CN102081032A - Laser granulometer with multiple sample cells - Google Patents

Laser granulometer with multiple sample cells Download PDF

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Publication number
CN102081032A
CN102081032A CN 201010576029 CN201010576029A CN102081032A CN 102081032 A CN102081032 A CN 102081032A CN 201010576029 CN201010576029 CN 201010576029 CN 201010576029 A CN201010576029 A CN 201010576029A CN 102081032 A CN102081032 A CN 102081032A
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lens
sample
sample cell
detector
photo
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蔡小舒
苏明旭
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University of Shanghai for Science and Technology
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University of Shanghai for Science and Technology
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Abstract

The invention discloses a laser granulometer with multiple sample cells which sequentially comprises a laser, a beam expander, sample cells, a receiving lens and an optical detector from front to back. The multi-sample cell laser granulometer disclosed by the invention is characterized in that sample cells are arranged in front and back of the receiving lens, and the optical detector is arranged on the focal plane of the lens; when large-size particles are measured, sample particles are put on the sample cell in front of the receiving lens so as to obtain the size of the largest particle and then obtain the measurement upper limit of the laser granulometer; and when small-size particles are measured, sample particles are put on the sample cell at the back of the receiving lens so as to obtain the measurement lower limit of the laser granulometer. The multi-sample cell laser granulometer disclosed by the invention has the beneficial effects that through adopting a technical scheme of multi-sample cells, the measurement upper and lower limits of the laser granulometer are expanded by using a simple structure.

