CN102510656A - Scanning magnet device used in electron irradiation accelerator - Google Patents
Scanning magnet device used in electron irradiation accelerator Download PDFInfo
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- CN102510656A CN102510656A CN2011102834288A CN201110283428A CN102510656A CN 102510656 A CN102510656 A CN 102510656A CN 2011102834288 A CN2011102834288 A CN 2011102834288A CN 201110283428 A CN201110283428 A CN 201110283428A CN 102510656 A CN102510656 A CN 102510656A
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Abstract
The invention relates to a scanning magnet device used in an electron irradiation accelerator. The scanning magnet device comprises a scanning power supply, a scanning magnet, a scanning magnet coil, a source end sampling device and a source end signal monitoring protection circuit, wherein the scanning power supply is used for generating scanning current or scanning voltage; the source end sampling device is arranged on the scanning power supply end and is used for sampling the scanning current signal or scanning voltage signal; and the source end signal monitoring protection circuit is connected with the source end sampling device and comprises a quick signal failure analyzer, and the signal failure quick analyzer is used for monitoring whether the scanning current or the scanning voltage signal accords with the preset waveform or not in real time. The scanning magnet device also comprises an induction coil arranged in the magnetic field loop of the scanning magnet and a load end signal monitoring protection circuit, wherein the induction coil is used for generating induction voltage; and the load end signal monitoring protection circuit is connected with the induction coil, comprises another quick signal failure analyzer and is used for monitoring whether the induction voltage signal accords with the preset waveform or not in real time.
Description
The application is to be 200910085456.1 and denomination of invention dividing an application for the Chinese invention patent application of " the scanning magnet device that in electron accelerator, uses " in the application number that on May 22nd, 2009 submitted to.
Technical field
The present invention relates to electron accelerator field, more specifically, relate to the scanning magnet device that in electron accelerator, uses.
Background technology
Electron accelerator is in the high vacuum field, to utilize magnetic field force to control electronics, utilize the electric field force accelerated electron, thereby makes electronics reach very high-octane device.Electron accelerator is widely used in multiple fields such as study of high energy physics, industrial or agricultural, biomedicine, material science, national defence science.
The scanning magnet device is a vitals of electron accelerator.Each beam pulse that the radial pattern pulsatron produces forms the spot beam spot on the irradiation thing; Sequence spot beam spot is swept and is split into band shape after the scanning of scanning magnet device; Banded electron beam is drawn in the external world forming irradiation field through extraction window, thereby article are carried out irradiation processing.Extraction window can the insulating electron irradiation accelerator inner vacuum and ambient atmosphere, can let high-power electron beam penetrate again simultaneously and draw, thus use high-intensity film to process this extraction window usually, like titanium metal foil.Because high-power electron beam has very high power density; If on extraction window, form point-like; Then this point can sharply heat up in the extremely short time and cause extraction window to burn, and the damage of extraction window causes destructive infringement can for usually whole electron accelerator system.The effect of scanning magnet device makes it on extraction window, become band shape by point-like after overscanning electron beam exactly; Be implemented in the certain width to motion by the even irradiation of irradiation object; Beam power density is disperseed; Guarantee that the distribute power on the extraction window is balanced, guarantee that the electron beam extraction window is not damaged.
