CN102200671A - Extinction ratio debugging device and method of optical module - Google Patents

Extinction ratio debugging device and method of optical module Download PDF

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CN102200671A
CN102200671A CN 201110103764 CN201110103764A CN102200671A CN 102200671 A CN102200671 A CN 102200671A CN 201110103764 CN201110103764 CN 201110103764 CN 201110103764 A CN201110103764 A CN 201110103764A CN 102200671 A CN102200671 A CN 102200671A
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microprocessor
current source
optical module
digital
conversion port
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CN102200671B (en
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裴培
蒋旭
杨毅
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Source Photonics Chengdu Co Ltd
Source Photonics Inc
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Abstract

The invention discloses a method for realizing high precision debugging of an extinction ratio index of an optical module by using an algorithm. The optical module is arranged to work by using an APC (Automatic Program Control) loop; a modulation signal coupling mode between an LD (Laser Device) driving circuit and an LD of the optical module is set as an alternating current coupling mode; in the debugging method, the light emitting efficiency and a threshold current of a laser of the optical module are not needed to be tested in advance and the dependence on the incoming material data is also not needed; by using the debugging method, the extinction ratio of the optical module can be debugged to a target value and the debugging error is controlled within a range of +/- 1dB; the debugging method can be used for debugging the large extinction ratio of the OLT (Optical Line Terminal) optical module and assuring the precision within a commercial full temperature range; and the debugging method can be realized through full automatic control.

Description

A kind of extinction ratio debugging apparatus and adjustment method of optical module
Technical field
The present invention relates to a kind of extinction ratio debugging of optical module of the AC coupling of making a start, especially relate to the debugging apparatus and the adjustment method of the extinction ratio that satisfies PON (EPON), OLT (optical fiber cable termination equipment) optical module.
Background technology
Along with developing rapidly of optical communication industry, optical module has obtained using widely.The main task of optical module is to finish electricity/light (optical modulation), light/electricity (optical modulator) conversion.The main devices that is used for electricity/light conversion has: laser instrument (LD) and laser diode (LED); The main devices that is used for light/electricity conversion mainly contains: photodiode and avalanche photodide.
In the digital fiber communication system, come the binary code stream signal of corresponding transmission by " light is arranged " with " unglazed ", this also is modal optical modulation transmission mode.This " light is arranged " will directly influence the performance that receives optical module with the difference of " unglazed " light signal strength.In optical fiber telecommunications system, generally recently weigh performance index of optical module by delustring.Extinction ratio is meant and is sending the ratio of " 1 " corresponding optical signal power with the corresponding optical signal power of transmission " 0 ".
Producing at present and going up debugging extinction ratio method is to have debugged under the situation of desired value in luminous power, come drive laser to produce " 1 " and " 0 " light signal by laser driver according to input binary signal output f, again light signal input digit light oscillograph is measured the intensity of " 1 " and " 0 " optical signal power, and the ratio that calculates " 1 " and " 0 " optical signal power intensity obtains extinction ratio.This delustring ratio can increase and reduce the modulating current debugging by laser driver.But this kind mode has two weak points, the one, and when intensity of each measurement " 1 " and " 0 " optical signal power and ratio calculated, the digital light oscillograph need be aimed at phase place, spend the regular hour; The 2nd, digital light is oscillographic to cost an arm and a leg, and has significantly increased production cost.
Summary of the invention
Therefore the objective of the invention is to solve the problem that debugging extinction ratio debug time is long in the prior art, cost is high, a kind of debugging apparatus and adjustment method of optical module extinction ratio are provided, and this method is the adjustment method of the extinction ratio of a kind of simple to operate, high precision, low cost, high efficiency PON optical module.
