CN102175948B - The proving installation of circuit physical parameter, method and single-board device - Google Patents
The proving installation of circuit physical parameter, method and single-board device Download PDFInfo
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- CN102175948B CN102175948B CN201110030884.1A CN201110030884A CN102175948B CN 102175948 B CN102175948 B CN 102175948B CN 201110030884 A CN201110030884 A CN 201110030884A CN 102175948 B CN102175948 B CN 102175948B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M3/00—Automatic or semi-automatic exchanges
- H04M3/22—Arrangements for supervision, monitoring or testing
- H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
- H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
- H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
- H04M3/305—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance
- H04M3/306—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop testing of physical copper line parameters, e.g. capacitance or resistance for frequencies above the voice frequency, e.g. xDSL line qualification
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- Tests Of Electronic Circuits (AREA)
- Monitoring And Testing Of Exchanges (AREA)
Abstract
The invention provides a kind of proving installation of circuit physical parameter, method and single-board device.This device comprises: data processing and controller, for control signal generator, signal receiver and switch, and calculates the physical parameter of tested circuit according to the digital signal that analog to digital converter exports; Switch, for selecting tested circuit, makes tested circuit be communicated with signal receiver with signal generator; Signal generator, for generation of pumping signal, is sent to tested circuit by pumping signal; Signal receiver, for gathering and feeding back the signal on tested circuit; Multiple analog to digital converter, the collection signal for the pumping signal fed back signal generator and signal receiver feedback carries out analog to digital conversion, and the digital signal after conversion is exported to data processing and controller.According to the present invention, solve subscriber line test platform and cannot to automatically switch the problem that different circuit carries out testing, improve operating efficiency.
Description
Technical field
The present invention relates to the communications field, in particular to a kind of proving installation of circuit physical parameter, method and single-board device.
Background technology
Due to continuous maturation and the development of mechanics of communication, xDSL (DigitalSubscriberLine, Digital Subscriber Line) user increase fast, xDSL signal is transmitted between local side (CO) and user side (CPE) by subscribers feeder.But subscribers feeder can be subject to aging, make moist, the various factors such as artificial destruction, cause xDSL signal to be attenuated, even interrupt.
In order to ensure the normal operation of xDSL business, improving telecom service quality, needing to carry out measuring timely fast to subscriber's line parameter.Subscriber's line parameter testing mainly comprises between TIP line (also claiming electrode line), RING line (also claiming negative line), TIP line over the ground, RING line DC voltage over the ground, alternating voltage, insulation resistance, electric capacity etc.
At present, the test of subscribers feeder parameter has come mainly through subscriber line test platform, but this equipment volume is comparatively large, and price comparison is expensive, cannot realize automatically switching, must rely on and manually complete switching when it tests different circuit.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of proving installation of circuit physical parameter, method and single-board device, cannot to automatically switch the problem that different circuit carries out testing at least to solve above-mentioned subscriber line test platform.
According to an aspect of the present invention, provide a kind of proving installation of circuit physical parameter, this device comprises: data processing and controller, for control signal generator, signal receiver and switch, and receive the digital signal of analog to digital converter output, determine the digital signal participating in calculating according to the physical parameter of tested circuit, calculate the physical parameter of tested circuit according to the digital signal of the participation calculating determined; Switch, for selecting tested circuit according to the control of data processing and controller, makes tested circuit be communicated with signal receiver with signal generator; Signal generator, produces pumping signal for the control according to data processing and controller, this pumping signal is sent to tested circuit, and to data processing and controller feedback excitation signal; Signal receiver, for gathering the signal on tested circuit, and to data processing and controller feedback collection signal according to the control of data processing and controller; Multiple analog to digital converter, carries out analog to digital conversion for the pumping signal fed back signal generator, carries out analog to digital conversion, the digital signal after conversion is exported to data processing and controller to the collection signal of signal receiver feedback.
According to a further aspect in the invention, provide a kind of single-board device, comprise CPU and said apparatus, the data processing in this device is connected with CPU with controller.