The scanning magnet device carries out work under the driving of the sweep current that scanning power supply produces, scanning power supply produces the scanning magnetic field of spoke value cyclic variation.The effect of the electron beam deflecting depends on the size of scanning magnetic field; And under the unsaturated situation of iron core; The size of scanning magnetic field is proportional to the size of sweep current; Therefore the sweep current of driven sweep magnet arrangement work has determined the scan deflection effect of electron beam, and its formation shape on extraction window.Sweep current is generally triangular wave, make the scanning magnet device produce positive and negative alternately, the magnetic field of big or small even variation.Usually, sweep current is little, and the electron beam deflecting is little, on extraction window, is swept the band shape that is split into to short; Sweep current is big, and the electron beam deflecting is big, on extraction window, is swept the band shape that is split into to long; If sweep current is a fixed value, then electron beam forms point-like on extraction window.In the electron accelerator system of operate as normal, the length that the quilt of electron beam is swept out all has definite scope, if the banded Kai Detai weak point of being swept, power density is too concentrated, then damages extraction window easily; If band shape is swept out oversizely; Then electron beam projects on the parts beyond the extraction window; This can damage said parts, so need monitor in real time the operating state of scanning magnet device during the electron accelerator system works, should prevent the inefficacy of sweep current; It comprises that current waveform distortion, electric current interrupt suddenly or is fixed value; To prevent that also sweep current is excessive or too small, when finding that sweep current occurs must accelerator system being quit work in order to avoid cause its damage when unusual.
In the existing scanning magnet device, major part is only to detect through in the inside of scanning power supply its output voltage being carried out lower limit, also has plenty of at load end sweep current is carried out the lower limit detection, comes the operating state of scanning magnet device is monitored.And this monitoring can not be to the inefficacy of sweep current, and current waveform distortion, electric current interrupt suddenly or be fixed value, and the excessive or too small overall monitor of carrying out of sweep current; For failure judgment for up to a scan period; About 100ms, reaction is slow, even if correct judgement is out of order; Possibly occur owing to delay time for a long time, electron accelerator does not in time quit work and causes the badly damaged problem yet.Therefore, there are a kind of needs that the multiple protection functions rapid-action is used in the scanning means of electron radiation accelerator that have.
Summary of the invention
In order to address the above problem, the invention provides a kind of scanning magnet device that in the electron radiation accelerator, uses, it comprises:
Be used to produce the scanning power supply of sweep current or scanning voltage;
Scanning magnet;
Scanning magnet line bag;
Be arranged on the source end sampling apparatus of scanning power supply end, its be used to sample said sweep current or scanning voltage signal;
The source end signal monitoring and protection circuit that is connected with source end sampling apparatus; It is characterized in that said source end signal monitoring and protection circuit comprises Signal Fail rapid analysis device, be used for whether said sweep current or scanning voltage signal are met predetermined waveform and monitor in real time.
In a further advantageous embodiment; Said source end signal monitoring and protection circuit also comprises comparator; It is used for said sweep current or scanning voltage signal and lower threshold and upper limit threshold are compared; When this sweep current or scanning voltage signal were greater than or equal to lower threshold and are less than or equal to upper limit threshold, this comparator was exported normal index signal, otherwise the output fault indication signal.
The present invention also provides a kind of scanning magnet device that in the electron radiation accelerator, uses, and it comprises:
Be used to produce the scanning power supply of sweep current or scanning voltage;
Scanning magnet;
Scanning magnet line bag;
Be arranged on the line of induction bag in the field circuit of scanning magnet, this line of induction bag be used to produce induced voltage and
The load end signal monitoring protective circuit that is connected with this line of induction bag is characterized in that said load end signal monitoring protective circuit comprises Signal Fail rapid analysis device, is used for whether said induced voltage signal is met predetermined waveform and monitors in real time.
In a further advantageous embodiment; Said load end signal monitoring protective circuit also comprises comparator; It is used for said induced voltage signal and lower threshold and upper limit threshold are compared; When this induced voltage signal was greater than or equal to lower threshold and is less than or equal to upper limit threshold, this comparator was exported normal index signal, otherwise the output fault indication signal.
The present invention also provides the electron accelerator that includes according to scanning magnet device of the present invention.
Through distinguishing signalization monitoring and protection circuit at the source of scanning magnet device end and load end; Can monitor in real time sample rate current and voltage simultaneously, thereby also can monitor the state of line bag of connecting line, the scanning magnet device of scanning power supply, scanning power supply in real time; Can also monitor in real time the magnitude range of sweep current, thereby can monitor the size variation scope of scanning magnetic field.Judgement unusual to sweep current or that lost efficacy can be accomplished in several milliseconds time; For example, improved reaction speed, the electron accelerator system has been realized effective protection less than 5ms; Help reducing fault, improve the life-span of electron accelerator system.
