CN102360045A - Thermal vacuum test method for power device - Google Patents
Thermal vacuum test method for power device Download PDFInfo
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- CN102360045A CN102360045A CN2011101679891A CN201110167989A CN102360045A CN 102360045 A CN102360045 A CN 102360045A CN 2011101679891 A CN2011101679891 A CN 2011101679891A CN 201110167989 A CN201110167989 A CN 201110167989A CN 102360045 A CN102360045 A CN 102360045A
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Abstract
The invention relates to a thermal vacuum test method for a power device. The method comprises the following steps of: determining the severity of a test through a reliability index required by the test or rated by a tested power device so as to determine the temperature variable speed, the limit temperature and the pressure variable speed of the test and a pressure value required by the test, and then putting the test power device into a thermal vacuum test box; after a debugged and tested test box is sealed and a tested test system is switched on, reducing pressure in the test box to the pressure value required by the test according to a set pressure variable speed; according to a set temperature variable speed, reducing/raising a temperature to a limiting temperature, keeping the limiting temperature for a certain period of time, and testing the electric property of the tested power device at the same time; and after the steps are circulated for stipulated cycle times, finally testing the electric property of the tested power device to determine whether the tested power device meets test requirements or not. By the method, a thermal vacuum simulation cyclic test for the power device can be guided, the reliability of an aerospace power device can be improved, and the thermal design of the power device can be guided.
Description
Technical field
The invention belongs to the thermal vacuum test technical field, be specifically related to a kind of space flight and use the power device thermal vacuum test method.
Background technology
Along with the development of China a new generation spacecraft technology, spacecraft function closeness increases, and space hot vacuum environment effect becomes with the influence of power device reliability to space flight and becomes increasingly conspicuous, and becoming influences spacecraft long-life, highly reliable key factor.Have the fact to show, China's some satellite in orbit has device function parameter drift or inefficacy in the shadow region by the earth turns to the process of sunny slope, and the partial function of satellite occurs losing efficacy along with the prolongation of time in orbit on the other hand.These situation all show: though we had done the thermal vacuum test of space environment simulation to spacecraft integral body, subsystem and assembly, these tests can not guarantee the long-life operation that spacecraft is safe and reliable to a certain extent.So along with further developing of spationautics, the thermal vacuum test technology of the critical power ratio device in the spacecraft has been put on the agenda, and the thermal vacuum test method of power device just becomes the basis of space flight with Primary Component thermal vacuum test technology.
The power device thermal vacuum test method is used in space flight, to realizing space flight with power device through engineering approaches application target, improves space flight with power device quality and reliability, is significant.U.S. army mark MIL-STD-1540, national military standard GJB " (the satellite environment testing requirements ": comprised thermal vacuum test method in this test standard, but do not comprised the thermal vacuum test method of power device to satellite component, subsystem and whole star.The power device thermal vacuum test method; To improving space flight with power long term device reliability; Improve China's thermal vacuum test facility level, instruct research institute, Subscriber Unit to find and solve the inherent shortcoming of product existence fully and effectively, use defective that significance is arranged.
Summary of the invention
The technical matters that (one) will solve
The object of the invention provides a kind of power device thermal vacuum test method, to improve space flight with power device quality and reliability.
(2) technical scheme
In order to solve the problems of the technologies described above, the present invention provides a kind of power device thermal vacuum test method, may further comprise the steps:
S101 is placed normal temperature, atmospheric pressure environment to be tried the electrical property of power device with trying power device;
S102 is installed in power device in the thermal vacuum test case;
S103 keeps the original ambient temperature and the pressure of thermal vacuum test case constant, is switched on to trying power device, carries out electric performance test;
S104 is reduced to the testing requirements force value by the pressure and speed rate of setting with the chamber internal pressure;
S105, by the warm variable Rate reductions/rising of setting test the said power device of the temperature inside the box to testing requirements need be proved to be the limit that can bear low/high-temperature, monitor the variation of power device electrical property described in the whole process;
S106, keep the said limit low/time that high-temperature continue to be set, said power device is carried out the sensitive parameter test, and monitors the variation of said sensitive parameter;
S107, by the warm variable Rate of said setting, risings/reduction test the temperature inside the box to the limit low/high-temperature, monitor the variation of power device electrical property described in the whole process;
S108, keep the limit low/high-temperature continues time of setting, said power device carried out the sensitive parameter test, and monitor the variation of said sensitive parameter;
S109, normal if said electric performance test and sensitive parameter change, the then loop ends of one whole, repeating step S105-S108 is to the cycle index of accomplishing testing requirements; If it is undesired that electric performance test or sensitive parameter described in certain circulation change, then off-test; If all the variation of electric performance test and sensitive parameter described in the circulation is all normal, then change step S100 over to;
S100 is adjusted to original ambient temperature and pressure state with the temperature and pressure of chamber, and power device is carried out electric performance test;
S111 under take-off output device to normal temperature, the atmospheric pressure environment, carries out final electric performance test, off-test to it in limiting time.
