CN102175130B - Real-time measuring device and measuring method for thickness of gas-containing liquid film in interface fluctuation - Google Patents
Real-time measuring device and measuring method for thickness of gas-containing liquid film in interface fluctuation Download PDFInfo
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Abstract
The invention relates to a real-time measuring device and a measuring method for thickness of a gas-containing liquid film in interface fluctuation. The device comprises a power supply, a single-head electric conduction probe detector, a clamping shifter and a data collecting analyzer, wherein the data collecting analyzer comprises an external resistor and a collecting board card; the external resistor is connected in series between the power supply and the single-head electric conduction probe detector; the collecting board card is used for measuring the voltage on both ends of the external resistor; the single-head electric conduction probe detector comprises a probe passing through a metal sleeve; the metal sleeve and the probe in the probing part are L-shaped; the probe and metal sleeve are insulated and are separately connected with the positive and negative electrodes of the power supply. During measuring, the difference between the absolute position of the probe tip in the level of 50% void and the absolute position of the probe tip positioned on the bottom of the pipe is the thickness of the liquid film. The method in the invention measures the gas-containing ratio of gas-liquid stratified flow, annular flow fluctuation and the gas-containing liquid film, and the variation of the bubble frequencies along the vertical direction of the interface through the single-head electric conduction probe technology, so as to exactly measure the thickness of the liquid film.
Description
Technical field
The invention belongs to the real-time field of measuring technique of gas-liquid layering or annular flow fluctuation gassiness thickness of liquid film; Be specifically related to a kind of interface fluctuation gassiness thickness of liquid film real-time measurement apparatus and measuring method; Promptly utilize the single head conducting probe of point measurement to differentiate liquid-gas interface, the measurement of gas-liquid stratified flow or annular flow equal flow type thickness of liquid film and open channel high-velocity flow liquid-gas interface in can be applicable to manage.
Background technology
In fields such as present oil multiphase pipe flow conveying, power engineering; Gas-liquid stratified flow and annular flow are common flow patterns; Thickness of liquid film is an important parameters in these flow patterns; Be necessary it is carried out accurate in real time the measurement, thereby pair cross-section distributes mutually, parameters such as pressure drop are accurately calculated.
The measuring method that a lot of stratified flows and annular flow thickness of liquid film are arranged at present, for example: optical method, rays method, high speed video process, electric method etc.In these methods, optical method and rays method measuring accuracy be than higher, but because factors such as equipment price is expensive, bulky, complicated operation, its use has received very big restriction.The high-speed photography method can be carried out dynamically recording to the interface with very high speed; So can provide the finer structure of relevant interface fluctuation; But it is very high that this method requires the operator, and need to solve optical problem such as relevant illumination, focusing, and the scope of application also is restricted.
Electric method can be divided into two types of conductance method and capacitance methods, its have cheap, equipment is simple, advantage such as easy to operate, in that polyphasic flow field thickness of liquid film and void fraction have obtained broad research in measuring in recent years.Like one Chinese patent application text " measuring the conducting probe measuring system of phase content and phase interface in the multiphase pipe flow in real time " (open day on October 18th, 2006; Publication number CN 1847836A; March 27 2006 applying date) a kind of conducting probe system of measuring stratified flow thickness of liquid film in the pipe is disclosed; Adopt dicyclo conducting probe or two parallel conducting probe; Can carry out on-line measurement and demonstration to phase content in the multiphase pipe flow and phase interface, this patent has promptly adopted conductance method, and its fundamental measurement principle is mounted in electricity between two electrodes on the pipeline section and leads with thickness of liquid film certain getting in touch arranged.But this method has the some shortcomings part: at first the electricity between two electrodes is led the influence that receives factor such as impurity component in liquidus temperature and the liquid phase; And the trailing vortex of two parallel probe entrainments gas and can cause probe downstream regional area to contact with gas, thereby the measurement of thickness of liquid film is caused than mistake; Next need set up a kind of funtcional relationship through demarcation between thickness of liquid film and output signal, and because difference and the signal demarcated between environment and the measurement environment receive factors such as noise effect, in demarcation and use, can bring some errors; This in addition method is only applicable to measurement static or the unhurried current thickness of liquid film; When the liquid film high-speed motion; Its surface is influenced by gas-entrained can produce fluctuation and