CN102507583A - Microscopic observation method for microsection - Google Patents
Microscopic observation method for microsection Download PDFInfo
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- CN102507583A CN102507583A CN2011103399946A CN201110339994A CN102507583A CN 102507583 A CN102507583 A CN 102507583A CN 2011103399946 A CN2011103399946 A CN 2011103399946A CN 201110339994 A CN201110339994 A CN 201110339994A CN 102507583 A CN102507583 A CN 102507583A
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- microsection
- sample
- plasticine
- placing
- slide
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Abstract
The invention provides a microscopic observation method for a microsection, which includes the steps: A, placing a piece of plasticine on a slide; B, horizontally placing a microsection sample to be tested on the plasticine of the slide, placing an even retaining washer on a section of the microsection, vertically applying force to the retaining washer and tightly pressing the bottom of the microsection sample into the plasticine; and C, placing the slide in an observation area of a microscope to observe the sample. The microscopic observation method has the advantages that the steps of the method are simple and easy in operation, placement evenness of the microsection sample is effectively improved, clearness of observing areas for the microsection is uniform, and integral experimental speed and efficiency are increased.
Description
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Technical field
the present invention relates to failure analysis field, particularly a kind of microscopic examination method of microsection.
Background technology
microsection is the detection means of the widely used observation sample of failure analysis engineering technical personnel cross section inner structure.In the process of microsection preparation, whether smooth grinding be the good and bad key point of judgement sample end product.At present; The operation of grinding is to lean on experimenter's hand lapping, main accumulation through experience to guarantee the flatness of grinding basically, since be underhand polish; So always can there be " out-of-flatness " on the microcosmic; These " out-of-flatnesses " are that naked eyes can't be observed, but can be very obvious at microscopically, thereby cause whole sample not observed simultaneously.In normal operation; Such situation just needs the engineering staff to do over again again once more to grind the flatness that guarantees sample, and so sometimes doing over again need be repeatedly, up to sample absolute smooth till; The prolongation that this will directly cause test period has reduced conventional efficient.
prepare in the process of microsection the most engineering technician; The capital runs into above such situation; Therefore, how to guarantee just can observe well and become failure analysis field problem demanding prompt solution once grinding the back to microsection.
Summary of the invention
Need repeatedly to grind in order to solve existing microsection sample observation analysis, thereby cause the long problem of test period, the present invention proposes following technical scheme:
A kind of microscopic examination method of microsection, this method may further comprise the steps:
A, on micro slide, place a plasticine;
B, microsection sample levels to be measured is positioned on the plasticine of micro slide, on the microsection cross section, places smooth protection pad,, microsection sample bottom is pressed in the plasticine the vertical application of force of protection pad;
C, micro slide is positioned over microscopical observation district, carries out sample and observe.
as a kind of preferred version of the present invention, the protection pad among the said step B has two, is positioned over the both sides on microsection sample top respectively.
The beneficial effect that
the present invention brings is: the inventive method step is simple to operation; Effectively improved the flatness that the microsection sample is placed; Sharpness is consistent when making each zone of observing microsection, has improved whole speed of experiment and efficient.
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Embodiment
Set forth in the face of preferred embodiment of the present invention down in detail
, thereby so that advantage of the present invention and characteristic can be easier to it will be appreciated by those skilled in the art that protection scope of the present invention is made more explicit defining.
A kind of microscopic examination method of microsection, this method may further comprise the steps:
A, on micro slide, place a plasticine;
B, microsection sample levels to be measured is positioned on the plasticine of micro slide; On the microsection cross section, place two smooth protection pads,, make the stressed unanimity of two block protection pads the vertical application of force of protection pad; Microsection sample bottom is pressed in the plasticine; Through the flatness of plasticine adjustment microsection sample, thereby guarantee no matter whether the microsection sample is definitely smooth, when the microscopic examination regional observation, can keep definitely smooth;
C, at last micro slide is positioned over microscopical observation district, can carries out sample and observe, thereby a plurality of viewing area sharpness that guaranteed sample are consistent.
the above; Be merely embodiment of the present invention; But protection scope of the present invention is not limited thereto; Any those of ordinary skill in the art are in the technical scope that the present invention disclosed, and variation or the replacement that can expect without creative work all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain that claims were limited.
Claims (2)
1. the microscopic examination method of a microsection, it is characterized in that: this method may further comprise the steps:
A, on micro slide, place a plasticine;
B, microsection sample levels to be measured is positioned on the plasticine of micro slide, on the microsection cross section, places smooth protection pad,, microsection sample bottom is pressed in the plasticine the vertical application of force of protection pad;
C, micro slide is positioned over microscopical observation district, carries out sample and observe.
2. the microscopic examination method of a kind of microsection according to claim 1, it is characterized in that: the protection pad among the said step B has two, is positioned over the both sides on microsection sample top respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011103399946A CN102507583A (en) | 2011-11-02 | 2011-11-02 | Microscopic observation method for microsection |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011103399946A CN102507583A (en) | 2011-11-02 | 2011-11-02 | Microscopic observation method for microsection |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102507583A true CN102507583A (en) | 2012-06-20 |
Family
ID=46219690
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011103399946A Pending CN102507583A (en) | 2011-11-02 | 2011-11-02 | Microscopic observation method for microsection |
Country Status (1)
| Country | Link |
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| CN (1) | CN102507583A (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101403678A (en) * | 2008-09-19 | 2009-04-08 | 山西太钢不锈钢股份有限公司 | Metallic phase automatic detection method for stainless steel casting blank foreign matter |
| CN101477009A (en) * | 2009-01-21 | 2009-07-08 | 哈尔滨工业大学 | Method for testing boundary strength between fiber bundle and substrate of carbon fiber reinforced carbon materials |
| CN101718647A (en) * | 2009-12-14 | 2010-06-02 | 哈尔滨工业大学 | Preparation method of conductive scanning metallographic sample |
-
2011
- 2011-11-02 CN CN2011103399946A patent/CN102507583A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101403678A (en) * | 2008-09-19 | 2009-04-08 | 山西太钢不锈钢股份有限公司 | Metallic phase automatic detection method for stainless steel casting blank foreign matter |
| CN101477009A (en) * | 2009-01-21 | 2009-07-08 | 哈尔滨工业大学 | Method for testing boundary strength between fiber bundle and substrate of carbon fiber reinforced carbon materials |
| CN101718647A (en) * | 2009-12-14 | 2010-06-02 | 哈尔滨工业大学 | Preparation method of conductive scanning metallographic sample |
Non-Patent Citations (1)
| Title |
|---|
| 宗斌 等: "倒置式金相显微镜的操作规程与实践教学", 《实验室科学》, no. 1, 29 February 2008 (2008-02-29) * |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20120620 |