Preferably, also comprise step: S201 before the said step S103, test said thermal vacuum test case and whether seal, and the whether conducting of said thermal vacuum test case and external control system, if blow-by or not conducting are then debugged up to sealing and conducting.
Preferably, according to the reliability index confirmed test severity of testing requirements or said power device nominal, thereby confirm said pressure and speed rate, warm variable Rate and testing requirements force value.
Preferably, the testing requirements force value among the said step S104 is not more than 1.3 * 10
-3Handkerchief; Said pressure and speed rate is not more than 10 kPas/minute.
Preferably, the time that said chamber internal pressure drops to the process of 20 handkerchiefs was at least 10 minutes, and in this process, detecting said power device has corona free and arc discharge phenomenon; When pressure drops to when being lower than 11.3 handkerchiefs, detect to have or not micro discharge to take place.
Preferably, said limit high-temperature is+125 degrees centigrade, and limit low temperature is-55 degrees centigrade; The duration that stops at limit high-temperature was at least 6.5 hours, and the duration that stops at limit low temperature was at least 2.5 hours; Said temperature variable Rate is not less than 1 degrees celsius/minute, and when temperature stabilization, the temperature fluctuation in the said chamber is no more than 3 degrees centigrade/hour.
Preferably; When chamber pressure is reduced to critical pressure value; The temperature inside the box is tested in warm variable Rate risings/reductions according to setting, temperature rise to/reduce to tried under the power device operative condition the highest/during minimum temperature, power device cuts off the power supply; Wait for certain hour so that power device is discharged to steady state (SS) fully, the chamber internal pressure reaches 1.3 * 10
-3During handkerchief, again to the power device energising, and according to the warm variable Rate of setting, rising/reduction test the temperature inside the box need prove the limit high temperature/low temperature that can bear to testing desired given the test agent, monitors the variation of power device electrical property described in the whole process.
Preferably, the cycle index of testing requirements is 10～500 times among the said step S109; During accomplishing said cycle index, if interruption times surpass the testing requirements cycle index 10% or when interrupting surpassing 12 hours, then test from S105 and restart circulation.
Preferably, if circulation for the first time or last circulation, the time of said setting was at least 9 hours.
Preferably, the limiting time among the said step S111 is 1～24 hour.
(3) beneficial effect
The present invention is through reliability index testing requirements or that tried the power device nominal; The confirmed test severity; Thereby after confirmed test temperature variable Rate, ultimate temperature, pressure and speed rate and the testing requirements force value, will be tried power device and put into the thermal vacuum test case; Reduce the chamber internal pressure to the testing requirements force value by the pressure and speed rate of setting; Ultimate temperature falls/is warming up in the warm variable Rate by setting, and keeps the ultimate temperature certain hour, is carried out electric performance test to trying power device simultaneously; After being circulated to the cycle index of regulation more than the repetition, carried out final electric performance test, confirm to be tried whether Pass Test requirement of power device trying power device.Power device thermal vacuum test method science of the present invention, accurate; Reliability is high, can instruct and carry out the power device thermal vacuum test, improves the reliability of space flight with power device; Instruct the thermal design of power device, for the formulation of power device thermal vacuum test standard provides scientific basis.
Description of drawings
Fig. 1 is the process flow diagram of power device thermal vacuum test method of the present invention;
Fig. 2 is a circulating temperature change curve of a power device thermal vacuum test synoptic diagram in one embodiment of the invention;
Fig. 3 is a power device thermal vacuum test pressure history synoptic diagram in one embodiment of the invention.
Embodiment
Below in conjunction with accompanying drawing and embodiment, specific embodiments of the invention describes in further detail.Following examples are used to explain the present invention, but are not restriction scopes of the present invention.
