lens III is 0.4 with back surface curvature radius ratio; The front surface radius-of-curvature of lens IV is 0.6 with back surface curvature radius ratio.
Lens II, lens III and lens IV are respectively with the diameter ratio of lens I: 1:1,1.6:1 and 4:1.
The present invention in use; Laser beam is through rear lens, and rear lens is incident in the sample cell sample generation scattering after changing divergent beams into parallel beam as collimation lens; Forward scattering light can penetrate from parallel surface before the sample cell for 0-90 °, detects through converging by preceding detector of front lens; Rear orientation light 90-180 ° behind the sample cell parallel surface penetrate, detect through converging of rear lens by the back detector.Before and after the sample cell lens utilized is that the zone of diameter range receives 0-180 ° scattered light and converges.
Claims (7)
1. an oblique incidence laser particle analyzer comprises laser instrument, lens combination, sample cell and view-finder, it is characterized in that, lens combination is to form with the front lens of optical axis and rear lens, places both sides, sample cell front and back respectively, and the sample cell center is on the optical axis; Laser instrument tilts to place the rear side of rear lens, and the laser beam of sending becomes the center that the directional light rear-inclined is incident to sample cell through the marginal portion of rear lens; View-finder comprises that the back view-finder at the preceding view-finder that is positioned at front lens the place ahead and rear lens rear accepts the scattered light signal from sample cell endoparticle thing.
2. according to the described oblique incidence laser particle analyzer of claim 1, it is characterized in that laser instrument is between 40 ~ 47 ° along angle between the optical axis of optical path direction and lens combination.
3. according to the described oblique incidence laser particle analyzer of claim 1; It is characterized in that; Front lens or rear lens are made up of the same optical axis lens I, lens II, lens III and the lens IV that are arranged in order; Wherein to be front surface be convex surface for lens I, lens II, lens III and lens IV, and the surface, back is the lens of concave surface.
4. according to the described oblique incidence laser particle analyzer of claim 3, it is characterized in that the front surface radius-of-curvature of lens I is 1.6 ~ 2 with back surface curvature radius ratio; The front surface radius-of-curvature of lens II is 2.5 ~ 4.5 with back surface curvature radius ratio; The front surface radius-of-curvature of lens III is 0.2 ~ 0.4 with back surface curvature radius ratio; The front surface radius-of-curvature of lens IV is 0.4 ~ 0.6 with back surface curvature radius ratio.
5. according to claim 3 or 4 described oblique incidence laser particle analyzers, it is characterized in that lens II, lens III and lens IV are respectively with the diameter ratio of lens I: 1:1,1.3 ~ 1.6:1 and 2 ~ 4:1.
6. according to the described oblique incidence laser particle analyzer of claim 3, it is characterized in that the concave surface subtend sample cell of front lens or rear lens.
7. according to the described oblique incidence laser particle analyzer of claim 1, it is characterized in that said sample cell is the rectangle sample pond.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210035888.3A CN102590051B (en) | 2012-02-17 | 2012-02-17 | Oblique incident laser particle analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210035888.3A CN102590051B (en) | 2012-02-17 | 2012-02-17 | Oblique incident laser particle analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102590051A true CN102590051A (en) | 2012-07-18 |
| CN102590051B CN102590051B (en) | 2014-05-14 |
Family
ID=46478994
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210035888.3A Active CN102590051B (en) | 2012-02-17 | 2012-02-17 | Oblique incident laser particle analyzer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102590051B (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105510190A (en) * | 2014-10-17 | 2016-04-20 | 中国石油化工股份有限公司 | Method for measuring particle size of particles in suspension |
| CN105954154A (en) * | 2016-04-28 | 2016-09-21 | 清华大学深圳研究生院 | Method and device for measuring two-dimensional light scattering angular distribution of suspended particles |
| CN108169083A (en) * | 2016-12-07 | 2018-06-15 | 董青云 | A kind of highly sensitive Particle size analysis methods in light blockage method particle collector |
| CN110426327A (en) * | 2019-07-29 | 2019-11-08 | 吉林大学 | A kind of test sampling system of laser particle analyzer |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02193041A (en) * | 1989-01-21 | 1990-07-30 | Shimadzu Corp | Particle size distribution apparatus |
| EP0559529A1 (en) * | 1992-03-04 | 1993-09-08 | Compagnie Industrielle Des Lasers Cilas | Laser granulometer |
| JP2004117096A (en) * | 2002-09-25 | 2004-04-15 | Horiba Ltd | Method and apparatus for measuring particle size distribution |
