CN102129402B - Test card - Google Patents
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- CN102129402B CN102129402B CN201010300421.8A CN201010300421A CN102129402B CN 102129402 B CN102129402 B CN 102129402B CN 201010300421 A CN201010300421 A CN 201010300421A CN 102129402 B CN102129402 B CN 102129402B
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Abstract
The invention discloses a test card, which comprises a communication interface module, a test interface module, a resistance regulation module, a voltage measuring module, a microcontroller and a signal processing module. The test interface module is connected with a data interface to be tested of a computer system to be tested; the resistance regulation module is connected with the test interface module; the voltage measuring module is used for measuring an input voltage of the resistance regulation module and outputting a value of the input voltage; the microcontroller is used for regulating the resistance of the resistance regulation module and receiving the value of the input voltage, and outputting the value of the input voltage and the resistance of the resistance regulation module through the communication interface module; the signal processing module is connected with the communication interface module, and is used for receiving the value of the input voltage and comparing the value with a reference voltage value to judge the load capacity of the data interface to be tested. The test card provided by the invention can simply and conveniently test the load capacity of the data interface of the computer system.
Description
Technical field
The present invention relates to a kind of test card, particularly a kind of test card that system is carried out to load testing.
Background technology
Along with the extended capability of computer function is more and more strong, intervention such as sound card, network interface card, video card and USB peripheral hardware etc., the stability of computer system and reliability are also further important, and the load capacity of the expansion interface of computer system becomes the important investigation factor of the stability of computer system.
Usually, the output voltage of the expansion interface of computer system (for example PCIE interface) reduces along with the reducing of resistance of the peripheral hardware that connects of expansion interface, and the output voltage of described expansion interface must be greater than the minimum of the peripheral hardware that is inserted in this expansion interface and can normally work to guarantee this peripheral hardware.In the situation that the peripheral hardware that this expansion interface connects reduces similar resistance, the reduction amplitude of the output voltage of the expansion interface more load capacity of the bright expansion interface of novel is larger, namely, when the lower voltage of expansion interface is during to a setting value, the load capacity of less this expansion interface of explanation of resistance of the peripheral hardware that expansion interface connects is larger.
Particularly, by a monitoring card, the expansion interface of computer system is tested.Although monitoring card can reach the object of extension of detecting capability interface, just whether the loop of extension of detecting capability interface is unobstructed, can not test the size of the load capacity of expansion interface.
Summary of the invention
In view of above content, be necessary to provide a kind of test card of load capacity of the expansion interface for test computer system.
A test card, comprising:
One communication interface module;
One test interface module, is connected for the testing data interface with a computer system to be measured;
One resistance adjustment module, is connected with described test interface module;
One voltage measurement module, for measuring the input voltage of described resistance adjustment module and exporting the value of described input voltage;
One microcontroller, for adjusting the resistance of described resistance adjustment module; Also for receiving the value of the described input voltage of exporting from described voltage measurement module and exporting the value of described input voltage and the resistance of described resistance adjustment module by described communication interface module; And
One signal processing module, be connected with described communication interface module, for receiving, from the value of the described input voltage of described communication interface module output and by itself and a reference voltage value, compare to judge the size of the two, and when the value of described input voltage is less than described reference voltage value according to the size of the load capacity of the described computer system to be measured of resistance size judgement of described resistance adjustment module, the resistance of described resistance adjustment module is less, and the load capacity of the testing data interface of described computer system to be measured is larger.
Test card of the present invention is connected with testing data interface by described test interface module, described microcontroller is adjusted the resistance that described resistance adjustment module is connected to described test interface module, described voltage measurement module measure described resistance adjustment module input voltage value and send microcontroller to, then described microcontroller sends the resistance of the value of described input voltage and resistance adjustment module to described signal processing module by described communication interface module, the value of described input voltage reduces and reduces with the resistance of described resistance adjustment module, when whether the value of described input voltage is less than described reference voltage value, described signal processing module judges the size of the load capacity of described testing data interface according to the value of described input voltage, simple and convenient.
