CN102163778A - Direct-insert type electronic device detection connector - Google Patents
Direct-insert type electronic device detection connector Download PDFInfo
- Publication number
- CN102163778A CN102163778A CN2010105999216A CN201010599921A CN102163778A CN 102163778 A CN102163778 A CN 102163778A CN 2010105999216 A CN2010105999216 A CN 2010105999216A CN 201010599921 A CN201010599921 A CN 201010599921A CN 102163778 A CN102163778 A CN 102163778A
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- connector
- electronic device
- substrate
- locating piece
- direct insertion
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Abstract
The invention discloses a direct-insert type electronic device detection connector which comprises a base plate, a terminal base, a plurality of terminals on the terminal base, a plurality of connector bases provided with conductive terminals and a plurality of connection conductors, wherein one end of each terminal is connected with a test device, the other end of each terminal is correspondingly connected with one end of one connection conductor, and the other end of each connection conductor is correspondingly connected with one conductive terminal of one connector base; the base plate is a permeability material base plate, each connector base is connected with a positioning block made of a high-strength magnetic material; and each connector base is mutually actuated with the base plate through the positioning block so as to be fixed on the base plate. By using the direct-insert type electronic device detection connector, a test fixture can be simplified, the test cost is reduced, and the test flexibility and the detection work efficiency are improved.
Description
Technical field
The present invention relates to technical field of measurement and test, relate more specifically to a kind of direct insertion electronic device of the electrical property detection of direct insertion crystal oscillator that is applicable to and detect connector.
Background technology
When the electrical characteristic of detection electronics, generally by welding, go between or realizing with wire clamp, crystal oscillator product still different for pin definitions, the need batch detection but is not suitable for the connection between testing equipment and the tested device.
In order to carry out the batch detection of electronic device better, prior art is that a special connector is installed between testing equipment and tested device, and device is inserted connector, product is taken out after detection is finished, by turns test again.Not corresponding a kind of product of test of a general common apparatus, when changing the product test of different model, pin definitions, spacing may be different, need the frequent conversion seat of changing coupling could satisfy test request.Electronic device mostly is customization encapsulation and pin definitions, and therefore different products all needs corresponding test bench coupling.Consider the reliability of test, the mode that the conversion seat can be taked to weld usually or screw is fixing, the conversion seat is changed can the waste plenty of time.
Therefore, be necessary to provide a kind of improved direct insertion electronic device to detect connector and overcome above-mentioned defective.
Summary of the invention
The purpose of this invention is to provide a kind of direct insertion electronic device and detect connector, can simplify test fixture, reduce testing cost, promote the flexibility and the testing efficient of test.
For achieving the above object, the invention provides a kind of direct insertion electronic device and detect connector, comprise substrate, the binding post pedestal, be located at the some binding posts on the described binding post pedestal, be provided with some connector bases and some bonding conductors of conducting terminal, one end of each described binding post connects testing equipment, the other end is corresponding to be connected with an end of a described bonding conductor, the other end correspondence of each described bonding conductor is connected in the conducting terminal of a described connector base, described substrate is the permeability magnetic material substrate, each described connector base is connected with the locating piece of high strength magnetic material, and each described connector base is fixed on the described substrate by the mutual adhesive of described locating piece and described substrate.
Preferably, each described locating piece is provided with groove, and an end of each described connector base is corresponding to be inserted in the described groove, and correspondence is fixedlyed connected with a described locating piece.
Preferably, described locating piece is electromagnet or permanent magnet.
Preferably, the contact-making surface with the mutual adhesive of described substrate of each described locating piece is provided with salient point, and the surface that contacts with described locating piece of described substrate is provided with concave point.
Preferably, described bonding conductor is a flexible conductor.
Preferably, be provided with the installing and locating hole around the described substrate, so that described substrate is fixedly installed on work top or the equipment.
Preferably, described connector base is made by insulating material.
Compared with prior art, the direct insertion electronic device of the present invention detects connector and utilizes the magnetic force location, make each described connector base be connected with the locating piece of high strength magnetic material, each described connector base is fixed on the described substrate by the mutual adhesive of described locating piece and described permeability magnetic material substrate, and connector base can move on the optional position of substrate, and moves the certain stationkeeping ability of back maintenance.Like this, when needs carry out the crystal oscillator detection, can be inserted in connector base on the pin of measured device as requested respectively earlier, and then the connector base that will connect measured device is placed on the substrate, because the mutual adhesive of the locating piece of high strength magnetic material and permeability magnetic material substrate turns usefulness into, connector base can fast and effeciently be positioned on the substrate, and the location of connector base is just consistent with measured device, finished the spacing of pin and the setting of definition fast, operation is simple.After measured device taken off, the position of connector can not change, and can directly carry out the lower whorl test.Thereby the simplification test fixture reduces testing cost, promotes the flexibility and the testing efficient of test.
