CN102279359B - Analog circuit fault test node selection method based on fault coding - Google Patents

Analog circuit fault test node selection method based on fault coding Download PDF

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CN102279359B
CN102279359B CN 201110117857 CN201110117857A CN102279359B CN 102279359 B CN102279359 B CN 102279359B CN 201110117857 CN201110117857 CN 201110117857 CN 201110117857 A CN201110117857 A CN 201110117857A CN 102279359 B CN102279359 B CN 102279359B
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fuzzy set
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袁莉芬
何怡刚
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Hunan Normal University
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Abstract

An analog circuit fault test node selection method based on fault coding is disclosed. The method comprises the following steps: collecting test variables, dividing a fuzzy field for a test value so as to obtain a fuzzy set; deleting a fault mode which can be isolated; establishing a relation table between nodes to be selected and the fault to be isolated; rearranging the relation table between the nodes to be selected and the fault to be isolated so that the node with higher priority is arranged on a position with small line numbers; selecting the nodes: preferentially selecting the nodes with the small line numbers to be the test nodes from the arranged the relation table of the test nodes and the fault mode and updating a fault code; deleting the fault mode which can be separated after carrying out a round of selection, reconstructing the table and carrying out the next round of deletion of the fault mode which can be isolated; ending a node selection process when the selected nodes can realize only coding to all the fault modes. By using the method of the invention, calculated amount is small. The method is suitable for a real time selection place. Algorithm is simple, which is easy to realize automation of node selection.

Description

A kind of analog circuit fault test node system of selection based on malfunction coding
Technical field
The present invention relates to a kind of analog circuit test node selecting method based on fault fuzzy set coding, reaching fault fuzzy set variance minimum at most with the fault fuzzy set quantity of test node to be selected serve as the preferential test node principle of selecting, the test node collection of selection optimum.
Background technology
An extremely important branch as electric network theory, analog circuit fault diagnosing is because the bottleneck restriction of its equation solvability problem, up to 1962, people such as R.S.Berkowitz have proposed the solvability demand of analog circuit fault diagnosing, and the electric network theory part has just had new branch---fault diagnosis.Navid in 1979 and Willson have provided for linear resistor circuit, and the adequate condition that the circuit element parameter value can be separated is for analog circuit fault diagnosing has been established theoretical foundation.At present, analog circuit fault diagnosing has been called one of hot issue of international and domestic area research.
Analog circuit fault diagnosing comprises three main steps usually: the collection of test variable and storage; The selection of test node; Fault isolation.
Node for equivalent fault is selected, and must select different test nodes just might finish fault isolation, if so-called equivalent fault refers to certain two fault in identical fuzzy set, then these two faults have identical fault signature, undistinguishable.Therefore the final purpose of node selection is to select appropriate nodes by certain algorithm, reaches the purpose of separating all faults.Usually, not all node all is node to be selected in the circuit, and the data of collection carry out to(for) all nodes to be selected also is unpractical, and the quality that the fault test node is selected directly has influence on the performance that fault detects.
At present, the selection of test node mainly is a large amount of fuzzy sets to be carried out cap between any two obtain, and still, this method not only operand is big, length consuming time, and easily cause the real-time diagnosis weak effect of system, and being difficult to reach requirement of actual application, the scope of application is little; In addition, owing in the selection course of test node, lack and select criterion, so the test node collection that obtains often is not optimum.
Summary of the invention
In order to overcome the above-mentioned defective that prior art exists, it is less to the invention provides a kind of operand, weak point consuming time, the analog circuit fault test node system of selection based on malfunction coding applied widely.
Technical scheme of the present invention is: it may further comprise the steps:
(1) collecting test variable: to each node to be selected place of circuit under test, gather the voltage tester variable under all kinds of malfunctions;
(2) to all nodes to be selected, divide the node failure fuzzy set;
(3) the isolable fault mode of deletion;
(4) set up node to be selected and fault relationship form to be isolated;
(5) node to be selected and fault relationship form to be isolated are reset, had the higher node of priority and come row number less position;
(6) node is selected: to test node and the fault mode related table that has arranged, the preferential number little node of row of selecting is as test node, and the renewal failure code;
(7) judge whether all failure codes are unique: if not, step (3) then returned; If, illustrate that selected node has possessed the ability of isolating all faults, then selection course finishes;
In the described step (5), the method for the priority of predicate node height is: the quantity of the fuzzy set that has according to node, and a fairly large number of node priority of fuzzy set is higher; When certain plural node to be selected has the fuzzy set of equal number, the node priority height that then the fuzzy set variance is little; If have the fuzzy set quantity of certain node to be selected more than two and the situation that the fuzzy set variance all equates, the then less node priority height of node number.