According to above-mentioned purpose, the invention provides a kind of adjustment method of optical module extinction ratio, described optical module comprises biasing circuit and modulation circuit, and described biasing circuit comprises first microprocessor, first resistance, first mirror current source, operational amplifier, NPN transistor, second mirror current source, second resistance, laser instrument and first current source; Described modulation circuit comprises bit error analyzing instrument, differential amplifier, the 3rd mirror current source, second current source, the 3rd resistance, second microprocessor and laser instrument; Wherein said first microprocessor comprises the first digital-to-analog conversion port and analog to digital conversion port, the digital-to-analog conversion port of described first microprocessor and analog to digital conversion port are N1 bit value, the conversion proportion of described second mirror current source is 1: K, the resistance of described second resistance is R, and the resistance of described the 3rd resistance is R MODThe conversion proportion of described the 3rd mirror current source is 1: M, the digital-to-analog conversion port of described second microprocessor and analog to digital conversion port are N2 bit value, and described adjustment method may further comprise the steps: step 1: optical module to be debugged is inserted on the evaluation board; Step 2 a: light power meter is connected to a computing machine and optical module described to be debugged, wherein said light power meter comprises light mouth and GBIP interface, described light mouth is connected to describedly waits to debug optical module, described GBIP interface is connected to described computing machine in order to measured optical power value is sent to described computing machine in order to measuring light power; Step 3: described evaluation board is placed a constant temperature oven; Step 4: constant temperature oven is set to normal temperature; Step 5: drive described laser instrument with a laser driver, the reference voltage of described laser driver is V REFStep 6: the numerical value of setting described first microprocessor analog to digital conversion port is DAC_0, reads the corresponding light power P from light power meter 0, from the value ADC_0 of its digital-to-analog conversion port of first microprocessor collection, according to equation
Figure BDA0000057267580000021
Calculate the bias current I of this moment BIAS_(0), and with result of calculation deposits a register in; Step 7: adjust the numerical value of described first microprocessor analog to digital conversion port, luminous power is debugged the target light performance number, the value that obtains described first microprocessor analog to digital conversion port is DAC_1, and reading corresponding light power from light power meter is P 1, from the value ADC_1 of its digital-to-analog conversion port of first microprocessor device collection, according to equation
Figure BDA0000057267580000022
Calculate the bias current I of this moment BIAS_(1), and with result of calculation deposits described register in; Step 8: with the luminous power P that step 5 and step 6 read 0, P 1And the bias current I that calculates BIAS_(0) and I BIAS_(1) substitution equation
Figure BDA0000057267580000023
Calculate the luminescence efficiency SE of described optical module, and deposit result of calculation in described register; Step 9: according to equation
Figure BDA0000057267580000024
Calculate average light power, and the luminescence efficiency SE substitution equation of the described optical module that result of calculation and step 7 are calculated
Figure BDA0000057267580000031
Calculate the debugging electric current I MOD, and deposit result of calculation in described register; Step 10: provide long " 0 " respectively and grow " 1 " signal and send into optical module with the bit error analyzing instrument, up to the luminous power ratio of the luminous power of optical module when growing " 1 " during divided by length " 0 " is target delustring ratio, obtains the target debugging electric current I of described optical module when the target extinction ratio MODTStep 11: with the target debugging electric current I of step 9 debugging MODTDebugging electric current I with step 8 calculating MODThe substitution equation
Figure BDA0000057267580000032
Calculate penalty coefficient; Step 12: with the debugging electric current I of step 8 calculating MODPenalty coefficient C substitution equation with step 10 calculating
Figure BDA0000057267580000033
The numerical value DAC of calculating described second microprocessor analog to digital conversion port when the target extinction ratio _ MOD, and deposit result of calculation in register; Step 13: write down the temperature of current first microprocessor, deposit register in.
According to above-mentioned purpose, the present invention also provides a kind of debugging apparatus of optical module extinction ratio, comprising: computing machine, described computing machine comprises I 2C parallel interface, GBIP interface and device control software; Optical module, described optical module comprises biasing circuit and modulation circuit, and described biasing circuit is in order to set the bias current of described optical module, and described modulation circuit is in order to set the modulating current of described optical module; Laser driver is in order to drive described optical module; Evaluation board, described optical module are inserted on the described evaluation board, and described evaluation board comprises that one is connected to the power supply port of dc power supply; Constant temperature oven is used to place described evaluation board; Light power meter, described light power meter comprises GBIP interface and Guang Kou, described light mouth is connected to described optical module, in order to read the luminous power of described optical module; Described GBIP interface is connected to described computing machine, is sent to described computing machine in order to the luminous power with described optical module; Wherein said biasing circuit comprises first microprocessor, first resistance, first mirror current source, operational amplifier, NPN transistor, second mirror current source, resistance, laser instrument and first current source; Described modulation circuit comprises bit error analyzing instrument, differential amplifier, the 3rd mirror current source, second current source, the 3rd resistance, second microprocessor and described laser instrument; Wherein said first microprocessor comprises analog to digital conversion port and digital-to-analog conversion port, and its digital-to-analog conversion port is exported first electric current; Described first resistance comprises first end and second end, and its first end is connected to the digital-to-analog conversion port of described first microprocessor, to receive described first electric current; Described first mirror current source has first input end, second input end and output terminal, described first input end is connected to second end of described first resistance, to receive described first electric current, described second input end is connected to described first current source, to receive second current signal that described first current source provides, described output terminal provides first image current; Described operational amplifier receives first image current of described first mirror current source output, and will obtain an amplifying signal after its amplification; Described NPN transistor comprises base stage, collector and emitter, described amplifying signal is transferred into described base stage, in order to drive described NPN transistor, described collector is connected to described laser instrument, described emitter is connected to described second mirror current source, described NPN transistor is driven the back and produces described bias current, in order to set the average light power of described laser instrument; Described second mirror current source comprises input end and output terminal, and its input end is connected to the emitter of described NPN transistor, in order to receiving described bias current, and described bias current is changed into second image current; Its output terminal is connected to an end of second resistance; Described second resistance comprises first end and second end, and its first end is connected to the output terminal of described second mirror current source, in order to receiving described second image current, and is translated into the analog to digital conversion port that voltage signal is delivered to described microprocessor; Its second end ground connection; Described second microprocessor comprises the digital-to-analog conversion port, and described digital-to-analog conversion port is exported second electric current; Described the 3rd resistance comprises first end and second end, and described first end is connected to the digital-to-analog conversion port of described second microprocessor, and described second end is connected to the reference voltage of described laser driver; Described second current source comprises first end and second end, and described first end is connected to second end of described the 3rd resistance; Described the 3rd mirror current source comprises first end and second end, and described first end is connected to second end of described second current source, and described second end provides the 3rd image current; Described bit error analyzing instrument comprises first output terminal and second output terminal, in order to the binary code stream of " 1 " and " 0 " to be provided respectively; Described differential amplifier comprises first input end, second input end, the 3rd input end and output terminal, and its first input end and second input end are connected to described bit error analyzing instrument respectively, in order to receive described binary code stream; Described the 3rd input end is connected to second end of described the 3rd mirror current source, and in order to receive described the 3rd image current, described output terminal provides described modulating current to described laser instrument.
