CN102193849A - Keyboard testing system - Google Patents
Keyboard testing system Download PDFInfo
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- CN102193849A CN102193849A CN2010101312252A CN201010131225A CN102193849A CN 102193849 A CN102193849 A CN 102193849A CN 2010101312252 A CN2010101312252 A CN 2010101312252A CN 201010131225 A CN201010131225 A CN 201010131225A CN 102193849 A CN102193849 A CN 102193849A
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Abstract
The invention discloses a keyboard testing system, which is used for detecting the keyboard function of a mainboard. The keyboard testing system comprises a control unit, a microprocessor, a keyboard switch unit, a keyboard interface and a mainboard, wherein the control unit is used for outputting an execution command; the microprocessor is used for receiving the execution command and outputting a plurality of control signals in sequence according to the execution command; the keyboard switch unit comprises a plurality of electronic switches which are used for receiving the plurality of control signals output by the microprocessor and are conducted in sequence; the keyboard interface is connected with the plurality of electronic switches of the keyboard switch unit; the mainboard comprises a keyboard interface circuit which is connected with the plurality of electronic switches of the keyboard switch unit through the keyboard interface; and when the plurality of electronic switches in the keyboard unit are conducted in sequence, the mainboard outputs coded information of corresponding keys in sequence. By adopting the keyboard testing system, detection can be performed without manually beating all keys on a keyboard, thus the detection efficiency and the detection speed can be increased and the labor cost is saved.
Description
[technical field]
The present invention relates to a kind of test macro, particularly a kind of keyboard test system that is applied to a portable type electronic product as a notebook computer.
[background technology]
Keyboard is the main input equipment of computing machine, keyboard is carried out functional test be absolutely necessary to guarantee that keyboard can normally be imported in computing machine manufacturing field.
Keyboard mainly is made up of internal control circuit and external key.The button winding displacement of keyboard generally takes matrix form to arrange, form by row signal line and column signal line, (being example only) as shown in Figure 1 with 4 * 4 keyboards, the ranks signal wire does not directly intersect at the place, point of crossing, and by an optionally conducting of switch being set, a button of the corresponding keyboard of each switch outside.When a button is pressed on the keyboard, the switch conduction that it is corresponding, thereby corresponding ranks signal wire is obtained the coded message of this button then by short circuit by keyboard scanning circuit.
The keyboard control circuit of notebook computer is arranged on the mainboard, realizes keypad function by mainboard.At present, each tame notebook computer manufacturer generally still takes manual type that the keyboard of notebook computer is tested, and promptly operator is tested by buttons all on the lower keyboard one by one.The keyboard of general notebook computer is made up of 84 buttons, and as if beaing the Time Calculation of a button with 1 second, the keyboard of then testing whole notebook computer probably needs more than 80 second time, and therefore, detection efficiency is not high; And manual detection is easy because testing staff's carelessness causes detecting mistake, and therefore, accuracy of detection is not high yet; In addition, manual detection needs a large amount of manpowers, and can produce the wear and tear expense of keyboard in testing process, and therefore, cost is than higher.
[summary of the invention]
In view of this, the object of the present invention is to provide a kind of detection efficiency and accuracy of detection than the keyboard test system higher, that cost is lower.
For achieving the above object, keyboard test system of the present invention is used for the keypad function of a mainboard is detected, and it is characterized in that this keyboard test system comprises:
One control module is used to export an execution command;
One microprocessor links to each other with this control module, is used to receive this execution command, and exports some control signals successively according to this execution command;
One keyboard switch unit links to each other with this microprocessor, and this keyboard switch unit comprises some electronic switches, and these some electronic switches receive the some control signals and the conducting successively of this microprocessor output respectively;
One keyboard interface links to each other with some electronic switches of this keyboard switch unit; And
One mainboard, comprise a keyboard interface circuit, this keyboard interface circuit links to each other with some electronic switches of this keyboard switch unit by this keyboard interface, and this mainboard is exported the coded message of corresponding button successively when the some electronic switches in this keyboard switch unit conducting successively.
