CN102236063A - 一种预测绝缘体上硅器件热载流子寿命的方法 - Google Patents
一种预测绝缘体上硅器件热载流子寿命的方法 Download PDFInfo
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102736011A (zh) * | 2012-07-10 | 2012-10-17 | 中国科学院微电子研究所 | 确定AlGaN/GaN基异质结沟道载流子寿命的方法 |
CN103576066A (zh) * | 2012-07-26 | 2014-02-12 | 中芯国际集成电路制造(上海)有限公司 | 一种半导体器件热载流子寿命的测量方法 |
WO2014176812A1 (zh) * | 2013-05-02 | 2014-11-06 | 北京大学 | 分离soi器件中两种效应导致阈值电压漂移的方法 |
CN108051722A (zh) * | 2017-12-22 | 2018-05-18 | 中国电子产品可靠性与环境试验研究所 | 热载流子注入效应的寿命评估方法和系统 |
CN111060794A (zh) * | 2019-11-19 | 2020-04-24 | 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) | 热载流子注入效应的寿命评估方法、装置和计算机设备 |
Citations (4)
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US6524872B1 (en) * | 1999-05-24 | 2003-02-25 | Agere Systems Inc. | Using fast hot-carrier aging method for measuring plasma charging damage |
US6873932B1 (en) * | 2002-12-20 | 2005-03-29 | Advanced Micro Devices, Inc. | Method and apparatus for predicting semiconductor device lifetime |
CN101073149A (zh) * | 2004-12-08 | 2007-11-14 | 国际商业机器公司 | 双极器件中恢复热载流子引起的退化的方法 |
CN101089642A (zh) * | 2006-06-13 | 2007-12-19 | 中芯国际集成电路制造(上海)有限公司 | 一种加速热载流子注入测试的方法 |
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Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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US6524872B1 (en) * | 1999-05-24 | 2003-02-25 | Agere Systems Inc. | Using fast hot-carrier aging method for measuring plasma charging damage |
US6873932B1 (en) * | 2002-12-20 | 2005-03-29 | Advanced Micro Devices, Inc. | Method and apparatus for predicting semiconductor device lifetime |
CN101073149A (zh) * | 2004-12-08 | 2007-11-14 | 国际商业机器公司 | 双极器件中恢复热载流子引起的退化的方法 |
CN101089642A (zh) * | 2006-06-13 | 2007-12-19 | 中芯国际集成电路制造(上海)有限公司 | 一种加速热载流子注入测试的方法 |
Non-Patent Citations (1)
Title |
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赵文彬 等: "NMOS管热载流子衰退效应评价模型及寿命预测方法研究", 《电子器件》, vol. 31, no. 5, 31 October 2008 (2008-10-31) * |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102736011A (zh) * | 2012-07-10 | 2012-10-17 | 中国科学院微电子研究所 | 确定AlGaN/GaN基异质结沟道载流子寿命的方法 |
CN102736011B (zh) * | 2012-07-10 | 2014-05-07 | 中国科学院微电子研究所 | 确定AlGaN/GaN基异质结沟道载流子寿命的方法 |
CN103576066A (zh) * | 2012-07-26 | 2014-02-12 | 中芯国际集成电路制造(上海)有限公司 | 一种半导体器件热载流子寿命的测量方法 |
WO2014176812A1 (zh) * | 2013-05-02 | 2014-11-06 | 北京大学 | 分离soi器件中两种效应导致阈值电压漂移的方法 |
CN108051722A (zh) * | 2017-12-22 | 2018-05-18 | 中国电子产品可靠性与环境试验研究所 | 热载流子注入效应的寿命评估方法和系统 |
CN111060794A (zh) * | 2019-11-19 | 2020-04-24 | 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) | 热载流子注入效应的寿命评估方法、装置和计算机设备 |
CN111060794B (zh) * | 2019-11-19 | 2022-05-13 | 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) | 热载流子注入效应的寿命评估方法、装置和计算机设备 |
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