CN102522122B - Method of testing and equipment - Google Patents
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- CN102522122B CN102522122B CN201110394916.6A CN201110394916A CN102522122B CN 102522122 B CN102522122 B CN 102522122B CN 201110394916 A CN201110394916 A CN 201110394916A CN 102522122 B CN102522122 B CN 102522122B
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Abstract
Embodiments provide method of testing and equipment, wherein a kind of method of testing comprises: by the first data write second memory in first memory to be tested; In the process that described first memory is tested, when wish accesses described first data in described first memory, the first access is performed to described first data write in described second memory.The method of testing provided by the embodiment of the present invention and equipment, access be the data not having tested destruction, therefore there will not be the problem made a mistake owing to accessing destroyed data in prior art.
Description
Technical field
The present invention relates to measuring technology, particularly relate to method of testing and equipment.
Background technology
Utilize testing software to carry out test to storer and be widely used in hardware development field.Such as, testing software utilizes test data to test flash memory.Detailed process can be, first test data is write in the storage block of storer to be tested, then reads this storage block.Whether consistent by the data of the test data with reading that compare write, judge that whether storer to be tested is normal.
But carry out storer testing the data may destroyed in storer, the data that access occurs to destroy may make a mistake.
In prior art, carry out storer testing the data may destroyed in storer.Destroyed data are conducted interviews and may be made a mistake.In the technical scheme that the present embodiment provides, access be the data not having tested destruction, therefore there will not be the problem made a mistake owing to accessing destroyed data in prior art.
Summary of the invention
On the one hand, embodiments provide a kind of method of testing, comprising:
By in the first data write second memory in first memory to be tested;
In the process that described first memory is tested, when wish accesses described first data in described first memory, the first access is performed to described first data write in described second memory.
On the other hand, embodiments provide a kind of method of testing, comprising:
By in the data write second memory in first memory to be tested;
Described first memory is tested;
After described test terminates, the described data write in described second memory are write in described first memory, so that conducted interviews to described data by described first memory.
On the other hand, embodiments provide a kind of testing apparatus, comprising:
First writing unit, for writing in second memory by the first data in first memory to be tested;
Addressed location, in the process of testing described first memory, when wish accesses described first data in described first memory, performs the first access to described first data write in described second memory.
On the other hand, embodiments provide a kind of testing apparatus, comprising:
First writing unit, for writing in second memory by the data in first memory to be tested;
Test cell, for testing described first memory;
The described data write in described second memory, after terminating for described test cell test, are write in described first memory, so that conducted interviews to described data by described first memory by the second writing unit.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
The schematic flow sheet of a kind of method of testing that Fig. 1 provides for the embodiment of the present invention;
The schematic flow sheet of the another kind of method of testing that Fig. 2 provides for the embodiment of the present invention;
The schematic flow sheet of the another kind of method of testing that Fig. 3 provides for the embodiment of the present invention;
The structural representation of a kind of testing apparatus that Fig. 4 provides for the embodiment of the present invention;
The structural representation of the another kind of testing apparatus that Fig. 5 provides for the embodiment of the present invention.
Embodiment
For making the object of the embodiment of the present invention, technical scheme and advantage clearly, below in conjunction with the accompanying drawing in the embodiment of the present invention, technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
Embodiment one
The schematic flow sheet of a kind of method of testing that Fig. 1 provides for the embodiment of the present invention.As shown in Figure 1, the method for testing of the present embodiment comprises:
101, by the first data write second memory in first memory to be tested.
102, in the process that above-mentioned first memory is tested, when wish accesses above-mentioned first data in above-mentioned first memory, the first access is performed to above-mentioned first data write in above-mentioned second memory.
The access to storer is all related in 101 and 102.Conducting interviews to storer can be read operation and write operation.The main body of access storer can be the driver of this storer, also can be testing software, operating system and file system.Wherein, driver can DASD.Operating system can access storer by driver.When there is file system, file system under the control of an operating system, can access storer by driver.Testing software can by operating system and driver access storer.In addition, operating system directly can access the storer of some type, such as internal memory.In addition, the storer of some type is with the storage of the form of " block " realization to data.When the storer of these types is conducted interviews, be also carry out with the form of " block ".The storer of these types comprises flash memory (Flash), standard flash memory (Compact Flash, CF), solid state hard disc (SolidState Drive, SSD) and hard disk (hard drive, HD) etc.