Description of drawings
Figure 1A-1C shows the scanning magnet device that in electron accelerator, uses that has multiple signal monitoring protective circuit according to of the present invention;
Fig. 2 shows the circuit structure diagram of Signal Fail rapid analysis device;
Fig. 3 shows the block diagram of signal monitoring protective circuit according to an embodiment of the invention;
Fig. 4 shows the particular circuit configurations that realizes comparing sampled signal and lower threshold;
Fig. 5 shows the particular circuit configurations that realizes comparing sampled signal and upper limit threshold;
Fig. 6 shows the sketch map of another kind of form of layout of the right half part of Fig. 1.
Embodiment
Figure 1A-1C shows the instance of the scanning magnet device with signal monitoring protective circuit that in electron accelerator, uses.Instance shown in Figure 1A, said scanning magnet device comprises scanning power supply 1, scanning magnet 2; Scanning magnet line bag 3; The connecting line 4 that connects scanning power supply 1 and scanning magnet line bag 3 is arranged on the source end sampling apparatus 5 of scanning power supply end, and it is between scanning power supply 1 and scanning magnet line bag 3; The source end signal monitoring and protection circuit 6 that is connected with source end sampling apparatus, wherein this source end signal monitoring and protection circuit 6 comprises Signal Fail rapid analysis device 13.Perhaps, in the optional embodiment of another one, shown in Figure 1B; Scanning magnet device according to the present invention comprises scanning power supply 1, scanning magnet 2, scanning magnet line bag 3; The connecting line 4 that connects scanning power supply 1 and scanning magnet line bag 3; Be arranged on the line of induction bag 7 in the field circuit of scanning magnet 2, and the load end signal monitoring protective circuit 8 that links to each other with line of induction bag 7, wherein this load end signal monitoring protective circuit 8 comprises Signal Fail rapid analysis device 13.In addition, in another optional embodiment, shown in Fig. 1 C; Scanning magnet device according to the present invention can also comprise scanning power supply 1; Scanning magnet 2, scanning magnet line bag 3, the connecting line 4 of connection scanning power supply 1 and scanning magnet line bag 3; Be arranged on the source end sampling apparatus 5 of scanning power supply end; It is between scanning power supply 1 and scanning magnet line bag 3, and the source end signal monitoring and protection circuit 6 that is connected with source end sampling apparatus is arranged on the line of induction bag 7 on the field circuit of scanning magnet 2; And the load end signal monitoring protective circuit 8 that links to each other with line of induction bag 7, wherein this source end signal monitoring and protection circuit 6 or load end signal monitoring protective circuit 8 or this two comprise Signal Fail rapid analysis device 13 (not shown in Fig. 1 C).At work; Scanning power supply 3 produces sweep current; This sweep current is generally triangular wave; Sweep current is sent to scanning magnet line bag 3 through electric power connection line 4, and the sweep current in scanning magnet line bag 3 makes scanning magnet 2 produce scanning magnetic field like this, and the size variation in magnetic field is confirmed by the triangular voltage sweep electric current of size variation.Current signal or voltage signal A that the source end sampling apparatus 5 that is connected with scanning power supply 1 can be sampled and produced and carried through power supply line 4 by scanning power supply 1; Source end signal monitoring and protection circuit is analyzed current signal or voltage signal A, and provides normal/fault indication signal C1.During changes of magnetic field in the scanning magnet 2, make line of induction bag 7 produce induced voltage signal B, load end signal monitoring protective circuit is analyzed this induced voltage signal B, and provides normal/fault indication signal C2.Index signal C1; C2 is connected to the control system (not shown) of electron accelerator; This control system can be according to index signal C1, and C2 controls the operating state of electron accelerator, thereby this electron accelerator system is realized effectively protection.Based on above-mentioned,, just can realize protecting the effect of electron accelerator as long as scanning magnet device according to the present invention comprises in active end signal monitoring and protection circuit and the load end signal monitoring protective circuit any.