Description

A kind of many sample cells laser particle analyzer
Technical field
The present invention relates to a kind of laser particle analyzer grain graininess measurement mechanism, particularly a kind of many sample cells laser particle analyzer.
Background technology
Laser particle analyzer widespread use in a lot of fields, its ultimate principle is when beam of laser incides tested particulate samples because scattering process, incident light can depart from former incident direction, to all directions scattering.The space distribution of light scattering is relevant with the size of particle.Particle hour, forward scattering light relatively a little less than, forward scattering light is stronger relatively when particle is big.It is to distribute at the different directions angle that laser particle analyzer utilizes this principle to measure scattered light exactly, obtains the size-grade distribution of tested particle then according to light scattering theory and inversion algorithm.Fig. 1 is classical laser particle analyzer principle schematic.In this light channel structure, before sample cell places lens, be called as the Fourier transform light path, adopted by most laser particle analyzers.If after sample cell placed lens, then such light path is called as the inversefouriertransform light path or is inverted the Fourier transform light path.
For improving the granulometry scope of laser particle analyzer, multiple light path arrangement scheme has been proposed.For lowering the measurement lower limit of laser particle analyzer, patent 01249644.8 has proposed the multi-angle measurement, in side direction and back to having arranged a plurality of scattered light signals measurements, can measure simultaneously forward direction, side direction and back to scattered light signal, and can eliminate in the laser beam multi-mode competition to the influence of measurement result precision.Patent 200610013967.9 has proposed the light channel structure of coaxial pair of test surface, on the focal plane of the 1st lens, arrange and be used for the light-detecting device that short grained large angle scattering is measured, arrange the 2nd lens in this photoelectric detector back, be used to converge through oarse-grained small angle scattering light signal on the 1st lens focal plane, on the combination focal plane of 2 lens, arrange the 2nd photoelectric detector, be used to measure oarse-grained scattered light signal.Disclosed patented claim 200810011837.0 has proposed the single-lens light channel structure of a kind of three light beams, a kind of structure of twin-beam is proposed, only use 1 lens and 1 light-detecting device, but 3 laser beams incide sample cell with different angles, this light-detecting device can play and promptly measure the effect that forward-scattering signal is measured the lateral scattering light signal again like this, has enlarged measurement range.Patent 94225544.5 has proposed the light channel structure after a kind of sample cell according to the inversefouriertransform principle is arranged in lens, and sample cell is installed in behind the lens on the diverse location, is equivalent to the lens that adopt different focal, thereby reaches the purpose that changes measurement range.
The purpose of above-mentioned these light channel structures all is the granulometry scope for the expansion of laser light particle size analyzer, but the structure more complicated.
Summary of the invention
The objective of the invention is the granulometry scope of wanting the expansion of laser light particle size analyzer in the prior art in order to overcome, but the shortcoming of structure more complicated provides a kind of and can enlarge the granulometry scope and a kind of many sample cells laser particle analyzer simple in structure.
Ultimate principle of the present invention: the granulometry scope that the objective of the invention is to adopt better simply structure expansion of laser light particle size analyzer.According to light scattering theory, the granulometry scope of laser particle analyzer is relevant with the physical dimension of the focal length of lens and scattered light signal detector.When adopting scattering theory to calculate, can survey the size of granularity and can estimate by formula (1):
Figure 2010105760296100002DEST_PATH_IMAGE002
(1)
λ is an optical maser wavelength in the formula, fBe the focal length of lens, SIt is the size of photo-detector.Adopt the long focal length of lens fThe measurement upper limit of particle size analyzer can be improved, but measurement lower limit can be reduced simultaneously.If increase the size of light-detecting device S, can lower measurement lower limit.When only measuring forward-scattering signal, be subjected to the restriction of total reflection, maximum light scattering angle approximates 48 degree.If further increase the diameter of detector, can not be received by photo-detector greater than 48 scattered lights of spending angles, that is to say and only measuring the forward scattering light time that the diameter that further increases photo-detector is inoperative.Under the certain situation of the focal length of lens, the maximum gauge of photo-detector also just has been determined, and the smallest particles granularity that can survey has also just been determined.If the reduction measurement lower limit just needs to adopt than short focus lens, measure the upper limit but will reduce grain graininess like this.
Based on above-mentioned inventive principle, technical scheme of the present invention is: a kind of many sample cells laser particle analyzer, from
Be aligned in sequence with laser instrument, beam expander, sample cell, receiver lens and photo-detector behind the forward direction, be characterized in, according to Fourier transform light path and inversion Fourier transform light path principle, be furnished with many sample cells in the front and back of receiver lens, light-detecting device is installed on the focal plane of receiver lens, when measuring the coarsegrain particle, sample particle is placed on the sample cell before the lens, and the size of grain graininess D is according to formula like this: (1) estimation, in the formula: λ is an optical maser wavelength, fBe the focal length of lens, SBe the size of photo-detector, the focal length of lens of determining fSize with photo-detector S isDuring minimum dimension, record maximum particle size, obtain many sample cells laser particle analyzer and measure the upper limit; When measuring small size particle, sample is placed in the sample cell behind the lens, according to being inverted the Fourier transform light path principle, this moment, sample cell was equivalent to the focal length of receiver lens in the Fourier transform light path to the distance between photo-detector, this distance obtains many sample cells laser particle analyzer measurement lower limit less than the focal length of receiver lens.