| CN101290281A (en) * | 2008-06-12 | 2008-10-22 | 丹东百特科技有限公司 | Three-light beam single lens laser particle sizer |
| CN101368899A (en) * | 2008-10-16 | 2009-02-18 | 丹东百特科技有限公司 | Single-beam double-lens laser particle analyzer |
| CN102221518A (en) * | 2010-04-13 | 2011-10-19 | 张福根 | Laser particle size analyzer |
| CN202522502U (en) * | 2012-02-17 | 2012-11-07 | 丹东市百特仪器有限公司 | Oblique incidence laser particle analyzer |
-
2012
- 2012-02-17 CN CN201210035888.3A patent/CN102590051B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02193041A (en) * | 1989-01-21 | 1990-07-30 | Shimadzu Corp | Particle size distribution apparatus |
| EP0559529A1 (en) * | 1992-03-04 | 1993-09-08 | Compagnie Industrielle Des Lasers Cilas | Laser granulometer |
| JP2004117096A (en) * | 2002-09-25 | 2004-04-15 | Horiba Ltd | Method and apparatus for measuring particle size distribution |
| CN101290281A (en) * | 2008-06-12 | 2008-10-22 | 丹东百特科技有限公司 | Three-light beam single lens laser particle sizer |
| CN101368899A (en) * | 2008-10-16 | 2009-02-18 | 丹东百特科技有限公司 | Single-beam double-lens laser particle analyzer |
| CN102221518A (en) * | 2010-04-13 | 2011-10-19 | 张福根 | Laser particle size analyzer |
| CN202522502U (en) * | 2012-02-17 | 2012-11-07 | 丹东市百特仪器有限公司 | Oblique incidence laser particle analyzer |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105510190A (en) * | 2014-10-17 | 2016-04-20 | 中国石油化工股份有限公司 | Method for measuring particle size of particles in suspension |
| CN105510190B (en) * | 2014-10-17 | 2019-06-14 | 中国石油化工股份有限公司 | The test method of grain diameter in a kind of suspension |
| CN105954154A (en) * | 2016-04-28 | 2016-09-21 | 清华大学深圳研究生院 | Method and device for measuring two-dimensional light scattering angular distribution of suspended particles |
| CN108169083A (en) * | 2016-12-07 | 2018-06-15 | 董青云 | A kind of highly sensitive Particle size analysis methods in light blockage method particle collector |
| CN110426327A (en) * | 2019-07-29 | 2019-11-08 | 吉林大学 | A kind of test sampling system of laser particle analyzer |
| CN110426327B (en) * | 2019-07-29 | 2021-07-23 | 吉林大学 | Test sampling system of laser particle analyzer |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102590051B (en) | 2014-05-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102721826B (en) | Speed testing device and method of non-spliced large-target surface laser light screen | |
| CN108080798B (en) | A kind of laser synchronization is double to be degraded system and its degrades method | |
| CN201622345U (en) | Laser distance measurement device | |
| CN101477044B (en) | Surface plasma resonance sensor | |
| CN103335819A (en) | Method and device for optical detection of high-precision cube-corner prism | |
| CN105066910B (en) | Electro-optic crystal Z axis deviate angle measuring device and measuring method | |
| CN102590051B (en) | Oblique incident laser particle analyzer | |
| CN105571834A (en) | Measuring device of quantum efficiency of CCD device | |
| CN101672642B (en) | Optical precision tracking detector based on double pyramidal rectangular pyramids | |
| CN108920869B (en) | MPO focusing imaging performance analysis method based on grazing incidence X-ray optical simulation | |
| CN109186548A (en) | A kind of device and method measuring lobster eye lens square hole channel inclination angle | |
| CN203299110U (en) | Device for measuring spectra with different angles, colors, brightness degrees and reflectance rates of glass | |
| CN202522502U (en) | Oblique incidence laser particle analyzer | |
| CN101672641B (en) | Optical precision tracking detector based on double four quadrant photoelectric detectors | |
| CN104931239A (en) | MTF test apparatus and method for small off-axis optical system | |
| CN101368899A (en) | Single-beam double-lens laser particle analyzer | |
| CN110208169A (en) | A kind of method of scatter light polarization state data in measurement polarizers of big angle scope | |
| CN109580182A (en) | Curved optical device refractive index measurement method and device based on Brewster's law | |
| CN209198785U (en) | A kind of adjustment device for lens group adjustment | |
| CN209373107U (en) | Laser radar Optical devices and laser radar system | |
| CN106646840A (en) | Equivalent optical system for omnidirectional point detector | |
| CN201903495U (en) | Multi-sample cell laser particle sizer | |
| CN101290281A (en) | Three-light beam single lens laser particle sizer | |
| CN105092608A (en) | Removing method for twin image in terminal optical element damage on-line detection | |
| CN102081032A (en) | Laser granulometer with multiple sample cells |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee |
Owner name: DANDONG BETTERSIZE INSTRUMENTS LTD. Free format text: FORMER NAME: BAITE INSTRUMENT CO., LTD., DANDONG |
|
| CP01 | Change in the name or title of a patent holder |
Address after: 118009 Liaoning province Dandong City Oasis Kimcheon Industrial Zone Border Cooperation Zone Road No. 9 Patentee after: Dandong Bettersize Instruments Ltd. Address before: 118009 Liaoning province Dandong City Oasis Kimcheon Industrial Zone Border Cooperation Zone Road No. 9 Patentee before: Bettersize Instruments Ltd. |