CN102323238B - Device and method for measuring refractive index of intermediate infrared multi-wavelength material - Google Patents
Device and method for measuring refractive index of intermediate infrared multi-wavelength material Download PDFInfo
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- CN102323238B CN102323238B CN 201110327127 CN201110327127A CN102323238B CN 102323238 B CN102323238 B CN 102323238B CN 201110327127 CN201110327127 CN 201110327127 CN 201110327127 A CN201110327127 A CN 201110327127A CN 102323238 B CN102323238 B CN 102323238B
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Abstract
The invention discloses a device and method for measuring a refractive index of an intermediate infrared multi-wavelength material. The device comprises a laser diode, a beam shaping device, an input mirror, a laser crystal, a spherical surface high reflection mirror, a prism pair, a slit, an output coupling mirror, a Faraday isolator, a half-transparent and half-reflecting mirror, an adjustable diaphragm, a precise rotating platform, a spectrograph and a dual-channel power meter. The invention realizes direct measurement of refractive indexes of a material to be measured in a wide-spectrum range under different intermediate infrared wavelengths, solves the problem of difficulty in measurement of the refractive index of the material with intermediate infrared wavelength, and is simple and easy in a measurement process, thus the measurement process of the refractive index is greatly simplified and the measurement cost is reduced.
Description
Technical field
The present invention relates to a kind of material refractometry technical field, particularly a kind of measurement mechanism and measuring method thereof of the material of middle infrared wavelength at ambient temperature refractive index.
Background technology
At present, varied for the measuring method of material refractive index, the most frequently used method has V-arrangement prism method, minimum deviation horn cupping etc.Though these methods can provide the more accurate refractive index of detected materials at specific wavelength; But prerequisite is the requirement detected materials possesses the good transparency, refractive index homogeneity and bigger size; Shape and machining precision for detected materials also has strict demand simultaneously; And in measuring process, some method need be used harmful reagent subsidiary, thereby make these methods in the measurement of materials refractive index process, have significant limitation.Nonetheless; Current measuring methods all is confined to visible light and near-infrared band for the material refractometry; And for the refractive index of material at middle infrared wavelength, generally can only utilize experimental formula to carry out match through the refractive index data that detected materials is recorded at visible light and near-infrared band and obtain, can't guarantee the accuracy of fitting data; Thereby bring very large inconvenience to practical application, limited the development of mid-infrared light material and device to a certain extent.
Summary of the invention
In order to overcome the deficiency of above-mentioned prior art; The present invention provide a kind of in the measurement mechanism and the measuring method thereof of infrared multi-wavelength material refractive index; Through measuring the surface reflectivity of detected materials under different middle infrared wavelengths; Utilize fresnel formula to calculate the accurate refractive index that obtains detected materials, solve the present situation that present various material can't directly be measured in the middle infrared wavelength refractive index.
Technical solution of the present invention is following:
A kind of measurement mechanism of middle infrared wavelength material refractive index; Characteristics are that its formation comprises that laser diode, light-beam forming unit, input mirror, laser crystal, sphere high reflective mirror, prism are to, slit, output coupling mirror, faraday isolator, semi-transparent semi-reflecting lens, adjustable diaphragm, accurate universal stage, spectrometer and binary channels power meter; The annexation of each element is: along light path is described laser diode, light-beam forming unit, input mirror, laser crystal and sphere high reflective mirror successively; Described sphere high reflective mirror will be imported light and be divided into first folded light beam and first transmitted light beam; First transmitted light beam gets into described spectrometer; Along the first folded light beam light path is described prism to, slit, output coupling mirror, faraday isolator and semi-transparent semi-reflecting lens successively, and said semi-transparent semi-reflecting lens is divided into second folded light beam and second transmitted light beam with its input light, and second transmitted light beam is received by first probe of described binary channels power meter; Second folded light beam impinges perpendicularly on the detected materials through described adjustable diaphragm; And return along former road, through inciding once more behind the adjustable diaphragm on the semi-transparent semi-reflecting lens, semi-transparent semi-reflecting lens is divided into the 3rd folded light beam and the 3rd transmitted light beam with it; The 3rd folded light beam is isolated by described faraday isolator, and the 3rd transmitted light beam is received by second probe of described binary channels power meter.
Described laser crystal is for mixing thulium calcium-lithium-niobium Ga garnet crystal (Tm:CLNGG).
