CN102129402A - Test card - Google Patents
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- CN102129402A CN102129402A CN2010103004218A CN201010300421A CN102129402A CN 102129402 A CN102129402 A CN 102129402A CN 2010103004218 A CN2010103004218 A CN 2010103004218A CN 201010300421 A CN201010300421 A CN 201010300421A CN 102129402 A CN102129402 A CN 102129402A
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- module
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- input voltage
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Abstract
The invention discloses a test card, which comprises a communication interface module, a test interface module, a resistance regulation module, a voltage measuring module, a microcontroller and a signal processing module. The test interface module is connected with a data interface to be tested of a computer system to be tested; the resistance regulation module is connected with the test interface module; the voltage measuring module is used for measuring an input voltage of the resistance regulation module and outputting a value of the input voltage; the microcontroller is used for regulating the resistance of the resistance regulation module and receiving the value of the input voltage, and outputting the value of the input voltage and the resistance of the resistance regulation module through the communication interface module; the signal processing module is connected with the communication interface module, and is used for receiving the value of the input voltage and comparing the value with a reference voltage value to judge the load capacity of the data interface to be tested. The test card provided by the invention can simply and conveniently test the load capacity of the data interface of the computer system.
Description
Technical field
The present invention relates to a kind of test card, particularly a kind of test card that system is carried out load testing.
Background technology
Along with the extended capability of computer function is more and more strong, the for example intervention of sound card, network interface card, video card and USB peripheral hardware etc., the stability of computer system and reliability are also important further, and the load capacity of the expansion interface of computer system becomes the important investigation factor of the stability of computer system.
Usually, the output voltage of the expansion interface of computer system (for example PCIE interface) reduces along with the reducing of resistance of the peripheral hardware that connects of expansion interface, and the output voltage of described expansion interface must be greater than the minimum of the peripheral hardware that is inserted in this expansion interface to guarantee that this peripheral hardware can operate as normal.Reduce at the peripheral hardware that this expansion interface connect under the situation of similar resistance, the reduction amplitude of the output voltage of the expansion interface load capacity of the bright expansion interface of novel more is big more, just when the voltage of expansion interface was reduced to a setting value, the load capacity of more little this expansion interface of explanation of the resistance of the peripheral hardware that expansion interface connect was big more.
Particularly, come the expansion interface of computer system is tested by a monitoring card.Though monitoring card can reach the purpose that detects expansion interface, whether the loop of just detecting expansion interface is unobstructed, can not test the size of the load capacity of expansion interface.
Summary of the invention
In view of above content, be necessary to provide a kind of test card of load capacity of the expansion interface that is used for the test computer system.
A kind of test card comprises:
One communication interface module;
One test interface module is used for being connected with the testing data interface of a computer system to be measured;
One resistance adjustment module is connected with described test interface module;
One voltage measurement module, the value that is used to measure the input voltage of described resistance adjustment module and exports described input voltage;
One microcontroller is used to adjust the resistance of described resistance adjustment module; Also be used to receive the value of described input voltage and export the value of described input voltage and the resistance of described resistance adjustment module by described communication interface module; And
One signal processing module, be connected with described communication interface module, be used to receive the value of described input voltage and itself and a reference voltage value are compared judging the size of the two, and judge the size of the load capacity of described computer system to be measured during less than described reference voltage value according to the resistance size of described resistance adjustment module in the value of described input voltage.
Test card of the present invention is connected with the testing data interface by described test interface module, described microcontroller is adjusted the resistance that described resistance adjustment module is connected to described test interface module, described voltage measurement module measure described resistance adjustment module input voltage value and send microcontroller to, described then microcontroller sends the value of described input voltage and the resistance of resistance adjustment module to described signal processing module by described communication interface module, the value of described input voltage reduces and reduces with the resistance of described resistance adjustment module, when the value of described input voltage during whether less than described reference voltage value, described signal processing module is judged the size of the load capacity of described testing data interface according to the value of described input voltage, and is simple and convenient.
Description of drawings
The invention will be further described in conjunction with embodiment with reference to the accompanying drawings.
Fig. 1 is the block diagram of the better embodiment and a computer system to be measured of test card of the present invention.
The main element symbol description
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| Computer system to be measured | 200 |
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Please refer to Fig. 1, the better embodiment of test card 100 of the present invention comprises a communication interface module 10, a test interface module 20, a resistance adjustment module 30, a voltage measurement module 40, a microcontroller 50 and a signal processing module 60.Described communication interface module 10, resistance adjustment module 30 and voltage measurement module 40 all are connected with described microcontroller 50, and described test interface module 20 is connected with described resistance adjustment module 30; Described communication interface module 10 also is used for being connected with described signal processing module 60; Described test interface module 20 also is connected with the testing data interface 210 of a computer system 200 to be measured.
Described communication interface module 10 comprises one or more in the communication interfaces such as USB interface, serial ports, parallel port, IEEE1394 interface and ESATA interface.
Because the testing data interface 210 of computer system 200 to be measured can be one or more in the interface types such as pci interface, PCIE interface and USB interface, so described test interface module 20 need comprise the interface that all are corresponding with the type of described testing data interface 210, can be one or more in the interface types such as pci interface, PCIE interface and USB interface.
Described resistance adjustment module 30 comprises that one can control to change the digital regulation resistance of resistance for described microcontroller 50; Also can comprise a plurality of relays and the different resistance of a plurality of resistance, described relay is subjected to the control of described microcontroller 50 to be used to select which resistance to be connected with described test interface module 20.
Described voltage measurement module 40 is used to survey the input voltage of described resistance adjustment module 30, and its physical circuit belongs to prior art, does not do specifying herein.
