CN102135566A - Frequency testing system and frequency testing method - Google Patents
Frequency testing system and frequency testing method Download PDFInfo
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- CN102135566A CN102135566A CN2010103005973A CN201010300597A CN102135566A CN 102135566 A CN102135566 A CN 102135566A CN 2010103005973 A CN2010103005973 A CN 2010103005973A CN 201010300597 A CN201010300597 A CN 201010300597A CN 102135566 A CN102135566 A CN 102135566A
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Abstract
The invention provides a frequency testing system that comprises a microcontroller, a frequency input module, a frequency selecting module, a frequency processing module and a frequency collecting module. The microcontroller judges whether the received control instruction is a frequency measurement instruction or not, if so, the microcontroller outputs a first control signal so as to control the tested equipment to output the frequency signal to be tested and outputs a second control signal; the frequency input module receives the frequency signal to be tested; the frequency selecting module selects the received frequency signal to be tested according to the second control signal; the frequency processing module processes and outputs the tested frequency signal obtained by selection; the frequency collecting module collects and calculates the processed frequency signal, and outputs the calculated analogue frequency signal to the microcontroller; and the microcontroller converts the analogue frequency signal into a digital frequency signal and transmits the digital frequency signal to a computer so that the digital frequency signal can be memorized and displayed. The invention also provides a frequency testing method. The frequency testing system and the frequency testing method can display the analogue frequency signal output by the tested equipment into the digital frequency signal for display, thus facilitating the testing personnel to observe signal.
Description
Technical field
The present invention relates to a kind of frequency testing system and method, the particularly a kind of system and method for output frequency test to guarantee that it normally moves to Devices to test.
Background technology
At present, in the test and control system of electronic equipment, need carry out frequency test to described electronic equipment, whether can normally operation in this frequency range with each parts of determining described electronic equipment.Traditional frequency test device mainly adopts interpositioning, this method of testing is to realize on the basis of Analogical Circuit Technique, adopt directly the frequency signal of simulation is measured, measurement result shows by the waveform on the oscillograph, and can not intuitively show with digital form, be not easy to the tester and observe.And traditional frequency test device can not offer Devices to test by output frequency signal.
Summary of the invention
In view of above content, be necessary to provide a kind of and can measure and provide frequency testing system and the method for frequency of operation the output frequency of Devices to test to Devices to test.
A kind of frequency testing system is used to test the frequency signal that a Devices to test is exported, and described frequency testing system comprises:
One microcontroller, be used to receive a steering order of computer output, and judge whether the described steering order that receives is the frequency measurement instruction, when the steering order that receives was the frequency measurement instruction, described microcontroller was exported one first control signal and is given described Devices to test to control the many group frequency signals to be measured of described Devices to test output and to export one second control signal;
One frequency load module is used to receive the frequency signal to be measured that described Devices to test is exported;
One frequency is selected module, is used for selecting according to the frequency signal to be measured that described second control signal is exported the described frequency load module that receives;
One frequency processing module is used to receive that described frequency is selected frequency signal to be measured that the selection of module output obtains and little frequency signal to be measured that described selection is obtained is exported after passing through attenuation processing through processing and amplifying or frequency signal to be measured that will be big;
One frequency acquisition module, be used to receive the frequency signal to be measured after the processing of described frequency processing module output and the frequency signal to be measured after the described processing gathered and calculate, and the analog frequency signal that calculates exported to described microcontroller, number conversion is to send described computer behind the numerical frequency signal to store and show to the analog frequency signal that described microcontroller will receive from described frequency acquisition module through internal mode;
One frequency generation module;
One frequency adjustment module; And
One frequency output module, when described microcontroller judges that the steering order that receives is a frequency output order, described microcontroller is exported one the 3rd control signal and one the 4th control signal according to described frequency output order, and described frequency generation module produces an analog frequency signal according to described the 3rd control signal and described analog frequency signal is exported; Described frequency adjustment module is regulated the analog frequency signal that receives from described frequency generation module according to described the 4th control signal, and the analog frequency signal after will regulating sends described microcontroller to, and number conversion is to send described computer behind the numerical frequency signal to store and show to described microcontroller through internal mode with the analog frequency signal that receives; Described frequency output module receives the analog frequency signal after the adjusting of described frequency adjustment module output and the analog frequency signal after the described adjusting is offered described Devices to test.