inflation, does not have entirely different liquid-gas interface this moment, therefore can not provide interface gas-liquid changes in distribution rule accurately.One Chinese patent application text " the monofilament capacitance Probe Measurement System for Fluid of phase content and phase interface in the multiphase pipe flow " (discloses day on November 22nd, 2006; Publication number CN 1865966A; May 11 2006 applying date) a kind of monofilament capacitance probe system of measuring stratified flow thickness of liquid film in the pipe is disclosed; This patent has adopted the capacitance measurement thickness of liquid film, and measurement result does not receive the influence of fluid temperature (F.T.) and impurity component, can carry out the continuous real-time on-line measurement to phase content in the multiphase pipe flow and phase interface.But this method needs to demarcate equally, and can not provide liquid film gas-liquid changes in distribution rule at the interface under fluctuation and the gassiness liquid film situation.One Chinese patent application text " measuring method of liquid film thickness of electrically-conductive backing plate " (discloses day on April 9th, 2008 in addition; Publication number CN101159225A; November 7 2007 applying date) measuring method of thin liquid film thickness static on a kind of electrically-conductive backing plate is disclosed; Its main thought is to utilize conducting probe movably to survey the position of liquid film surface and liquid film bottom surface; Can carry out the measurement of meticulousr thickness of liquid film, but this method scope of application is narrower, is difficult to be applied in the measurement of dynamic flow gassiness thickness of liquid film.
Some researchers use supercritical ultrasonics technology to survey liquid-gas interface; Like Murzyn etc. 2007 at report CH63/07 " Free Surface; Bubbly flow and Turbulence Measurements in Hydraulic Jumps " in used the ultrasonic displacement meter to survey in the hydraulic jump liquid-gas interface of fluctuation gassiness; Its ultimate principle is that the aerial velocity of propagation of sound wave is certain; Propagate into the time that the liquid-gas interface back reflection gets into receiving trap from emitter and can derive the distance of acoustic wave movement through measuring it, thereby confirm the position of liquid-gas interface.Discover that the interface location void fraction that supercritical ultrasonics technology is measured is approximately 50%-60% when interface fluctuation gassiness.This method requires lower to gas-liquid phase character; And can judge the general interface location of fluctuation gassiness liquid film, but its device is complicated, is difficult to be applied in the small diameter pipeline; And can not provide the relation of liquid-gas interface zone void fraction with change in location, can only judge interface location roughly.
In sum, these thickness of liquid film measuring methods have certain limitation at present, can not provide liquid film gas-liquid changes in distribution rule at the interface, measure during the high-precision real of fluctuation gassiness thickness of liquid film in being difficult to realize manage.
Summary of the invention
The purpose of this invention is to provide a kind of interface fluctuation gassiness thickness of liquid film real-time measurement apparatus and measuring method; A kind of single head conducting probe technology of point measurement promptly is provided; Void fraction and the thickness that bubble frequency changes to confirm liquid film through accurate measurement liquid film liquid-gas interface zone can also provide accurate near interface gas-liquid changes in distribution rule, and need not demarcation; Overcome the difficulty that thickness of liquid film is difficult to accurate measurement under liquid-gas interface fluctuation and the inflated condition, remedied the deficiency of prior art.
Interface fluctuation gassiness thickness of liquid film real-time measurement apparatus of the present invention includes the clamping shifter and the data collection and analysis device of power supply, single head conducting probe detector, control probe in detecting position; Wherein the data collection and analysis device includes external resistance that is connected between power supply and the single head conducting probe detector and the analog input card of measuring external resistance voltage; It is characterized in that; Above-mentioned single head conducting probe detector includes the probe that passes metal sleeve; At probe portion metal sleeve and probe is the L type, insulate between probe and the metal sleeve, and is connected respectively on the both positive and negative polarity of power supply.
Above-mentioned probe is a tinsel, and diameter is 0.2mm, and the test section is the cone tip shape.The diameter of metal sleeve is 1mm, contacts with liquid phase all the time in order to guarantee metal sleeve, and its outer wall is connected with lead, contacts all the time with liquid level.
Insulation is meant that probe all has between insulation course or probe and metal sleeve and is filled with insulating material between above-mentioned probe and the metal sleeve except that needle point probe portion and afterbody, and wherein the needle point probe portion is used for surveying bubble, and afterbody is used for CC.In order to obtain more accurate measurement data, there is the conductive region of 40～80 μ m at the needle point place of probe.In order better to obtain insulation effect, seal with micelle at the two ends of metal sleeve, prevent that liquid from infiltrating in the sleeve pipe.
