CN102364295A - A method for measuring the thickness of crystal ingot edge skin - Google Patents
A method for measuring the thickness of crystal ingot edge skin Download PDFInfo
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- CN102364295A CN102364295A CN2011101800481A CN201110180048A CN102364295A CN 102364295 A CN102364295 A CN 102364295A CN 2011101800481 A CN2011101800481 A CN 2011101800481A CN 201110180048 A CN201110180048 A CN 201110180048A CN 102364295 A CN102364295 A CN 102364295A
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- 238000000034 method Methods 0.000 title claims abstract description 10
- 239000013078 crystal Substances 0.000 title abstract description 6
- 238000005259 measurement Methods 0.000 claims abstract description 22
- 238000005520 cutting process Methods 0.000 claims abstract description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000010985 leather Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
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Abstract
Description
技术领域 technical field
本发明涉及在光伏切硅锭工艺中一种晶锭边皮厚度的测量方法。The invention relates to a method for measuring the thickness of a crystal ingot edge in a photovoltaic silicon ingot cutting process.
背景技术 Background technique
目前检测晶锭开方是否偏移,采用的是分别测量开方后四面边皮的厚度来完成。作业指导书要求是以边皮对应晶锭底部的一面为测量基准面,以X轴78mm,Y轴63mm为测量点。开方边皮厚度的控制范围为17+/-3mm。现测量采点均为目视,因边皮存在锥面,固测量点的偏差严重影响测量数值,导致开方偏移的误判。At present, the detection of whether the square of the crystal ingot is offset is completed by measuring the thickness of the four side skins after the square is opened. The work instructions require that the side of the side skin corresponding to the bottom of the ingot be the measurement reference plane, and the X-axis 78mm and the Y-axis 63mm be the measurement points. The control range of square skin thickness is 17+/-3mm. The current measurement points are all visual, because there is a tapered surface on the edge, and the deviation of the solid measurement point seriously affects the measurement value, resulting in misjudgment of the square root offset.
发明内容 Contents of the invention
本发明所要解决的技术问题是:提供一种晶锭边皮厚度的测量方法,保证每次测量点均固定落在作业指导书要求X轴78mm,Y轴63mm的位置。The technical problem to be solved by the present invention is to provide a method for measuring the thickness of the skin of the crystal ingot, so as to ensure that each measurement point is fixed at the position of 78 mm on the X axis and 63 mm on the Y axis as required by the work instruction.
本发明解决其技术问题所采用的技术方案是:一种晶锭边皮厚度的测量方法,首先制作一种工装,该工装的相邻两侧边具有与边皮贴合的相互垂直的折边,在工装上设置测量位置标记点,该测量位置标记点到与边皮的基准底面贴合的折边内侧的距离为63mm,到与边皮的侧面贴合的折边内侧的距离为78mm,利用该工装进行边皮厚度测量时,只需要将该工装1紧贴边皮切割面,折边紧贴边皮的基准底面和侧面,工装上的测量位置标记点即对应于作业指导书要求的X轴78mm、Y轴63mm的位置,此时用游标卡尺测量该测量位置标记点处的边皮厚度即可。The technical solution adopted by the present invention to solve the technical problem is: a method for measuring the thickness of the skin of an ingot. First, a tool is made, and the adjacent two sides of the tool have mutually perpendicular folds that fit the skin , set the measurement position mark point on the tooling, the distance from the measurement position mark point to the inner side of the fold that fits with the reference bottom surface of the edge is 63mm, and the distance to the inner side of the fold that fits with the side of the edge is 78mm, When using this tool to measure the edge skin thickness, you only need to put the tooling 1 close to the cut surface of the edge skin, and the folded edge is close to the reference bottom surface and side surface of the edge skin. The measurement position marks on the tool correspond to the requirements of the work instruction At the position of 78mm on the X axis and 63mm on the Y axis, use a vernier caliper to measure the thickness of the skin at the marked point of the measurement position.
本发明的有益效果是:通过本方法可以简单、快捷的固定测量点,避免因边皮的锥度产生取点误差,确保测量数值的准确性,从而减少误判。且本工装可长期反复使用,操作简单,贴覆于工件表面即可取点。The beneficial effects of the invention are: the method can simply and quickly fix the measurement point, avoid point selection errors due to the taper of the edge skin, ensure the accuracy of the measurement value, thereby reducing misjudgment. Moreover, this tool can be used repeatedly for a long time, and the operation is simple, and the point can be picked up by sticking to the surface of the workpiece.
附图说明 Description of drawings
下面结合附图和实施例对本发明进一步说明;Below in conjunction with accompanying drawing and embodiment the present invention is further described;
图1是本发明的立体图;Fig. 1 is a perspective view of the present invention;
图2是本发明的使用状态侧视图;Fig. 2 is a side view of the use state of the present invention;
图3是本发明的使用状态立体图;Fig. 3 is a perspective view of the use state of the present invention;
图中,1.工装,2.边皮,3.折边,4.圆孔,5.工装尖角。In the figure, 1. tooling, 2. edges, 3. folded edges, 4. round holes, 5. sharp corners of tooling.