Accompanying drawing explanation
In conjunction with embodiment, the invention will be further described with reference to the accompanying drawings.
Fig. 1 is the block diagram of better embodiment and a computer system to be measured of test card of the present invention.
Main element symbol description
Embodiment
Please refer to Fig. 1, the better embodiment of test card 100 of the present invention comprises a communication interface module 10, a test interface module 20, a resistance adjustment module 30, a voltage measurement module 40, a microcontroller 50 and a signal processing module 60.Described communication interface module 10, resistance adjustment module 30 and voltage measurement module 40 are all connected with described microcontroller 50, and described test interface module 20 is connected with described resistance adjustment module 30; Described communication interface module 10 is also for being connected with described signal processing module 60; Described test interface module 20 is also connected with the testing data interface 210 of a computer system 200 to be measured.
Described communication interface module 10 comprises one or more in the communication interfaces such as USB interface, serial ports, parallel port, IEEE1394 interface and ESATA interface.
Because the testing data interface 210 of computer system 200 to be measured can be one or more in the interface types such as pci interface, PCIE interface and USB interface, so interface corresponding to type that described test interface module 20 need comprise all and described testing data interface 210, can be one or more in the interface types such as pci interface, PCIE interface and USB interface.
Described resistance adjustment module 30 comprises that one can control to change for described microcontroller 50 digital regulation resistance of resistance; Also can comprise a plurality of relays and the different resistance of a plurality of resistance, described relay is subject to the control of described microcontroller 50 for selecting which resistance to be connected with described test interface module 20.
Described voltage measurement module 40 is for surveying the input voltage of described resistance adjustment module 30, and its physical circuit belongs to prior art, does not illustrate herein.
Described signal processing module 60 can comprise a computer.
Below the principle of work of test card 100 of the present invention is described.
When data-interface 210 to be measured is tested, first the interface of a type in described test interface module 20 is inserted in to the interface of the corresponding types in described testing data interface 210, the resistance that described microcontroller 50 is first controlled described resistance adjustment module 30 is that maximal value is greater than a reference voltage to guarantee the output voltage of the testing data interface 210 of described computer system to be measured 200, described reference voltage equals or is slightly larger than the minimum that can be inserted in described testing data interface 210 and obtain the peripheral hardware (such as video card) that this computer system to be measured 200 supports, can obtain by the handbook of inquiry peripheral hardware chip used the minimum of each chip, then with reduce at every turn the mode of a setting resistance (as-50 Ω) reduce gradually as described in the resistance of resistance adjustment module 30, the input voltage of resistance adjustment module 30 is with the reducing and reduce of resistance of self, simultaneously, the value of the input voltage of the described resistance adjustment module 30 of described voltage measurement module 40 measurement also sends described microcontroller 50 to, described microcontroller 50 sends the resistance of the value of described input voltage and resistance adjustment module 30 to described signal processing module 60 records by described communication interface module 10, show and compare with the value of described reference voltage.When the value of described input voltage is less than the value of described reference voltage, described signal processing module 60 is controlled the resistance that described microcontroller 50 stops continuing to reduce described resistance adjustment module 30, and the resistance of described signal processing module 60 use resistance adjustment module 30 now represents the size of the load capacity of the type interface in described testing data interface 210.The load capacity of the type interface in the described testing data interface 210 of the less explanation of resistance of resistance adjustment module 30 is now larger.
In like manner, the interface correspondence of other type in the data-interface on described test interface module 20 can be inserted in to the interface of other type in described testing data interface 210, to test the size of load capacity of the interface of other type in described testing data interface 210.