The collection of voltage tester variable is finished by data acquisition board or Computer Simulation in the described step (1).
In the described step (1), to each node to be selected place of circuit under test, can gather the testing current variable under all kinds of malfunctions, be used for replacing the voltage tester variable.
In the described step (2), the division methods of node failure fuzzy set is, collecting all nodes to be selected of circuit behind the voltage tester variate-value under the different faults pattern, and each node to be selected is carried out following steps:
(a) centered by the voltage tester variate-value under the normal mode of operation, respectively expand 0.7V(V to the left and right from central value and represent the voltage unit volt), obtain first fuzzy field, search voltage tester variable falls into all fault modes of this fuzzy field, obtains first fault fuzzy set;
(b) get a fault mode that is not included into the fault fuzzy set again, get its test variable value as the center of new fuzzy field, respectively expand 0.7V(V up and down and represent the voltage unit volt) as new fuzzy field, and search for other fault mode that the voltage tester variable falls into this fuzzy field, obtain new fault fuzzy set; (in the process of concrete operations, if there is the zone of overlapping intersection on the border of two adjacent fuzzy fields, then exist two fuzzy fields of intersect edges to shrink to central value separately, the slit more than the 0.1V arranged between two fuzzy field borders).
(c) constantly repeat (b) step, all be included in definite fault fuzzy set until all fault modes.The set of the fault fuzzy set that each node is divided, i.e. node failure fuzzy set.
In the described step (3), isolable fault mode distinguishing rule is: when only comprising a kind of fault mode in certain fault fuzzy set, then this fault mode is exactly isolable.
In the described step (4), the concrete operations of setting up node to be selected and fault relationship form to be isolated are: for N node to be selected, the situation of M kind fault mode to be isolated, set up the form of the capable M row of N, wherein each node to be selected accounts for delegation, every kind of fault mode accounts for row, and the content in the form is the fault fuzzy set numbering of fault in corresponding node.
The concept of described fault fuzzy set numbering is: suppose to utilize node
Figure 2011101178578100002DEST_PATH_IMAGE001
The test variable that gather at the place can be divided altogether
Figure 2011101178578100002DEST_PATH_IMAGE002
Individual fault fuzzy set is to this
Figure 681830DEST_PATH_IMAGE002
Individual fault fuzzy set is pressed fuzzy field central value order from small to large and is arranged, and the order that increases progressively with natural number is numbered the fault fuzzy set after sorting then.
The computing method that described fuzzy set variance is calculated are: suppose to use
Figure 2011101178578100002DEST_PATH_IMAGE003
The expression node
Figure 504905DEST_PATH_IMAGE001
In, label is The fault fuzzy set in the number of faults that comprises,
Figure 325094DEST_PATH_IMAGE001
Be the node serial number of correspondence,
Figure 2011101178578100002DEST_PATH_IMAGE005
Be fault collection numbering,
Figure DEST_PATH_IMAGE006
Be total fault mode number to be separated,
Figure DEST_PATH_IMAGE008
Be node
Figure 428310DEST_PATH_IMAGE001
The number of corresponding fuzzy set, then being calculated as follows of fault fuzzy set variance:
(1) average of the fault fuzzy set that comprises of computing node
Figure 2011101178578100002DEST_PATH_IMAGE009
(2) variance of calculating fault fuzzy set
Figure DEST_PATH_IMAGE010
:
Figure 2011101178578100002DEST_PATH_IMAGE011
The generation method of the failure code in described step (6) and the step (7) is: the node to be selected after the ordering and fault mode related table are selected node since first row, the Capable and the fault of inferior selected node
Figure 618913DEST_PATH_IMAGE004
The point of crossing numeral of column is as fault
Figure 39530DEST_PATH_IMAGE004
Figure 449782DEST_PATH_IMAGE001
Position coding (by order from left to right).
The present invention compared with prior art has following advantage:
(1) utilize node failure fuzzy set quantity as the separating power criterion to all faults, node failure fuzzy set variance is as the equal energy ability criterion to all faults, need not the cap between the computing node fuzzy set, only need sort by fault fuzzy set quantity or variance size and get final product, calculated amount is little, is suitable for selecting in real time the place;
(2) algorithm is simple, utilizes the selection of the thought realization fault test node of coding, is convenient to computer programming and realizes, is easy to the robotization that realizes that node is selected.