First memory and second memory can be nonvolatile memories, such as flash memory, solid state hard disc, standard flash memory, secure digital (Secure Digital, SD), hard disk etc.First memory and second memory also can be volatile memory, such as double data rate synchronous DRAM (DoubleData Rate Synchronous Dynamic Random Access Memory, DDRSDRAM) etc.
During method of testing specific implementation, Ke Yishi:
Testing software by the first data reading in first memory to be tested, and writes in second memory.
Testing software creates corresponding table in internal memory.Corresponding table can comprise mark and the test mark that the first data are stored in the mark of second memory, the first data are stored in first memory.First data are stored in the mark of second memory referred to as the first mark by the present embodiment.First data are stored in the mark of first memory referred to as the second mark by the present embodiment.Wherein, when operating system is the main body of access second memory, and when operating system directly can access second memory, the first mark can be the physical address that the first data are stored in second memory.When the main body that file system is access second memory, and when the first data are stored in second memory in the form of a file, the first mark also can be filenames corresponding to the first data.First data are stored in the physical address of second memory referred to as the first address by the present embodiment.First data are stored in the physical address of first memory referred to as the second address by the present embodiment.During the second mark specific implementation, can with reference to the first mark.
After corresponding table creates, testing software tests first memory; In test process, when operating system is for conducting interviews to the first data in first memory, the first mark can be provided to the driver of first memory by operating system.The driver of first memory by searching corresponding table, can obtain test mark and the second mark.Operating system can determine first memory just tested according to test mark.Second mark is supplied to the driver of second memory by operating system.The driver of second memory conducts interviews to the first data write in second memory according to the second mark.In said process, first memory and second memory can not be same storeies.First memory and second memory also can be same storeies.
Alternatively, after above-mentioned test terminates, can also further the second data in above-mentioned second memory be write in above-mentioned first memory, so that conducted interviews to above-mentioned second data by above-mentioned first memory, above-mentioned second data are the data after above-mentioned first data in above-mentioned second memory are performed above-mentioned first access.
During specific implementation, after carrying out the first access to the first data in second memory, the first data may change, also may not change.When the first access is read operation, the first data do not change.Under this scene, the second data are identical with the first data; When the first access is write operation, the first data may change.Under this scene, the second data and the first data may be different.
Alternatively, above-mentioned second memory can be the memory device independent of above-mentioned first memory.First memory and second memory also can belong to same memory device.When first memory and second memory belong to same memory device, above-mentioned first data can be stored in the first storage block of above-mentioned first memory; Above-mentioned test can for test above-mentioned first storage block.
Optionally, above-mentioned second memory is the second storage block of above-mentioned first memory.
In the present embodiment, by the first data write second memory in first memory to be tested.When this makes first memory tested, when wish accesses the first data in first memory, the first data write in second memory can be accessed.In prior art, carry out storer testing the data may destroyed in storer.Destroyed data are conducted interviews and may be made a mistake.In the technical scheme that the present embodiment provides, access be the first data in second memory.The first data in second memory are not destroyed by this test.Therefore, what the technical scheme that the present embodiment provides was accessed is the data not having tested destruction, there will not be the problem made a mistake owing to accessing destroyed data in prior art.
Embodiment two
The schematic flow sheet of the another kind of method of testing that Fig. 2 provides for the embodiment of the present invention.As shown in Figure 2, the method for testing of the present embodiment comprises:
201, by the data write second memory in first memory to be tested.
202, above-mentioned first memory is tested.
203, after above-mentioned test terminates, the above-mentioned data write in above-mentioned second memory are write in above-mentioned first memory, so that conducted interviews to above-mentioned data by above-mentioned first memory.