Described signal processing module 60 can comprise a computer.
Below the principle of work of test card 100 of the present invention is described.
When data-interface 210 to be measured is tested, earlier the interface of a type in the described test interface module 20 is inserted in the interface of the corresponding types in the described testing data interface 210, described microcontroller 50 resistances of the described resistance adjustment module 30 of control earlier is a maximal value with the output voltage of the testing data interface 210 that guarantees described computer system to be measured 200 greater than a reference voltage, described reference voltage equals or is slightly larger than the minimum that can be inserted in described testing data interface 210 and obtain the peripheral hardware (such as video card) of these computer system 200 supports to be measured, can obtain the minimum of each chip by the handbook of the used chip of inquiry peripheral hardware; The resistance of resistance adjustment module 30 as described in reducing gradually in the mode that reduces a setting resistance (as-50 Ω) at every turn then, the input voltage of resistance adjustment module 30 is with the reducing and reduce of resistance of self, simultaneously, the value that described voltage measurement module 40 is measured the input voltage of described resistance adjustment module 30 also sends described microcontroller 50 to, and described microcontroller 50 sends the resistance of the value of described input voltage and resistance adjustment module 30 described signal processing module 60 records to, shows and compares with the value of described reference voltage by described communication interface module 10.When the value of described input voltage during less than the value of described reference voltage, the described microcontroller 50 of described signal processing module 60 controls stops to continue to reduce the resistance of described resistance adjustment module 30, and the resistance of described signal processing module 60 usefulness resistance adjustment module 30 is at this moment represented the size of the load capacity of the type interface in the described testing data interface 210.The load capacity of the type interface in the described testing data interface 210 of the more little explanation of resistance of the resistance adjustment module 30 of this moment is big more.
In like manner, the interface correspondence of other type in the data-interface on the described test interface module 20 can be inserted in the interface of other type in the described testing data interface 210, with the size of the load capacity of the interface of testing other type in the described testing data interface 210.
Claims (5)
1. test card comprises:
One communication interface module;
One test interface module is used for being connected with the testing data interface of a computer system to be measured;
One resistance adjustment module is connected with described test interface module;
One voltage measurement module, the value that is used to measure the input voltage of described resistance adjustment module and exports described input voltage;
One microcontroller is used to adjust the resistance of described resistance adjustment module; Also be used to receive the value of described input voltage and export the value of described input voltage and the resistance of described resistance adjustment module by described communication interface module; And
One signal processing module, be connected with described communication interface module, be used to receive the value of described input voltage and itself and a reference voltage value are compared judging the size of the two, and judge the load capacity size of the testing data interface of described computer system to be measured during less than described reference voltage value according to the resistance size of described resistance adjustment module in the value of described input voltage.
2. test card as claimed in claim 1 is characterized in that: described communication interface module comprises in USB interface, serial ports, parallel port, IEEE1394 interface and the ESATA interface at least.
3. test card as claimed in claim 1 is characterized in that: described test interface module comprises in pci interface, PCIE interface and the USB interface at least.
4. test card as claimed in claim 1 is characterized in that: described resistance adjustment module comprises a digital regulation resistance, by the described digital regulation resistance of described microprocessor controls to regulate the resistance that described resistance adjustment module is connected with described test interface module.
5. test card as claimed in claim 1, it is characterized in that: described resistance adjustment module comprises a plurality of relays and the different resistance of a plurality of resistance at least, selects different resistance to be connected with described test interface module by the described relay of described microprocessor controls.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010300421.8A CN102129402B (en) | 2010-01-19 | 2010-01-19 | Test card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010300421.8A CN102129402B (en) | 2010-01-19 | 2010-01-19 | Test card |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102129402A true CN102129402A (en) | 2011-07-20 |
| CN102129402B CN102129402B (en) | 2014-03-26 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010300421.8A Expired - Fee Related CN102129402B (en) | 2010-01-19 | 2010-01-19 | Test card |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102129402B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104020372B (en) * | 2014-05-23 | 2017-04-12 | 国家电网公司 | Acquisition terminal equipment communication interface load capacity tester with communication module |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100501436C (en) * | 2004-08-24 | 2009-06-17 | 鸿富锦精密工业（深圳）有限公司 | Electric resistance loading system |
| CN101042667A (en) * | 2006-03-20 | 2007-09-26 | 佛山市顺德区顺达电脑厂有限公司 | Testing card |
| CN201083810Y (en) * | 2007-07-02 | 2008-07-09 | 佛山市顺德区顺达电脑厂有限公司 | Test card |
| CN201134093Y (en) * | 2007-12-26 | 2008-10-15 | 英业达科技有限公司 | Load testing tool |
-
2010
- 2010-01-19 CN CN201010300421.8A patent/CN102129402B/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104020372B (en) * | 2014-05-23 | 2017-04-12 | 国家电网公司 | Acquisition terminal equipment communication interface load capacity tester with communication module |
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| Publication number | Publication date |
|---|---|
| CN102129402B (en) | 2014-03-26 |
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| EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20110720 Assignee: Hongfujin Precision Electronics (Tianjin) Co., Ltd. Assignor: Hon Hai Precision Industry Co., Ltd. | Hong Fujin Precision Industry (Shenzhen) Co., Ltd. Contract record no.: 2014990000931 Denomination of invention: Integrated circuit test card Granted publication date: 20140326 License type: Exclusive License Record date: 20141216 |
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| LICC | Enforcement, change and cancellation of record of contracts on the licence for exploitation of a patent or utility model | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140326 Termination date: 20150119 |
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| EXPY | Termination of patent right or utility model |