Description of drawings
Fig. 1 is the analog circuit fault test node system of selection FB(flow block) that the present invention is based on malfunction coding;
Fig. 2 is the node failure fuzzy set synoptic diagram of the present invention's one test circuit;
Fig. 3 is the node failure fuzzy set synoptic diagram that removes behind all separable fault modes.
Embodiment
The present invention will be described in detail below in conjunction with drawings and Examples.
With reference to accompanying drawing, it may further comprise the steps: at first, execution in step 01, the collecting test variable, but namely voltage or the current signal of circuit under test measuring point are gathered.
Then, execution in step 02 to each node to be selected, is divided the node failure fuzzy set; Carry out according to the following steps: (a) with the test variable that collects centered by the voltage tester variable under the normal mode of operation, respectively expanding 0.7V(V to the left and right from central value is the voltage unit volt), obtain first fuzzy field, search voltage tester variable falls into other fault mode of this fuzzy field, obtains first fault fuzzy set; (b) get a fault mode that is not included into the fault fuzzy set again, get its test variable value as the center of new fuzzy field, respectively expand 0.7 volt up and down as new fuzzy field, and search for other fault mode that the voltage tester variable falls into this fuzzy field, obtain new fault fuzzy set; (c) constantly repetitive operation (b) all is included in definite fault fuzzy set until all fault modes.In the process of concrete operations, if there is the zone of overlapping intersection on the border of two adjacent fuzzy fields, then exist two fuzzy fields of intersect edges to shrink to central value separately, the slit more than the 0.1V is arranged between two fuzzy field borders.
After the execution of step 02, execution in step 03 is deleted isolable fault mode.
Then, execution in step 04 is set up node to be selected and fault relationship form to be isolated.
Afterwards, in the execution in step 05, node to be selected and fault relationship form to be isolated are reset, had the higher node of priority and come row number less position.
After the execution of step 05, execution in step 06, node is selected: to test node and the fault mode related table that has arranged, the node that row is number little in the priority selection lattice is as test node, and the renewal failure code.
Then, execution in step 07 judges whether all failure codes are unique: if failure code is not unique, then return step 03; If failure code is unique, illustrate that selected node has possessed the ability of isolating all faults, then execution in step 08, and selection course finishes.
But voltage or current signals to the test circuit measuring point in the described step 01 are finished by data acquisition board or Computer Simulation.
In the described step 03, isolable fault mode distinguishing rule is: when only comprising a kind of fault mode in certain fault fuzzy set, then this fault mode is exactly isolable.
In the described step 04, the concrete operations of setting up node to be selected and fault relationship form to be isolated are: for N node to be selected, the situation of M kind fault mode to be isolated, set up the form of the capable M row of N, wherein each node to be selected accounts for delegation, every kind of fault mode accounts for row, and the content in the form is the fault fuzzy set numbering of fault in corresponding node.
The concept of described fault fuzzy set numbering is: suppose to utilize node
Figure 563232DEST_PATH_IMAGE001
The test variable that gather at the place can be divided altogether
Figure 426146DEST_PATH_IMAGE002
Individual fault fuzzy set is to this
Figure 588137DEST_PATH_IMAGE002
Individual fault fuzzy set is pressed fuzzy field central value order from small to large and is arranged, and the order that increases progressively with natural number is numbered the fault fuzzy set after sorting then.
In the described step 05, the method for the priority of predicate node height is: the quantity of the fuzzy set that has according to node, and a fairly large number of node priority of fuzzy set is higher; When certain plural node to be selected has the fuzzy set of equal number, the node priority height that then the fuzzy set variance is little; If have the fuzzy set quantity of certain node to be selected more than two and the situation that the fuzzy set variance all equates, the then less node priority height of node number.
The computing method that described fuzzy set variance is calculated are: suppose to use
Figure 649634DEST_PATH_IMAGE003
The expression node
Figure DEST_PATH_IMAGE012
In, label is
Figure 809351DEST_PATH_IMAGE004
The fault fuzzy set in the number of faults that comprises,
Figure 221877DEST_PATH_IMAGE001
Be the node serial number of correspondence,
Figure 125242DEST_PATH_IMAGE005
Be fault collection numbering,
Figure 306825DEST_PATH_IMAGE006
Be total fault mode number to be separated,
Figure 2011101178578100002DEST_PATH_IMAGE007
Be node
Figure 392372DEST_PATH_IMAGE001
The number of corresponding fuzzy set, then being calculated as follows of fault fuzzy set variance:
(1) average of the fault fuzzy set that comprises of computing node
Figure 292195DEST_PATH_IMAGE009
(2) variance of calculating fault fuzzy set :
Figure 97657DEST_PATH_IMAGE011
The generation method of the failure code in described step 06 and the step 07 is: the node to be selected after the ordering and fault mode related table are selected node since first row, the Capable and the fault of inferior selected node
Figure 783033DEST_PATH_IMAGE004
The point of crossing numeral of column is as fault
Figure 90518DEST_PATH_IMAGE004
Position coding (by order from left to right).