When using source end signal monitoring and protection circuit or load end signal monitoring protective circuit that sampled signal is analyzed, whether Signal Fail rapid analysis device 13 wherein can meet predetermined waveform to sampled signal is monitored in real time.In case it is unusual to find that sampled signal occurs, this Signal Fail rapid analysis circuit 13 can be exported fault indication signal at once in several milliseconds time.As required, Signal Fail rapid analysis circuit can be designed to analyze the sampled signal of triangular wave, sine wave, square wave, fixed signal.The back will be elaborated to its operation principle.
Two electric leads of output that source end sampling apparatus 5 can be directly parallel in scanning power supply 1 through use to be to carry out voltage sample, also can be connected on the output of scanning power supply 1 and the resistor in the power lead 4 carries out current sample through use.Though can make judgement to the working condition of scanning power supply 1 according to voltage sampling signal; But can not judge the open circuit conditions of electric power connection line 4 or the open circuit conditions of scanning magnet line bag 3; So in the present invention, preferably utilize source end sampling apparatus to carry out current sample.
Use line of induction bag 7 to carry out voltage sample; Electric current in the line of induction bag 7 is very little; Be generally microampere order, so line of induction bag 7 adopts usually tiny enamelled wire coiling to form, line directly is generally 0.2mm～1mm; The coiling number of turn is generally 20 circles～200 circles, and the coiling number of turn is to confirm through the requirement of the intensity size of the magnetic flux density in the consideration scanning magnet and 8 pairs of sampled signals of load end signal monitoring protective circuit.Line of induction bag 7 is installed in the field circuit of scanning magnet 2; For example can be installed in the outside of scanning magnet line bag 3, as shown in Figure 1, perhaps wait other position in the yoke outside; As shown in Figure 6, this Fig. 6 shows the sketch map of the version that the right half part of structure shown in Figure 1 arranges.The scanning magnet device uses the triangular current drive signal usually, so the sampled voltage signal B that produces in the line of induction bag 7 is generally corresponding square wave voltage signal.
Fig. 2 shows an example of the particular circuit configurations of Signal Fail rapid analysis device 13.The voltage sampling signal B that obtains from line of induction bag 7 is a square wave voltage signal.First resistor R, 21, the second resistor R 22, capacitor C21 constitutes filter circuit, is used for filtering out sampled signal B owing to disturb spike and the burr that produces.The first operational amplifier N21, the 3rd resistor R 23, variable resistance RP21 constitutes amplifying circuit, can adjust multiplication factor through variable resistance RP21, and sampled signal B is amplified to suitable value.The second operational amplifier N22, the first diode D21, the second diode D22; The second capacitor C22, the 5th resistor R 25, the six resistor R 26; The 7th resistor R 27, the eight resistor R, 28, the nine resistor R 29 and the tenth resistor R 30 constitute square wave inefficacy rapid analysis circuit.When the square wave inefficacy, promptly input voltage is 0 o'clock, the 5th resistor R 25; The 6th resistor R 26, the seven resistor R 27, the eight resistor R 28; The 9th resistor R 29, the first diode D21, the second diode D22; The second capacitor C22 constitutes the potential-divider network from the anode of power supply to the negative terminal of power supply, and the voltage of the second capacitor C22 is the conduction voltage drop sum of the first diode D21 and the second diode D22, and promptly the voltage on the two ends of the second capacitor C22 is about 1.4V; Just the voltage of the positive input (+) of second operational amplifier N22 end is about 0.7V; And the voltage of negative input (-) end is about-0.7V, and the second operational amplifier N22 export high level, and feasible output that is connected the second operational amplifier N22 and the 21 line bags of the relay K between the supply voltage V+ can not adhesives; Break off between control signal VIO and the output signal C, promptly exporting signal C is