Above-mentioned probe is connected to the negative pole of direct supply, and metal sleeve is connected to the positive pole of direct supply, and direct supply is the 4.5v direct supply.
The clamping shifter of described control probe in detecting position can be that control instrument is advanced in micro-stepping; Enter the position that control instrument is regulated probe and metal sleeve through micro-stepping; And signal passed to the analog input card of data collection and analysis device, calculate through computer processing and can obtain probe tip apart from the pipe height at the end.
Described clamping shifter can also include electronic digital indicator and probe vernier fixed block is formed; Probe vernier fixed block is fixed together metal sleeve, probe and electronic digital indicator; Can change the radial position of needle point in pipe along with moving up and down of vernier, while digital display calliper display demonstrate the position of vernier on the spot and with the signal is far passed to analog input card.
Described clamping shifter is installed on the pipeline that will measure through sealed fixing device.
Described external resistance is 5 megaohms; Analog input card is a NI PCI-6143 S series synchronous collecting card; Analog input card passes to computing machine with the data of collecting; By Labview graphics data collection analysis software records, the probe displacement data that advances control instrument or electronic digital indicator record in conjunction with micro-stepping carries out the analysis of gassiness thickness of liquid film.
Device of the present invention is used for the measurement of conducting liquid fluctuation gassiness thickness of liquid film.
The power positive cathode of apparatus of the present invention is connected on the probe and metal sleeve of single head conducting probe detector, and preferred positive pole is connected on the metal sleeve, and negative pole is connected on the probe, has constituted a circuit like this.But done insulation processing between probe and the metal sleeve, therefore, had only when metal sleeve and probe all touch conducting liquid, circuit is just understood UNICOM, this moment analog input card to measure external resistance be high level; When the needle point of probe is moved upwards up near the liquid-gas interface because the fluctuation and the inflation at interface, during needle point and be in gas phase, the time and be in liquid phase, the constantly conversion between high-low level of output signal; When needle point continued to move up disengaging liquid phase entering gas phase, signal showed low level.Labview graphics data collection analysis software through linking to each other with analog input card carries out signal analysis, calculates the void fraction of different needle points position, and wherein void fraction is that level data is in the ratio that low level temporal summation accounts for acquisition time.
Interface fluctuation gassiness thickness of liquid film method for real-time measurement of the present invention; Be earlier probe tips to be put into conducting liquid to be measured; Make needle point towards coming flow path direction, control the position of probe tip in pipe with the clamping shifter again, at first make probe tip be close to the pipeline lower wall surface; Absolute position when the record probe tip is positioned at the pipe bottom; Probe is moved to liquid-gas interface from the liquid level of conducting liquid, write down the level and the detection time at the external resistance of different aspects two ends simultaneously through analog input card, and the absolute position data of probe; Transfer the different aspects level data void fraction of aspect to, the difference of the absolute position the when absolute position of probe tip and probe tip are positioned at the pipe bottom during 20～90% void fraction aspects is the thickness of liquid film.
The absolute position of probe tip and probe tip were positioned at absolute position poor in when bottom pipe when the thickness of above-mentioned liquid film was 50% void fraction aspect.
The present invention is fluctuateed and the void fraction of gassiness liquid film liquid-gas interface and the situation of change of bubble frequency vertical line direction along the interface through the gas-liquid stratified flow of single head conducting probe commercial measurement and the annular flow of point measurement, thereby accurately measures thickness of liquid film.Compare with other measuring methods and to have following characteristics: need not to demarcate; Do not receive parameter influences such as medium conductivity, temperature, when the liquid phase conductivity hour, can make output signal high-low level significant difference through changing external resistance, also can change liquid conduction property through adding electrolyte; Can provide liquid film gas-liquid changes in distribution rule at the interface.