According to another aspect of the invention, provide a kind of method of testing of circuit physical parameter, the method uses above-mentioned proving installation, comprise the following steps: switch selects tested circuit according to the control of data processing and controller, tested circuit is communicated with signal receiver with signal generator; Signal generator produces pumping signal according to the control of data processing and controller, and pumping signal is sent to tested circuit, and to data processing and controller feedback excitation signal; Signal receiver gathers the signal on tested circuit according to the control of data processing and controller, to data processing and controller feedback collection signal; The collection signal of the pumping signal that analog to digital converter feeds back signal generator and signal receiver feedback carries out analog to digital conversion, obtains digital signal, exports this digital signal; Data processing and controller receive the digital signal that analog to digital converter exports, and determine the digital signal participating in calculating according to the physical parameter of tested circuit, calculate the physical parameter of described tested circuit according to the described digital signal participating in calculating determined.
By the present invention, adopt data processing and controller gauge tap automatically to select measurement circuit, do not need manual switchover measurement circuit, simplify operation, solve subscriber line test platform and cannot to automatically switch the problem that different circuit carries out testing, improve operating efficiency; Meanwhile, this device is smaller, is convenient to be integrated on broadband access plate (such as, single-board device), easy to use.
Accompanying drawing explanation
Accompanying drawing described herein is used to provide a further understanding of the present invention, and form a application's part, schematic description and description of the present invention, for explaining the present invention, does not form inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 is the structural representation of the proving installation of circuit physical parameter according to the embodiment of the present invention 1;
Fig. 2 is the concrete structure block diagram of data processing according to the embodiment of the present invention 1 and controller;
Fig. 3 is the structural representation of the single-board device according to the embodiment of the present invention 1;
Fig. 4 is the structural representation of the proving installation of circuit physical parameter according to the embodiment of the present invention 2;
Fig. 5 is the another kind of structural representation of the proving installation of circuit physical parameter according to the embodiment of the present invention 2;
Fig. 6 is the structural representation of the single-board device according to the embodiment of the present invention 2;
Fig. 7 is the method for testing process flow diagram of the circuit physical parameter according to the embodiment of the present invention 3;
Fig. 8 is the model schematic of the measurement circuit according to the embodiment of the present invention 3;
Fig. 9 is the schematic diagram of the measurement circuit voltage according to the embodiment of the present invention 3;
Figure 10 is the schematic diagram of the measurement circuit capacitance-resistance according to the embodiment of the present invention 3;
Figure 11 is the schematic diagram of the measurement circuit nonlinear device according to the embodiment of the present invention 3.
Embodiment
Hereinafter also describe the present invention in detail with reference to accompanying drawing in conjunction with the embodiments.It should be noted that, when not conflicting, the embodiment in the application and the feature in embodiment can combine mutually.
The embodiment of the present invention selects tested circuit automatically by adopting data processing and controller gauge tap, achieves the object that the different circuit that automatically switches carries out testing.Based on this, embodiments provide a kind of proving installation of circuit physical parameter, method and single-board device.Wherein, the tested circuit in the embodiment of the present invention can be twisted-pair feeder (also referred to as subscribers feeder), also can be concentric cable, and twisted-pair feeder here refers to the circuit be made up of TIP line and RING line.