The access to storer is all related in 201 and 203.Conducting interviews to storer can be read operation or write operation.The main body of access storer can be the driver of this storer, also can be testing software, operating system and file system.Wherein, driver can DASD.Operating system can access storer by driver.When there is file system, file system under the control of an operating system, can access storer by driver.Testing software can by operating system and driver access storer.In addition, operating system directly can access some storer, such as internal memory.In addition, the storer of some type is with the storage of the form of " block " realization to data.When the storer of these types is conducted interviews, be also carry out with the form of " block ".The storer of these types comprises flash memory, standard flash memory, solid state hard disc and hard disk etc.
First memory and second memory can be nonvolatile memories, such as flash memory, solid state hard disc, standard flash memory, secure digital, hard disk etc.First memory and second memory also can be volatile memory, such as DDR SDRAM etc.
Alternatively, above-mentioned second memory can be the memory device independent of above-mentioned first memory.First memory and second memory also can belong to same memory device.When first memory and second memory belong to same memory device, above-mentioned first data can be stored in the first storage block of above-mentioned first memory; Above-mentioned test can for test above-mentioned first storage block.
Optionally, above-mentioned second memory is the second storage block of above-mentioned first memory.
In the present embodiment, by the data in first memory to be tested are write in second memory, again the above-mentioned data write in above-mentioned second memory are write in above-mentioned first memory after test terminates, after test is terminated, the above-mentioned data write can be accessed in above-mentioned first memory.In prior art, carry out storer testing the data may destroyed in storer.Destroyed data are conducted interviews and may be made a mistake.In the technical scheme that the present embodiment provides, the write in first memory first the first data write in second memory.First data of second memory are not destroyed by this test.Therefore, what the technical scheme that the present embodiment provides was accessed is the data not having tested destruction, there will not be the problem made a mistake owing to accessing destroyed data in prior art.
Embodiment three
The schematic flow sheet of the another kind of method of testing that Fig. 3 provides for the embodiment of the present invention, the present embodiment is applicable to flash memory.As shown in Figure 3, the method for testing of the present embodiment can comprise:
301, by cache blocks corresponding with above-mentioned flash block to be tested in the data write buffer memory in flash block to be tested.
Such as: first can read the data in flash block to be tested, then by cache blocks corresponding with above-mentioned flash block to be tested in above-mentioned data write buffer memory.
Wherein, flash memory some flash block that can be divided into equal and opposite in direction or differ in size.
Alternatively, before 301, the corresponding relation of the cache blocks at least one flash block above-mentioned and buffer memory can also be set up further, write in cache blocks corresponding with above-mentioned flash block to be tested in above-mentioned buffer memory for by the above-mentioned data read.Such as: address maps mode can be utilized, according to the address space of flash block and the address space of cache blocks, set up the corresponding relation of the cache blocks at least one flash block above-mentioned and buffer memory.
302, above-mentioned flash block to be tested is tested.
Such as: test data write in flash block to be tested, and then read this flash block to be tested, by the consistance of the data of the test data and reading that compare write, go out to judge that whether flash block to be tested is normal.
If 303 above-mentioned tests are passed through, the data write in above-mentioned cache blocks are write in above-mentioned flash block to be tested.
Such as: if above-mentioned test is passed through, the data write in above-mentioned cache blocks can be read, and write in above-mentioned flash block to be tested.
Alternatively, after 303, the data dump that can also will write in above-mentioned cache blocks further, tests for other flash block corresponding to this cache blocks.
Alternatively, the buffer memory in the present embodiment can be region of memory.
Alternatively, the buffer memory in the present embodiment can also be the reserved area in above-mentioned flash memory, does not store data in above-mentioned reserved area.
Alternatively, if in the process of execution 301 ~ 303, file system is had to need to access above-mentioned flash block to be tested, then can access cache blocks corresponding with above-mentioned flash block to be tested in above-mentioned buffer memory, such as: perform after 301, the state of above-mentioned flash block to be tested can be set to test, when file system needs the above-mentioned flash block to be tested of access, file system can test the state of this flash block to be tested for test; Then, file system then according to the corresponding relation of the cache blocks in the flash block set up and buffer memory, can access cache blocks corresponding with above-mentioned flash block to be tested in above-mentioned buffer memory.Specifically, file system can read the data in cache blocks corresponding with above-mentioned flash block to be tested in above-mentioned buffer memory, or also new data can be write in cache blocks corresponding with above-mentioned flash block to be tested in above-mentioned buffer memory.