Description of drawings:
Fig. 1 is a single head conducting probe detector synoptic diagram of the present invention;
Fig. 2 is the one-piece construction figure of measurement mechanism of the present invention;
Fig. 3 is signal (Normalized Signal) and the contrast of ideal square wave signal (Square Signal) after probe original signal under a certain operating mode (Raw Signal), the standardization;
Fig. 4 is that probe tip is in the output voltage signal of liquid-gas interface when following, and handling and obtaining void fraction is 3%;
Fig. 5 is near the output voltage signal of probe tip when being in the liquid-gas interface, and handling and obtaining void fraction is 50%;
Fig. 6 is that probe tip is in the output voltage signal of liquid-gas interface when above, and handling and obtaining void fraction is 90%;
Fig. 7 is the void fraction of probe measurement and the curve map that bubble frequency changes with liquid-gas interface vertical line direction; Wherein: 1, probe 2, insullac 3, micelle 4, metal sleeve 5, pipeline 6, sealed fixing device 7, electronic digital indicator 8, probe vernier fixed block 9, single head conducting probe detector 10, external resistance 11, power supply 12, earth terminal 13, analog input card 14, computing machine.
Embodiment:
To combine detailed description of the drawings device and methods for using them of the present invention below:
One, the method for making of conducting probe
Like Fig. 1, single head conducting probe detector 9 of the present invention mainly is made up of probe 1 and metal sleeve 4.The manufacturing process of its middle probe 1 is following: at first adopt the method for galvanic corrosion that the electrode of conducting probe 1 is processed sharp tip-like; Subsequently in conducting probe 1 surface-coated insullac 2 and baking; After japanning is accomplished; Need probe tip be polished, make it expose the conductive region of 40～80 μ m.After needlepoint electrode completes; In the metal sleeve 4 with its hollow of packing into; Expose certain-length at needle point one end, guarantee insulation between probe 1 and the metal sleeve 4, metal sleeve 4 apart from the end position, the 2cm left and right sides; Metal sleeve 4 is curved 90 ° together with probe 1, make single head conducting probe detector 9 be the L type.In order to prevent that getting into conducting liquid in the metal sleeve 4 influences insulation effect, use high strength micelle 3 is sealed metal sleeve 4 two ends and probe 1 is fixed.
In addition, probe 1 passes the part of metal sleeve 4 can fill insulant, and for example nonconducting silica gel etc. so both can make probe 1 and metal sleeve 4 insulation, can make probe 1 be fixed on the inside of metal sleeve 4 again.
The tinsel that above-mentioned probe 1 is processed for conducting metal, for example stainless steel wire, platinum filament, copper wire etc., the diameter of probe 1 is 0.2mm, the test section is the cone tip shape.Metal sleeve is processed by conductive metallic material, for example stainless steel, copper etc., and its diameter is 1mm.In order to guarantee that metal sleeve 4 contacts with liquid phase all the time, its outer wall is connected with the lead that contacts all the time with liquid level.
Two, thickness of liquid film measurement mechanism system forms and measuring method
Like Fig. 2; Measurement mechanism of the present invention includes the clamping shifter and the data collection and analysis device of power supply 11, single head conducting probe detector 9, control probe in detecting position; Wherein the data collection and analysis device includes the external resistance 10 that is connected between power supply 11 and the single head conducting probe detector 9 and analog input card 13 and the computer data acquiring process software system of measuring external resistance 10 voltage; It is characterized in that above-mentioned single head conducting probe detector 9 includes the probe 1 that passes metal sleeve 4, is the L type at probe portion metal sleeve 4 with probe 1; Insulation between probe 1 and the metal sleeve 4, and be connected respectively on the both positive and negative polarity of power supply 11.Metal sleeve 4 be the L type with probe 1, like this measurement the time, and the bubble of the probe of L type on can more effective measurement liquid level.
During assembling; The clamping shifter of single head conducting probe detector 9 with control probe displacement fitted together; Single head conducting probe detector 9 pass the aperture of pipeline 5 upper walls that will detect stretch in the pipe, be installed on the pipeline 5 through sealed fixing device 6 again.Wherein the clamping shifter can be that control instrument is advanced in existing micro-stepping; Can also form by electronic digital indicator 7 and probe vernier fixed block 8; Its middle probe vernier fixed block 8 is fixed together the vernier of single head conducting probe detector 9 and electronic digital indicator 7; Can change the radial position of needle point in pipe along with moving up and down of vernier; Electronic digital indicator 7 can be realized the high-acruracy survey of the probe 1 needle point absolute position of single head conducting probe detector 9, show and data remote that analog input card 13 adopts NI PCI-6143 S series synchronous collecting card, and the needle point absolute position data of gathering is delivered to computing machine 14 on the spot.