The present invention has omitted oscillograph, only by the extinction ratio that light power meter detects, algorithm computation realizes optical module, is a kind of high precision, high-level efficiency, production debugging cheaply.
Description of drawings:
Fig. 1 is the synoptic diagram that concerns between the luminous power of optical module and the electric current.
Fig. 2 illustrates the biasing circuit theory diagram of optical module according to an embodiment of the invention.
Fig. 3 illustrates optical module modulation circuit theory diagram according to an embodiment of the invention.
Fig. 4 illustrates optical module extinction ratio debugging apparatus according to an embodiment of the invention.
Embodiment:
Below in conjunction with accompanying drawing, be that the 1.25G EPON OLT optical module of MAX3738 is an example with the chip for driving, modulating device of the present invention and adjustment method are elaborated and demonstrate.
Fig. 1 is the synoptic diagram that concerns between the luminous power of optical module and the electric current.As shown in Figure 1, bias current is set average light power, and modulation signal driving modulating current is carried on the bias current with positive negative direction and shakes, and obtains " 1 " and " 0 " light signal in conjunction with binary code stream.
Fig. 2 illustrates the biasing circuit theory diagram of optical module according to an embodiment of the invention.As shown in Figure 2, the biasing circuit theory diagram of optical module comprises power supply VCC, first microprocessor (MCU) 1, first resistance 2, first mirror current source 3, operational amplifier 4, NPN transistor 5, second mirror current source 6; Second resistance 7, laser instrument 8 and first current source 9; Wherein first microprocessor 1 comprises digital-to-analog conversion (A/D) port and analog to digital conversion (D/A) port, and first microprocessor 1 is exported first electric current by the digital-to-analog conversion port; First resistance 2 is connected to the digital-to-analog conversion port of first microprocessor 1, receives first electric current, and this first electric current is sent to first mirror current source 3; First mirror current source 3 comprises first input end, second input end and output terminal, and its first input end receives described first electric current, and its second input end receives second current signal that first current source 9 provides, and its output terminal is exported first image current; Operational amplifier 4 receives first image current of first mirror current source, 3 outputs, and with obtaining an amplifying signal after its amplification, is delivered to the control utmost point (base stage) of NPN transistor 5, in order to driving N PN transistor 5; The collector of NPN transistor 5 is connected to laser instrument 8, and its emitter is connected to second mirror current source 6; NPN transistor 5 is driven the back and produces in order to control the bias current I of laser instrument 8 BIASSecond mirror current source 6 receives bias current I BIAS, and bias current being changed into second image current, this second image current is flowed through and is converted into the analog to digital conversion port that voltage signal is transported to microprocessor 1 behind second resistance 7; First current source 9 and laser instrument 8 all are connected to power supply VCC.
In one embodiment, the conversion proportion of first mirror current source 3 is 1: 2, and the conversion proportion of second mirror current source 6 is 1: K.Then the voltage signal at second resistance, 7 two ends is
Figure BDA0000057267580000051
Wherein R is the resistance value of second resistance 7.