fault indication signal.When square wave voltage signal is in positive half period; The second diode D22 conducting, the first diode D21 turn-offs, and the voltage at negative input (-) the end place of the second operational amplifier N22 is raised to high level; Voltage than positive input (+) end is high, this second operational amplifier N22 output low level; When square wave voltage signal is in negative half-cycle; The first diode D21 conducting, the second diode D22 turn-offs, and the voltage of positive input (+) end of the second operational amplifier N22 is pulled low to low level; Voltage than negative input (-) end is low, the second operational amplifier N22 output low level.In other words, no matter square wave voltage signal is in positive half period or negative half-cycle, the equal output low level of the second operational amplifier N22 makes relay K 21 line bag adhesives, and control signal VIO is to exporting signal C conducting.According to the aforesaid operations principle, when square wave just often, output signal C is normal index signal.The second capacitor C22 plays the voltage effect of keeping; The second capacitor C22 makes the voltage of negative input (-) end of the second operational amplifier N22 be higher than the voltage that positive input (+) is held all the time when promptly very lack (being less than 2ms usually) in the height of square wave to the time of low or low paramount level conversion; Therefore, second operational amplifier N22 output low level all the time.When square wave voltage signal lost efficacy; Incoming level is zero; The second capacitor C22 discharges through the loop that the 7th resistor R 27, the 9th resistor R 29, the 6th resistor R 26 form; Make the voltage of an end of negative input (-) end that is connected to the second operational amplifier N22 of the second capacitor C22 be-0.7V apace; And the voltage of the end that the positive input (+) that is connected to the second operational amplifier N22 is held is 0.7V, and this second operational amplifier N22 exports high level like this, and output signal C is a fault indication signal.The reaction time of output fault indication signal is determined by the time constant that the second capacitor C22 and the 7th resistor R 27, the nine resistor R 29, the six resistor R 26 form fast.Usually; Through selecting proper parameters to make the said reaction time greater than getting final product high level to the low level change-over time of square wave; Usually for example less than 5ms; And this Signal Fail rapid analysis device can be in the one-period of signal waveform monitoring in real time whether have waveform to lose efficacy to take place, thereby the rapid analysis when having realized square wave lost efficacy.
The circuit of above-mentioned Signal Fail rapid analysis device only is an example, and those skilled in the art can design the particular circuit configurations of other form, the form that can adopt example, in hardware, form of software or hardware and software to combine.
Fig. 3 shows the another one example of source end signal monitoring and protection circuit 6 or load end signal monitoring protective circuit 8.Except Signal Fail rapid analysis device 13, the signal monitoring protective circuit can also comprise the comparator with upper limit comparison circuit 11 and lower limit comparison circuit 12.
Can require the maximum of sampled signal A or B or effective value or mean value are preestablished a lower threshold and a upper limit threshold according to system works.When using comparator to know maximum or the effective value of sampled signal A or B, or mean value is when being greater than or equal to lower threshold and being less than or equal to upper limit threshold, and the signal monitoring protective circuit is exported normal index signal.When using comparator to know that maximum or effective value or the mean value of sampled signal are lower than lower threshold or are higher than upper limit threshold, this signal monitoring protective circuit output fault indication signal.Consider that some sampled signal possibly include spike and the burr that produces owing to disturbing; Perhaps some sampled signal itself is the AC signal of positive and negative symmetry; It is not best carrying out maximum or mean value analysis, so the present invention preferably compares and analyzes the effective value of sampled signal.