A kind of measuring method of utilizing the measurement mechanism of the described middle infrared wavelength material of claim 1 refractive index is characterized in that this method may further comprise the steps:
1. prepare detected materials; Make it have an optical polish face that is not less than 3mm х 3mm, measure the power reflectance
of semi-transparent semi-reflecting lens (10) different wave length under angle of assembling simultaneously;
2. detected materials is fixed on the accurate universal stage (13), adjustment adjustable diaphragm (11) and accurate universal stage (13) make incident light impinge perpendicularly on the optical polish face of detected materials;
3. read-out power value P on the first passage of binary channels power meter (15) respectively
1, read-out power value P on the second channel of binary channels power meter (15)
2, read wavelength value at spectrometer (14)
And record corresponding data;
4. progressively change the position of slit 7, laser output wavelength is carried out continuous tuning in spectral range, and 2. repeat, 3. step, note different optical maser wavelengths
Following corresponding power data P
1And P
2
5. utilize the power reflectance of semi-transparent semi-reflecting lens (10) different wave length under angle of assembling
, different optical maser wavelengths
The power data P that records down
1And P
2And formula
Calculate the refractive index data of detected materials under the different mid-infrared laser wavelength, further match obtains the dispersion curve of material.
Compared with prior art, the invention has the beneficial effects as follows:
(1) realized various materials in the direct measurement of different wave length refractive index in the infrared broadband spectral scope, for optical material in application such as infrared broadband scope internal dispersion curve fitting, material dispersion compensation and middle infrared material optical coating reliable data support is provided.
(2) detected materials has only an optical polish surface that is not less than 3mm х 3mm to measure, thereby has simplified measuring process greatly, has reduced the measurement cost.
(3) owing to be to obtain the refractive index data through the reflectivity of measuring detected materials; Thereby the optical transmittance of material do not required; Any material of surface optics polishing all can be realized measuring in theory; Can realize direct measurement, widen the scope of the material of can measuring and monitoring the growth of standing timber greatly for low transmission material refractive index.
(4) through adopting different wavelength of laser device or optical parametric oscillator (OPO), optical parameter amplifier (OPA), can realize from deep ultraviolet to the measurement of refractive index under the infrared different wave length, for example adopt Cr
2+: the ZnSe laser instrument, can realize from 1800 ~ 3100nm wide-band tuning laser output, thereby widen the potential scope of application of this kind measuring method greatly.
(5) measuring process is simple and easy to do, only needs detected materials is carried out primary calibration, need not complicated adjustment, can realize the accurate measurement of refractive index data under the different wave length in the wide spectral range.
(6) utilize Fresnel formula, through measuring detected materials surface incident light and reflected optical power, calculate the refractive index data, detected materials is for the whether transparent measurement result that do not influence of incident light.
(7) utilize high sensitivity binary channels power meter simultaneously two-way light to be monitored reading, eliminated the error that the laser output power instability possibly brought to measurement.
Description of drawings
Fig. 1 is the structural representation of the measurement mechanism of middle infrared wavelength material refractive index of the present invention.
Embodiment
Below in conjunction with embodiment and accompanying drawing the present invention is described further, but should limit protection scope of the present invention with this.
