CN102185648B - Test system and method for increasing debugging and detection speed of optical module - Google Patents
Test system and method for increasing debugging and detection speed of optical module Download PDFInfo
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- CN102185648B CN102185648B CN201110104045.XA CN201110104045A CN102185648B CN 102185648 B CN102185648 B CN 102185648B CN 201110104045 A CN201110104045 A CN 201110104045A CN 102185648 B CN102185648 B CN 102185648B
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Abstract
The invention provides a test system and a test method for increasing a debugging and detection speed of an optical module. In order to change a low-efficiency working mode that the next optical module cannot be detected until the former optical module is tested and solve the technical problem that the test progress is slow because debugging and test cannot be executed at the same time, at least two optical modules are involved, and a linkage switch switching circuit is added in a circuit between a micro control unit (MCU) of the test system and the optical module; the MCU transmits a control signal to the controlled end of the linkage switch switching circuit; one path of switching switch in the linkage switch switching circuit transmits a debugging signal from the MCU to a debugging interface of an optical module group; and the other path of switching switch in the linkage switch switching circuit transmits a detection signal from detection equipment to a detection interface of the optical module group. The invention has the advantages of improving the production efficiency by 30 percent and obtaining obvious economical benefit, along with a rather high practical value.
Description
Technical field
The present invention relates to the technical field of measurement and test of optical module in optical network, comprise EPON, the debugging of GPON optical module performance parameter and detect, is a kind of test macro that can greatly improve debugging and detection rates.
Background technology
In FTTX day by day universal today, also be there is to growth at a high speed in the demand of PON module, therefore the problem that how to meet the requirement of production capacity and guarantee product quality just pendulum in face of everybody: do not increasing in product test instrument and equipment situation, reduce the product test link time, improve product test efficiency, reduce the testing cost of unit product.
For PON optical module product, be mainly divided into debugging and detect.In prior art, the general computer that adopts carries out communication by the MCU on serial line interface and test board, and MCU carries out test & check to the optical module on test board again, and the quantity of optical module is generally also one.Under such structure, to test an optical module, first download product firmware, carry out performance parameter debugging and demarcation, and then by testing equipment, particular product performance parameters is tested, particular product performance parameters is divided into transmitting TX and receives RX two parts, and product transmits and receives as duplexing working method.Traditional optical module test macro can only carry out the test of a product, test after an optical module, again next optical module is arranged on test board, then by computer, the control of MCU is regulated and controled and by testing equipment, optical module tested.
Summary of the invention
The object of the invention is in prior art, can only debug in order to change the mode of operation that detects again the inefficiency of next optical module after an optical module, to solve debugging and test, can not carry out simultaneously and cause the technical barrier that testing progress is slow, at least two optical module holders are set on test board, relend and help linked switch commutation circuit module to switch the debugging detected state of optical module, realize an optical module and debug simultaneously and detect, another optical module is debugged installation and the warming-up exercise before detecting.
The present invention is that the technical scheme that realizes goal of the invention employing is, improve the test macro of optical module test & check speed, structure comprises the computer of operation upper strata test program, store the MCU of test board control program, there is debugging interface and the optical module that detects interface, and the checkout equipment being connected with optical module, MCU and optical module are positioned on test board, key is: at least two of the quantity settings of described optical module, and set up linked switch commutation circuit in the MCU of test macro and the circuit between optical module, MCU sends a control signal to the controlled end of linked switch commutation circuit, the debug signal that linked switch commutation circuit Zhong mono-tunnel diverter switch is sent MCU is delivered to the debugging interface of optical module group, the detection signal that another road diverter switch is sent checkout equipment is delivered to the detection interface of optical module group.
The invention still further relates to the supporting method of testing of a kind of and above-mentioned test macro, realize the switching of the test job state between optical module group by linked switch commutation circuit, key is: described method concrete steps are:
A, installation the first optical module, and carry out the front warming-up exercise of debugging;
B, computer are inputted instruction to MCU, control linked switch commutation circuit the debugging interface of the first optical module is connected with MCU, detect interface and are connected with checkout equipment, and the first optical module is debugged
With detection parallel processing process;
C, when the first optical module carries out test & check, next optical module is installed, and carry out debugging before warming-up exercise;
D, after the first optical module is completed, computer is to MCU inputting switching command, control linked switch commutation circuit the debugging interface of next optical module is connected with MCU, detect interface and be connected with checkout equipment, next optical module is carried out to test & check parallel processing process;
E, repeating step c, d, until complete the test of all optical modules.
