CN102384878B - 显微组件下跨尺度原位微纳米拉伸/压缩液压驱动测试装置 - Google Patents
显微组件下跨尺度原位微纳米拉伸/压缩液压驱动测试装置 Download PDFInfo
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- CN102384878B CN102384878B CN 201110353413 CN201110353413A CN102384878B CN 102384878 B CN102384878 B CN 102384878B CN 201110353413 CN201110353413 CN 201110353413 CN 201110353413 A CN201110353413 A CN 201110353413A CN 102384878 B CN102384878 B CN 102384878B
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CN 201110353413 CN102384878B (zh) | 2011-11-10 | 2011-11-10 | 显微组件下跨尺度原位微纳米拉伸/压缩液压驱动测试装置 |
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CN103091164A (zh) * | 2013-01-15 | 2013-05-08 | 天津大学 | 一种适用于微纳米薄膜材料的双系统拉伸装置 |
CN103558419B (zh) * | 2013-11-15 | 2015-12-09 | 江苏尚飞光电科技有限公司 | 一种扫描近场光学检测台 |
CN112730896A (zh) * | 2020-12-21 | 2021-04-30 | 湘潭大学 | 一种与原子力显微镜联用的材料微顶推装置及其使用方法 |
CN117647727B (zh) * | 2024-01-30 | 2024-04-02 | 丰顺县锦顺科技有限公司 | 一种pcb刚性电路板检测用设备 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5606168A (en) * | 1993-04-30 | 1997-02-25 | Centre National De La Recherche Scientifique | In situ tensile testing machine and sample for a scanning electron microscope |
CN101261206A (zh) * | 2008-01-30 | 2008-09-10 | 吉林大学 | 材料纳米力学性能测试中的两自由度加载装置 |
CN101520389B (zh) * | 2009-03-27 | 2011-05-18 | 吉林大学 | 超精密跨尺度原位纳米压痕刻划测试系统 |
CN202351139U (zh) * | 2011-11-10 | 2012-07-25 | 吉林大学 | 显微组件下跨尺度原位微纳米拉伸/压缩液压驱动测试装置 |
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JP2002062229A (ja) * | 2000-08-22 | 2002-02-28 | Rohm Co Ltd | 微小部品用試験装置 |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5606168A (en) * | 1993-04-30 | 1997-02-25 | Centre National De La Recherche Scientifique | In situ tensile testing machine and sample for a scanning electron microscope |
CN101261206A (zh) * | 2008-01-30 | 2008-09-10 | 吉林大学 | 材料纳米力学性能测试中的两自由度加载装置 |
CN101520389B (zh) * | 2009-03-27 | 2011-05-18 | 吉林大学 | 超精密跨尺度原位纳米压痕刻划测试系统 |
CN202351139U (zh) * | 2011-11-10 | 2012-07-25 | 吉林大学 | 显微组件下跨尺度原位微纳米拉伸/压缩液压驱动测试装置 |
Non-Patent Citations (5)
Title |
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A tensile text device for in situ atomic force microscope mechanical texting;Eberhard Bamberg;《PrecisionEngineering》;20061231(第30期);71-84 * |
Eberhard Bamberg.A tensile text device for in situ atomic force microscope mechanical texting.《PrecisionEngineering》.2006,(第30期),71-84. |
嵇佳斌 等.测试原位纳米压痕的微小型加载装置.《吉林大学学报(工业版)》.2010,第40卷(第2期),471-474. * |
杨洁 等.用于应力应变和疲劳显微分析的原位拉伸系统的研制.《现代仪器》.2011,(第3期),21-26. |
用于应力应变和疲劳显微分析的原位拉伸系统的研制;杨洁 等;《现代仪器》;20110630(第3期);21-26 * |
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