See also Fig. 1, Fig. 1 is the structural representation of the measurement mechanism of middle infrared wavelength material refractive index of the present invention.As shown in the figure; In the frame of broken lines is tunable continuous middle infrared laser; After the pump light that laser diode 1 sends is focused on by light-beam forming unit 2 collimations; Focus in the laser crystal Tm:CLNGG4 (mixing thulium calcium-lithium-niobium Ga garnet crystal) through input mirror 3, cause population inversion and in the chamber, form laser generation.Laser in the chamber spills fraction laser entering spectrometer 14 through sphere high reflective mirror 5 and reads wavelength value
.Prism to 6 with slit 7 as the intracavity wavelength tuned cell, along continuous straight runs travelling slit 7 can carry out tuning to optical maser wavelength, the light of different wave length is by output coupling mirror 8 output.The mid-infrared laser of output incides on the semi-transparent semi-reflecting lens 10 through faraday isolator 9, and the light of transmissive part is directly received by first probe of binary channels power meter 15, and on the first passage of binary channels power meter 15 read-out power value size P
1The laser of reflecting part is got on the detected materials 12 through behind the adjustable diaphragm 11; 0 degree reflection through detected materials 12 is returned along former road; Through inciding once more on the semi-transparent semi-reflecting lens 10 behind the adjustable diaphragm 11, the light of reflecting part is isolated by faraday isolator 9, thereby preventing effectively that reflected light from returning along former road to get into causes output power unstable in the laserresonator; Second probe that the light of transmissive part incides binary channels power meter 15 is received, and on binary channels power meter 15 second channels read-out power value size P
2
At first accurately measure the power reflectance
of semi-transparent semi-reflecting lens 10 different wave length under angle of assembling before the experiment with binary channels power meter 15; The power transmittance of supposing it is
; Suppose that simultaneously the laser power behind the faraday isolator 9 is P; Then can release the laser general power that incides on the detected materials 12 for
, through the luminous power after the detected materials 12 surperficial normal reflections is
, further can try to achieve the power reflectance of detected materials:
（1）
Can know by Fresnel formula simultaneously: when light normal incidence;
arranged, (2)
Wherein
is air refraction, and
is the refractive index of detected materials 12.Suppose the refractive index
of detected materials 12, then can release by formula (1) and (2):
Preamble can be known, through changing the position of slit 7, can realize the continuous tuning of laser output wavelength in wide spectral range, because R
10Before experiment, accurately measure, so only need change the position of slit 7 and read the performance number P on the binary channels power meter 15 when carrying out refractometry
1And P
2And the mid-infrared laser wavelength read of spectrometer 14, can obtain the refractive index data of detected materials under different middle infrared wavelengths by formula (3).
At first detected materials 12 is fixed on the accurate universal stage 13 that can carry out two-dimentional tilt adjustments before the experiment; Polished surface is aimed at adjustable diaphragm 11 directions; Adjustable diaphragm 11 perforates are to maximum; Adjustment precise rotating platform 13 makes the light beam that incides on detected materials 12 polished surfaces penetrate through adjustable diaphragm 11 through detected materials 12 reflection backs, progressively dwindles the perforate of adjustable diaphragm 11 and further accurate universal stage 13 is adjusted the reflected light that makes detected materials 12 and still can constantly repeat this process through diaphragm 11 ejaculations; When adjustable diaphragm 11 bore size narrow down to about 1 ~ 2mm; Finely tune accurate universal stage 13 this moment, makes that the relative power value that incides on power meter 15 second channels is maximum, because output laser is Gaussian beam; Beam center intensity is maximum; Have only when the folded light beam center of detected materials 12 overlaps with the aperture center of adjustable diaphragm 11 and could obtain relative maximum power value on guaranteed output meter 15 second channels, just mean that the incident light of detected materials 12 polished surfaces and reflected light overlap, and have promptly realized normal incidence this moment.Calibration is opened adjustable diaphragm 11 after accomplishing fully, can carry out refractometry under the different wave length to detected materials 12 very easily.Can reach the purpose that improves calibration accuracy through further dwindling adjustable diaphragm 11 perforates to perhaps increasing the relative distance of adjustable diaphragm 11 below the 1mm during normal incidence calibration with accurate universal stage 13; Thereby can further improve measuring accuracy; What use during simultaneously owing to measurement is that 15 pairs of incident lights of high sensitivity binary channels power meter and reflected light are measured simultaneously; Eliminate the error that the laser output power instability possibly brought to measurement, thereby can improve measuring accuracy greatly.
Claims (4)
1. the measurement mechanism of a middle infrared wavelength material refractive index; Be characterised in that its formation comprises that laser diode (1), light-beam forming unit (2), input mirror (3), laser crystal (4), sphere high reflective mirror (5), prism are to (6), slit (7), output coupling mirror (8), faraday isolator (9), semi-transparent semi-reflecting lens (10), adjustable diaphragm (11), accurate universal stage (13), spectrometer (14) and binary channels power meter (15); The annexation of each element is: along light path is described laser diode (1), light-beam forming unit (2), input mirror (3), laser crystal (4) and sphere high reflective mirror (5) successively; Described sphere high reflective mirror (5) will be imported light and be divided into first folded light beam and first transmitted light beam; First transmitted light beam gets into described spectrometer (14); Along the first folded light beam light path is that described prism is to (6), slit (7), output coupling mirror (8), faraday isolator (9) and semi-transparent semi-reflecting lens (10) successively; Said semi-transparent semi-reflecting lens (10) is divided into second folded light beam and second transmitted light beam with its input light; Second transmitted light beam is received by first probe of described binary channels power meter (15); Second folded light beam impinges perpendicularly on the detected materials (12) through described adjustable diaphragm (11); And return along former road, through inciding once more behind the adjustable diaphragm (11) on the semi-transparent semi-reflecting lens (10), semi-transparent semi-reflecting lens (10) is divided into the 3rd folded light beam and the 3rd transmitted light beam with it; The 3rd folded light beam is isolated by described faraday isolator (9), and the 3rd transmitted light beam is received by second probe of described binary channels power meter (15).