Embodiment 1
Fig. 1 shows the structural representation of the proving installation of the circuit physical parameter according to the embodiment of the present invention, this device comprises: data processing and controller 12, signal generator 14, signal receiver 16, switch 18 and multiple analog to digital converter, wherein, multiple analog to digital converter refers to more than 1, the circuit that corresponding every bar is to be tested respectively, be arranged on signal generator 14 and data processing and controller 12, signal receiver 16 and between data processing and controller 12, the present embodiment is described for two analog to digital converters, be respectively analog to digital converter 20a and analog to digital converter 20b, wherein, data processing is connected with switch 18 with signal generator 14, signal receiver 16 respectively with controller 12, the function of each device is as follows:
Data processing and controller 12, for control signal generator 14, signal receiver 16 and switch 18, and receive the digital signal of analog to digital converter 20a and 20b output, determine the digital signal participating in calculating according to the physical parameter of tested circuit, calculate the physical parameter of tested circuit according to the digital signal of the participation calculating determined;
Switch 18, for selecting tested circuit according to the control of data processing and controller 12, makes tested circuit be communicated with signal receiver 16 with signal generator 14;
Signal generator 14, for producing pumping signal according to the control of data processing and controller 12, is sent to tested circuit by pumping signal, and to data processing and controller 12 feedback excitation signal;
Signal receiver 16, for gathering the signal on tested circuit, and to data processing and controller 12 feedback collection signal according to the control of data processing and controller 12;
Analog to digital converter 20a, carries out analog to digital conversion for the pumping signal fed back signal generator 14, and the digital signal after conversion is exported to data processing and controller 12;
Analog to digital converter 20b, carries out analog to digital conversion for the collection signal fed back signal receiver 16, and the digital signal after conversion is exported to data processing and controller 12.
Switch 18 in the present embodiment refers to and the port that circuit to be tested is connected, i.e. analog switch, actual when realizing, data processing and controller 12 trigger current tested circuit from digital signaling zero and 1 to these ports by sending is communicated with signal receiver 16 with signal generator 14, such as: circuit to be tested has 4, and the circuit of current tested is when being first, data processing can produce " 1000 " instruction and send to each port be connected with circuit to be tested successively with controller 12, the port receiving " 1 " will connect circuit to be tested, as the circuit of current tested.
The concrete mode of the process of data processing and controller 12 pairs of feedback signals in the present embodiment is relevant with the physical parameter that will record, and those skilled in the art can design concrete algorithm according to physical knowledge, realizes the physical parameter surveyed.Such as: if when the current physical parameter for test is the voltage of circuit, the signal that directly can read signal receiver 16 feedback after analog to digital converter conversion carries out corresponding calculating.The present embodiment selects tested circuit automatically by adopting data processing and controller gauge tap, solve subscriber line test platform cannot to automatically switch the problem that different circuit carries out testing, simultaneously, the device volume of the present embodiment is also smaller, compared with subscriber line test platform, cost is lower, simple to operate, switching between each port is responsible for by software, without manual switching.By the physical parameter (performance parameter) of circuit measured, circuit whether existing defects, such as line broken circuit can be judged, short circuit etc., and then complete consequent malfunction Recovery processing.
See Fig. 2, be the concrete structure block diagram of above-mentioned data processing and controller 12, this data processing and controller 12 comprise:
Control module 122, produces instruction for sending pumping signal to signal generator 14, sends acquisition instructions to signal receiver 16, and to switch 18 transmitting line selection instruction;
Wherein, the acquisition instructions of the present embodiment comprises the instruction of trigger receiver 16 opening and closing, enters duty and off working state to make signal receiver 16;
Signal receiving module 124, for receiving the digital signal obtained after multiple analog to digital converter (i.e. analog to digital converter 20a and analog to digital converter 20b) is changed;
Parameter calculating module 126, is connected with signal receiving module 124, calculates, obtain the physical parameter of tested circuit for the digital signal received signal receiving module 124.
In order to improve the precision of test, said apparatus also comprises: multiple operational amplifier, be arranged between tested circuit and signal generator 14, pumping signal for producing signal generator 14 is amplified, and be arranged between tested circuit and signal receiver 16, amplify for the signal fed back tested circuit.
According to the physical parameter of test, can also comprise in said apparatus: the bleeder circuit module be made up of two resistance, be arranged between tested circuit and signal receiver 16, for sharing tested circuit and the voltage between data processing and controller 12.
In order to obtain the electric current of tested circuit, said apparatus can also comprise: multiple appointment resistance, be arranged between tested circuit and signal generator 14, for providing the voltage of specifying resistance to data processing and controller 12, to make data processing and controller 12 according to this voltage and to specify the computing the resistor value of resistance to go out the electric current of tested circuit.
Data processing in the present embodiment and controller 12 produce DC voltage, alternating voltage or step signal according to the control of physical parameter signal generator 14 for obtaining, such as, different steering orders is sent, to produce different pumping signals according to the physical parameter for obtaining.