A kind of frequency test method is used to test the frequency signal that a Devices to test is exported, and may further comprise the steps:
S1: export a steering order and give a microcontroller;
S2: judge whether described steering order is frequency measurement instruction;
S3:, export one first control signal and export frequency signal to be measured to a frequency load module to control described Devices to test for described Devices to test if described steering order is the frequency measurement instruction;
S4: export one second control signal and select module to export to a frequency processing module for a frequency with one group of frequency signal to be measured controlling described frequency and select module that the frequency signal to be measured of the described frequency load module output that receives is selected and will be selected;
S5: the little frequency signal to be measured that will receive is exported to a frequency acquisition module through processing and amplifying or with big frequency signal to be measured through after the attenuation processing;
S6: the frequency signal treated to be measured that receives is gathered and calculated, and the analog frequency signal that calculates is exported to described microcontroller;
S7: the analog frequency signal process internal mode number conversion that will receive from described frequency acquisition module is to send a computer to behind the numerical frequency signal; And
S8: test result is stored and demonstration by described computer;
S9: if described steering order is not the frequency measurement instruction, judge that whether described steering order provides the frequency output order of frequency of operation to described Devices to test for one, if not, then exports one and feeds back signal to described computer and return step S1, if, execution in step S10 then;
S10: export one the 3rd control signal and produce an analog frequency signal and described analog frequency signal is exported to a frequency adjustment module for a frequency generation module to control described frequency generation module;
S11: export one the 4th control signal and to control described frequency adjustment module the analog frequency signal that receives is regulated for described frequency adjustment module; And
S12: the analog frequency signal after will regulating sends described microcontroller to, number conversion is to send described computer behind the numerical frequency signal to store and show that the analog frequency signal after also will regulating by a frequency output module offers described Devices to test to described microcontroller through internal mode with described analog frequency signal.
Compare prior art, described frequency testing system is selected module, frequency processing module and the frequency acquisition module realization frequency measurement to described Devices to test by described microcontroller, frequency load module, frequency, and provides frequency of operation to described Devices to test by described microcontroller, frequency generation module, frequency adjustment module and frequency output module.Described frequency testing system and method can be measured and can be described Devices to test to the output frequency of Devices to test frequency of operation is provided.
Description of drawings
The present invention is further illustrated in conjunction with embodiment with reference to the accompanying drawings.
Fig. 1 is a frequency testing system better embodiment of the present invention and block scheme after a Devices to test and a computer link to each other.
Fig. 2 A and Fig. 2 B are the process flow diagrams of the better embodiment of frequency test method of the present invention.
The main element symbol description
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100 |
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110、210 |
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120 |
| The |
130 |
| Frequency is selected |
140 |
| The |
150 |
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| The |
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| The |
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| Devices to test | 300 |
Embodiment
Please refer to Fig. 1, frequency testing system 100 of the present invention is used to test a Devices to test 300, as a computer main board, and the frequency signal of output.The better embodiment of described frequency testing system 100 comprises a usb 1 10, a microcontroller 120, a frequency load module 130, frequency selection module 140, a frequency processing module 150, a frequency acquisition module 160, a frequency generation module 170, a frequency adjustment module 180 and a frequency output module 190.Described microcontroller 120 connects described frequency acquisition module 160, frequency generation module 170, frequency is selected module 140, frequency adjustment module 180 and usb 1 10, described frequency load module 130 selects module 140 to connect frequency processing module 150 by described frequency, described frequency processing module 150 connects described microcontroller 120 by described frequency acquisition module 160, described microcontroller 120 connects frequency adjustment module 180 by described frequency generation module 170, described frequency adjustment module 180 connects described frequency output module 190, described frequency load module 130 and described frequency output module 190 are used to connect described Devices to test 300, described usb 1 10 can connect the USB interface 210 of a computer 200 by a cable, and described microcontroller 120 also is used to connect described Devices to test 300.In other embodiments, communicating by letter between described frequency testing system 100 and the computer 200 also can adopt wireless network to communicate.