As shown in Figure 1, the present invention includes following steps:
S101 is placed normal temperature, atmospheric pressure environment to be tried the electrical property of power device with trying power device;
S102 is installed in power device in the thermal vacuum test case; Behind step S102, can also comprise step: S201, whether test thermal vacuum test case seals, and the whether conducting of chamber and external control system;
S103 keeps the original ambient temperature and the pressure of thermal vacuum test case constant, is switched on to trying power device, carries out electric performance test;
S104 is reduced to the testing requirements force value by the pressure and speed rate of setting with the chamber internal pressure;
S105, by the warm variable Rate reductions/rising of setting test the said power device of the temperature inside the box to testing requirements need be proved to be the limit that can bear low/high-temperature, monitor the variation of power device electrical property described in the whole process;
S106, keep the said limit low/time that high-temperature continue to be set, said power device is carried out the sensitive parameter test, and monitors the variation of said sensitive parameter;
S107, by the warm variable Rate of said setting, risings/reduction test the temperature inside the box to the limit low/high-temperature, monitor the variation of power device electrical property described in the whole process;
S108, keep the limit low/high-temperature continues time of setting, said power device carried out the sensitive parameter test, and monitor the variation of said sensitive parameter;
S109, normal if said electric performance test and sensitive parameter change, the then loop ends of one whole, repeating step S105-S108 is to the cycle index of accomplishing testing requirements; If it is undesired that electric performance test or sensitive parameter described in certain circulation change, then off-test; If all the variation of electric performance test and sensitive parameter described in the circulation is all normal, then change step S100 over to;
S100 is adjusted to original ambient temperature and pressure state with the temperature and pressure of chamber, and power device is carried out electric performance test;
S111 under take-off output device to normal temperature, the atmospheric pressure environment, carries out final electric performance test, off-test to it in limiting time.
As shown in Figures 2 and 3, be respectively temperature variation and pressure history synoptic diagram in one embodiment of the invention.
Before test is carried out, require or tried the reliability index confirmed test severity of power device nominal according to test mission, thereby confirm the warm variable Rate of whole test, conditions such as ultimate temperature and testing requirements force value:
In the present embodiment, the pressure condition of test is for being not more than 1.3 * 10
-3Handkerchief; The chamber internal pressure should slowly descend, and the time that will reach 20 handkerchiefs from normal pressure should have 10 minutes at least, so that detect corona free and arc discharge phenomenon is arranged; When pressure drops to when being lower than 11.3 handkerchiefs; Also should detect and have or not micro discharge to take place, if no miscellaneous stipulations, to be not more than 10 kPas/minute rate of pressure reduction step-down;
The chamber maximum temperature range is the maximum temperature range (T that can bear by the no foment system that is tried power device design
NO-min, T
NO-max) determined T wherein
NO-minBe not more than-10 ℃, and T
NO-maxBe not less than 60 ℃.Whole temperature range must contain power device in-service, and minimum temperature that possibly run into when in running order and maximum temperature, this temperature range can use thermodynamical model to calculate; Thermodynamical model needs comprehensive considering various effects, such as equipment operation, and inner heating; Satellite position, solar radiation, solar lunar eclipse influence; Heating in emission and the removal process; And the degeneration of the surface heat of material, every kind of factor all will be considered the harshest situation, the correctness of thermodynamical model can use heat balance test to prove; Consider the error of heat balance test and thermodynamical model, also need reserve certain temperature surplus, promptly for thermal vacuum test, model hangs down 11.1 ℃ again with the minimum temperature that test provides, and maximum temperature adds 11.1 ℃ again, is only final temperature range; For in running order power device, the temperature surplus can be less than 11.1 ℃; Temperature range must satisfy the purpose of environmental stress screening; Temperature rate should be not less than 1 ℃/min, and is generally between 3-5 ℃/min, also unsuitable too high; Too high temperature change rate might make and tried power device and receive too high thermal stress; Thereby cause the damage that should not take place, therefore, the ability to bear that should be per sample and the performance of equipment are confirmed the speed of heating and cooling; When temperature stabilization, the temperature fluctuation in the chamber can not surpass 3 ℃/h.