In alternate embodiments; One of source end signal monitoring and protection circuit 6 or load end signal monitoring protective circuit 8 can include only comparator or Signal Fail rapid analysis device or this two; And another comprises Signal Fail rapid analysis device, and this selects as required.For example, in one embodiment, the present invention can use end sampling device 5 pairs of sweep currents in source to sample, and this sample rate current signal is a triangular wave, and 6 in source end signal monitoring and protection circuit comprises comparator; Use 7 pairs of voltages of line of induction bag to sample simultaneously, the sampled voltage signal is a square wave, and load end signal monitoring protective circuit only comprises Signal Fail rapid analysis device 13.Same, as required, also can select 6 in source end signal monitoring and protection circuit to comprise Signal Fail rapid analysis device 13, load end signal monitoring protective circuit only comprises comparator simultaneously.Perhaps, one in source end signal monitoring and protection circuit 6 and the load end signal monitoring protective circuit 8 comprises comparator and Signal Fail rapid analysis device 13, and another comprises comparator and/or Signal Fail rapid analysis device 13.In another example; One in source end signal monitoring and protection circuit 6 and the load end signal monitoring protective circuit 8 comprises upper limit comparison circuit 11 or lower limit comparison circuit 12 and Signal Fail rapid analysis device 13, and another comprises lower limit comparison circuit 12 or upper limit comparison circuit 11.Existing to this explanation for example.Said scanning magnet device comprises source end signal monitoring and protection circuit 6 and load end signal monitoring protective circuit 8 simultaneously.At this moment, said source end signal monitoring and protection circuit 6 comprises upper limit comparison circuit 11 and Signal Fail rapid analysis device 13, and said load end signal monitoring protective circuit 8 comprises lower limit comparison circuit 12.Also can be, said source end signal monitoring and protection circuit 6 comprises lower limit comparison circuit 12 and Signal Fail rapid analysis device 13, and said load end signal monitoring protective circuit 8 comprises upper limit comparison circuit 11.Vice versa, and promptly said source end signal monitoring and protection circuit 6 comprises upper limit comparison circuit 11, and said load end signal monitoring protective circuit 8 comprises lower limit comparison circuit 12 and Signal Fail rapid analysis device 13; Perhaps said source end signal monitoring and protection circuit 6 comprises lower limit comparison circuit 12, and said load end signal monitoring protective circuit 8 comprises upper limit comparison circuit 11 and Signal Fail rapid analysis device 13.Here, the course of work of said Signal Fail rapid analysis device 13 with above said identical.Because the upper limit comparison circuit 11 in the comparator is mounted respectively in source end signal monitoring and protection circuit 6 and load end signal monitoring protective circuit 8 with lower limit comparison circuit 12, its operating process will be described below.
Said source end signal monitoring and protection circuit 6 SC service ceiling comparison circuits 11 or lower limit comparison circuit 12 compare sweep current or scanning voltage signal and upper limit threshold or lower threshold.Existing is that example is illustrated with upper limit comparison circuit 11.When the upper limit comparison circuit 11 in the said source end signal monitoring and protection circuit 6 when just sweep current or scanning voltage signal and upper limit threshold compare; If said sweep signal is during greater than upper limit threshold, then said source end signal monitoring and protection circuit output fault indication signal; When if said sweep signal is less than or equal to upper limit threshold, then said source end signal monitoring and protection circuit is exported normal index signal.Simultaneously, the lower limit comparison circuit 12 in the said load end signal monitoring protective circuit 8 compares induced voltage and lower threshold.When induced voltage during less than lower threshold, said load end signal monitoring protective circuit 8 output fault indication signals; When induced voltage is greater than or equal to lower threshold, the normal index signal of said load end signal monitoring protective circuit 8 outputs.When source end signal monitoring and protection circuit 6 and load end signal monitoring protective circuit 8 were exported normal index signal simultaneously, this expression sweep signal at this moment was in normal condition, and the scanning magnet device also is in normal operating state.
When said source end signal monitoring and protection circuit 6 comprises lower limit comparison circuit 12; And said load end signal monitoring protective circuit 8 is when comprising upper limit comparison circuit 11; Its course of work and above-mentioned similar, those skilled in the art readily appreciates that the course of work of this embodiment through top description.Here just repeated no more.
Above-mentioned comparator can also adopt the comparator of other form, can be the combination of hardware, software or hardware and software, as long as can realize above-mentioned comparing function.