In the present embodiment, the full width of cloth voltage of the analog to digital conversion of first microprocessor 1 (A/D) port and digital-to-analog conversion (D/A) port is 2.5V, and analog to digital conversion is 12 bits, then
R × I BIAS K 2.5 = ADC 2 12 = ADC 4096
So we obtain bias current I BIASComputing formula be:
I BIAS = ADC × 2.5 × K 4096 × R - - - ( 1 )
Wherein ADC is the numerical value of first microprocessor 1 analog to digital conversion port.We just can calculate the bias current I of optical module at this moment from equation (1) by setting the numerical value of first microprocessor 1 analog to digital conversion port like this BIAS
And as can see from Figure 1, the optical module of AC coupling is to set average light power by bias current, and modulation signal driving modulating current is carried on the bias current with positive negative direction and shakes, thereby obtains " 1 " and " 0 " light signal.Because extinction ratio is the ratio of " 1 " and " 0 " optical signal power intensity, the average light power that then defines optical module is P again AVG, extinction ratio is ER, and the luminescence efficiency of laser instrument LD is SE, and " 1 " is respectively P with " 0 " optical signal power intensity 1, P 0, can obtain following equation:
SE = P 1 - P 0 I BIAS _ ( 1 ) - I BIAS _ ( 0 ) - - - ( 2 )
ER = 10 × lg P 1 P 0 - - - ( 3 )
P 0 = 2 × P AVG P 1 P 0 + 1 - - - ( 4 )
P 1 = 2 × P AVG × P 1 P 0 P 1 P 0 + 1 - - - ( 5 )
I MOD = P 1 - P 0 SE - - - ( 6 )
Arrangement equation (3) obtains:
P 1 P 0 = 10 ER 10 - - - ( 7 )
Equation (4), (5) and (7) are brought into equation (6) and are obtained:
I MOD = 2 × P AVG × ( 10 ER 10 - 1 ) SE 1 + 10 ER 10 - - - ( 8 )
Under lab do test with 10 optical modules that printed circuit board (PCB) field engineering (PCBA) is identical, the debugging electric current I when debugging out the target extinction ratio by oscillograph MODWith calculate I by above formula MODThe value penalty coefficient C when obtaining this PCBA that is divided by with adjustment method of the present invention debugging.
Fig. 3 illustrates optical module modulation circuit theory diagram according to an embodiment of the invention.As shown in Figure 3, optical module modulation circuit theory diagram comprises: power supply VCC, bit error analyzing instrument 1, differential amplifier 2, the 3rd mirror current source 3, second current source 4, the 3rd resistance 5, second microprocessor (MCU) 6, laser instrument (LD) 7.Wherein second microprocessor 6 comprises analog to digital conversion port and digital-to-analog conversion port, and its analog to digital conversion port receives setting value (not shown), and its digital-to-analog conversion port is exported second electric current; The 3rd resistance 5 comprises first end and second end, and its first end is connected to the digital-to-analog conversion port of second microprocessor 6, and its second end is connected to the reference voltage V of laser driver MAX3738 REF_MAX3738Second current source 4 comprises first end and second end, and its first end is connected to second end of the 3rd resistance 5; The 3rd mirror current source 3 comprises first end and second end, and its first end is connected to second end of second current source 4, and its second end provides the 3rd image current; Bit error analyzing instrument 1 comprises first output terminal and second output terminal, in order to the binary code stream of " 1 " and " 0 " to be provided respectively; Described differential amplifier comprises first input end, second input end, the 3rd input end and output terminal, and its first input end and second input end are connected to bit error analyzing instrument 1 respectively, in order to receive described binary code stream; Its 3rd input end is connected to second end of the 3rd mirror current source 3, and in order to receive described the 3rd image current, its output terminal provides modulating current I MODTo laser instrument 7; Differential amplifier 2 and laser instrument 7 all are connected to power supply VCC.
The conversion proportion of the 3rd mirror current source is 1 in the present embodiment: M.The digital-to-analog conversion port of second microprocessor and analog to digital conversion port are 12 bit values.
In one embodiment, the first microprocessor and second microprocessor are same microprocessor.
By setting the numerical value DAC of correct second microprocessor, 6 analog to digital conversion ports _ MOD, the modulating current I in the time of can obtaining the target extinction ratio MODTTherefore the numerical value DAC of the analog to digital conversion port by the second correct microprocessor 6 is set _ MODJust can obtain the target extinction ratio.And can obtain from Fig. 3
DAC _ MOD 4096 = V REF _ MAX 3738 - R MOD × I MOD × C × 1000 M 2.5 , Then
DAC _ MOD = ( V REF _ MAX 3738 - R MOD × I MOD × C × 1000 M ) × 4096 2.5 - - - ( 9 )
Therefore obtain bias current I by biasing circuit shown in Figure 2 MODThe back can obtain second microprocessor, 6 analog to digital conversion port numerical value under the target extinction ratio in conjunction with modulation circuit shown in Figure 3.
Fig. 4 illustrates optical module extinction ratio debugging apparatus according to an embodiment of the invention.As shown in Figure 4, described debugging apparatus comprises computing machine, and described computing machine comprises I 2C parallel interface, GBIP interface and device control software; Optical module, described optical module comprises biasing circuit and modulation circuit, and described biasing circuit is in order to set the bias current of described optical module, and described modulation circuit is in order to set the modulating current of described optical module; Evaluation board, described optical module are inserted on the described evaluation board, and described evaluation board comprises that one is connected to the power supply port (not shown) of dc power supply, in order to guarantee each chip operate as normal in the optical module; Light power meter comprises light mouth and GBIP interface, and its light mouth is connected to optical module by optical fiber, and in order to read the luminous power of optical module, its GBIP interface is connected to the GBIP interface of computing machine, is sent to computing machine with the luminous power with described optical module; The bit error analyzing instrument is connected to evaluation board by coaxial cable.Wherein optical module comprises biasing circuit and modulation circuit.
In one embodiment, debugging apparatus also comprises constant temperature oven, is used to place evaluation board; Laser driver is in order to drive optical module.