With respect to prior art, keyboard test system provided by the invention is controlled some electronic switches conducting successively in this keyboard switch unit by this microprocessor, make mainboard export the coded message of corresponding button successively, thereby judge according to the coded message of mainboard output whether the keypad function of this mainboard is normal.Keyboard test system of the present invention need not to detect by all buttons that manually beat on the keyboard, and therefore, detection efficiency and detection speed be than higher, and has reduced cost because of saving manpower and keyboard wear and tear expense.
[description of drawings]
Fig. 1 illustrates the button winding displacement synoptic diagram of existing keyboard.
Fig. 2 illustrates the schematic appearance of the applied notebook computer of keyboard test system of the present invention.
Fig. 3 illustrates the interior block diagram of the better embodiment of keyboard test system of the present invention.
Fig. 4 illustrates the circuit diagram of the better embodiment of test cell in the keyboard test system of the present invention.
[embodiment]
Below in conjunction with description of drawings and better embodiment the present invention is described in further detail:
Please refer to Fig. 2 and Fig. 3, the better embodiment of keyboard test system of the present invention is used for the keyboard 2 of a notebook computer 1 is carried out functional test.This keyboard test system comprises a test cell 100, a mainboard 200, a comparing unit 300 and an indicating member 400.This test cell 100 comprises a control module 110, a microprocessor 120, a keyboard switch unit 130 and a keyboard interface 140.This mainboard 200 comprises a keyboard interface circuit 210.This mainboard 200 is arranged in this notebook computer 1.
Please refer to Fig. 4, this control module 110 comprises a gauge tap SW1, two resistance R 1, R2 and two capacitor C 1, C2.In this better embodiment, this gauge tap SW1 is a keyswitch.First end, 1 ground connection of this gauge tap SW1, and link to each other with its second end 2 by this capacitor C 1.Second end 2 of this gauge tap SW1 meets a power supply VCC by this resistance R 1, and links to each other with this microprocessor 120 by this resistance R 2.Second end 2 of this gauge tap SW1 is also by these capacitor C 2 ground connection.
This microprocessor 120 is a programmable integrated circuit control chip, such as being that a model is the control chip of 80C51.This microprocessor 120 comprises first group of input and output pin P1.0-P1.7, second group of input and output pin P2.0-P2.7 and one the 3rd input and output pin P3.0.The 3rd input and output pin P3.0 of this microprocessor 120 links to each other with second end 2 of this gauge tap SW1 by this resistance R 2.First group of input and output pin P1.0-P1.7 of this microprocessor 120 links to each other with this keyboard switch unit 130 with second group of input and output pin P2.0-P2.7.In addition, but for guaranteeing this microprocessor 120 operate as normal, this microprocessor 120 also should comprise other pin such as power pins, grounding pin and clock pin etc., and these pins corresponding circuit such as power circuit, the clock circuit etc. that connect, this is a prior art, does not repeat them here.
This keyboard switch unit 130 comprises 16 MOS (Metal Oxide Semiconductor, metal-oxide semiconductor (MOS)) field effect transistor Q1-Q16.The grid of each metal-oxide-semiconductor field effect transistor Q1-Q16 is corresponding continuous with this first group of input and output pin P1.0-P1.7 and second group of input and output pin P2.0-P1.7 respectively, and links to each other by a resistance R 3 source electrode corresponding with it respectively.The input pin that the source electrode of each metal-oxide-semiconductor field effect transistor Q1-Q16 is corresponding with this keyboard interface 140 respectively links to each other.The drain electrode of each metal-oxide-semiconductor field effect transistor Q1-Q16 links to each other by a resistance R 4 and this keyboard interface 140 corresponding output pins respectively.In other embodiments, these 16 metal-oxide-semiconductor field effect transistor Q1-Q16 also can be other electronic switch, as triode, also can be metal-oxide-semiconductor field effect transistors and the combination of different electronic switches such as triode.