The said apparatus of the present embodiment can make separately an equipment, and this equipment can be connected with the CPU in the external world, completes test assignment under the control of cpu.This device also can be arranged on single-board device, the structural representation of single-board device shown in Figure 3, and this equipment, to adopt Fig. 1 shown device, also comprises CPU22 and EPLD24.The data processing of this device can be connected with the CPU22 on single-board device with controller 12, wherein, data processing and controller 12 are devices that special operation circuit is tested, and it adopts SPI (ServiceProviderInterface, Service Provider Interface) mode communication with outside;
If CPU has SPI mouth, directly can dock with controller 12 with data processing with the SPI of CPU, realize the direct control of CPU to it, be i.e. mode shown in dotted line in figure.
If CPU there is no SPI mouth, also EPLD (ErasableProgrammableLogicDevice can be passed through, Erasable Programmable Logic Device) change, convert HOST (main frame) bus mode to SPI mode, and then be connected with controller 12 with data processing, such CPU indirectly removes access and control data process and controller 12 by EPLD; As long as these two kinds of modes select wherein one; Current single-board device has CPU and EPLD, and due to HOST, to turn SPI more convenient, so the present embodiment comes control data process and controller 12 by EPLD.If mode shown in dotted line, namely adopt the SPI interface on CPU, line, by fewer, realizes also fairly simple.
Above-mentioned device in the present embodiment can adopt existing device to realize, also can according to the above-mentioned device of line design of test.The device of the present embodiment can realize automatically testing many circuits, simple to operation, and its volume is little, easy to use, is integrated on single-board device and is easy to carry, and cost is lower simultaneously, has stronger market application foreground.
Embodiment 2
The present embodiment for circuit to be measured for subscriber's line (twisted-pair feeder), a kind of proving installation of subscriber's line physical parameter is provided, see Fig. 4, this device mainly comprises signal generator, signal receiver, switch, resistance, ADC (analog to digital converter), AMP (operational amplifier) and data processing and controller, annexation between each device can adjust as required, the present embodiment is only described for Fig. 4, but be not limited to structure shown in Fig. 4, wherein, TIP0, RING0 is a pair subscribers feeder, with the ST0 of receiving unit, SR0 is corresponding, the like, TIP7, RING7 be another to subscribers feeder, corresponding with ST7, SR7 of receiving unit.The function of each device is as follows:
1. data processing and controller---the circuit tested can be selected as required, by switch S
oNor switch S
oFFbe connected on circuit to be measured, the signal simultaneously received feedback and the signal receiver of the pumping signal that signal generator sends carries out process and calculates, and finally obtains the line parameter circuit value needing to measure;
2. signal generator---specific pumping signal can be produced, comprise the d. c. voltage signal that amplitude is adjustable, the ac voltage signal of amplitude and frequency-adjustable, slope and the adjustable step signal of amplitude;
3. signal receiver---the response signal in sampling circuit, and be transferred to data processing and controller.
4. resistance---R
mwith R
gform bleeder circuit, during to prevent external voltage higher, damage device; By measuring R
cthe magnitude of voltage at two ends, can calculate signal generator and output to electric current on TIP and RING line; Work as switch S
oFFwhen being connected on circuit to be measured, the electric capacity on TIP and RING line can be allowed to discharge over the ground, and doing this operation before measuring can increase measuring accuracy.Such as, first switch to be connected to circuit to be measured when surveying voltage, now need controller to control; In addition signal generator out after signal feedback be amplitude and the size of current (electric current is obtained divided by resistance sizes by the magnitude of voltage at those resistance two ends) of the signal that data processing and controller send to the fundamental purpose of data processing and controller; If only survey voltage, can not use the signal that signal generator feeds back, directly use the signal of signal receiver feedback, the data read are multiplied by 1+Rm/Rg (voltage is by Rm and Rg dividing potential drop).