The present invention also provides a kind of adjustment method of optical module extinction ratio, described optical module comprises biasing circuit and modulation circuit, and described biasing circuit comprises first microprocessor, first resistance, first mirror current source, operational amplifier, NPN transistor, second mirror current source, second resistance, laser instrument and first current source; Described modulation circuit comprises bit error analyzing instrument, differential amplifier, the 3rd mirror current source, second current source, the 3rd resistance, second microprocessor and laser instrument; Wherein said first microprocessor comprises the first digital-to-analog conversion port and analog to digital conversion port, the digital-to-analog conversion port of described first microprocessor and analog to digital conversion port are N1 bit value, the conversion proportion of described second mirror current source is 1: K, the resistance of described second resistance is R, and the resistance of described the 3rd resistance is R MOD, the conversion proportion of described the 3rd mirror current source is 1: M, and the digital-to-analog conversion port of described second microprocessor and analog to digital conversion port are N2 bit value, described adjustment method may further comprise the steps:
Step 1: optical module to be debugged is inserted on the evaluation board, and described debugging optical module is connected with the golden finger that is connected to of described evaluation board;
Step 2: light power meter is connected to computing machine and optical module described to be debugged, wherein said light power meter comprises light mouth and GBIP interface, described light mouth is connected to describedly waits to debug optical module, described GBIP interface is connected to a computing machine in order to measured optical power value is sent to described computing machine in order to measuring light power;
Step 3: described evaluation board is placed a constant temperature oven;
Step 4: constant temperature oven is set to normal temperature;
Step 5: drive described laser instrument with a laser driver, the reference voltage of described laser driver is V REF
Step 6: the numerical value of setting described first microprocessor analog to digital conversion port is DAC_0, reads the corresponding light power P from light power meter 0, from the value ADC_0 of its digital-to-analog conversion port of first microprocessor collection, according to equation Calculate the bias current I of this moment BIAS_(0), and with result of calculation deposits a register in;
Step 7: adjust the numerical value of described first microprocessor analog to digital conversion port, luminous power is debugged the target light performance number, the value that obtains described first microprocessor analog to digital conversion port is DAC_1, and reading corresponding light power from light power meter is P 1, from the value ADC_1 of its digital-to-analog conversion port of first microprocessor device collection, according to equation
Figure BDA0000057267580000092
Calculate the bias current I of this moment BIAS_(1), and with result of calculation deposits described register in;
Step 8: with the luminous power P that step 5 and step 6 read 0, P 1And the bias current I that calculates BIAS_(0) and I BIAS_(1) substitution equation
Figure BDA0000057267580000093
Calculate the luminescence efficiency SE of described optical module, and deposit result of calculation in described register;
Step 9: according to equation Calculate average light power, and with result of calculation and step 7
The luminescence efficiency SE substitution equation of the described optical module that is calculated
Figure BDA0000057267580000095
Calculate the debugging electric current I MOD, and deposit result of calculation in described register;
Step 10: debug out the target debugging electric current I of described optical module when the target extinction ratio with oscillograph MODT
Step 11: with the target debugging electric current I of step 9 debugging MODTDebugging electric current I with step 8 calculating MODThe substitution equation
Figure BDA0000057267580000096
Calculate penalty coefficient;
Step 12: with the debugging electric current I of step 8 calculating MODPenalty coefficient C substitution equation with step 10 calculating The numerical value DAC of calculating described second microprocessor analog to digital conversion port when the target extinction ratio _ MOD, and deposit result of calculation in register;
Step 13: write down the temperature of current first microprocessor, deposit register in;
Step 14: constant temperature oven is set to low temperature, repeating step 6～step 13.
In the present embodiment, the digital-to-analog conversion port and the analog to digital conversion port that go of the first microprocessor and second microprocessor is 12 bit values; Laser driver is the chip for driving of MAX3738 for model.
Use above-mentioned adjustment method that the extinction ratio of optical module is carried out low temperature, normal temperature and high temperature test, obtain experiment test result as following table 1, table 2 and table 3.Wherein table 1 is a low temperature test test data table, and table 2 is a normal temperature test data of experiment table; Table 3 high temperature test data of experiment table.Wherein BOSA is the optical transceiver module interface module, and AOP is that the dB of average light power represents value, and Pavg is an average light power, and target_ER is that the dB of target extinction ratio represents value, I MODBe the debugging electric current, IMOD_DAC is the binary form indicating value of debugging electric current, and test_ER represents value for the dB of debugging extinction ratio, and Δ (test_ER-target_ER) is the difference of target extinction ratio and debugging extinction ratio.
Figure BDA0000057267580000101
Table 1
Figure BDA0000057267580000102
Table 2
Figure BDA0000057267580000112
Table 3
From the data of above table 1, table 2 and table 3 as can be seen, adopt optical module extinction ratio debugging apparatus of the present invention and method, its debugging error+/-1dB in, greatly guaranteed adjustment accuracy.And this debugging apparatus and adjustment method need not to use oscillograph, greatly reduce cost.