This keyboard interface 140 can be a connector, and it comprises eight input pin KI0-KI7 and 16 output pin KO0-KO15.The input pin KI0-KI7 of this keyboard interface 140 and output pin KO0-KO15 link to each other with the keyboard interface circuit 210 of this mainboard 200.In this better embodiment, the source electrode of each metal-oxide-semiconductor field effect transistor Q1-Q16 and drain electrode are all to an input pin and an output pin that should keyboard interface 140, but, the input pin and the output pin of the drain electrode of any two metal-oxide-semiconductor field effect transistors and the keyboard interface 140 that source electrode connected are not finished identical, if promptly there is the source electrode of two metal-oxide-semiconductor field effect transistors to be connected to the same input pin of this keyboard interface 140, then the output pin of the keyboard interface that drain electrode connected 140 of these two metal-oxide-semiconductor field effect transistors is same scarcely, thus different button on the keyboard 2 of may command notebook computer 1.
Please refer again to Fig. 1, Fig. 1 is to be example with 4 * 4 keyboard matrix spread pattern, and its button winding displacement is made up of four row signal line P1-P4 and four column signal line L1-L4.This spread pattern common property of 4 * 4 is given birth to 16 point of crossing, and each place, point of crossing is provided with a keyswitch.Be example with row signal line P1, P12 and column signal line L1, L2 now, the point of crossing of row signal line P1 and column signal line L1 is provided with a keyswitch K1, and the point of crossing of row signal line P2 and column signal line L2 is provided with a keyswitch K2.Analysis is learnt according to Fig. 1, can determine that just this row signal line P1 and column signal line L1 are working properly if this keyswitch K1 is working properly; Just can determine that this row signal line 21 and column signal line 22 are working properly if this keyswitch K2 is working properly.Therefore, in Fig. 1, but only need to determine also operate as normal of keyswitch K1, K2, K3, the K4 button that just can determine among Fig. 1 other working properly, because of need not that each button is detected.
Learn that based on above-mentioned analysis and in conjunction with the inside button winding displacement form of this notebook computer 1 the END key on the keyboard 2 of this notebook computer 1, HOME key, left SHIFT key, { key, % key, (ten six press keys residing positions in the button winding displacement such as key, F9 key, * key, @ key, E key, left WIN key, left ALT key, right WIN key, right CTRL key, F1 key, FN key are consistent with keyswitch K1, K2, K3, K4 among Fig. 1.Therefore, just can determine whether operate as normal of whole keyboard 2 but only need above-mentioned ten six press keys are tested, and need not all buttons on the keyboard 2 of notebook computer 1 are tested one by one.
Therefore, keyboard test system of the present invention by 16 metal-oxide-semiconductor field effect transistor Q1-Q16 in this keyboard switch unit 130 control respectively this keyboard 2 END key, HOME key, left SHIFT key, { key, % key, (ten six press keys such as key, F9 key, * key, @ key, E key, left WIN key, left ALT key, right WIN key, right CTRL key, F1 key, FN key are promptly simulated the sight that above-mentioned ten six press keys are pressed with 16 metal-oxide-semiconductor field effect transistor Q1-Q16.Such as, when this metal-oxide-semiconductor field effect transistor Q1 is used to control END key on this keyboard 2, then represent that the END key on this keyboard 2 is pressed when this MOS is in great demand pipe Q1 conducting, then the row signal line at this END key place and column signal line be by short circuit, thereby export the keyboard-coding information of this END key.
Therefore, microprocessor 120 in the keyboard test system of the present invention also corresponding stored has a test procedure, make first group of output pin P1.0-P1.7 and second group of input and output pin P2.0 and P2.7 can export the corresponding metal-oxide-semiconductor field effect transistor Q1-Q16 conducting successively of control signal control of high level successively, thereby make the pairing ranks signal wire of above-mentioned ten six press keys on this mainboard 200 successively by short circuit, to export the coded message of above-mentioned ten six press keys.
This comparing unit 300 is used to store a standard code information, promptly when the END key on this keyboard 2, HOME key, left SHIFT key, { key, % the key, (coded message that ten six press keys such as key, F9 key, * key, @ key, E key, left WIN key, left ALT key, right WIN key, right CTRL key, F1 key, FN key are exported during in operate as normal.Whether keyboard-coding information and this standard code information of these mainboard 200 outputs were compared when this comparing unit 300 also was used for test, normal with the keypad function of confirming this mainboard 200, and exported an indicator signal according to comparative result and give this indicating member 400.Whether this indicating member 400 indicates the keypad function to show this mainboard 200 normal according to this indicator signal.Wherein, this indicating member 400 can be a hummer or a pilot lamp.