Be understandable that: in the present embodiment, whole flash memory can be traveled through, successively 301 ~ 303 are performed to all flash block in this flash memory.
In the present embodiment, by the data in flash block to be tested are write in cache blocks corresponding with above-mentioned flash block to be tested in buffer memory, make it possible to test above-mentioned flash block to be tested, if above-mentioned test is passed through, then can the data write in above-mentioned cache blocks be write in above-mentioned flash block to be tested, the problem of the data in the flash block that the destruction that causes owing to storing data in flash block to be tested in prior art can be avoided to be tested, thus make it possible to test flash memory when file system is run
Embodiment four
The structural representation of a kind of testing apparatus that Fig. 4 provides for the embodiment of the present invention.This testing apparatus can perform the method for testing in embodiment one.As shown in Figure 4, testing apparatus comprises:
First writing unit 41, for writing the first data in first memory to be tested in second memory.
Addressed location 42, in the process of testing above-mentioned first memory, when wish accesses above-mentioned first data in above-mentioned first memory, performs the first access to above-mentioned first data write in above-mentioned second memory.
The access to storer is all related in first writing unit 41 and addressed location 42.Conducting interviews to storer can be read operation and write operation.The main body of access storer can be the driver of this storer, also can be testing software, operating system and file system.Wherein, driver can DASD.Operating system can access storer by driver.When there is file system, file system under the control of an operating system, can access storer by driver.Testing software can by operating system and driver access storer.In addition, operating system directly can access the storer of some type, such as internal memory.In addition, the storer of some type is with the storage of the form of " block " realization to data.When the storer of these types is conducted interviews, be also carry out with the form of " block ".The storer of these types comprises flash memory, standard flash memory, solid state hard disc and hard disk etc.
First memory and second memory can be nonvolatile memories, such as: flash memory, solid state hard disc, standard flash memory, secure digital, hard disk etc.First memory and second memory also can be volatile memory, such as: DDR SDRAM etc.
During proving installation specific implementation, Ke Yishi:
Testing software by the first data reading in first memory to be tested, and writes in second memory.
Testing software creates corresponding table in internal memory.Corresponding table can comprise mark and the test mark that the first data are stored in the mark of second memory, the first data are stored in first memory.First data are stored in the mark of second memory referred to as the first mark by the present embodiment.First data are stored in the mark of first memory referred to as the second mark by the present embodiment.Wherein, when operating system is the main body of access second memory, and when operating system directly can access second memory, the first mark can be the physical address that the first data are stored in second memory.When the main body that file system is access second memory, and when the first data are stored in second memory in the form of a file, the first mark also can be filenames corresponding to the first data.First data are stored in the physical address of second memory referred to as the first address by the present embodiment.First data are stored in the physical address of first memory referred to as the second address by the present embodiment.During the second mark specific implementation, can with reference to the first mark.
After corresponding table creates, testing software tests first memory; In test process, when operating system is for conducting interviews to the first data in first memory, the first mark can be provided to the driver of first memory by operating system.The driver of first memory by searching corresponding table, can obtain test mark and the second mark.Operating system can determine first memory just tested according to test mark.Second mark is supplied to the driver of second memory by operating system.The driver of second memory conducts interviews to the first data write in second memory according to the second mark.In said process, first memory and second memory can not be same storeies.First memory and second memory also can be same storeies.
Optionally, testing apparatus can also comprise,
Second writing unit, after terminating for above-mentioned test, the second data in above-mentioned second memory are write in above-mentioned first memory, so that conducted interviews to above-mentioned second data by above-mentioned first memory, above-mentioned second data are the data after above-mentioned first data in above-mentioned second memory are performed above-mentioned first access.
During specific implementation, after carrying out the first access to the first data in second memory, the first data may change, also may not change.When the first access is read operation, the first data do not change.Under this scene, the second data are identical with the first data; When the first access is write operation, the first data may change.Under this scene, the second data and the first data may be different.