The measurement mechanism of fluctuation gassiness liquid film provided by the invention has constituted a circuit in fact, and this circuit comprises the probe 1 of single head conducting probe detector 9 and the external resistance 10 and the 4.5V direct supply 11 of metal sleeve 4,5 megaohms.Wherein the probe 1 of single head conducting probe detector 9 is connected with external internal resistance 10, power supply 11 successively; 4.5V the positive pole of direct supply 11 is connected on probe metal sleeve 4 outer walls; And link to each other with earth terminal 12, negative pole links to each other with the probe 1 of single head conducting probe detector 9.Analog input card 13 is gathered the voltage at external resistance 10 two ends with the sampling rate of 10-40KHz, and gives computing machine 14 with data transfer.
Device of the present invention is used for the measurement of conducting liquid fluctuation gassiness thickness of liquid film, and its measuring principle is based on the difference of gas-liquid phase resistance, and gas phase resistance is much larger than liquid phase.Owing to done insulation processing between the probe 1 of single head conducting probe detector 9 and the metal sleeve 4, therefore, have only when metal sleeve 4 and probe 1 needle point all touch conducting liquid, circuit is just understood UNICOM; When probe 1 needle point touched the minute bubbles in gas phase or the liquid phase, circuit broke off.Interface fluctuation gassiness liquid film is put in probe 1 end, make needle point towards coming flow path direction, liquid phase is an external phase in fluid-mixing, and gas is dispersed in the liquid phase with the form of minute bubbles, and metal sleeve 4 contacts with continuous water all the time.When probe 1 needle point touched liquid phase, electric current will flow through probe 1 and metal sleeve 4, because external resistance is much larger than water and conductor resistance, was the voltage at external resistance 10 two ends and analog input card 13 is measured, so signal is exported high level; During the trough gas at the minute bubbles in touching fluid-mixing or liquid film fluctuation interface, probe 1 can't with metal sleeve 4 conductings, circuit breaks off, external resistance 10 voltage are near zero, the signal output low level.Move up and down the vernier of digital display calliper 7, the probe 1 that is attached thereto moves thereupon, in the time of under its needle point contacts liquid-gas interface, and signal output high level; In the time of near needle point is moved upwards up to liquid-gas interface because the fluctuation and the inflation at interface, during needle point and be in gas phase, the time and be in liquid phase, the constantly conversion between high-low level of output signal; When needle point continued to move up disengaging liquid phase entering gas phase, signal showed low level.Analog input card 13 is delivered to computing machine 14 with the signal of the probe that collects 1 and the signal of electronic digital indicator 7; Adopt the Labview graphics data collection analysis software of special establishment that signal is carried out analyzing and processing; Calculate the equal void fraction in absolute position and the local time here and the bubble frequency of each place, collection point probe tip, carry out data storage and demonstration in real time on graphoscope.
In addition, when measuring, probe 1 is in the air interface earlier, moves down then, until bottommost to pipeline.
Three, measurement mechanism signal processing method
The Labview graphics data collection analysis The software adopted two-wire journey parallel processing technique of operation is realized the calculating of collection in real time and probe displacement and void fraction corresponding relation on the computing machine 14; One of them thread acquisition probe signal, another thread carry out signal analysis and processing and show.After gathering a period of time (as 2 seconds) with higher sampling rate near the liquid-gas interface, can obtain one group of time dependent primary voltage signal, be liquid phase during high level wherein, during low level gas phase.During signal Processing, at first will carry out filtering to original signal, remove the high frequency interference noise in the signal, what adopt here is 5 smooth filtering.Because the resistivity of water is slightly different under the different flox conditions; This makes the double end conducting probe export the basic voltage of signal; And can there be certain difference in the amplitude of variation of voltage signal; Therefore need carry out standardization to the original output signal of double end conducting probe, original signal is converted into the signal between the 0-1, the amplitude of variation problem of unstable of basic voltage and voltage signal in the elimination original signal.In addition because the probe tips size is limited; The interface needs certain hour to the wetting/drying of probe; Probe and Circuits System need reasons such as certain reaction time; The original signal that obtains not is strict square-wave signal, needs passing threshold to handle signal is become square-wave signal, just can carry out CALCULATION OF PARAMETERS then.