The concrete course of work of keyboard test system of the present invention is as follows: in the ordinary course of things, the 3rd input and output pin P3.0 of this microprocessor 120 is pulled into high level by this power supply VCC.In the time will carrying out functional test to the keyboard 2 of notebook computer 1, the gauge tap SW1 that presses in the control module 100 makes the input and output pin P3.0 of this microprocessor 120 by resistance R 2 ground connection, thereby provide a low level signal to offer the 3rd input and output pin P3.0 of this microprocessor 120 as execution command, this microprocessor 120 receives the test procedure that just begins to carry out its storage inside after this execution command, the control signal that first group of input and output pin P1.0-P1.7 of this microprocessor 120 and second group of input and output pin P2.0-P2.7 just export high level is successively controlled 16 metal-oxide-semiconductor field effect transistor Q1-Q16 conductings successively, thereby makes this mainboard 200 export the END key successively, the HOME key, left side SHIFT key, { key, the % key, (key, the F9 key, * key, the @ key, the E key, left side WIN key, left side ALT key, right WIN key, right CTRL key, the F1 key, the coded message of ten six press keys such as FN key.
After the test procedure of microprocessor 120 inside is carried out end, this comparing unit 300 is compared the coded message of these mainboard 200 outputs and the standard code information of storage inside, if the keyboard-coding information of mainboard 200 outputs is consistent with this standard code information, then comparing unit 200 outputs one indicator signal is given this indicating member 400, and this indicating member 400 indicates the keypad function to show this mainboard 200 normal according to this indicator signal.If the coded message and the standard code information inconsistency of mainboard 200 outputs, then comparing unit 200 another indicator signals of output are given this indicating member 400, and it is undesired that this indicating member 400 is indicated with the keypad function that shows this mainboard 200 according to this another indicator signal.
In other embodiments, keyboard test system of the present invention also can comprise a display screen, link to each other with this mainboard 200, be used for showing the keyboard-coding information of this standard code information and these mainboard 200 outputs of test process, thereby can understand the test result of this keyboard test system more intuitively.Therefore, in other embodiments, this comparing unit 300 and indicating member 400 also can be omitted, and directly judge according to the keyboard-coding information of these mainboard 200 outputs whether the keypad function of this mainboard 200 is normal.
In addition, because residing position may be different in the button winding displacement for the button of the keyboard of different notebook computers, therefore, in other embodiments, these 16 metal-oxide-semiconductor field effect transistor Q1-Q16 also can be used for controlling other button on the another kind of keyboard of notebook computer, as long as these buttons END key of this notebook computer 1 in residing position and the present embodiment in the button winding displacement, the HOME key, left side SHIFT key, { key, the % key, (key, the F9 key, * key, the @ key, the E key, left side WIN key, left side ALT key, right WIN key, right CTRL key, the F1 key, identical the getting final product in the residing position of FN key.In addition, keyboard test system of the present invention also can be used for testing the keypad function of the mainboard of other portable type electronic product, as mobile phone, and PDA (Personal Digital Assistant, personal work assistant) etc., its test philosophy is same as described above.
Claims (10)
1. a keyboard test system is used for the keypad function of a mainboard is detected, and it is characterized in that this keyboard test system comprises:
One control module is used to export an execution command;
One microprocessor links to each other with this control module, is used to receive this execution command, and exports some control signals successively according to this execution command;
One keyboard switch unit links to each other with this microprocessor, and this keyboard switch unit comprises some electronic switches, and these some electronic switches are used for receiving respectively the some control signals and the conducting successively of this microprocessor output;
One keyboard interface links to each other with some electronic switches of this keyboard switch unit; And
One mainboard, comprise a keyboard interface circuit, this keyboard interface circuit links to each other with some electronic switches of this keyboard switch unit by this keyboard interface, and this mainboard is exported the coded message of corresponding button successively when the electronic switch in this keyboard switch unit conducting successively.