Alternatively, above-mentioned second memory can be the memory device independent of above-mentioned first memory.First memory and second memory also can belong to same memory device.When first memory and second memory belong to same memory device, above-mentioned first data can be stored in the first storage block of above-mentioned first memory; Above-mentioned test can for test above-mentioned first storage block.
Optionally, above-mentioned second memory is the second storage block of above-mentioned first memory.
In the present embodiment, by the first data write second memory in first memory to be tested.When this makes first memory tested, when wish accesses the first data in first memory, the first data write in second memory can be accessed.In prior art, carry out storer testing the data may destroyed in storer.Destroyed data are conducted interviews and may be made a mistake.In the technical scheme that the present embodiment provides, access be the first data in second memory.The first data in second memory are not destroyed by this test.Therefore, what the technical scheme that the present embodiment provides was accessed is the data not having tested destruction, there will not be the problem made a mistake owing to accessing destroyed data in prior art.
Embodiment five
The structural representation of the another kind of testing apparatus that Fig. 5 provides for the embodiment of the present invention.This testing apparatus can perform the method for testing in embodiment two.As shown in Figure 5, this testing apparatus comprises:
First writing unit 51, for writing the data in first memory to be tested in second memory.
Test cell 52, for testing above-mentioned first memory.
The above-mentioned data write in above-mentioned second memory, after terminating for above-mentioned test cell test, are write in above-mentioned first memory, so that conducted interviews to above-mentioned data by above-mentioned first memory by the second writing unit 53.
The access to storer is all related in first writing unit 51 and the second writing unit 53.Conducting interviews to storer can be read operation or write operation.The main body of access storer can be the driver of this storer, also can be testing software, operating system and file system.Wherein, driver can DASD.Operating system can access storer by driver.When there is file system, file system under the control of an operating system, can access storer by driver.Testing software can by operating system and driver access storer.In addition, operating system directly can access some storer, such as internal memory.In addition, the storer of some type is with the storage of the form of " block " realization to data.When the storer of these types is conducted interviews, be also carry out with the form of " block ".The storer of these types comprises flash memory, standard flash memory, solid state hard disc and hard disk etc.
First memory and second memory can be nonvolatile memories, such as flash memory, solid state hard disc, standard flash memory, secure digital, hard disk etc.First memory and second memory also can be volatile memory, such as DDR SDRAM etc.
Alternatively, above-mentioned second memory can be the memory device independent of above-mentioned first memory.First memory and second memory also can belong to same memory device.When first memory and second memory belong to same memory device, above-mentioned first data can be stored in the first storage block of above-mentioned first memory; Above-mentioned test can for test above-mentioned first storage block.
Optionally, above-mentioned second memory is the second storage block of above-mentioned first memory.
In the present embodiment, by the data in first memory to be tested are write in second memory, again the above-mentioned data write in above-mentioned second memory are write in above-mentioned first memory after test terminates, after test is terminated, the above-mentioned data write can be accessed in above-mentioned first memory.In prior art, carry out storer testing the data may destroyed in storer.Destroyed data are conducted interviews and may be made a mistake.In the technical scheme that the present embodiment provides, the write in first memory first the first data write in second memory.First data of second memory are not destroyed by this test.Therefore, what the technical scheme that the present embodiment provides was accessed is the data not having tested destruction, there will not be the problem made a mistake owing to accessing destroyed data in prior art.
The technical scheme of above-mentioned five embodiments, can be applied to various operating system, such as: the operating systems such as LINUX, UNIX, SOLARIS or QNX.For LINUX system, operate in LINUX system files system and can comprise flash memory Journaling File System the 2nd edition (Journaling Flash FileSystem Version2, JFFS2), unordered block image file system (Unsorted Block ImageFile System, and the file system such as compressed read-only file system (Compressed ROM File System, CRAM FS) UBIFS).
It should be noted that: for aforesaid each embodiment of the method, in order to simple description, therefore it is all expressed as a series of combination of actions, but those skilled in the art should know, the present invention is not by the restriction of described sequence of movement, because according to the present invention, some step can adopt other orders or carry out simultaneously.Secondly, those skilled in the art also should know, the embodiment described in instructions all belongs to preferred embodiment, and involved action and module might not be that the present invention is necessary.
