CN102259099B - Grain sorting mechanism of integrated circuit test selector - Google Patents
Grain sorting mechanism of integrated circuit test selector Download PDFInfo
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- CN102259099B CN102259099B CN 201110111304 CN201110111304A CN102259099B CN 102259099 B CN102259099 B CN 102259099B CN 201110111304 CN201110111304 CN 201110111304 CN 201110111304 A CN201110111304 A CN 201110111304A CN 102259099 B CN102259099 B CN 102259099B
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- pin
- retaining rod
- stop lever
- front stop
- air cylinder
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Abstract
The invention discloses a grain sorting mechanism of an integrated circuit test handler. The mechanism at least comprises a circuit flow channel, an air cylinder, a front retaining rod and a rear retaining rod, wherein the front retaining rod and the rear retaining rod act on the circuit flow channel and the air cylinder; the front retaining rod is connected with an L-shaped connecting piece which is fixed on an air cylinder shaft by a screw; the air cylinder shaft is arranged in the cylinder body of the air cylinder; the front retaining rod and the rear retaining rod are provided with a front support and a rear support; an optical axis and an optical axis groove are formed between the front retaining rod and the rear retaining rod; and the front retaining rod is provided with a threaded hole through which a grain sorting pressure block can be fixed on the front retaining rod by a screw. The grain sorting mechanism is driven by a translation air cylinder, so the use cost is reduced effectively.
Description
Technical field
The present invention relates to a kind of integrated circuit test sorting machine, refer to especially a kind of gradation mechanism of integrated circuit test sorting machine.
Background technology
The separator that at present integrated circuit testing encapsulation is used is varied, the mode that gradation mechanism wherein adopts gas pawl cylinder directly to be connected with lever mostly, and that the structure that this gas pawl cylinder is made has a cost is high, the shortcoming that service life is short.
Summary of the invention
The object of the invention is to overcome the deficiency of above-mentioned existence, a kind of gradation mechanism of integrated circuit test sorting machine of simple in structure, long service life is provided.
The objective of the invention is to complete by following technical solution, a kind of gradation mechanism of integrated circuit test sorting machine, a circuit runner, a cylinder block have been which comprises at least, act on front stop lever and the rear pin of the gentle cylinder of described circuit runner, described front stop lever connects the L-type connector, described L-type connector is screwed on cylinder axis, and described cylinder axis is arranged at cylinder block inside; Be provided with front bearing and rear support on described front stop lever and rear pin, be provided with optical axis and optical axis groove between described front stop lever and rear pin; Be provided with screwed hole on described front stop lever, the gradation briquetting be fixed on front stop lever with screw by this screwed hole.
Described gradation briquetting bottom is provided with oblique through hole, is provided with rubber strip in this oblique through hole.
Described front stop lever is fixed on front bearing by the pin pin.
Described rear pin is fixed on rear support by the pin pin.
The present invention has following characteristics: 1, feeding distribution mechanism is an integral body, has modular nature, maintains easily to change to wait operation 2, employing translation air cylinder driven, can effectively reduce use cost.3, backgauge part and binder part adopt pin interlock mode, guarantee that feeding distribution mechanism under any circumstance can not lose efficacy.4, front and back two stopper slots are eliminated and are rocked, and guarantee the precision of feeding distribution mechanism.But 5, material pressing device quick adjustment can adapt to different encapsulated circuits.
Description of drawings
Fig. 1 is structural representation of the present invention.
The specific embodiment
Below in conjunction with accompanying drawing, the present invention is done detailed introduction: as shown in Figure 1: a kind of gradation mechanism of integrated circuit test sorting machine, a circuit runner 15, a cylinder block 11 have been which comprises at least, act on front stop lever 4 and the rear pin 12 of described circuit runner 15 and cylinder block 11, described front stop lever 4 connects L-type connector 9, described L-type connector 9 is fixed on cylinder axis 10 by screw 7B, and described cylinder axis 10 is arranged at cylinder block 11 inside; Be provided with front bearing 6 and rear support 8 on described front stop lever 4 and rear pin 12, be provided with optical axis 13 and optical axis groove 14 between described front stop lever 4 and rear pin 12; Be provided with screwed hole 3 on described front stop lever 4,3 use screw 7A are fixed on gradation briquetting 1 on front stop lever 4 by this screwed hole.
Described gradation briquetting 1 bottom is provided with oblique through hole, is provided with rubber strip 2 in this oblique through hole.
Described front stop lever 4 is fixed on front bearing 6 by pin pin 5A.
Described rear pin 12 is fixed on rear support 8 by pin pin 5B.