2. keyboard test system as claimed in claim 1, it is characterized in that: also comprise a comparing unit, link to each other with this mainboard, this comparing unit is used to store a standard code information, and keyboard-coding information and this standard code information of the output of this mainboard compared, and export an indicator signal according to comparison result.
3. keyboard test system as claimed in claim 2 is characterized in that: also comprise an indicating member, link to each other with this comparing unit, be used to receive the indicator signal of this comparing unit output and indicate.
4. keyboard test system as claimed in claim 1 is characterized in that: also comprise a display screen, link to each other with this mainboard, be used to show the coded message of the corresponding button of this mainboard output.
5. keyboard test system as claimed in claim 1 is characterized in that: this control module comprises a gauge tap, the first end ground connection of this gauge tap, and its second end links to each other with this microprocessor by a resistance.
6. keyboard test system as claimed in claim 1 is characterized in that: this keyboard switch unit comprises 16 electronic switches.
7. keyboard test system as claimed in claim 1 is characterized in that: each this electronic switch is a metal oxide semiconductor field effect tube.
8. keyboard test system as claimed in claim 1 is characterized in that: each this electronic switch is a triode.
9. keyboard test system as claimed in claim 1 is characterized in that: these some electronic switches are the combination of metal oxide semiconductor field effect tube and triode.
10. keyboard test system as claimed in claim 1 is characterized in that: corresponding key is END key, HOME key, left SHIFT key, { key, % key, (key, F9 key, * key, @ key, E key, left WIN key, left ALT key, right WIN key, right CTRL key, F1 key and the FN key on the notebook computer on this mainboard.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010101312252A CN102193849A (en) | 2010-03-03 | 2010-03-03 | Keyboard testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010101312252A CN102193849A (en) | 2010-03-03 | 2010-03-03 | Keyboard testing system |
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| CN102193849A true CN102193849A (en) | 2011-09-21 |
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| CN2010101312252A Pending CN102193849A (en) | 2010-03-03 | 2010-03-03 | Keyboard testing system |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103852718A (en) * | 2012-11-30 | 2014-06-11 | 英业达科技有限公司 | Testing system and method for keyboard |
| CN106155850A (en) * | 2015-04-21 | 2016-11-23 | 神讯电脑(昆山)有限公司 | Fast key automatization test system and method |
| CN107329862A (en) * | 2017-06-19 | 2017-11-07 | 北京小米移动软件有限公司 | Detection method, device and the terminal of keyboard |
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| CN101241461A (en) * | 2007-02-07 | 2008-08-13 | 纬创资通股份有限公司 | Keyboard automatic test system and its method |
| CN101452413A (en) * | 2007-11-28 | 2009-06-10 | 英业达股份有限公司 | Automatic detection system for note type computer keyboard interface and method thereof |
| CN201673498U (en) * | 2010-03-03 | 2010-12-15 | 神讯电脑(昆山)有限公司 | Keyboard test system |
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Patent Citations (5)
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| CN1327193A (en) * | 2000-06-05 | 2001-12-19 | 英业达股份有限公司 | Method for detecting keyboard array short circuit |
| CN2888534Y (en) * | 2006-04-19 | 2007-04-11 | 深圳安博电子有限公司 | A keyboard tester |
| CN101241461A (en) * | 2007-02-07 | 2008-08-13 | 纬创资通股份有限公司 | Keyboard automatic test system and its method |
| CN101452413A (en) * | 2007-11-28 | 2009-06-10 | 英业达股份有限公司 | Automatic detection system for note type computer keyboard interface and method thereof |
| CN201673498U (en) * | 2010-03-03 | 2010-12-15 | 神讯电脑(昆山)有限公司 | Keyboard test system |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103852718A (en) * | 2012-11-30 | 2014-06-11 | 英业达科技有限公司 | Testing system and method for keyboard |
| CN106155850A (en) * | 2015-04-21 | 2016-11-23 | 神讯电脑(昆山)有限公司 | Fast key automatization test system and method |
| CN107329862A (en) * | 2017-06-19 | 2017-11-07 | 北京小米移动软件有限公司 | Detection method, device and the terminal of keyboard |
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Application publication date: 20110921 |
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