By following description also in conjunction with the accompanying drawings, it is more clear that the present invention will become, and these accompanying drawings are used to explain embodiments of the invention.
Description of drawings
Fig. 1 is the structural representation that the present invention is based on the direct insertion electronic device detection connector of Phase Lock Technique.
Embodiment
With reference now to accompanying drawing, describe embodiments of the invention, the similar elements label is represented similar elements in the accompanying drawing.As mentioned above, the invention provides a kind of direct insertion electronic device and detect connector, can simplify test fixture, reduce testing cost, promote the flexibility and the testing efficient of test.
Please refer to Fig. 1, the direct insertion electronic device of the present invention detects connector and comprises substrate 20, binding post pedestal 30, is located at some binding posts 40, some bonding conductors 50 and some connector bases 60 on the described binding post pedestal 30, described substrate 20 is the permeability magnetic material substrate, be square, and the every nook and cranny is respectively equipped with installing and locating hole 10, described substrate 20 is fixedly installed on work top or the equipment convenient test.
Described binding post pedestal 30 is located at an end of described substrate 20, described binding post 40 is located on the described binding post pedestal 30, and an end 41 of each described binding post 40 connects testing equipment (figure does not show), the other end 42 correspondences are connected with an end 51 of a described bonding conductor 50, the other end 52 correspondences of each described bonding conductor 50 are connected in the conducting terminal 70 of a described connector base 60, and described bonding conductor 50 is a flexible conductor.Described conducting terminal 70 is the connector reed, is used to be electrically connected measured device, and each described connector base 60 is an insulator, and is cylinder, and each conducting terminal 70 fixedly is contained in the described connector base 60 and forms an integral body with connector base 60.Measured device only need be inserted into an end 61 of described connector base 60, and its pin can contact with described conducting terminal 70, thereby tests.
As shown in Figure 1, each described connector base 60 is connected with the locating piece 80 of high strength magnetic material, each described connector base 60 can be fixed on the described substrate 20 with the mutual adhesive of described substrate 20 by described high strength magnetic material locating piece 80, and can move freely within the specific limits.
The preferably, each described high strength magnetic material locating piece 80 is provided with groove 81, the other end 62 corresponding the insertions in the described groove 81 of each described connector base 60, and correspondence is fixedlyed connected with a described high strength magnetic material locating piece 80.
The preferably, described high strength magnetic material locating piece 80 is electromagnet or permanent magnet.
The preferably, described high strength magnetic material locating piece 80 has carried out anti-skidding processing with the contact-making surface of described permeability magnetic material substrate 20, is provided with some tiny salient points with the frictional force of increase with described permeability magnetic material substrate 20 surfaces; And anti-skidding processing has been carried out on permeability magnetic material substrate 20 surfaces, is provided with some tiny concave points with the frictional force of increase with described high strength magnetic material 80 contact-making surfaces.
Like this, when needs carry out the crystal oscillator detection, can be inserted in connector base 60 on the pin of measured device as requested respectively earlier, and then the connector base 60 that will connect measured device is placed on the permeability magnetic material substrate 20, because high strength magnetic material locating piece 80 turns usefulness into the mutual adhesive of permeability magnetic material substrate 20, connector base 60 can fast and effeciently be positioned on the permeability magnetic material substrate 20, the location of connector base 60 is just consistent with measured device, finished the spacing of pin and the setting of definition fast, operation is simple.After measured device taken off, the position of connector can not change, and can directly carry out the lower whorl test.When needs detect the measured device of different model, only need and to take out from described permeability magnetic material substrate 20 together with high strength magnetic material locating piece 80 from connector base 60, be inserted in respectively on the pin of new measured device as requested, and then the connector base 60 that will connect measured device is placed on and carries out new detection on the permeability magnetic material substrate 20.Thereby the simplification test fixture reduces testing cost, promotes the flexibility and the testing efficient of test.
Above invention has been described in conjunction with most preferred embodiment, but the present invention is not limited to the embodiment of above announcement, and should contain various modification, equivalent combinations of carrying out according to essence of the present invention.