5. ADC---the simulating signal obtained is changed into digital signal, data processing and controller can be processed, this device can be arranged in data processing and controller, also can be arranged on outside data processing and controller, and the present embodiment Fig. 4 is for being arranged on outside data processing and controller.
6. AMP---amplify the signal exported and the signal amplifying reception, improve measuring accuracy, this device is Alternative devices.
7. switch S
oNor S
oFF---S
oNeffect be communicated with or disconnect circuit to be measured, S
oFFeffect be will be selected line-to-ground; It can be analog switch.
See Fig. 5, be the another kind of implementation of the switch in the present embodiment, wherein, when needing test, by S
oNbe connected on corresponding circuit, by S when not testing
oNbe connected on the ground.
Equally, device shown in Fig. 4 and Fig. 5 also can be arranged on single-board device, now, CPU on single-board device is connected with controller with the data processing on this device, and its connected mode still can have two kinds, two kinds of modes namely in embodiment 1, here be only described for Fig. 4 shown device, the structured flowchart of single-board device shown in Figure 6, single-board device, by the CPU control data process on it and controller, completes the test of circuit.
The signal generator of the present embodiment sends known signal to subscriber's line to be measured, signal receiver receives the feedback signal on subscribers feeder subsequently, processed by data processing and controller, determine the physical characteristics of subscribers feeder, whole test process does not need manual switchover measurement circuit, directly can be realized by data processing and controller sending controling instruction, simple to operate, and the cost compare of device is low.
Embodiment 3
Fig. 7 shows the method for testing process flow diagram of the circuit physical parameter according to the embodiment of the present invention, and the proving installation in the method uses the proving installation in above-described embodiment 1 or 2, comprises the following steps:
Step S702, switch selects tested circuit according to the control of data processing and controller, and tested circuit is communicated with signal receiver with signal generator;
Step S704, signal generator produces pumping signal according to the control of data processing and controller, and this pumping signal is sent to tested circuit, and feeds back this pumping signal to data processing and controller;
Step S706, signal receiver gathers the signal on tested circuit according to the control of data processing and controller, to data processing and controller feedback collection signal;
Step S708, the collection signal of the pumping signal that analog to digital converter feeds back signal generator and signal receiver feedback carries out analog to digital conversion, obtains and exports this digital signal;
Step S710, data processing and controller receive the digital signal that analog to digital converter exports, and determine the digital signal participating in calculating according to the physical parameter of tested circuit, calculate the physical parameter of tested circuit according to the digital signal of the participation calculating determined.
Wherein, signal generator produces pumping signal according to the control of data processing and controller and comprises: data processing and controller produce steering order according to the physical parameter for obtaining; Signal generator produces DC voltage, alternating voltage or step signal according to steering order.
Fig. 8 shows the model structure block diagram of the measurement circuit of the embodiment of the present invention, wherein, and C
tGfor the electric capacity between TIP line and ground, C
rGfor the electric capacity between RING line and ground, C
tRfor the electric capacity between TIP line and RING, R
tGfor the resistance between TIP line and ground, R
rGfor the resistance between RING line and ground, R
tRfor the resistance between TIP line and RING, U
tG_DCfor passing through equiva lent impedance Z between TIP line and ground
bAT_TIPthe DC voltage of coupling, U
tG_ACfor passing through equiva lent impedance Z between TIP line and ground
bAT_TIPthe alternating voltage of coupling, U
rG_DCfor passing through equiva lent impedance Z between RING line and ground
bAT_RINGthe DC voltage of coupling, U
rG_ACfor passing through equiva lent impedance Z between RING line and ground
bAT_RINGthe alternating voltage of coupling, U
tR_DCfor passing through equiva lent impedance Z between TIP line and RING line
bAT_TIPRINGthe DC voltage of coupling, U
tR_ACfor passing through equiva lent impedance Z between TIP line and RING line
bAT_TIPRINGthe alternating voltage of coupling.