Claims (5)
1. a test card, comprising:
One communication interface module;
One test interface module, is connected for the testing data interface with a computer system to be measured;
One resistance adjustment module, is connected with described test interface module;
One voltage measurement module, for measuring the input voltage of described resistance adjustment module and exporting the value of described input voltage;
One microcontroller, for adjusting the resistance of described resistance adjustment module; Also for receiving the value of the described input voltage of exporting from described voltage measurement module and exporting the value of described input voltage and the resistance of described resistance adjustment module by described communication interface module; And
One signal processing module, be connected with described communication interface module, for receiving, from the value of the described input voltage of described communication interface module output and by itself and a reference voltage value, compare to judge the size of the two, and big or small according to the load capacity of the testing data interface of the described computer system to be measured of resistance size judgement of described resistance adjustment module when the value of described input voltage is less than described reference voltage value, the resistance of described resistance adjustment module is less, and the load capacity of the testing data interface of described computer system to be measured is larger.
2. test card as claimed in claim 1, is characterized in that: described communication interface module at least comprises in USB interface, serial ports, parallel port, IEEE1394 interface and ESATA interface.
3. test card as claimed in claim 1, is characterized in that: described test interface module at least comprises in pci interface, PCIE interface and USB interface.
4. test card as claimed in claim 1, is characterized in that: described resistance adjustment module comprises a digital regulation resistance resistance by digital regulation resistance described in described microprocessor controls to regulate described resistance adjustment module to be connected with described test interface module.
5. test card as claimed in claim 1, it is characterized in that: described resistance adjustment module at least comprises a plurality of relays and the different resistance of a plurality of resistance, by relay described in described microprocessor controls, select different resistance to be connected with described test interface module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010300421.8A CN102129402B (en) | 2010-01-19 | 2010-01-19 | Test card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010300421.8A CN102129402B (en) | 2010-01-19 | 2010-01-19 | Test card |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102129402A CN102129402A (en) | 2011-07-20 |
| CN102129402B true CN102129402B (en) | 2014-03-26 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201010300421.8A Expired - Fee Related CN102129402B (en) | 2010-01-19 | 2010-01-19 | Test card |
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| Country | Link |
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| CN (1) | CN102129402B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104020372B (en) * | 2014-05-23 | 2017-04-12 | 国家电网公司 | Acquisition terminal equipment communication interface load capacity tester with communication module |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1740803A (en) * | 2004-08-24 | 2006-03-01 | 鸿富锦精密工业（深圳）有限公司 | The ohmic load system |
| CN101042667A (en) * | 2006-03-20 | 2007-09-26 | 佛山市顺德区顺达电脑厂有限公司 | Testing card |
| CN201083810Y (en) * | 2007-07-02 | 2008-07-09 | 佛山市顺德区顺达电脑厂有限公司 | Test card |
| CN201134093Y (en) * | 2007-12-26 | 2008-10-15 | 英业达科技有限公司 | Load testing tool |
-
2010
- 2010-01-19 CN CN201010300421.8A patent/CN102129402B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1740803A (en) * | 2004-08-24 | 2006-03-01 | 鸿富锦精密工业（深圳）有限公司 | The ohmic load system |
| CN101042667A (en) * | 2006-03-20 | 2007-09-26 | 佛山市顺德区顺达电脑厂有限公司 | Testing card |
| CN201083810Y (en) * | 2007-07-02 | 2008-07-09 | 佛山市顺德区顺达电脑厂有限公司 | Test card |
| CN201134093Y (en) * | 2007-12-26 | 2008-10-15 | 英业达科技有限公司 | Load testing tool |
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| CN102129402A (en) | 2011-07-20 |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20110720 Assignee: Hongfujin Precision Electronics (Tianjin) Co., Ltd. Assignor: Hon Hai Precision Industry Co., Ltd. | Hong Fujin Precision Industry (Shenzhen) Co., Ltd. Contract record no.: 2014990000931 Denomination of invention: Integrated circuit test card Granted publication date: 20140326 License type: Exclusive License Record date: 20141216 |
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