The process of the test of present embodiment is:
R01 will be tried power device and placed normal temperature, atmospheric pressure environment, the electrical property that is tried power device after the test energising, outage after test finishes;
R02; Test clamp will be tried power device and will be installed in the thermal vacuum test case; The local thermal sensors of arranging such as cold drawing in temperature monitoring point that is tried power device, power device shell and chamber and chamber; The temperature detection of being carried out in the test comprises being tried power device shell temperature, test the temperature inside the box and temperature fluctuation, connects chamber and external control system, wherein; Multi way temperature detects and a large amount of test leads is the main source that chamber gas carries, so should select to have the lead-in wire that the lead-in wire of little air output is wrapped up in compress material;
R03, whether test thermal vacuum test case seals, and the whether conducting of chamber and external control system;
R04 is testing to such an extent that the thermal vacuum test case seals, and after chamber and the external control system conducting, keeps being switched on to trying power device under the constant condition of original ambient temperature and pressure, carries out electric performance test;
R05 slowly drops to the warm variable Rate of the pressure in the chamber with regulation and is not more than 1.3 * 10
-3Under the pressure condition of the testing requirements of handkerchief;
In this process, the time that drops to 20 handkerchiefs from normal pressure should have 10 minutes at least, so that detect corona free and arc discharge phenomenon is arranged; When pressure drops to when being lower than 11.3 handkerchiefs, also should detect to have or not micro discharge to take place, if no miscellaneous stipulations, to be not more than 10 kPas/minute pressure and speed rate step-down;
R06; When chamber pressure is reduced to critical pressure value; Critical pressure value is meant guarantees that pressure is tried the pressure threshold that power device can not produce phenomenons such as corona, arc discharge or micro discharge again when being lower than this value; According to warm variable Rate rising test the temperature inside the box of setting, temperature rises to the maximum temperature T that is tried under the power device operative condition
SU-highThe time, power device outage, stand-by period t
E(0.5 hour), so that power device is discharged to steady state (SS) fully, the chamber internal pressure reaches 1.3 * 10
-3During handkerchief, again to the power device energising, and warm variable Rate according to the rules, the test the temperature inside the box that raises need prove the limit high temperature T that can bear to testing desired given the test agent
Q-max(+125 ℃) are monitored power device electrical property described in the whole process and are changed;
R07, stand-by period t
EAfterwards, test the temperature inside the box is stabilized in T gradually
Q-max, keep limit high temperature T
Q-maxThe time of continue setting, carried out sensitive parameter and test trying power device, the situation of change of various parameters under this extreme condition of monitor power device, the limit high-temperature duration of setting is at least 6.5 hours;
R08 after the time of setting arrives, reduces test the temperature inside the box according to the warm variable Rate of setting, and reduces to the minimum temperature T that is tried under the power device operative condition in temperature
SU-lowThe time, power device outage, stand-by period t
E, so that after power device is discharged to steady state (SS) fully,, improves test the temperature inside the box and need be proved to be the limit low temperature T that can bear to testing desired given the test agent again to the power device energising, and according to the warm variable Rate of setting
Q-min(55 ℃) are kept watch on power device electrical property described in the whole process and are changed;
R09, stand-by period t
ESo that temperature stabilization is in T
Q-min, keep limit low temperature T
Q-minThe time of continue setting, carried out sensitive parameter and test trying power device, the situation of change of various parameters under this extreme condition of monitor power device, the time of setting is at least 2.5 hours, so that power device inside reaches thermal equilibrium;
R10, tried power device in above-mentioned test process Pass Test to the qualified requirement of given the test agent, then for the first time complete loop ends, circulation beginning for the second time repeats the cycle index of R06-R10 step to complete completion test determination;
R11 to the chamber processing that heats up, boosts, to original ambient temperature, pressure state, carries out electric performance test to power device;
R12 under take-off output device to normal temperature, the atmospheric pressure environment, carries out final electric performance test to it in the qualification time limit.Be circulated to for the second time second from the bottom circulation and all begin to repeat to step R10, the first time and last circulation each at least 9 hours in its specified limits temperature duration from step R06.
Last circulation begins to repeat to R10 from R06; After also execution in step R11, R12 chamber return to original ambient temperature and atmospheric pressure state; Need to be carried out electric performance test again one time to trying power device, outage is taken out then, behind the taking-up case; Recover after 1 hour and within 24 hours, carried out final electric performance test to trying power device once more.Final electric performance test also comprises not amplifying or amplifying being no more than 3 times said power device sign being checked except that said sensitive parameter test, amplify 10～20 times to said power device shell, go between or seal and carry out visual inspection.
Use power device thermal vacuum test method provided by the invention that space flight is carried out the thermovacuum durability test with power device; Need carry out repeatedly complete temperature cycles process; Given the test agent must be accomplished the cycle index of regulation continuously under defined terms, cycle index is between 10～500 times.During the testing cycle total degree of accomplishing regulation, in order to carry out the loading that device criticizes or to unload, or because power supply or equipment failure; Allow abort, owing to the unexpected circulation of interrupting should be reformed once, if circulate accidental interruption for the last time; Then except repeating circulation this time, also should do for supplement once circulation, if interruption times surpass regulation the circulation total degree 10% or when interrupting surpassing 12 hours; Any reason no matter, test must restart circulation.