Application Example of the present invention:
The node to be selected of supposing certain test circuit has 5, and the fuzzy set of each node to be selected is divided as shown in table 1, and each row represents a fuzzy field in the table, and each row represents a node to be selected, and row represents a fault fuzzy set with the table content that row intersect,
Figure 2011101178578100002DEST_PATH_IMAGE013
Represent 9 kinds of fault modes.Content in the form represents test variable at the test value at corresponding node place, drops on the fault mode in the corresponding fuzzy field, and the set of fault mode constitutes a fault fuzzy set in the same grid.The dividing condition of fault fuzzy set such as the first row corresponding node 1, fault F1~F3 dropped on by 2.25 ~ 4.0 in the corresponding fault fuzzy set of the fuzzy field of dividing, fault F0 and F6 have then dropped on by in the corresponding fault fuzzy set of fuzzy field that 5.9 ~ 8.15V divides, fault F5 and F7 have dropped on by in the corresponding fault fuzzy set of fuzzy field that 9.8 ~ 11.2V divides, fault F4 and F8 dropped on by 23.8 ~ 25 in the corresponding fault fuzzy set of the fuzzy field of dividing.
Figure DEST_PATH_IMAGE014
Respectively the corresponding fault fuzzy set of each node is numbered by the method that the natural number order increases progressively, node failure fuzzy set synoptic diagram after the numbering as shown in Figure 2, the fault mode set that is among the figure in the same numerical value territory represents a fault fuzzy set, and the numeral on it is the numbering of fault fuzzy set.
Set up node to be selected and fault fuzzy set related table, as shown in table 2.
Above form by how much the resetting of node failure fuzzy set quantity, namely in the form, with behavior unit, is arranged by row maximal value order from big to small: N4, N1, N2, N5}, and N3}, as shown in table 3.
Figure DEST_PATH_IMAGE017
Select N4 and N1 as after the test node, each fault mode is corresponding to be encoded to: { 12,11,31,31,44,23,52,23,54}, fault F2 has identical failure code 31 with F3 obviously, and fault F5 also has identical failure code 23 with F7, two nodes can't be isolated all faults, consider that again remaining node to separating power that still can not isolated fault, removes the fault mode that all can separate, rebuild node and fault fuzzy set areal map, as shown in Figure 3.
Obviously, by what order arranged nodes of node failure collection quantity to be selected, be followed successively by N5, N2, N3 carry out successively form again and reset, and get shown in the table 4
Table 4 form is for the second time reset node to be selected and fault mode related table afterwards
Figure DEST_PATH_IMAGE019
Select node N4 successively, N1, after the N5, the malfunction coding of 9 class faults is respectively:
121,111,311,312,443,233,523,231,542
Through relatively, can obtain above coding and not have repetition, the node selection course finishes.

Claims (9)

1. the analog circuit fault test node system of selection based on malfunction coding is characterized in that, may further comprise the steps:
(1) collecting test variable: to each node to be selected place of circuit under test, gather the voltage tester variable under all kinds of malfunctions;
(2) to all nodes to be selected, divide the fault fuzzy set;
(3) the isolable fault mode of deletion;
(4) set up node to be selected and fault relationship form to be isolated;
(5) node to be selected and fault relationship form to be isolated are reset, had the higher node of priority and come row number less position;
(6) node is selected: to test node and the fault mode related table that has arranged, the preferential number little node of row of selecting is as test node, and the renewal failure code;
(7) judge whether all failure codes are unique: if not, step (3) then returned; If, illustrate that selected node has possessed the ability of isolating all faults, then selection course finishes;
In the described step (5), the method for the priority of predicate node height is: the quantity of the fuzzy set that has according to node, and a fairly large number of node priority of fuzzy set is higher; When certain plural node to be selected has the fuzzy set of equal number, the node priority height that then the fuzzy set variance is little; If have the fuzzy set quantity of certain node to be selected more than two and the situation that the fuzzy set variance all equates, the then less node priority height of node number.