In above-mentioned five embodiments, the description of each embodiment is all emphasized particularly on different fields, in certain embodiment, there is no the part described in detail, can see the associated description of other embodiments.
In several embodiments that the application provides, should be understood that, disclosed system, apparatus and method, can realize by another way.Such as, device embodiment described above is only schematic, such as, the division of described unit, be only a kind of logic function to divide, actual can have other dividing mode when realizing, such as multiple unit or assembly can in conjunction with or another system can be integrated into, or some features can be ignored, or do not perform.Another point, shown or discussed coupling each other or direct-coupling or communication connection can be by some interfaces, and the indirect coupling of device or unit or communication connection can be electrical, machinery or other form.
The described unit illustrated as separating component or can may not be and physically separates, and the parts as unit display can be or may not be physical location, namely can be positioned at a place, or also can be distributed in multiple network element.Some or all of unit wherein can be selected according to the actual needs to realize the object of the present embodiment scheme.
In addition, each functional unit in each embodiment of the present invention can be integrated in a processing unit, also can be that the independent physics of unit exists, also can two or more unit in a unit integrated.Above-mentioned integrated unit both can adopt the form of hardware to realize, and the form that hardware also can be adopted to add SFU software functional unit realizes.
The above-mentioned integrated unit realized with the form of SFU software functional unit, can be stored in a computer read/write memory medium.Above-mentioned SFU software functional unit is stored in a storage medium, comprising some instructions in order to make a computer equipment (can be personal computer, server, or the network equipment etc.) perform the part steps of method described in each embodiment of the present invention.And aforesaid storage medium comprises: USB flash disk, portable hard drive, ROM (read-only memory) (Read-Only Memory, be called for short ROM), random access memory (Random Access Memory, be called for short RAM), magnetic disc or CD etc. various can be program code stored medium.
Last it is noted that above embodiment is only in order to illustrate technical scheme of the present invention, be not intended to limit; Although with reference to previous embodiment to invention has been detailed description, those of ordinary skill in the art is to be understood that: it still can be modified to the technical scheme described in foregoing embodiments, or carries out equivalent replacement to wherein portion of techniques feature; And these amendments or replacement, do not make the essence of appropriate technical solution depart from the spirit and scope of various embodiments of the present invention technical scheme.
Claims (10)
1. a method of testing, is characterized in that, comprising:
By in the first data write second memory in first memory to be tested;
In the process that described first memory is tested, when wish accesses described first data in described first memory, the first access is performed to described first data write in described second memory;
Described described first data to writing in described second memory perform the first access and specifically comprise:
In test process, when operating system is for conducting interviews to described first data in first memory, the second mark is provided to the driver of first memory by operating system;
The driver of described first memory searches corresponding table, obtains test mark and the first mark; Described correspondence table comprises the mark and described test mark that the first data are stored in the mark of second memory, the first data are stored in first memory; Described first data be stored in second memory be designated described first mark, described first data be stored in first memory be designated described second mark;
Described operating system determines first memory just tested according to described test mark, first mark is supplied to the driver of described second memory by described operating system, and the driver of described second memory performs the first access according to described first mark to described first data write in described second memory.
2. method according to claim 1, is characterized in that, also comprise:
After described test terminates, the second data in described second memory are write in described first memory, so that conducted interviews to described second data by described first memory, described second data are the data after described first data in described second memory are performed described first access.
3. method according to claim 1 or 2, is characterized in that, described first data are stored in the first storage block of described first memory; Described test is for test described first storage block.
4. method according to claim 3, it is characterized in that, described second memory is the second storage block of described first memory.
5. a method of testing, is characterized in that, comprising:
By in the data write second memory in first memory to be tested;
Described first memory is tested;
In test process, when operating system is for conducting interviews to the first data in described first memory, the second mark is provided to the driver of described first memory by described operating system;
The driver of described first memory searches corresponding table, obtains test mark and the first mark; Described correspondence table comprises the mark and described test mark that described first data are stored in the mark of described second memory, described first data are stored in described first memory; Described first data be stored in described second memory be designated described first mark, described first data be stored in described first memory be designated described second mark;
Described operating system determines described first memory just tested according to described test mark, described first mark is supplied to the driver of described second memory by described operating system, and the driver of described second memory performs the first access according to described first mark to described first data write in described second memory;
After described test terminates, the described data write in described second memory are write in described first memory, so that conducted interviews to described data by described first memory.