The above only is a preferred implementation of the present invention; Should be pointed out that for those skilled in the art, under the prerequisite that does not break away from know-why of the present invention; Can also make some improvement and replacement, these improvement and replacement also should be regarded as protection scope of the present invention.
Claims (10)
1. a power device thermal vacuum test method is characterized in that, may further comprise the steps:
S101 is placed normal temperature, atmospheric pressure environment to be tried the electrical property of power device with trying power device;
S102 is installed in power device in the thermal vacuum test case;
S103 keeps the original ambient temperature and the pressure of thermal vacuum test case constant, is switched on to trying power device, carries out electric performance test;
S104 is reduced to the testing requirements force value by the pressure and speed rate of setting with the chamber internal pressure;
S105, by the warm variable Rate reductions/rising of setting test the said power device of the temperature inside the box to testing requirements need be proved to be the limit that can bear low/high-temperature, monitor the variation of power device electrical property described in the whole process;
S106, keep the said limit low/time that high-temperature continue to be set, said power device is carried out the sensitive parameter test, and monitors the variation of said sensitive parameter;
S107, by the warm variable Rate of said setting, risings/reduction test the temperature inside the box to the limit low/high-temperature, monitor the variation of power device electrical property described in the whole process;
S108, keep the limit low/high-temperature continues time of setting, said power device carried out the sensitive parameter test, and monitor the variation of said sensitive parameter;
S109, normal if said electric performance test and sensitive parameter change, the then loop ends of one whole, repeating step S105-S108 is to the cycle index of accomplishing testing requirements; If it is undesired that electric performance test or sensitive parameter described in certain circulation change, then off-test; If all the variation of electric performance test and sensitive parameter described in the circulation is all normal, then change step S100 over to;
S100 is adjusted to original ambient temperature and pressure state with the temperature and pressure of chamber, and power device is carried out electric performance test;
S111 under take-off output device to normal temperature, the atmospheric pressure environment, carries out final electric performance test, off-test to it in limiting time.
2. power device thermal vacuum test method as claimed in claim 1; It is characterized in that; Also comprise step: S201 before the said step S103, test said thermal vacuum test case and whether seal, and the whether conducting of said thermal vacuum test case and external control system; If blow-by or not conducting are then debugged up to sealing and conducting.
3. power device thermal vacuum test method as claimed in claim 1; It is characterized in that; According to the reliability index confirmed test severity of testing requirements or said power device nominal, thereby confirm said pressure and speed rate, warm variable Rate and testing requirements force value.
4. power device thermal vacuum test method as claimed in claim 3 is characterized in that, the testing requirements force value among the said step S104 is not more than 1.3 * 10
-3Handkerchief; Said pressure and speed rate is not more than 10 kPas/minute.
5. power device thermal vacuum test method as claimed in claim 4 is characterized in that, the time that said chamber internal pressure drops to the process of 20 handkerchiefs was at least 10 minutes, and in this process, detecting said power device has corona free and arc discharge phenomenon; When pressure drops to when being lower than 11.3 handkerchiefs, detect to have or not micro discharge to take place.
6. like any described power device thermal vacuum test method among the claim 1-5, it is characterized in that said limit high-temperature is+125 degrees centigrade, limit low temperature is-55 degrees centigrade; The duration that stops at limit high-temperature was at least 6.5 hours, and the duration that stops at limit low temperature was at least 2.5 hours; Said temperature variable Rate is not less than 1 degrees celsius/minute, and when temperature stabilization, the temperature fluctuation in the said chamber is no more than 3 degrees centigrade/hour.
7. power device thermal vacuum test method as claimed in claim 6; It is characterized in that, when chamber pressure is reduced to critical pressure value, according to warm variable Rate rising/reduction test the temperature inside the box of setting; Temperature rise to/reduce to tried under the power device operative condition the highest/during minimum temperature; The power device outage is waited for certain hour so that power device is discharged to steady state (SS) fully, and the chamber internal pressure reaches 1.3 * 10
-3During handkerchief, again to the power device energising, and according to the warm variable Rate of setting, rising/reduction test the temperature inside the box need prove the limit high temperature/low temperature that can bear to testing desired given the test agent, monitors the variation of power device electrical property described in the whole process.