Based on the measurement circuit shown in Fig. 8, the proving installation measurement circuit voltage that the present embodiment adopts embodiment 2 to provide, Fig. 9 is measurement circuit V diagram, and concrete test process is as follows:
Magnitude of voltage on signal receiver Direct Sampling TIP, RING line, be transferred to data processing and controller, data processing and controller according to this magnitude of voltage, and according to known conditions, calculate the DC voltage on TIP, RING line, alternating voltage, and the frequency of AC signal.Because the input voltage of signal receiver is restricted, therefore need processing after carrying out dividing potential drop to the voltage of input.Such as:
When measuring DC voltage, the magnitude of voltage collected is passed to data processing and controller by signal receiver, data processing and controller according to the electric resistance partial pressure of this value and known fixed than the DC voltage calculated on TIP and RING line;
When measuring alternating voltage, signal receiver to be sampled the data received by fixed frequency, then these data are passed to data processing and controller successively, data processing and controller, according to these data and known electric resistance partial pressure ratio, calculate frequency and the peak-to-peak value of AC signal.Because the frequency of signal receiver sampled data is fixed, therefore the frequency for the AC signal on circuit is also restricted, the frequency of signal receiver sampled data is higher, then can on survey line road the frequency of AC signal also higher, can the sampled data frequency of setting signal receiver as required.
Based on the measurement circuit shown in Fig. 8, the capacitance-resistance of the proving installation measurement circuit that the present embodiment adopts embodiment 2 to provide, Figure 10 shows measurement circuit capacitance-resistance schematic diagram.In order to prevent electric capacity there is voltage influence measuring accuracy, can first discharge to the electric capacity on TIP, RING line, then signal generator produces known DC voltage, sine wave signal or step signal by the order producing signal respectively on TIP, RING line, and by this signal feedback to data processing and controller; Wherein, the order producing signal can for first to produce DC voltage, also can for first to produce AC signal, and signal can produce by a graded as required repeatedly; The feedback signal of signal receiver to the various excitations that circuit produces is measured, and data are passed to data processing and controller, and data processing and controller, according to the signal received, calculate C by specific algorithm
tG, C
rG, C
tR, R
tG, R
rG, R
tRdeng circuit physical parameter.
During measuring resistance, the first step, TIP line adds known DC level V1, and the signal of RING line exports ground connection, is gathered the data that TIP, RING line is measured, pass to data processing and controller by signal receiver; Second step, RING line adds known DC level V2, and the signal of TIP line exports ground connection, by signal receiver, the data that TIP, RING line is measured is passed to data processing and controller respectively; Data processing and controller by the algorithm set, calculate R according to the data received
tG, R
rGwith R
tR.
When measuring electric capacity, in order to by R
tG, R
rGwith R
tRthe measuring error caused reduces to minimum as far as possible, first measures R
tG, R
rGwith R
tRvalue.Then on TIP line, add the alternating voltage V3 of given frequency, the signal output open circuit of RING line, gathered the data (comprising the phase place of signal) that TIP, RING line is measured by signal receiver, pass to data processing and controller; RING line adds the alternating voltage V4 of given frequency, the signal output open circuit of TIP line, by signal receiver, the data that TIP, RING line is measured (comprising phase place) are passed to data processing and controller; Data processing and controller are according to the data received and measure the R obtained
tG, R
rGwith R
tRvalue, by setting algorithm, calculate C
tG, C
rGwith C
tR.
In addition, whether the proving installation that the embodiment of the present invention provides can also have nonlinear device on measurement circuit, and Figure 11 is the schematic diagram of the present embodiment measurement circuit nonlinear device, and concrete test process is as follows:
When measuring circuit resistance, by adding positive voltage between TIP line and RING line, be in reverse blocking state, R due to diode Diode
lOADthe R of measurement can not be affected
tR, now measuring the value obtained is R
tR_POS; When adding negative electricity between TIP line and RING line, diode Diode conducting, the R now recorded
tR_NEGfor R
lOADwith R
tRparallel connection value.If R
tR_POSwith R
tR_NEGdiffer greatly, then can judge there is nonlinear device between TIP and RING line, and the polarity of nonlinear device can be known, if R
tR_POSwith R
tR_NEG, these two values are more or less the same, then can know does not have nonlinear device between TIP and RING.When testing nonlinear device, R
tRselection is needed to be greater than R
lOADdevice, to ensure the accuracy measured.