What need statement is that foregoing invention content and embodiment are intended to prove the practical application of technical scheme provided by the present invention, should not be construed as the qualification to protection domain of the present invention.Those skilled in the art are in spirit of the present invention and principle, when doing various modifications, being equal to and replacing or improve.Protection scope of the present invention is as the criterion with appended claims.

Claims (49)

1. the adjustment method of an optical module extinction ratio, described optical module comprises biasing circuit and modulation circuit, it is characterized in that, described adjustment method may further comprise the steps:
Step 1: optical module to be debugged is inserted on the evaluation board;
Step 2 a: light power meter is connected to a computing machine and optical module described to be debugged, wherein said light power meter comprises light mouth and GBIP interface, described light mouth is connected to describedly waits to debug optical module, described GBIP interface is connected to described computing machine in order to measured optical power value is sent to described computing machine in order to measuring light power;
Step 3: described evaluation board is placed a constant temperature oven;
Step 4: constant temperature oven is set to normal temperature;
Step 5: drive described laser instrument with a laser driver, the reference voltage of described laser driver is V REF
Step 6: the numerical value of setting described first microprocessor analog to digital conversion port is DAC_0, reads the corresponding light power P from light power meter 0, from the value ADC_0 of its digital-to-analog conversion port of first microprocessor collection, according to equation
Figure FDA0000057267570000011
Calculate the bias current I of this moment BIAS_(0), and with result of calculation deposits a register in;
Step 7: adjust the numerical value of described first microprocessor analog to digital conversion port, luminous power is debugged the target light performance number, the value that obtains described first microprocessor analog to digital conversion port is DAC_1, and reading corresponding light power from light power meter is P 1, from the value ADC_1 of its digital-to-analog conversion port of first microprocessor device collection, according to equation
Figure FDA0000057267570000012
Calculate the bias current I of this moment BIAS_(1), and with result of calculation deposits described register in;
Step 8: with the luminous power P that step 5 and step 6 read 0, P 1And the bias current I that calculates BIAS_(0) and I BIAS_(1) substitution equation
Figure FDA0000057267570000013
Calculate the luminescence efficiency SE of described optical module, and deposit result of calculation in described register;
Step 9: according to equation
Figure FDA0000057267570000014
Calculate average light power, and the luminescence efficiency SE substitution equation of the described optical module that result of calculation and step 7 are calculated Calculate the debugging electric current I MOD, and deposit result of calculation in described register;
Step 10: provide long " 0 " respectively and grow " 1 " signal and send into optical module with the bit error analyzing instrument, up to the luminous power ratio of the luminous power of optical module when growing " 1 " during divided by length " 0 " is target delustring ratio, obtains the target debugging electric current I of described optical module when the target extinction ratio MODT
Step 11: with the target debugging electric current I of step 9 debugging MODTDebugging electric current I with step 8 calculating MODThe substitution equation
Figure FDA0000057267570000021
Calculate penalty coefficient;
Step 12: with the debugging electric current I of step 8 calculating MODPenalty coefficient C substitution equation with step 10 calculating The numerical value DAC of calculating described second microprocessor analog to digital conversion port when the target extinction ratio _ MOD, and deposit result of calculation in register;
Step 13: write down the temperature of current first microprocessor, deposit register in.
2. adjustment method as claimed in claim 1 is characterized in that, further comprises:
Step 14: constant temperature oven is set to low temperature, repeating step 6～step 13.
3. adjustment method as claimed in claim 1 is characterized in that, further comprises:
Step 15: constant temperature oven is set at high temperature, repeating step 6～step 13.
4. adjustment method as claimed in claim 1 is characterized in that, wherein the digital-to-analog conversion port of first microprocessor and analog to digital conversion port are 12 bit values.
5. adjustment method as claimed in claim 1 is characterized in that, wherein the digital-to-analog conversion port of second microprocessor and analog to digital conversion port are 12 bit values.
6. adjustment method as claimed in claim 1 is characterized in that, wherein said first microprocessor and described second microprocessor are same microprocessor.
7. adjustment method as claimed in claim 6 is characterized in that, the full width of cloth voltage of the analog to digital conversion port of wherein said microprocessor and digital-to-analog conversion port is 2.5V.
8. adjustment method as claimed in claim 1 is characterized in that, wherein said laser driver is that model is the chip for driving of MAX3738.
9. adjustment method as claimed in claim 1 is characterized in that,
Described biasing circuit comprises first microprocessor, first resistance, first mirror current source, operational amplifier, NPN transistor, second mirror current source, second resistance, laser instrument and first current source.
10. adjustment method as claimed in claim 9 is characterized in that,
Described modulation circuit comprises bit error analyzing instrument, differential amplifier, the 3rd mirror current source, second current source, the 3rd resistance, second microprocessor and laser instrument; Wherein said first microprocessor comprises the first digital-to-analog conversion port and analog to digital conversion port, the digital-to-analog conversion port of described first microprocessor and analog to digital conversion port are N1 bit value, the conversion proportion of described second mirror current source is 1: K, the resistance of described second resistance is R, and the resistance of described the 3rd resistance is R MOD, the conversion proportion of described the 3rd mirror current source is 1: M, the digital-to-analog conversion port of described second microprocessor and analog to digital conversion port are N2 bit value.