Fig. 4 shows the instance that the particular circuit configurations of sampled signal effective value and lower threshold is compared in realization.Use resistor as source end sampling apparatus 5, the voltage signal A that obtains on it electric current is sampled is the triangular signal of small magnitude.The first operational amplifier N1, first resistor R 1, the second resistor R, 2, the five resistor R 5 and the first diode D1 constitute reverse amplification circuit, the negative half-cycle of signal A is amplified, and be output as on the occasion of signal.The second operational amplifier N2, the 3rd resistor R 3, the four resistor R, 4, the six resistor R 6 and the second diode D2 constitute the forward amplifying circuit, the positive half period of signal A is amplified, and be output as on the occasion of signal.The 7th resistor R 7, the eight resistor R 8, the first capacitor C1 constitute integrating circuit, and the magnitude of voltage on the 8th resistor R 8 can be represented the effective value of sampled signal A, and it is sent to the 3rd operational amplifier N3 through the 9th resistor R 9.Variable resistance RP1 constitutes threshold adjuster.Can obtain different setting voltages, i.e. lower threshold through regulating variable resistance RP1.The 3rd operational amplifier N3 compares the effective value and the lower threshold of sampled signal, if the effective value of sampled signal is greater than or equal to lower threshold, and the 3rd operational amplifier N3 output low level; Be connected the relay K 1 line bag adhesive between the output of high level and the 3rd operational amplifier N3, relay K 1 is connected control signal VIO, and output signal C is normal index signal; If the effective value of sampled signal is lower than lower threshold, then the 3rd operational amplifier N3 exports high level; The relay line bag that is connected between the output of high level and the 3rd operational amplifier N3 can not adhesive, and relay breaks off control signal VIO, and output signal C is a fault indication signal, and this expression needs handling failure.Relay is an output element, with control signal and circuit board isolated from power, plays buffer action.
Fig. 5 shows the instance that the particular circuit configurations of sampled signal and upper limit threshold is compared in realization.The sampled signal A that end sampling apparatus 5 obtains from the source is the triangle wave voltage signal of small magnitude.The first operational amplifier N11, resistor R 11, resistor R 12, resistor R 15 and diode D11 constitute reverse amplification circuit, the negative half-cycle of signal A is amplified, and be output as on the occasion of signal.The second operational amplifier N12, resistor R 13, resistor R 14, resistor R 16 and diode D12 constitute the forward amplifying circuit, the positive half period of signal A is amplified, and be output as on the occasion of signal.Resistor R 17, resistor R 18, capacitor C11 constitutes integrating circuit, and the magnitude of voltage that obtains on the resistor R 18 can be represented the effective value of sampled signal A, and it is sent to the 3rd operational amplifier N13 through resistor R 19.Variable resistance RP11 constitutes threshold adjuster; Can obtain different setting voltages through regulating variable resistance RP11; It is upper limit threshold; The 3rd operational amplifier N13 compares the effective value and the upper limit threshold of sampled signal, if the effective value of sampled signal is less than or equal to upper limit threshold, and the 3rd operational amplifier N13 output low level; Be connected the relay K 11 line bag adhesives between the output of high level and the 3rd operational amplifier N13, relay is connected control signal VIO, and output signal C is normal index signal; If the effective value of sampled signal is higher than upper limit threshold, the 3rd operational amplifier N13 exports high level; The relay line bag that is connected between the output of high level and the 3rd operational amplifier N13 can not adhesive, and relay breaks off control signal VIO, and output signal C is a fault indication signal, and this expression needs handling failure.Relay is an output element, with control signal and circuit board isolated from power, plays buffer action.
Although adopted the circuit structure that separates here lower threshold comparison circuit and upper limit threshold comparison circuit are described; But those skilled in the art knows these two comparison circuits and can integrate making, comprises the combining form of example, in hardware, form of software or hardware and software.The present invention only is a kind of circuit structure that illustrates comparator; But the comparator of realizing principle of the present invention is not limited to above-mentioned instantiation; Those skilled in the art can adopt any type of comparator configuration, as long as can realize above-mentioned comparing function.