According to above-mentioned a kind of many sample cells laser particle analyzer, be characterized in, before receiver lens, be equipped with 1 sample cell, behind receiver lens, be equipped with two sample cells, closely locate apart from photo-detector after wherein 1 sample cell is arranged in lens, and when measuring the median size grain graininess, sample particle is put into behind the receiver lens apart from the photo-detector distant location, when measuring the bulky grain granularity, then particulate samples is put into sample cell before the receiver lens.
The invention has the beneficial effects as follows and adopt a kind of various product pool technology scheme, enlarged the granulometry bound of laser particle analyzer with simple structure.
Description of drawings
Fig. 1 is classical laser particle analyzer principle schematic;
Fig. 2 is the embodiment of the invention 1 synoptic diagram;
Fig. 3 is embodiment 2 synoptic diagram;
Fig. 4 is embodiment 3 synoptic diagram.
Embodiment
A kind of many sample cells laser particle analyzer by Fig. 2, shown in Figure 3, is aligned in sequence with laser instrument in the past backward
1, beam expander 2, first sample cell 3, receiver lens 4 and photo-detector 5 are characterized in, according to Fourier
Conversion light path and inversion Fourier transform light path principle, be furnished with many sample cells in the front and back of receiver lens 4, photo-detector 5 is installed on the focal plane of receiver lens 4, when measuring the coarsegrain particle, sample particle is placed on first sample cell 3 before the lens, and the size of grain graininess D is according to formula like this:
Figure 884490DEST_PATH_IMAGE002
(1) estimation, in the formula: λ is an optical maser wavelength, fBe the focal length of lens, SBe the size of photo-detector, the focal length of lens of determining fSize with photo-detector S isDuring minimum dimension, record maximum particle size, obtain many sample cells laser particle analyzer and measure the upper limit; When measuring small size particle, sample is placed in second sample cell 7 behind the lens, according to being inverted the Fourier transform light path principle, this moment, sample cell was equivalent to the focal length 11 of receiver lens in the Fourier transform light path to the distance between photo-detector, this distance obtains many sample cells laser particle analyzer measurement lower limit less than the focal length 8 of receiver lens.
According to above-mentioned a kind of many sample cells laser particle analyzer, by shown in Figure 4, be characterized in, before receiver lens 4, be equipped with 1 sample cell 3, behind receiver lens, be equipped with two sample cells 7 and 12, closely locate apart from photo-detector 5 after wherein 1 sample cell 12 is arranged in receiver lens 4, and when measuring the median size grain graininess, sample particle is put into the sample cell 7 of receiver lens 4 backs apart from photo-detector 5 distant locations, when measuring the bulky grain granularity, then particulate samples is put into receiver lens 4 preceding sample cells 3.
Embodiment 1:
By shown in Figure 2, when tested grain graininess was big, particulate samples was put into sample cell 3, and laser beam 6 incides particulate samples, and scattered light signal 9 is received and is received to photo-detector 5 after lens 4 receive.Because grain graininess is bigger, scattered light signal 9 concentrates on the less scattering angle 10 of forward direction relatively.Employing can record meticulousr scattered light space distribution than the receiver lens 4 of long-focus 8.
Embodiment 2:
Opposite with example 1, in the present embodiment, by shown in Figure 3, tested grain graininess is less, and particulate samples is put into sample cell 7, and the laser beam 6 that converges incides particulate samples, and scattered light signal 9 is received by photo-detector 5.Because equivalent focal length 11 is less, when adopting similarly to Example 1 photo-detector 5, can record than the scattered light signal in the wide-angle, lowered measurement lower limit.
Embodiment 3:
By shown in Figure 4, because the focal length of lens is fixed in being inverted the Fourier transform light path, and the position of sample cell can be determined according to variable grain granularity stepping behind receiver lens.Therefore, if further reduce measurement lower limit, 1 sample cell 12 can be arranged in receiver lens 4 back apart from photo-detector 5 closer distance places, and when measuring the median size grain graininess, sample can be put into behind the lens apart from the sample cell 7 of photo-detector than distant location.When measuring the bulky grain granularity, then particulate samples is put into receiver lens 4 preceding sample cells 3.
In the present embodiment, the size ratio embodiment 2 of tested particle is littler, and particulate samples is put into sample cell 12, and the laser beam 5 that converges incides particulate samples, and scattered light signal 9 is received by photodetector 5.Because the equivalent focal length 11 of sample cell 12 is less than the equivalent focal length 11 of sample cell 7 among the embodiment 2, when same light detector 5, can survey the situation of the granularity upper limit less than embodiment 1 and embodiment 2, but because bigger scattering angle 10 arranged, measurement lower limit is also less than the measurement lower limit of embodiment 2.In this embodiment, be subjected to the restriction at maximum scattering angle 10, sample cell should equal the size of photo-detector substantially to the minor increment of photodetector, and scattering angle 10 can not surpass 48 degree.