The principle of above technology contents is: prior art is due to an optical module holder being only set on test board, therefore can only through debugging is front, prepare by an optical module, debugging, the process of test completes after test, carry out again the test of next optical module, before debugging, preparation elapsed time is shorter, but the process time of test & check is long, and debug and detect to obtain and carry out successively, wasted a large amount of time, the solution of the present invention is to be provided with two optical modules, debug signal and detection signal are realized the conversion of optical module test mode by switch switching circuit, so just can make to carry out to two optical modules simultaneously, a parallel processing of debugging and detecting, another one module is debugged the warming-up exercise before detecting and is installed on test board, after modular debugging has detected, the carrying out debugging to off-the-shelf module detects at once, then optical module debugging having been detected unloads from test board, change another optical module, flowing water switch operating state like this, guarantee that debugging and test process loop, greatly improved operating efficiency, in the process of producing in enormous quantities and testing, there is significant progressive meaning.
Below in conjunction with accompanying drawing, the present invention is described in detail.
Accompanying drawing explanation
Fig. 1 is the structural representation of test macro of the present invention.
In accompanying drawing, the 1st, computer, the 2nd, linked switch commutation circuit, the 3rd, test board, 4 is first
Optical module, the 5th, next optical module, the 6th, checkout equipment.
Embodiment
Improve the test macro of optical module test & check speed, structure comprises the computer 1 of operation upper strata test program, store the MCU of test board control program, there is debugging interface and the optical module that detects interface, and the checkout equipment 6 being connected with optical module, MCU and optical module are positioned on test board 3, key is: at least two of the quantity settings of described optical module, and set up linked switch commutation circuit 2 in the MCU of test macro and the circuit between optical module, MCU sends a control signal to the controlled end of linked switch commutation circuit 2, the debug signal that linked switch commutation circuit 2 Zhong mono-tunnel diverter switches are sent MCU is delivered to the debugging interface of optical module group, the detection signal that another road diverter switch is sent checkout equipment 6 is delivered to the detection interface of optical module group.
The debugging detection signal that MCU sends optical module comprises I
2c, SD, BEN signal, wherein I
2c refers to SCL clock and the SDA data-signal of IIC communication; SD refers to acquisition of signal, and whether pilot light module has normal light signal input; BEN refers to burst enable signal, by this signal controlling optical module transmitting, is opened and is forbidden.
Above-mentioned checkout equipment 6 comprises Error Detector, oscilloscope, light power meter and attenuator.Wherein, Error Detector is for generation of TX signal and receive RX signal, and whether test has error code, and it is very high that TX transmitting and RX receive signal rate, conventionally all more than 1Gbps.TX signal is produced by error code ceremony, for produce transmitting pattern data to optical module, as 0101 data, RX signal refers to the signal of optical module after opto-electronic conversion, send Error Detector back to, by Error Detector, whether judge signal after opto-electronic conversion or 0101 data, if not explanation optical module, in transfer process, occurred error code; Oscilloscope is used for when eye diagram quality of test light module delustring; Light power meter is used for measuring luminous power; Attenuator is for attenuate light power.
Above-mentioned optical module is positioned on test board 3 by holder.
The quantity of above-mentioned optical module is 2.According to the time of test & check, arrange 2 optical modules carry out in turn test & check can the maximum using time, more necessity is set little.
And the supporting method of testing of above-mentioned test macro, realizes the switching of the test job state between optical module group by linked switch commutation circuit 2, key is: described method concrete steps are:
A, installation the first optical module 4, and carry out the front warming-up exercise of debugging;
B, 1 pair of MCU input instruction of computer, control linked switch commutation circuit 2 debugging interface of the first optical module 4 be connected with MCU, detects interface and be connected with checkout equipment 6, and the first optical module 4 is carried out to test & check parallel processing process;
C, when the first optical module 4 carries out test & check, next optical module 5 is installed, and carry out debugging before warming-up exercise;
D, after the first optical module 4 is completed, 1 pair of MCU inputting switching command of computer, control linked switch commutation circuit 2 debugging interface of next optical module 5 is connected with MCU, detect interface and be connected with checkout equipment 6, next optical module 5 is carried out to test & check parallel processing process;
E, repeating step c, d, until complete the test of all optical modules.
In the specific implementation, referring to Fig. 1, it is example that two optical modules of take carry out the test process of test & check in turn in the present invention.First computer 1 informs that by program MCU carries out debugging and the detection of the first optical module 4, now MCU can control linked switch commutation circuit 2 by the debug signal of MCU and the first optical module 4 connections, carry out the warming-up exercise of next optical module 5 simultaneously and be installed on test board, Deng the rear MCU of debugging detection the first optical module 4, can control linked switch commutation circuit 2 by the debug signal of MCU and 5 connections of next optical module, carry out debugging and the detection of next optical module 5, according to above-mentioned
Principle carry out incremental step and switch, the time of whole test process is shortened greatly.