During test, described computer 200 is given described microcontroller 120 by described USB interface 210 and 110 outputs, one steering order, described microcontroller 120 judges whether the described steering order that receives is frequency measurement instruction, when the steering order that receives when described microcontroller 120 is the frequency measurement instruction, described microcontroller 120 outputs one first control signal gives described frequency load module 130 to control described Devices to test 300 outputs frequency signal to be measured for described Devices to test 300, and select module 140 to select the frequency signal to be measured of described frequency load module 130 outputs that 140 pairs of modules receive to select for described frequency to control described frequency according to described frequency measurement instruction output one second control signal, as select a group in the frequency signal to be measured and output it to as described in frequency processing module 150, the frequency signal to be measured that 150 pairs of described frequency processing modules receive is adjusted processing, its adjustment processing comprises amplifies less frequency signal to be measured, or the frequency signal to be measured of high level is decayed, again to carrying out filtering through the frequency signal to be measured that amplifies or decay, export to described frequency acquisition module 160 after the shaping, the frequency signal treated to be measured that 160 pairs of described frequency acquisition modules receive is gathered, wherein said frequency acquisition module 160 adopts the timer sum counter that the frequency signal treated to be measured that receives is gathered, the i.e. level change frequency of calculated rate signal in the unit interval, perhaps time between the calculated rate signal level variation, described frequency acquisition module 160 will be exported to described microcontroller 120 through the data of gathering and calculate, the analog frequency signal process internal mode number conversion that described microcontroller 120 will receive from described frequency acquisition module 160 is to send described computer 200 to by described usb 1 10 and 210 behind the numerical frequency signal, described computer 200 is with described numerical frequency signal storage and show that the test result that the tester shows by described computer 200 can obtain a class frequency value of Devices to test 300 outputs.Other frequency signal test philosophies of described Devices to test 300 outputs are same as described above, do not repeat them here.
The steering order that receives when described microcontroller 120 is not described measurement instruction and be a frequency output order, when a frequency signal to be provided to described Devices to test 300, described microcontroller 120 is exported one the 3rd control signal according to described frequency output order and is produced an analog frequency signal to described frequency adjustment module 180 to control described frequency generation module 170 for described frequency generation module 170, and export one the 4th control signal and regulate so that described analog frequency signal can satisfy the demand of described Devices to test 300 for described frequency adjustment module 180 with the analog frequency signal of controlling 180 pairs of described frequency adjustment module and receiving, 180 pairs of described analog frequency signals of wherein said frequency adjustment module carry out the adjusting of amplitude size, analog frequency signal after described frequency adjustment module 180 will be regulated sends described microcontroller 120 to, described microcontroller 120 with the analog frequency signal that receives through internal mode number conversion be send described computer 200 to by described usb 1 10 and 210 behind the numerical frequency signal so that described computer 200 with its storage and demonstration, the analog frequency signal after described frequency adjustment module 180 also will be regulated by described frequency output module 190 offers described Devices to test 300 so that described Devices to test 300 is worked.The steering order that receives when described microcontroller 120 is during also for described frequency output order, and described microcontroller 120 outputs one feed back signal to described computer 200 and give described microcontroller 120 so that described computer 200 is exported a steering order again by described USB interface 210 and 110.
Please refer to Fig. 2 A-2B, the better embodiment of frequency test method of the present invention may further comprise the steps:
Step S1: described frequency testing system 100 is connected with described Devices to test 300, and described frequency testing system 100 is connected to described computer 200 by described usb 1 10, open described frequency testing system 100, described computer 200 and described Devices to test 300.