Claims (2)

1. sample cell laser particle analyzer more than a kind, be aligned in sequence with backward in the past laser instrument, beam expander, sample cell,
Receiver lens and photo-detector, it is characterized in that, according to Fourier transform light path and inversion Fourier transform light path principle, be furnished with many sample cells in the front and back of receiver lens, light-detecting device is installed on the focal plane of lens, when measuring the coarsegrain particle, sample particle is placed on the sample cell before the lens, and the size of grain graininess D is according to formula like this:
Figure DEST_PATH_IMAGE002
(1) estimation, in the formula: λ is an optical maser wavelength, fBe the focal length of lens, SBe the size of photo-detector, the focal length of lens of determining fSize with photo-detector S isDuring minimum dimension, record maximum particle size, obtain many sample cells laser particle analyzer and measure the upper limit; When measuring small size particle, sample is placed in the sample cell behind the lens, according to being inverted the Fourier transform light path principle, this moment, sample cell was equivalent to the focal length of receiver lens in the Fourier transform light path to the distance between photo-detector, this distance obtains many sample cells laser particle analyzer measurement lower limit less than the focal length of receiver lens.
2. a kind of many sample cells laser particle analyzer according to claim 1, it is characterized in that, before receiver lens, be equipped with 1 sample cell, behind receiver lens, be equipped with two sample cells, closely locate apart from photo-detector after wherein 1 sample cell is arranged in lens, and when measuring the median size grain graininess, sample particle is put into behind the receiver lens apart from photo-detector distant location sample cell, when measuring the bulky grain granularity, then particulate samples is put into sample cell before the receiver lens.
CN 201010576029 2010-12-07 2010-12-07 Laser granulometer with multiple sample cells Pending CN102081032A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103575626A (en) * 2013-10-29 2014-02-12 中国人民解放军第四军医大学 Particulate matter (PM) 2.5 detection device based on wide-angle Fourier transformation
CN103890561A (en) * 2011-08-05 2014-06-25 纳米观测有限公司 Optical detection and analysis of particles
CN111175137A (en) * 2019-10-19 2020-05-19 安徽磐彩装饰工程有限公司 Porous thermal insulation material pressure test device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2195091Y (en) * 1994-01-11 1995-04-19 山东建筑材料工业学院 Portable high-resolution laser granulometer
US6104491A (en) * 1998-12-14 2000-08-15 Microtrac, Inc. System for determining small particle size distribution in high particle concentrations
CN1865918A (en) * 2006-05-31 2006-11-22 天津大学 Coaxial double test-surface laser particle analyzer
CN101504352A (en) * 2009-03-10 2009-08-12 上海理工大学 Inverse-Fourier transform particle on-line measurement apparatus for thick sample pool

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2195091Y (en) * 1994-01-11 1995-04-19 山东建筑材料工业学院 Portable high-resolution laser granulometer
US6104491A (en) * 1998-12-14 2000-08-15 Microtrac, Inc. System for determining small particle size distribution in high particle concentrations
CN1865918A (en) * 2006-05-31 2006-11-22 天津大学 Coaxial double test-surface laser particle analyzer
CN101504352A (en) * 2009-03-10 2009-08-12 上海理工大学 Inverse-Fourier transform particle on-line measurement apparatus for thick sample pool

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
《中国优秀博硕士学位论文全文数据库(硕士) 信息科技辑》 20060615 孙昕 基于Mie散射理论测量微小球粒粒径的数值模拟及实验研究 第3-4页 1-2 , 第6期 2 *
《光电工程》 20090630 刘启海等 基于改进R-R分布的现场激光粒度仪反演算法 第1.1节 1-2 第36卷, 第6期 2 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103890561A (en) * 2011-08-05 2014-06-25 纳米观测有限公司 Optical detection and analysis of particles
CN103890561B (en) * 2011-08-05 2016-06-01 马尔文器械有限公司 The optical detection of particle and analysis
CN103575626A (en) * 2013-10-29 2014-02-12 中国人民解放军第四军医大学 Particulate matter (PM) 2.5 detection device based on wide-angle Fourier transformation
CN103575626B (en) * 2013-10-29 2016-09-28 中国人民解放军第四军医大学 PM2.5 based on Radix Rumicis Fourier transformation detects device
CN111175137A (en) * 2019-10-19 2020-05-19 安徽磐彩装饰工程有限公司 Porous thermal insulation material pressure test device

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Application publication date: 20110601