6. method according to claim 5, it is characterized in that, described data are stored in the first storage block of described first memory, and described test is for test described first storage block.
7. method according to claim 6, it is characterized in that, described second memory is the second storage block of described first memory.
8. a testing apparatus, is characterized in that, comprising:
First writing unit, for writing in second memory by the first data in first memory to be tested;
Addressed location, in the process of testing described first memory, when wish accesses described first data in described first memory, performs the first access to described first data write in described second memory;
Described described first data to writing in described second memory perform the first access and specifically comprise:
In test process, when operating system is for conducting interviews to described first data in first memory, the second mark is provided to the driver of first memory by operating system;
The driver of described first memory searches corresponding table, obtains test mark and the first mark; Described correspondence table comprises the mark and described test mark that the first data are stored in the mark of second memory, the first data are stored in first memory; Described first data be stored in second memory be designated described first mark, described first data be stored in first memory be designated described second mark;
Described operating system determines first memory just tested according to described test mark, first mark is supplied to the driver of described second memory by described operating system, and the driver of described second memory performs the first access according to described first mark to described first data write in described second memory.
9. equipment according to claim 8, is characterized in that, comprising:
Second writing unit, after terminating for described test, the second data in described second memory are write in described first memory, so that conducted interviews to described second data by described first memory, described second data are the data after described first data in described second memory are performed described first access.
10. a testing apparatus, is characterized in that, comprising:
First writing unit, for writing in second memory by the data in first memory to be tested;
Test cell, for testing described first memory;
In test process, when operating system is for conducting interviews to the first data in described first memory, the second mark is provided to the driver of described first memory by described operating system;
The driver of described first memory searches corresponding table, obtains test mark and the first mark; Described correspondence table comprises the mark and described test mark that described first data are stored in the mark of described second memory, described first data are stored in described first memory; Described first data be stored in described second memory be designated described first mark, described first data be stored in described first memory be designated described second mark;
Described operating system determines described first memory just tested according to described test mark, described first mark is supplied to the driver of described second memory by described operating system, and the driver of described second memory performs the first access according to described first mark to described first data write in described second memory;
The described data write in described second memory, after terminating for described test cell test, are write in described first memory, so that conducted interviews to described data by described first memory by the second writing unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110394916.6A CN102522122B (en) | 2011-12-02 | 2011-12-02 | Method of testing and equipment |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1504893A (en) * | 2002-12-05 | 2004-06-16 | 纬创资通股份有限公司 | Hard disk data controlling method |
| JP2006294104A (en) * | 2005-04-08 | 2006-10-26 | Yokogawa Electric Corp | Apparatus and method for testing device |
| US7137037B2 (en) * | 2003-03-27 | 2006-11-14 | Silicon Motion, Inc. | Data storage system and method for testing the same |
| CN101576860A (en) * | 2009-06-11 | 2009-11-11 | 成都市华为赛门铁克科技有限公司 | Detection method and detection system |
| CN102024502A (en) * | 2010-12-09 | 2011-04-20 | 福建星网锐捷网络有限公司 | Flash device testing method and device as well as board and network equipment |
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1504893A (en) * | 2002-12-05 | 2004-06-16 | 纬创资通股份有限公司 | Hard disk data controlling method |
| US7137037B2 (en) * | 2003-03-27 | 2006-11-14 | Silicon Motion, Inc. | Data storage system and method for testing the same |
| JP2006294104A (en) * | 2005-04-08 | 2006-10-26 | Yokogawa Electric Corp | Apparatus and method for testing device |
| CN101576860A (en) * | 2009-06-11 | 2009-11-11 | 成都市华为赛门铁克科技有限公司 | Detection method and detection system |
| CN102024502A (en) * | 2010-12-09 | 2011-04-20 | 福建星网锐捷网络有限公司 | Flash device testing method and device as well as board and network equipment |
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