Embodiment 1:
When cylinder block 11 work, when cylinder axis 10 makes progress jack-up, front lever 4 due to lever pin 5A as fulcrum support, the part of lever pin 5A one lateral deviation cylinder block 11 will be with cylinder axis 10 perks, the part of another lateral deviation gradation briquetting 1 of lever pin 5A will descend, and realize the function of second material of overwhelming; Simultaneously, the perk of front lever 4 one sides will drive the perk of the superincumbent optical axis 13 in location, due to, lever pin 5B as fulcrum on rear lever 12 is positioned on the rear support 8 of afterbody, optical axis 13 will move in the through slot 14 on rear lever 12, and after driving, lever 12 around lever pin 5B perk, is realized the function of putting last material; In like manner, when cylinder axis 10 was regained downwards, front lever 4 was due to the support of lever pin 5A as fulcrum, and the part of lever pin 5A one lateral deviation cylinder block 11 will descend with cylinder axis 10, the part of another lateral deviation gradation briquetting 1 of lever pin 5A realizes bleeding off pressure the function of that material with perk; Simultaneously, the lower general who has surrendered of front lever 4 one sides drives the decline of the superincumbent optical axis 13 in location, due to, lever pin 5B as fulcrum on rear lever 12 is positioned on the rear support 8 of afterbody, optical axis 13 will move in the through slot 14 on rear lever 12, and after driving, lever 12 descends around lever pin 5B, realizes the function of gradation.
Claims (2)
1. the gradation mechanism of an integrated circuit test sorting machine, a circuit runner, a cylinder block have been which comprises at least, act on front stop lever and the rear pin of the gentle cylinder of described circuit runner, described front stop lever connects the L-type connector, described L-type connector is screwed on cylinder axis, and described cylinder axis is arranged at cylinder block inside; Be provided with front bearing and rear support on described front stop lever and rear pin, described front stop lever is fixed on front bearing by the pin pin, and described rear pin is fixed on rear support by the pin pin; Be provided with optical axis and optical axis groove between described front stop lever and rear pin; Be provided with screwed hole on described front stop lever, the gradation briquetting be fixed on front stop lever with screw by this screwed hole.
2. the gradation mechanism of integrated circuit test sorting machine according to claim 1 is characterized in that described gradation briquetting bottom is provided with oblique through hole, is provided with rubber strip in this oblique through hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110111304 CN102259099B (en) | 2011-04-28 | 2011-04-28 | Grain sorting mechanism of integrated circuit test selector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110111304 CN102259099B (en) | 2011-04-28 | 2011-04-28 | Grain sorting mechanism of integrated circuit test selector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102259099A CN102259099A (en) | 2011-11-30 |
| CN102259099B true CN102259099B (en) | 2013-05-22 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201110111304 Active CN102259099B (en) | 2011-04-28 | 2011-04-28 | Grain sorting mechanism of integrated circuit test selector |
Country Status (1)
| Country | Link |
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| CN (1) | CN102259099B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102641855B (en) * | 2012-04-23 | 2014-05-07 | 上海信耀电子有限公司 | Automatic detecting of LED (light-emitting diode) and stepping system and method |
| CN105057232B (en) * | 2015-08-03 | 2017-05-31 | 杭州长川科技股份有限公司 | The shuttle mechanism of separator |
| CN105057234B (en) * | 2015-08-03 | 2017-07-04 | 杭州长川科技股份有限公司 | The separating mechanism of integrated circuit separator |
| CN110961379B (en) * | 2019-12-21 | 2021-07-02 | 铜陵蓝盾丰山微电子有限公司 | Grading mechanism of integrated circuit testing and sorting machine |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6221434A (en) * | 1985-07-19 | 1987-01-29 | Toyota Motor Corp | Device for feeding and ejecting work to and out of press machine |
| JP4399863B2 (en) * | 2005-02-21 | 2010-01-20 | セイコーエプソン株式会社 | Holding device |
| CN101339223B (en) * | 2008-04-21 | 2011-08-17 | 公元太阳能股份有限公司 | Solar panel automatic detection machine |
| CN201249183Y (en) * | 2008-05-08 | 2009-06-03 | 张华� | Stepping feed divider of gravity type integrated circuit-testing sorting machine |
| CN202037129U (en) * | 2011-04-28 | 2011-11-16 | 杭州长川科技有限公司 | Classifying mechanism of integrated circuit testing and sorting machine |
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2011
- 2011-04-28 CN CN 201110111304 patent/CN102259099B/en active Active
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| CN102259099A (en) | 2011-11-30 |
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Owner name: HANGZHOU CHANGCHUAN TECHNOLOGY CO., LTD. Free format text: FORMER NAME: HANGZHOU CHANGCHUAN TECHNOLOGY CO., LTD. |
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| CP01 | Change in the name or title of a patent holder |
Address after: Hangzhou City, Zhejiang province Binjiang District 310052 shore road 1180 Huaye hi tech Industrial Park No. 3 building six layer Patentee after: Hangzhou long river Science and Technology Co., Ltd. Address before: Hangzhou City, Zhejiang province Binjiang District 310052 shore road 1180 Huaye hi tech Industrial Park No. 3 building six layer Patentee before: Hangzhou ChangChuan Technology Co., Ltd. |