11. adjustment method as claimed in claim 10 is characterized in that,
Described first microprocessor comprises analog to digital conversion port and digital-to-analog conversion port, and its digital-to-analog conversion port is exported first electric current;
Described first resistance comprises first end and second end, and its first end is connected to the digital-to-analog conversion port of described first microprocessor, to receive described first electric current.
12. adjustment method as claimed in claim 11 is characterized in that,
Described first mirror current source has first input end, second input end and output terminal, described first input end is connected to second end of described first resistance, to receive described first electric current, described second input end is connected to described first current source, to receive second current signal that described first current source provides, described output terminal provides first image current.
13. adjustment method as claimed in claim 12 is characterized in that,
Described operational amplifier receives first image current of described first mirror current source output, and will obtain an amplifying signal after its amplification.
14. adjustment method as claimed in claim 13 is characterized in that,
Described NPN transistor comprises base stage, collector and emitter, described amplifying signal is transferred into described base stage, in order to drive described NPN transistor, described collector is connected to described laser instrument, described emitter is connected to described second mirror current source, described NPN transistor is driven the back and produces described bias current, in order to set the average light power of described laser instrument.
15. adjustment method as claimed in claim 14 is characterized in that,
Described second mirror current source comprises input end and output terminal, and its input end is connected to the emitter of described NPN transistor, in order to receiving described bias current, and described bias current is changed into second image current; Its output terminal is connected to an end of second resistance.
16. adjustment method as claimed in claim 15 is characterized in that,
Described second resistance comprises first end and second end, and its first end is connected to the output terminal of described second mirror current source, in order to receiving described second image current, and is translated into the analog to digital conversion port that voltage signal is delivered to described microprocessor; Its second end ground connection.
17. adjustment method as claimed in claim 1, its spy is being,
Described second microprocessor comprises the digital-to-analog conversion port, and described digital-to-analog conversion port is exported second electric current;
Described the 3rd resistance comprises first end and second end, and described first end is connected to the digital-to-analog conversion port of described second microprocessor, and described second end is connected to the reference voltage of described laser driver.
18. adjustment method as claimed in claim 17, its spy is being,
Described second current source comprises first end and second end, and described first end is connected to second end of described the 3rd resistance;
Described the 3rd mirror current source comprises first end and second end, and described first end is connected to second end of described second current source, and described second end provides the 3rd image current.
19. adjustment method as claimed in claim 18, its spy is being,
Described bit error analyzing instrument comprises first output terminal and second output terminal, in order to the binary code stream of " 1 " and " 0 " to be provided respectively;
Described differential amplifier comprises first input end, second input end, the 3rd input end and output terminal, and its first input end and second input end are connected to described bit error analyzing instrument respectively, in order to receive described binary code stream; Described the 3rd input end is connected to second end of described the 3rd mirror current source, and in order to receive described the 3rd image current, described output terminal provides described modulating current to described laser instrument.
20. as the described adjustment method of one of claim 1 to 19, its spy is being that wherein said optical module is connected with the golden finger that is connected to of described evaluation board.
21. as the described adjustment method of one of claim 1 to 19, its spy is being that the conversion proportion of wherein said first mirror current source is 1: 2.
22. as the described adjustment method of one of claim 1 to 19, its spy is being that wherein said computing machine comprises I 2C parallel interface, GBIP interface and device control software.
23. as the described adjustment method of one of claim 1 to 19, its spy is being that wherein said evaluation board comprises that one is connected to the power supply port of dc power supply.
24. as the described adjustment method of one of claim 1 to 19, its spy is being that the light mouth of wherein said light power meter is connected to described optical module by optical fiber.
25. as the described adjustment method of one of claim 1 to 19, its spy is being that wherein said bit error analyzing instrument is connected to described evaluation board by coaxial cable.
26. the debugging apparatus of an optical module extinction ratio is characterized in that, described debugging apparatus comprises:
Computing machine, described computing machine comprises I 2C parallel interface, GBIP interface and device control software;
Optical module, described optical module comprises biasing circuit and modulation circuit, and described biasing circuit is in order to set the bias current of described optical module, and described modulation circuit is in order to set the modulating current of described optical module;
Laser driver is in order to drive described optical module;
Evaluation board, described optical module are inserted on the described evaluation board, and described evaluation board comprises that one is connected to the power supply port of dc power supply;
Constant temperature oven is used to place described evaluation board;
Light power meter, described light power meter comprises GBIP interface and Guang Kou, described light mouth is connected to described optical module, in order to read the luminous power of described optical module; Described GBIP interface is connected to described computing machine, is sent to described computing machine in order to the luminous power with described optical module.
27. debugging apparatus as claimed in claim 26 is characterized in that,
Described biasing circuit comprises first microprocessor, first resistance, first mirror current source, operational amplifier, NPN transistor, second mirror current source, resistance, laser instrument and first current source.