Alternatively, the present embodiment only provides above-mentioned several test mode, according to actual test request, can data processing from different data processing algorithms is set in controller, change concrete steps and the method for above-mentioned measuring circuit physical parameter.
The present embodiment adopts proving installation in embodiment 1 or 2 can the physical parameter of automatic acquisition circuit, test result is obtained by the Processing Algorithm of the data processing in proving installation and controller, solve the problem that subscriber line test platform can not realize automatic switchover measurement circuit, and then improve the efficiency of test.
As can be seen from the above description, the proving installation in the embodiment of the present invention adopts data processing and controller gauge tap automatically to select measurement circuit, does not need manual switchover measurement circuit, simplifies operation, improve operating efficiency.
Obviously, those skilled in the art should be understood that, above-mentioned of the present invention each module or each step can realize with general calculation element, they can concentrate on single calculation element, or be distributed on network that multiple calculation element forms, alternatively, they can realize with the executable program code of calculation element, thus, they can be stored and be performed by calculation element in the storage device, and in some cases, step shown or described by can performing with the order be different from herein, or they are made into each integrated circuit modules respectively, or the multiple module in them or step are made into single integrated circuit module to realize.Like this, the present invention is not restricted to any specific hardware and software combination.
The foregoing is only the preferred embodiments of the present invention, be not limited to the present invention, for a person skilled in the art, the present invention can have various modifications and variations.Within the spirit and principles in the present invention all, any amendment done, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (11)
1. a proving installation for circuit physical parameter, is characterized in that, comprising:
Data processing and controller, for control signal generator, signal receiver and switch, and receive the digital signal of analog to digital converter output, determine the digital signal participating in calculating according to the physical parameter of tested circuit, calculate the physical parameter of described tested circuit according to the described digital signal participating in calculating determined;
Described switch, for selecting tested circuit according to the control of described data processing and controller, makes described tested circuit be communicated with described signal receiver with described signal generator;
Described signal generator, produces pumping signal for the control according to described data processing and controller, described pumping signal is sent to described tested circuit, and feeds back described pumping signal to described data processing and controller;
Described signal receiver, for gathering the signal on described tested circuit, and to described data processing and controller feedback collection signal according to the control of described data processing and controller;
Multiple described analog to digital converter, described pumping signal for feeding back described signal generator carries out analog to digital conversion, analog to digital conversion is carried out to the described collection signal that described signal receiver feeds back, and the digital signal after conversion is exported to described data processing and controller.
2. device according to claim 1, is characterized in that, described data processing and controller comprise:
Control module, producing instruction for sending pumping signal to described signal generator, sending acquisition instructions to described signal receiver, and to described switch transmitting line selection instruction;
Signal receiving module, for receiving the digital signal that described multiple analog to digital converter exports;
Parameter calculating module, for selecting the digital signal participating in calculating from the digital signal that described signal receiving module receives according to the physical parameter of tested circuit, calculate the physical parameter of described tested circuit according to the described digital signal participating in calculating selected.
3. device according to claim 1, is characterized in that, described device also comprises:
First operational amplifier, is arranged between described tested circuit and described signal generator, amplifies for the pumping signal produced described signal generator.
4. device according to claim 1, is characterized in that, described device also comprises:
Second operational amplifier, is arranged between described tested circuit and described signal receiver, for amplifying the signal on described tested circuit.
5. device according to claim 1, is characterized in that, described device also comprises:
The bleeder circuit module be made up of two resistance, is arranged between described tested circuit and described signal receiver, for sharing described tested circuit and the voltage between described data processing and controller.
6. device according to claim 1, is characterized in that, described device also comprises:
Multiple appointment resistance, is arranged between described tested circuit and described signal generator, for providing the voltage of described appointment resistance to described data processing and controller.
7. device according to claim 1, is characterized in that, described data processing and controller signal generator according to the control of physical parameter for obtaining produces DC voltage, alternating voltage or step signal.