Step S2: described computer 200 is given described microcontroller 120 by described USB interface 210 and 110 outputs, one steering order.
Step S3: described microcontroller 120 judges whether the steering order that receives is frequency measurement instruction, in this way, execution in step S4 then, as not being, execution in step S10 then.
Step S4: described microcontroller 120 gives described frequency load module 130 to control described Devices to test 300 outputs frequency signal to be measured for described Devices to test 300 according to described frequency measurement instruction output one first control signal.
Step S5: described microcontroller 120 selects module 140 to export to described frequency processing module 150 with one group of frequency signal to be measured controlling described frequency and select the frequency signal to be measured of described frequency load module 130 outputs that 140 pairs of modules receive to select and will select for described frequency according to described frequency measurement instruction output one second control signal.
Step S6: the little frequency signal to be measured that described frequency processing module 150 will receive is exported to described frequency acquisition module 160 through processing and amplifying or with big frequency signal to be measured through after the attenuation processing.
Step S7: the frequency signal treated to be measured that 160 pairs of described frequency acquisition modules receive is gathered and is calculated, and the analog frequency signal that calculates is exported to described microcontroller 120.
Step S8: the analog frequency signal process internal mode number conversion that described microcontroller 120 will receive from described frequency acquisition module 160 is to send described computer 200 to by described usb 1 10 and 210 behind the numerical frequency signal.
Step S9: described computer 200 is with test result storage and demonstration.
Step S10: described microcontroller 120 judges whether the steering order that receives is a frequency output order, and if not, then described microcontroller 120 outputs one feed back signal to described computer 200 and return step S2, if, execution in step S11 then.
Step S11: described microcontroller 120 is exported one the 3rd control signal according to described frequency output order and is produced an analog frequency signal and described analog frequency signal is exported to described frequency adjustment module 180 for described frequency generation module 170 to control described frequency generation module 170.
Step S12: described microcontroller 120 is exported one the 4th control signal according to described frequency output order and is regulated so that described analog frequency signal satisfies the demand of described Devices to test 300 for described frequency adjustment module 180 with the analog frequency signal of controlling 180 pairs of described frequency adjustment module and receiving.
Step S13: the analog frequency signal after described frequency adjustment module 180 will be regulated sends described microcontroller 120 to, described microcontroller 120 with described analog frequency signal through internal mode number conversion be send described computer 200 to by described usb 1 10 and 210 behind the numerical frequency signal so that described computer 200 with its storage and demonstration, the analog frequency signal after described frequency adjustment module 180 also will be regulated by described frequency output module 190 offers described Devices to test 300 so that described Devices to test 300 is worked.
Described frequency testing system 100 is selected module 140, frequency processing module 150 and the frequency acquisition module 160 realizations frequency measurement to described Devices to test 300 by described microcontroller 120, frequency load module 130, frequency, and provides frequency of operation to described Devices to test 300 by described microcontroller 120, frequency generation module 170, frequency adjustment module 180 and frequency output module 190.Described frequency testing system and method can be measured and can be described Devices to test to the output frequency of Devices to test frequency of operation is provided.