8. power device thermal vacuum test method as claimed in claim 1 is characterized in that, the cycle index of testing requirements is 10～500 times among the said step S109; During accomplishing said cycle index, if interruption times surpass the testing requirements cycle index 10% or when interrupting surpassing 12 hours, then test from S105 and restart circulation.
9. power device thermal vacuum test method as claimed in claim 1 is characterized in that, if circulation for the first time or last circulation, the time of said setting was at least 9 hours.
10. power device thermal vacuum test method as claimed in claim 1 is characterized in that, the limiting time among the said step S111 is 1～24 hour.
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Cited By (9)
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| CN102765488A (en) * | 2012-08-01 | 2012-11-07 | 北京卫星环境工程研究所 | Ordinary-pressure thermal test system and method of manned spacecraft |
| CN102981081A (en) * | 2012-12-03 | 2013-03-20 | 北京圣涛平试验工程技术研究院有限责任公司 | Evaluation method of thermal vacuum environmental adaptability of elements and components for spacecraft |
| CN103868750A (en) * | 2014-03-20 | 2014-06-18 | 航天东方红卫星有限公司 | Asymmetry hot test method suitable for repaired onboard product |
| CN103914092A (en) * | 2014-03-20 | 2014-07-09 | 航天东方红卫星有限公司 | Temperature control method for equipment on satellite in system level thermal vacuum test |
| CN105426283A (en) * | 2014-09-19 | 2016-03-23 | 环旭电子股份有限公司 | Thermal design optimization method of electronic product |
| CN106292786A (en) * | 2015-06-02 | 2017-01-04 | 英属开曼群岛商精曜有限公司 | Voltage reduction method and decompression device thereof |
| CN108169653A (en) * | 2017-12-27 | 2018-06-15 | 中国电子产品可靠性与环境试验研究所 | Device for high-power power electronic performance testing device and system |
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| CN110171584A (en) * | 2019-06-19 | 2019-08-27 | 上海微小卫星工程中心 | Vacuum thermal test method for mass production of satellite constellation system |
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| CN102765488B (en) * | 2012-08-01 | 2015-05-20 | 北京卫星环境工程研究所 | Ordinary-pressure thermal test system and method of manned spacecraft |
| CN102765488A (en) * | 2012-08-01 | 2012-11-07 | 北京卫星环境工程研究所 | Ordinary-pressure thermal test system and method of manned spacecraft |
| CN102981081A (en) * | 2012-12-03 | 2013-03-20 | 北京圣涛平试验工程技术研究院有限责任公司 | Evaluation method of thermal vacuum environmental adaptability of elements and components for spacecraft |
| CN103868750B (en) * | 2014-03-20 | 2016-05-04 | 航天东方红卫星有限公司 | Asymmetry thermal test method after being applicable to product on star and reprocessing |
| CN103868750A (en) * | 2014-03-20 | 2014-06-18 | 航天东方红卫星有限公司 | Asymmetry hot test method suitable for repaired onboard product |
| CN103914092A (en) * | 2014-03-20 | 2014-07-09 | 航天东方红卫星有限公司 | Temperature control method for equipment on satellite in system level thermal vacuum test |
| CN103914092B (en) * | 2014-03-20 | 2016-03-02 | 航天东方红卫星有限公司 | System-level thermal vacuum test on-board equipment temperature-controlled process |
| CN105426283A (en) * | 2014-09-19 | 2016-03-23 | 环旭电子股份有限公司 | Thermal design optimization method of electronic product |
| CN105426283B (en) * | 2014-09-19 | 2018-02-02 | 环旭电子股份有限公司 | Electronic product thermal design optimization method |
| CN106292786A (en) * | 2015-06-02 | 2017-01-04 | 英属开曼群岛商精曜有限公司 | Voltage reduction method and decompression device thereof |
| CN108375703A (en) * | 2017-01-31 | 2018-08-07 | 罗德施瓦兹两合股份有限公司 | Test system for executing micro discharge test to equipment under test and the method for testing equipment under test |
| CN108375703B (en) * | 2017-01-31 | 2022-04-19 | 罗德施瓦兹两合股份有限公司 | Test system for performing microdischarge tests on a device under test and method for testing a device under test |
| CN108169653A (en) * | 2017-12-27 | 2018-06-15 | 中国电子产品可靠性与环境试验研究所 | Device for high-power power electronic performance testing device and system |
| CN110171584A (en) * | 2019-06-19 | 2019-08-27 | 上海微小卫星工程中心 | Vacuum thermal test method for mass production of satellite constellation system |
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