The single head conducting probe is the general single threshold technology that adopts when Liquid Flow is measured, and is made as high level when promptly signal value is greater than threshold value, is made as low level during less than threshold value, here we adopted the high-low level difference 50% as threshold value.
Fig. 3 has provided signal (Normalized Signal) and the contrast of ideal square wave signal (Square Signal) after original signal under a certain operating mode (Raw Signal), the standardization.Through square-wave signal is handled, can obtain the value of equal void fraction of local time and bubble frequency.Wherein the equal void fraction C of local time is expressed as single head conducting probe electrode and is in the ratio of the time accumulated value of gas phase divided by total sampling time:
Wherein AT is total sampling time, and N is the total number of bubbles that double end conducting probe upstream electrode measures in the sampling time, (t
TF-t
TR)
jBe meant the low duration of j bubble.
Bubble frequency F is meant the bubbles number that detects in the single head conducting probe unit interval, can directly count to get the pulse in the ideal square wave signal, and its computing method are:
Wherein Δ T is total sampling time, and N is the total number of bubbles that double end conducting probe upstream electrode measures in the sampling time.
Four, the gassiness thickness of liquid film is measured embodiment
In the plexi-glass tubular of internal diameter 50mm, external diameter 70mm, use this measurement mechanism to carry out the measurement of air-moisture laminar flow fluctuation gassiness thickness of liquid film; At first make probe tip be close to the pipeline lower wall surface; Absolute position when the record probe tip is positioned at the pipe bottom is 0.00mm; And the L type of probe 1 met the flow direction of conductive liquid, and measure bubble so more easily, compare with linear probe; The shape of apparatus of the present invention, and the direction of putting when measuring can be measured thickness of liquid film more accurately.Probe vernier fixed block 8 then slides; Make the probe tip of single head conducting probe detector 9 be positioned at the pure liquid phase zone below the liquid-gas interface zone; This moment, electric current will flow through probe 1 and metal sleeve 4 because the conducting effect of water, made the Acquisition Circuit conducting; Signal continues the output high level, and this moment, void fraction was 0.Probe vernier fixed block 8 slowly upwards slides; Make probe tip move up to get into the liquid-gas interface zone, this moment is because the fluctuation and the gassiness on liquid film surface, during needle point and be in gas phase; The time and be in liquid phase; Signal output changes between high-low level, carries out signal analysis through the Labview graphics data collection analysis program on the computing machine 14, calculates here equal void fraction of local time and bubble frequency.Every in the liquid-gas interface zone at a distance from one section void fraction of slight distance measurement and bubble frequency; When probe tip has just got into the liquid-gas interface zone; The output signal is main with the high level that continues, and low level (see accompanying drawing 4, this moment, void fraction was 3%) occurs because of the minute bubbles of carrying secretly once in a while; The probe tip that moves up is to new position, and low level number increases (see accompanying drawing 5, this moment, void fraction was 50%) gradually in the output signal; Continue the probe tip that moves up, high level becomes rare in the output signal, is main (see accompanying drawing 6, this moment, void fraction was 90%) with the low level.Continue the vernier that moves up, make probe tip leave the liquid-gas interface zone and get into gas phase, this moment, this moment, void fraction was 100% because circuit breaks off, and signal continues output low level.
So moving up and down probe tip gets multiple spot and measures; Probe displacement and local void fraction, bubble frequency that the data collection and analysis program is calculated are presented on the screen in real time; And can be stored on the hard disk; Thereby detect the relation of displacement and void fraction in real time, obtain the relation curve (seeing accompanying drawing 7) of void fraction and bubble frequency vertical line direction change in displacement, thereby judge thickness of liquid film along the interface.The absolute position of probe is 13.15mm during for example desirable 50% void fraction; This correspondence position is a liquid-gas interface; The as can be seen from Figure 7 just in time corresponding largest air bubbles frequency location in 50% void fraction position; Be the position, middle of gas-liquid transition here, can think the liquid-gas interface position, the thickness of liquid film that obtains in the accompanying drawing 7 with this standard is 13.15mm.If when the difference of the absolute position the when absolute position of probe 1 and probe 1 are positioned at the pipe bottom when selecting 90% void fraction was the thickness of liquid film, the thickness of liquid film that is obtained was 13.78mm.