Claims (4)
1. a frequency testing system is used to test the frequency signal that a Devices to test is exported, and described frequency testing system comprises:
One microcontroller, be used to receive a steering order of computer output, and judge whether the described steering order that receives is the frequency measurement instruction, when the steering order that receives was the frequency measurement instruction, described microcontroller was exported one first control signal and is given described Devices to test to control the many group frequency signals to be measured of described Devices to test output and to export one second control signal;
One frequency load module is used to receive the frequency signal to be measured that described Devices to test is exported;
One frequency is selected module, is used for selecting according to the frequency signal to be measured that described second control signal is exported the described frequency load module that receives;
One frequency processing module is used to receive that described frequency is selected frequency signal to be measured that the selection of module output obtains and little frequency signal to be measured that described selection is obtained is exported after passing through attenuation processing through processing and amplifying or frequency signal to be measured that will be big;
One frequency acquisition module, be used to receive the frequency signal to be measured after the processing of described frequency processing module output and the frequency signal to be measured after the described processing gathered and calculate, and the analog frequency signal that calculates exported to described microcontroller, number conversion is to send described computer behind the numerical frequency signal to store and show to the analog frequency signal that described microcontroller will receive from described frequency acquisition module through internal mode;
One frequency generation module;
One frequency adjustment module; And
One frequency output module, when described microcontroller judges that the steering order that receives is a frequency output order, described microcontroller is exported one the 3rd control signal and one the 4th control signal according to described frequency output order, and described frequency generation module produces an analog frequency signal according to described the 3rd control signal and described analog frequency signal is exported; Described frequency adjustment module is regulated the analog frequency signal that receives from described frequency generation module according to described the 4th control signal, and the analog frequency signal after will regulating sends described microcontroller to, and number conversion is to send described computer behind the numerical frequency signal to store and show to described microcontroller through internal mode with the analog frequency signal that receives; Described frequency output module receives the analog frequency signal after the adjusting of described frequency adjustment module output and the analog frequency signal after the described adjusting is offered described Devices to test.
2. frequency testing system as claimed in claim 1 is characterized in that: described frequency testing system also comprises a USB interface, described USB interface be used to connect described computer USB interface so that described frequency testing system and described computer communicate.
3. frequency testing system as claimed in claim 1 is characterized in that: communicating by letter between described frequency testing system and the described computer adopts wireless network to communicate.
4. a frequency test method is used to test the frequency signal that a Devices to test is exported, and may further comprise the steps:
S1: export a steering order and give a microcontroller;
S2: judge whether described steering order is frequency measurement instruction;
S3:, export one first control signal and export frequency signal to be measured to a frequency load module to control described Devices to test for described Devices to test if described steering order is the frequency measurement instruction;
S4: export one second control signal and select module to export to a frequency processing module for a frequency with one group of frequency signal to be measured controlling described frequency and select module that the frequency signal to be measured of the described frequency load module output that receives is selected and will be selected;
S5: the little frequency signal to be measured that will receive is exported to a frequency acquisition module through processing and amplifying or with big frequency signal to be measured through after the attenuation processing;
S6: the frequency signal treated to be measured that receives is gathered and calculated, and the analog frequency signal that calculates is exported to described microcontroller;
S7: the analog frequency signal process internal mode number conversion that will receive from described frequency acquisition module is to send a computer to behind the numerical frequency signal; And
S8: test result is stored and demonstration by described computer;
S9: if described steering order is not the frequency measurement instruction, judge that whether described steering order provides the frequency output order of frequency of operation to described Devices to test for one, if not, then exports one and feeds back signal to described computer and return step S1, if, execution in step S10 then;
S10: export one the 3rd control signal and produce an analog frequency signal and described analog frequency signal is exported to a frequency adjustment module for a frequency generation module to control described frequency generation module;
S11: export one the 4th control signal and to control described frequency adjustment module the analog frequency signal that receives is regulated for described frequency adjustment module; And
S12: the analog frequency signal after will regulating sends described microcontroller to, number conversion is to send described computer behind the numerical frequency signal to store and show that the analog frequency signal after also will regulating by a frequency output module offers described Devices to test to described microcontroller through internal mode with described analog frequency signal.
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| CN2010103005973A CN102135566A (en) | 2010-01-22 | 2010-01-22 | Frequency testing system and frequency testing method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106199179A (en) * | 2016-06-22 | 2016-12-07 | 何颖 | Frequency testing device and method |
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| CN2386447Y (en) * | 1998-07-29 | 2000-07-05 | 四川长虹电子集团公司 | Frequency tester |
| CN1474188A (en) * | 2002-08-05 | 2004-02-11 | 华为技术有限公司 | Device and method for detecting long term frequency stability of clock |
| CN101162398A (en) * | 2006-10-12 | 2008-04-16 | 东莞理工学院 | Arbitrarily signal generating device |
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Application publication date: 20110727 |