28. debugging apparatus as claimed in claim 26 is characterized in that,
Described modulation circuit comprises bit error analyzing instrument, differential amplifier, the 3rd mirror current source, second current source, the 3rd resistance, second microprocessor and described laser instrument;
Described first microprocessor comprises analog to digital conversion port and digital-to-analog conversion port, and its digital-to-analog conversion port is exported first electric current.
29. debugging apparatus as claimed in claim 28 is characterized in that,
Described first resistance comprises first end and second end, and its first end is connected to the digital-to-analog conversion port of described first microprocessor, to receive described first electric current.
30. debugging apparatus as claimed in claim 29 is characterized in that,
Described first mirror current source has first input end, second input end and output terminal, described first input end is connected to second end of described first resistance, to receive described first electric current, described second input end is connected to described first current source, to receive second current signal that described first current source provides, described output terminal provides first image current.
31. debugging apparatus as claimed in claim 26 is characterized in that,
Described operational amplifier receives first image current of described first mirror current source output, and will obtain an amplifying signal after its amplification.
32. debugging apparatus as claimed in claim 31 is characterized in that,
Described NPN transistor comprises base stage, collector and emitter, described amplifying signal is transferred into described base stage, in order to drive described NPN transistor, described collector is connected to described laser instrument, described emitter is connected to described second mirror current source, described NPN transistor is driven the back and produces described bias current, in order to set the average light power of described laser instrument.
33. debugging apparatus as claimed in claim 32 is characterized in that,
Described second mirror current source comprises input end and output terminal, and its input end is connected to the emitter of described NPN transistor, in order to receiving described bias current, and described bias current is changed into second image current; Its output terminal is connected to an end of second resistance.
34. debugging apparatus as claimed in claim 33 is characterized in that,
Described second resistance comprises first end and second end, and its first end is connected to the output terminal of described second mirror current source, in order to receiving described second image current, and is translated into the analog to digital conversion port that voltage signal is delivered to described microprocessor; Its second end ground connection.
35. debugging apparatus as claimed in claim 34 is characterized in that,
Described second microprocessor comprises the digital-to-analog conversion port, and described digital-to-analog conversion port is exported second electric current.
36. debugging apparatus as claimed in claim 35 is characterized in that,
Described the 3rd resistance comprises first end and second end, and described first end is connected to the digital-to-analog conversion port of described second microprocessor, and described second end is connected to the reference voltage of described laser driver.
37. debugging apparatus as claimed in claim 36 is characterized in that,
Described second current source comprises first end and second end, and described first end is connected to second end of described the 3rd resistance;
Described the 3rd mirror current source comprises first end and second end, and described first end is connected to second end of described second current source, and described second end provides the 3rd image current;
Described bit error analyzing instrument comprises first output terminal and second output terminal, in order to the binary code stream of " 1 " and " 0 " to be provided respectively.
38. debugging apparatus as claimed in claim 37 is characterized in that,
Described differential amplifier comprises first input end, second input end, the 3rd input end and output terminal, and its first input end and second input end are connected to described bit error analyzing instrument respectively, in order to receive described binary code stream; Described the 3rd input end is connected to second end of described the 3rd mirror current source, and in order to receive described the 3rd image current, described output terminal provides described modulating current to described laser instrument.
39., it is characterized in that the digital-to-analog conversion port of wherein said first microprocessor and analog to digital conversion port are 12 bit values as the described debugging apparatus of one of claim 26 to 38.
40. debugging apparatus as claimed in claim 39 is characterized in that, the digital-to-analog conversion port of wherein said second microprocessor and analog to digital conversion port are 12 bit values.
41. debugging apparatus as claimed in claim 39 is characterized in that, wherein said first microprocessor and described second microprocessor are same microprocessor.
42. debugging apparatus as claimed in claim 39 is characterized in that, the full width of cloth voltage of the digital-to-analog conversion port of wherein said microprocessor and analog to digital conversion port is 2.5V.
43., it is characterized in that wherein said laser driver is that model is the chip for driving of MAX3738 as the described debugging apparatus of one of claim 26 to 38.
44., it is characterized in that wherein said optical module is connected with the golden finger that is connected to of described evaluation board as the described debugging apparatus of one of claim 26 to 38.
45., it is characterized in that wherein said bit error analyzing instrument is connected to described evaluation board by coaxial cable as the described debugging apparatus of one of claim 26 to 38, to provide described binary code stream to described optical module.
46., it is characterized in that the light mouth of wherein said light power meter is connected to described optical module by optical fiber as the described debugging apparatus of one of claim 26 to 38.
47., it is characterized in that the conversion proportion of wherein said first mirror current source is 1: 2 as the described debugging apparatus of one of claim 26 to 38.
48., it is characterized in that the conversion proportion of wherein said second mirror current source is 1: K as the described debugging apparatus of one of claim 26 to 38.
49., it is characterized in that the conversion proportion of wherein said the 3rd mirror current source is 1: M as the described debugging apparatus of one of claim 26 to 38.
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