Claims (7)
1. a direct insertion electronic device detects connector, comprise substrate, the binding post pedestal, be located at the some binding posts on the described binding post pedestal, be provided with some connector bases and some bonding conductors of conducting terminal, one end of each described binding post connects testing equipment, the other end is corresponding to be connected with an end of a described bonding conductor, the other end correspondence of each described bonding conductor is connected in the conducting terminal of a described connector base, it is characterized in that: described substrate is the permeability magnetic material substrate, each described connector base is provided with the locating piece of high strength magnetic material, and each described connector base is fixed on the described substrate by the mutual adhesive of described locating piece and described substrate.
2. direct insertion electronic device as claimed in claim 1 detects connector, it is characterized in that each described locating piece is provided with groove, and an end of each described connector base is corresponding to be inserted in the described groove, and correspondence is fixedlyed connected with a described locating piece.
3. direct insertion electronic device as claimed in claim 1 or 2 detects connector, it is characterized in that described locating piece is electromagnet or permanent magnet.
4. direct insertion electronic device as claimed in claim 1 detects connector, it is characterized in that the contact-making surface with the mutual adhesive of described substrate of each described locating piece is provided with salient point, and the surface that contacts with described locating piece of described substrate is provided with concave point.
5. direct insertion electronic device as claimed in claim 1 detects connector, it is characterized in that described bonding conductor is a flexible conductor.
6. direct insertion electronic device as claimed in claim 1 detects connector, it is characterized in that, is provided with the installing and locating hole around the described substrate, so that described substrate is fixedly installed on work top or the equipment.
7. direct insertion electronic device as claimed in claim 1 detects connector, it is characterized in that described connector base is made by insulating material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010105999216A CN102163778A (en) | 2010-12-22 | 2010-12-22 | Direct-insert type electronic device detection connector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010105999216A CN102163778A (en) | 2010-12-22 | 2010-12-22 | Direct-insert type electronic device detection connector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102163778A true CN102163778A (en) | 2011-08-24 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010105999216A Pending CN102163778A (en) | 2010-12-22 | 2010-12-22 | Direct-insert type electronic device detection connector |
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| Country | Link |
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| CN (1) | CN102163778A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103825117A (en) * | 2014-03-04 | 2014-05-28 | 中山市中大电力自动化有限公司 | Quick coupling device for instrument aging test |
| CN106054050A (en) * | 2016-06-08 | 2016-10-26 | 昂纳信息技术（深圳）有限公司 | Semiconductor device test device |
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|---|---|---|---|---|
| CN2436994Y (en) * | 2000-01-06 | 2001-06-27 | 姚志勇 | Principle figure distribution type electronic experiment device |
| JP3395216B2 (en) * | 1992-09-29 | 2003-04-07 | 松下電器産業株式会社 | Printed wiring board inspection jig |
| CN101009983A (en) * | 2006-01-23 | 2007-08-01 | 纬创资通股份有限公司 | Structure and method for increasing the locking friction of the circuit board |
| CN201035043Y (en) * | 2007-04-28 | 2008-03-12 | 佛山市顺德区顺达电脑厂有限公司 | Measurement cramping apparatus |
| CN201852797U (en) * | 2010-11-24 | 2011-06-01 | 东莞市创丰科技发展有限公司 | Double-surfaced automatic detector |
-
2010
- 2010-12-22 CN CN2010105999216A patent/CN102163778A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3395216B2 (en) * | 1992-09-29 | 2003-04-07 | 松下電器産業株式会社 | Printed wiring board inspection jig |
| CN2436994Y (en) * | 2000-01-06 | 2001-06-27 | 姚志勇 | Principle figure distribution type electronic experiment device |
| CN101009983A (en) * | 2006-01-23 | 2007-08-01 | 纬创资通股份有限公司 | Structure and method for increasing the locking friction of the circuit board |
| CN201035043Y (en) * | 2007-04-28 | 2008-03-12 | 佛山市顺德区顺达电脑厂有限公司 | Measurement cramping apparatus |
| CN201852797U (en) * | 2010-11-24 | 2011-06-01 | 东莞市创丰科技发展有限公司 | Double-surfaced automatic detector |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103825117A (en) * | 2014-03-04 | 2014-05-28 | 中山市中大电力自动化有限公司 | Quick coupling device for instrument aging test |
| CN103825117B (en) * | 2014-03-04 | 2016-01-27 | 中山市中大电力自动化有限公司 | A kind of Quick Connect Kit for instrument ageing test |
| CN106054050A (en) * | 2016-06-08 | 2016-10-26 | 昂纳信息技术（深圳）有限公司 | Semiconductor device test device |
| CN106054050B (en) * | 2016-06-08 | 2019-07-12 | 昂纳信息技术（深圳）有限公司 | The test device of semiconductor devices |
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Application publication date: 20110824 |