Claims (8)
1. interface fluctuation gassiness thickness of liquid film real-time measurement apparatus; Include the clamping shifter and the data collection and analysis device of power supply (11), single head conducting probe detector (9), control single head conducting probe detector (9) position; Wherein the data collection and analysis device includes external resistance (10) that is connected between power supply (11) and the single head conducting probe detector (9) and the analog input card (13) of measuring external resistance (10) voltage; It is characterized in that; Above-mentioned single head conducting probe detector (9) includes the probe (1) that passes metal sleeve (4); At probe portion metal sleeve (4) and probe (1) is the L type, insulation between probe (1) and the metal sleeve (4), and be connected respectively on the both positive and negative polarity of power supply (10).
2. measurement mechanism as claimed in claim 1 is characterized in that above-mentioned probe (1) is that diameter is the tinsel of 0.2mm, and the test section of probe (1) is the cone tip shape.
3. measurement mechanism as claimed in claim 1, the diameter that it is characterized in that above-mentioned metal sleeve (4) is 1mm.
4. measurement mechanism as claimed in claim 2 is characterized in that above-mentioned probe (1) outside surface scribbles insullac (2), only has the conductive region of 40～80 μ m at the needle point place.
5. measurement mechanism as claimed in claim 1 is characterized in that the two ends of above-mentioned metal sleeve (4) seal with micelle (3).
6. measurement mechanism as claimed in claim 1 is characterized in that above-mentioned probe (1) is connected to the negative pole of power supply (11), and metal sleeve (4) is connected to the positive pole of power supply (11), and power supply (11) is the direct supply of 4.5v.
7. measurement mechanism as claimed in claim 1 is characterized in that above-mentioned clamping shifter is made up of electronic digital indicator (7) and probe vernier fixed block (8).
8. the described device of claim 1 is used to measure the thickness of conducting liquid fluctuation gassiness liquid film.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU1029006A1 (en) * | 1981-11-03 | 1983-07-15 | Институт Космических Исследований Природных Ресурсов Научно-Производственного Объединения "Космические Исследования" | Device for measuring fluid film thickness |
| CN1743791A (en) * | 2004-08-31 | 2006-03-08 | 精碟科技股份有限公司 | Film thickness measuring device |
| CN101159225A (en) * | 2007-11-07 | 2008-04-09 | 上海宏力半导体制造有限公司 | Method for measuring liquid film thickness of electrically-conductive backing plate |
| WO2009018571A3 (en) * | 2007-08-02 | 2009-03-26 | Veeco Instr Inc | Probe device for a metrology instrument and method of fabricating the same |
| CN201666776U (en) * | 2009-12-14 | 2010-12-08 | 东莞联志五金制品有限公司 | Film thickness measurement device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010156544A (en) * | 2008-12-26 | 2010-07-15 | Aisin Seiki Co Ltd | Terahertz light measuring device |
-
2011
- 2011-03-03 CN CN201110050908A patent/CN102175130B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU1029006A1 (en) * | 1981-11-03 | 1983-07-15 | Институт Космических Исследований Природных Ресурсов Научно-Производственного Объединения "Космические Исследования" | Device for measuring fluid film thickness |
| CN1743791A (en) * | 2004-08-31 | 2006-03-08 | 精碟科技股份有限公司 | Film thickness measuring device |
| WO2009018571A3 (en) * | 2007-08-02 | 2009-03-26 | Veeco Instr Inc | Probe device for a metrology instrument and method of fabricating the same |
| CN101159225A (en) * | 2007-11-07 | 2008-04-09 | 上海宏力半导体制造有限公司 | Method for measuring liquid film thickness of electrically-conductive backing plate |
| CN201666776U (en) * | 2009-12-14 | 2010-12-08 | 东莞联志五金制品有限公司 | Film thickness measurement device |
Non-Patent Citations (3)
| Title |
|---|
| 吕晓明,丁忠满.《水平管道中汽液两相流的流型描述及测量方法的研究》.《水利学报》.1990,(第10期),23-27. * |
| 梁法春,陈婧,曹学文.《截面含气率的单丝电容探针测量》.《石油化工高等学校学报》.2009,第22卷(第2期),70-72. * |
| 王仁芳.《竖壁降液膜流动特性的研究》.《中国优秀硕士学位论文全文数据库》.2007,(第3期),全文. * |
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