8. the device according to any one of claim 1-7, is characterized in that, described circuit is twisted-pair feeder or concentric cable.
9. a single-board device, comprises CPU, it is characterized in that, also comprises the device described in any one of claim 1-7, and the data processing of described device is connected with described CPU with controller.
10. a method of testing for circuit physical parameter, is characterized in that, described method uses the device described in any one of claim 1-7, comprising:
Switch selects tested circuit according to the control of data processing and controller, and described tested circuit is communicated with signal receiver with signal generator;
Described signal generator produces pumping signal according to the control of described data processing and controller, described pumping signal is sent to described tested circuit, and feeds back described pumping signal to described data processing and controller;
Described signal receiver gathers the signal on described tested circuit according to the control of described data processing and controller, to described data processing and controller feedback collection signal;
The described collection signal of the pumping signal that analog to digital converter feeds back described signal generator and described signal receiver feedback carries out analog to digital conversion, obtains digital signal, exports described digital signal;
Described data processing and controller receive the digital signal that described analog to digital converter exports, determine the digital signal participating in calculating according to the physical parameter of tested circuit, calculate the physical parameter of described tested circuit according to the described digital signal participating in calculating determined.
11. methods according to claim 10, is characterized in that, described signal generator produces pumping signal according to the control of described data processing and controller and comprises:
Described data processing and controller produce steering order according to the physical parameter for obtaining;
Described signal generator produces DC voltage, alternating voltage or step signal according to described steering order.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110030884.1A CN102175948B (en) | 2011-01-28 | 2011-01-28 | The proving installation of circuit physical parameter, method and single-board device |
| PCT/CN2011/075960 WO2012100493A1 (en) | 2011-01-28 | 2011-06-20 | Equipment, method and single board device for testing physical parameters of lines |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201110030884.1A CN102175948B (en) | 2011-01-28 | 2011-01-28 | The proving installation of circuit physical parameter, method and single-board device |
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| CN102175948A CN102175948A (en) | 2011-09-07 |
| CN102175948B true CN102175948B (en) | 2016-01-20 |
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| CN201110030884.1A Expired - Fee Related CN102175948B (en) | 2011-01-28 | 2011-01-28 | The proving installation of circuit physical parameter, method and single-board device |
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| CN (1) | CN102175948B (en) |
| WO (1) | WO2012100493A1 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103248370B (en) * | 2012-02-03 | 2016-02-03 | 联发科技（新加坡）私人有限公司 | Press keys setup method |
| CN102608469B (en) * | 2012-03-29 | 2014-08-13 | 北京经纬恒润科技有限公司 | Testing device |
| CN107153158B (en) * | 2016-03-04 | 2020-01-03 | 深圳市汇顶科技股份有限公司 | Chip performance testing method, device and system |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1516015A (en) * | 2003-01-09 | 2004-07-28 | 华为技术有限公司 | Multichain boundary scanning test system and multichain boundary scanning test method |
| CN1848773A (en) * | 2005-04-05 | 2006-10-18 | 华为技术有限公司 | Method for parallel detecting XDSL and testing equipment |
| CN1869722A (en) * | 2005-05-27 | 2006-11-29 | 安捷伦科技有限公司 | Channel switching circuit |
-
2011
- 2011-01-28 CN CN201110030884.1A patent/CN102175948B/en not_active Expired - Fee Related
- 2011-06-20 WO PCT/CN2011/075960 patent/WO2012100493A1/en active Application Filing
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1516015A (en) * | 2003-01-09 | 2004-07-28 | 华为技术有限公司 | Multichain boundary scanning test system and multichain boundary scanning test method |
| CN1848773A (en) * | 2005-04-05 | 2006-10-18 | 华为技术有限公司 | Method for parallel detecting XDSL and testing equipment |
| CN1869722A (en) * | 2005-05-27 | 2006-11-29 | 安捷伦科技有限公司 | Channel switching circuit |
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| Publication number | Publication date |
|---|---|
| WO2012100493A1 (en) | 2012-08-02 |
| CN102175948A (en) | 2011-09-07 |
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