2. the analog circuit fault test node system of selection based on malfunction coding according to claim 1 is characterized in that, the collection of voltage tester variable is finished by data acquisition board or Computer Simulation in the described step (1).
3. the analog circuit fault test node system of selection based on malfunction coding according to claim 1 and 2, it is characterized in that, in the described step (1), to each node to be selected place of circuit under test, gather the testing current variable under all kinds of malfunctions, be used for replacing the voltage tester variable.
4. the analog circuit fault test node system of selection based on malfunction coding according to claim 1 and 2, it is characterized in that, in the described step (2), the division methods of fault fuzzy set is, collecting all nodes to be selected of circuit behind the voltage tester variate-value under the different faults pattern, each node to be selected carried out following steps:
(a) centered by the voltage tester variate-value under the normal mode of operation, respectively expand 0.7V to the left and right from central value, V represents the voltage unit volt, obtains first fuzzy field, search voltage tester variable falls into all fault modes of this fuzzy field, obtains first fault fuzzy set;
(b) get a fault mode that is not included into the fault fuzzy set again, get its test variable value as the center of new fuzzy field, respectively expand 0.7V up and down as new fuzzy field, and search for other fault mode that the voltage tester variable falls into this fuzzy field, obtain new fault fuzzy set; In the process of concrete operations, if there is the zone of overlapping intersection on the border of two adjacent fuzzy fields, then exist two fuzzy fields of intersect edges to shrink to central value separately, the slit more than the 0.1V is arranged between two fuzzy field borders;
(c) constantly repeat (b) step, all be included in definite fault fuzzy set until all fault modes.
5. the analog circuit fault test node system of selection based on malfunction coding according to claim 1 and 2, it is characterized in that, in the described step (3), isolable fault mode distinguishing rule is: when only comprising a kind of fault mode in certain fault fuzzy set, then this fault mode is exactly isolable.
6. the analog circuit fault test node system of selection based on malfunction coding according to claim 1 and 2, it is characterized in that, in the described step (4), the concrete operations of setting up node to be selected and fault relationship form to be isolated are: for N node to be selected, the situation of M kind fault mode to be isolated is set up the form that the capable M of N is listed as, and wherein each node to be selected accounts for delegation, every kind of fault mode accounts for row, and the content in the form is the fault fuzzy set numbering of fault in corresponding node.
7. the analog circuit fault test node system of selection based on malfunction coding according to claim 6 is characterized in that, the concept of described fault fuzzy set numbering is: suppose to utilize node
Figure 150336DEST_PATH_IMAGE002
The test variable that gather at the place can be divided altogether
Figure 2011101178578100001DEST_PATH_IMAGE003
Individual fault fuzzy set is to this
Figure 78453DEST_PATH_IMAGE003
Individual fault fuzzy set is pressed fuzzy field central value order from small to large and is arranged, and the order that increases progressively with natural number is numbered the fault fuzzy set after sorting then.
8. the analog circuit fault test node system of selection based on malfunction coding according to claim 1 is characterized in that, the computing method that described fuzzy set variance is calculated are: suppose to use The expression node In, be numbered
Figure 2011101178578100001DEST_PATH_IMAGE005
The fault fuzzy set in the number of faults that comprises, Be the node serial number of correspondence,
Figure 336073DEST_PATH_IMAGE006
Be fault collection numbering,
Figure 2011101178578100001DEST_PATH_IMAGE007
Be total fault mode number to be separated, Be node The number of corresponding fuzzy set, then being calculated as follows of fault fuzzy set variance:
(1) average of the fault fuzzy set that comprises of computing node
Figure 2011101178578100001DEST_PATH_IMAGE009
(2) variance of calculating fault fuzzy set
Figure 371659DEST_PATH_IMAGE010
:
Figure 2011101178578100001DEST_PATH_IMAGE011
9. the analog circuit fault test node system of selection based on malfunction coding according to claim 1 and 2, it is characterized in that, the generation method of the failure code in described step (6) and (7) is: the node to be selected after the ordering and fault mode related table are selected node since first row, the Capable and the fault of inferior selected node
Figure 311114DEST_PATH_IMAGE005
The point of crossing numeral of column is as fault
Figure 160619DEST_PATH_IMAGE005
The position coding is by order from left to right.
CN 201110117857 2011-05-09 2011-05-09 Analog circuit fault test node selection method based on fault coding Expired - Fee Related CN102279359B (en)

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