2. the measurement mechanism of middle infrared wavelength material refractive index according to claim 1 is characterized in that described laser crystal (4) is Tm:CLNGG.
3. the measurement mechanism of middle infrared wavelength material refractive index according to claim 1 is characterized in that described detected materials has an optical polish surface that is not less than 3mm х 3mm to measure.
4. measuring method of utilizing the measurement mechanism of the described middle infrared wavelength material of claim 1 refractive index is characterized in that this method may further comprise the steps:
1. prepare detected materials, make it have an optical polish face that is not less than 3mm х 3mm, measure the power reflectance R of semi-transparent semi-reflecting lens (10) different wave length under angle of assembling simultaneously
10(λ);
2. detected materials is fixed on the accurate universal stage (13), adjustment adjustable diaphragm (11) and accurate universal stage (13) make incident light impinge perpendicularly on the optical polish face of detected materials;
3. read-out power value P on the first passage of binary channels power meter (15) respectively
1, read-out power value P on the second channel of binary channels power meter (15)
2, read wavelength value λ and write down corresponding data at spectrometer (14);
4. progressively change the position of slit (7), laser output wavelength is carried out continuous tuning in spectral range, and the 2. repeat, 3. step, note power data P corresponding under the different laser wavelength lambda
1And P
2
5. utilize the power reflectance R of semi-transparent semi-reflecting lens (10) different wave length under angle of assembling
10The power data P that (λ), records under the different laser wavelength lambda
1And P
2And formula
Calculate the refractive index data of detected materials under the different mid-infrared laser wavelength, further match obtains the dispersion curve of detected materials.
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| CN103017900A (en) * | 2012-11-26 | 2013-04-03 | 中国科学院长春光学精密机械与物理研究所 | Dual-channel common-path prism dispersion broadband imaging spectrometer optical system |
| CN103868854A (en) * | 2014-04-02 | 2014-06-18 | 上海仪电物理光学仪器有限公司 | Optical system of multi-wavelength abbe refractometer |
| CN106770034A (en) * | 2016-12-20 | 2017-05-31 | 西南科技大学 | The measurement apparatus and method of a kind of Refractive Index of Material and thermal refractive index coefficient |
| CN109827927B (en) * | 2019-03-29 | 2020-12-25 | 北京交通大学 | Measuring device for optical fiber doping concentration |
| CN113375914B (en) * | 2021-06-04 | 2022-09-02 | 哈尔滨工程大学 | Light spot intensity distribution acquisition method for laser slab surface detection |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101074900A (en) * | 2006-05-16 | 2007-11-21 | 株式会社拓普康 | Apparatus for detecting refractive index |
| CN101187631A (en) * | 2007-12-19 | 2008-05-28 | 山东大学 | Uniaxial crystal birefringence measuring method |
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| JP4442843B2 (en) * | 2000-08-11 | 2010-03-31 | 株式会社トプコン | Refractive index measuring device for test lens |
| US6914680B2 (en) * | 2002-07-09 | 2005-07-05 | National Institute Of Advanced Industrial Science And Technology | Optical system for measurement of optical constant |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101074900A (en) * | 2006-05-16 | 2007-11-21 | 株式会社拓普康 | Apparatus for detecting refractive index |
| CN101187631A (en) * | 2007-12-19 | 2008-05-28 | 山东大学 | Uniaxial crystal birefringence measuring method |
Non-Patent Citations (5)
| Title |
|---|
| JP特开2002-55023A 2002.02.20 |
| 吸收光谱测量晶体折射率的简易方法;张庆礼等;《人工晶体学报》;20070228;第36卷(第1期);110-113 * |
| 张庆礼等.吸收光谱测量晶体折射率的简易方法.《人工晶体学报》.2007,第36卷(第1期),110-113. |
| 用透射法测量单层薄膜的折射率;蒋卫敏等;《光学仪器》;20071231;第29卷(第6期);90-94 * |
| 蒋卫敏等.用透射法测量单层薄膜的折射率.《光学仪器》.2007,第29卷(第6期),90-94. |
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