Can distinguish independent making according to above-mentioned source end signal supervisory circuit of the present invention and load end signal monitoring circuit, also can integrate making, perhaps also can choose one of which wantonly and make, as long as can satisfy the demand of monitoring.
The present invention has explained principle of the present invention with instantiation, but is in no way intended to limit the scope of the invention to above-mentioned instantiation, and limits protection scope of the present invention through affiliated claims.
Claims (4)
1. scanning magnet device that in the electron radiation accelerator, uses, it comprises:
Be used to produce the scanning power supply of sweep current or scanning voltage;
Scanning magnet;
Scanning magnet line bag;
Be arranged on the line of induction bag in the field circuit of scanning magnet, this line of induction bag be used to produce induced voltage and
The load end signal monitoring protective circuit that is connected with this line of induction bag is characterized in that said load end signal monitoring protective circuit comprises Signal Fail rapid analysis device, is used for whether said induced voltage signal is met predetermined waveform and monitors in real time.
2. according to the scanning magnet device of claim 1; Wherein said load end signal monitoring protective circuit also comprises comparator; Be used for said induced voltage signal and lower threshold and upper limit threshold are compared; When this induced voltage signal was greater than or equal to lower threshold and is less than or equal to upper limit threshold, this comparator was exported normal index signal, otherwise the output fault indication signal.
3. according to the scanning magnet device of claim 1 or 2, also comprise:
Be arranged on the source end sampling apparatus of scanning power supply end, its be used to sample said sweep current or scanning voltage signal;
The source end signal monitoring and protection circuit that is connected with source end sampling apparatus; It comprises comparator; Be used for said sweep current or scanning voltage signal and lower threshold and upper limit threshold are compared; When this sweep current or scanning voltage signal were greater than or equal to lower threshold and are less than or equal to upper limit threshold, this comparator was exported normal index signal, otherwise the output fault indication signal.
4. electron radiation accelerator, it comprises the scanning magnet device according to one of claim 1-3.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103068145A (en) * | 2013-01-04 | 2013-04-24 | 中国原子能科学研究院 | Electromagnet magnetic field wave form synthetic method and device thereof |
| CN103762007A (en) * | 2014-01-20 | 2014-04-30 | 汇佳生物仪器（上海）有限公司 | Two-dimensional scanning high-energy X-ray irradiation system with electron linear accelerator |
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| US5017789A (en) * | 1989-03-31 | 1991-05-21 | Loma Linda University Medical Center | Raster scan control system for a charged-particle beam |
| US5311028A (en) * | 1990-08-29 | 1994-05-10 | Nissin Electric Co., Ltd. | System and method for producing oscillating magnetic fields in working gaps useful for irradiating a surface with atomic and molecular ions |
| CN1154179A (en) * | 1994-06-10 | 1997-07-09 | 日新电机股份有限公司 | Fast magnetic scanning of heavy ion beams |
| CN1302440A (en) * | 1999-04-12 | 2001-07-04 | Gsi重离子研究有限公司 | Device and method for controlling raster scanner feedback in ion-beam therapy |
| CN1282078A (en) * | 1999-06-04 | 2001-01-31 | 株式会社荏原制作所 | Electron beam illuminating device |
| CN101110280A (en) * | 2006-07-17 | 2008-01-23 | 清华同方威视技术股份有限公司 | Irradiation device and its control method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103068145A (en) * | 2013-01-04 | 2013-04-24 | 中国原子能科学研究院 | Electromagnet magnetic field wave form synthetic method and device thereof |
| CN103762007A (en) * | 2014-01-20 | 2014-04-30 | 汇佳生物仪器（上海）有限公司 | Two-dimensional scanning high-energy X-ray irradiation system with electron linear accelerator |
| CN103762007B (en) * | 2014-01-20 | 2016-08-17 | 汇佳生物仪器（上海）有限公司 | Electron linear accelerator two-dimensional scan high-energy X-ray irradiation system |
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Application publication date: 20120620 |