Arrange after 2 optical module holders, like this when the debugging of carrying out the first optical module 4 detects, can carry out the warming-up exercise of next optical module 5, improve the rate of utilization of work hour simultaneously, can carry out continuously debugging and the testing process of two optical modules, in a word, guarantee that commissioning device and checkout equipment do not carry out work with resting, reach the object that shortens the testing time, improve the rate of utilization of work hour simultaneously.
Adopt after parallel debugging test macro of the present invention, before module commissioning, warming-up exercise and reception testing time can be saved, and the debugging testing time of whole module has reduced 32 seconds, and production efficiency has improved 30%, obtain obvious economic benefit, had very high practical value.
Claims (5)
1. improve the test macro of optical module test & check speed, structure comprises the computer (1) of operation upper strata test program, store the MCU of test board control program, there is debugging interface and the optical module that detects interface, and the checkout equipment being connected with optical module (6), MCU and optical module are positioned on test board (3), it is characterized in that: at least two of the quantity settings of described optical module, and set up linked switch commutation circuit (2) in the MCU of test macro and the circuit between optical module, MCU sends a control signal to the controlled end of linked switch commutation circuit (2), the debug signal that linked switch commutation circuit (2) Zhong mono-tunnel diverter switch is sent MCU is delivered to the debugging interface of optical module group, the detection signal that another road diverter switch is sent checkout equipment (6) is delivered to the detection interface of optical module group.
2. the test macro of raising optical module test & check speed according to claim 1, is characterized in that: described checkout equipment (6) comprises Error Detector, oscilloscope, light power meter and attenuator.
3. the test macro of raising optical module test & check speed according to claim 1, is characterized in that: described optical module is positioned on test board (3) by holder.
4. the test macro of raising optical module test & check speed according to claim 1, is characterized in that: the quantity of described optical module is 2.
5. with the supporting method of testing of test macro claimed in claim 1, by linked switch commutation circuit (2), realize the switching of the test job state between optical module group, it is characterized in that: described method concrete steps are:
A, installation the first optical module (4), and carry out the front warming-up exercise of debugging;
B, computer (1), to MCU input instruction, are controlled linked switch commutation circuit (2) debugging interface of the first optical module (4) are connected with MCU, and detect interface and be connected with checkout equipment (6),
The first optical module (4) is carried out to test & check parallel processing process;
C, when the first optical module (4) carries out test & check, next optical module (5) is installed, and carry out debugging before warming-up exercise;
D, after the first optical module (4) is completed, computer (1) is to MCU inputting switching command, controlling linked switch commutation circuit (2) is connected the debugging interface of next optical module (5) with MCU, detect interface and be connected with checkout equipment (6), next optical module (5) is carried out to test & check parallel processing process;
E, repeating step c, d, until complete the test of all optical modules.
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Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103051379B (en) * | 2013-01-06 | 2016-04-20 | 青岛海信宽带多媒体技术有限公司 | A kind of optical module debug system |
| CN104506350A (en) * | 2014-12-18 | 2015-04-08 | 姜斯平 | Gigabit Ethernet switching device |
| CN105207712B (en) * | 2015-08-31 | 2018-03-13 | 索尔思光电（成都）有限公司 | A kind of optical module multi-channel parallel test system and method |
| CN105871459A (en) * | 2016-05-05 | 2016-08-17 | 成都君禾天成科技有限公司 | Optical module test system applied to optical communication field |
| CN105871474A (en) * | 2016-05-05 | 2016-08-17 | 成都君禾天成科技有限公司 | Optical module testing system powered by solar energy |
| CN107835048A (en) * | 2017-12-18 | 2018-03-23 | 上海市共进通信技术有限公司 | Optical module test system |
| CN116203288B (en) * | 2023-02-13 | 2024-01-12 | 成都光创联科技有限公司 | Testing device and testing method for static performance of optical device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101915659A (en) * | 2010-07-27 | 2010-12-15 | 东南大学 | Time-division-multiplex device and method of testing instruments and equipment in process of EDFA (Erbium-doped Optical Fiber Amplifer) performance test |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101915659A (en) * | 2010-07-27 | 2010-12-15 | 东南大学 | Time-division-multiplex device and method of testing instruments and equipment in process of EDFA (Erbium-doped Optical Fiber Amplifer) performance test |
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Address after: 518000, Shenzhen, Guangdong province Nanshan District Shekou Nanhai Road 1019, 100 surplus medical instrument Park, two floor Applicant after: Shenzhen Gongjin Electronics Co., Ltd. Address before: 518000, Shenzhen, Guangdong province Nanshan District Shekou Nanhai Road 1019, 100 surplus medical instrument Park, two floor Applicant before: Shenzhen Gongjin Electronics Co., Ltd. |
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