具体实施方式 Detailed ways
一种晶锭边皮厚度的测量方法,首先制作一种工装,该工装的相邻两侧边具有与边皮贴合的相互垂直的折边,在工装上设置测量位置标记点,该测量位置标记点到与边皮的基准底面贴合的折边的距离为63mm,到与边皮的侧面贴合的折边的距离为78mm,利用该工装进行边皮厚度测量时,只需要将该工装1紧贴边皮切割面,折边紧贴边皮的基准底面和侧面,工装上的测量位置标记点即对应于作业指导书要求的X轴78mm、Y轴63mm的位置,此时用游标卡尺测量该测量位置标记点处的边皮厚度即可。A method for measuring the thickness of an ingot edge. Firstly, a tooling is made. The adjacent two sides of the tooling have mutually perpendicular folded edges that fit with the edge skin. Marking points for measuring positions are set on the tooling. The measuring position The distance from the marking point to the hem that is attached to the reference bottom surface of the edge is 63mm, and the distance to the edge that is attached to the side of the edge is 78mm. When using this tool to measure the thickness of the edge, you only need to use the tool 1 Close to the cutting surface of the edge skin, and the folded edge is close to the reference bottom and side of the edge skin. The measurement position marking points on the tooling correspond to the positions of 78mm on the X axis and 63mm on the Y axis as required by the work instructions. At this time, use a vernier caliper to measure The skin thickness at the marked point of the measurement position is enough.
实施例:Example:
如图1、2、3所示,该晶锭边皮厚度测量点定位工装为长方形,长度为78mm,宽度为63mm,该工装的长、宽均等于作业指导书测量要求所规定的X轴78mm,Y轴63mm。在工装1的相邻两侧边具有与边皮2贴合的折边3,折边3的宽度与边皮2的基准底面宽度一致,避免与边皮贴合时架空,从而保证工装与边皮完全贴合。工装1一侧的折边3上设置两个圆孔4,此目的是为了固定工装基准面,避免此设计工装X轴与Y轴的混淆。在图1、2和3所示的实施例中,圆孔设置在长度方向的折边3上,该工装的折边对面的工装尖角5即为测量位置标记点。As shown in Figures 1, 2, and 3, the tooling for positioning the measuring point of the thickness of the ingot is rectangular, with a length of 78mm and a width of 63mm. The length and width of the tooling are equal to the X-axis 78mm specified in the measurement requirements of the work instruction , Y-axis 63mm. On the adjacent two sides of the tooling 1, there is a folded
使用时首先将工装1有圆孔4面为底面垂直的贴附于要测量的边皮2上,工装1紧贴边皮切割面即无锥度的面。贴合后的效果如图2和3所示,要求工装1内边缘与边皮2是密合的,此时用游标卡尺测量角对准工装尖角5收取读数即可。为了使测量手法更加顺畅,也可按以上要求先将工装1紧密的贴合于边皮2上,在工装尖角5处用笔描点,拿下工装1,游标卡尺对准记号点测量读数。When in use, at first attach the frock 1 with the
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CN 201110180048 CN102364295B (en) | 2011-06-30 | 2011-06-30 | Method for measuring thickness of side piece of crystal ingot |
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Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0750972A1 (en) * | 1995-06-30 | 1997-01-02 | Tokyo Seimitsu Co.,Ltd. | Ingot slicing machine with built-in grinder |
CN201264318Y (en) * | 2008-10-14 | 2009-07-01 | 浙江华友电子有限公司 | Silicon chip locating device |
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0750972A1 (en) * | 1995-06-30 | 1997-01-02 | Tokyo Seimitsu Co.,Ltd. | Ingot slicing machine with built-in grinder |
CN201264318Y (en) * | 2008-10-14 | 2009-07-01 | 浙江华友电子有限公司 | Silicon chip locating device |
Non-Patent Citations (1)
Title |
---|
李保军等,1: "多线切割工艺中切割线直径对翘曲度影响的研究", 《电子工业专用设备》 * |
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Address after: 213031, No. 2, Tianhe Road, Xinbei Industrial Park, Jiangsu, Changzhou Patentee after: trina solar Ltd. Address before: 213031, No. 2, Tianhe Road, Xinbei Industrial Park, Jiangsu, Changzhou Patentee before: CHANGZHOU TRINA SOLAR ENERGY Co.,Ltd. Address after: 213031, No. 2, Tianhe Road, Xinbei Industrial Park, Jiangsu, Changzhou Patentee after: TRINASOLAR Co.,Ltd. Address before: 213031, No. 2, Tianhe Road, Xinbei Industrial Park, Jiangsu, Changzhou Patentee before: trina solar Ltd. |
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