CN102109329A - 厚度信息获取装置、方法和程序以及显微镜 - Google Patents

厚度信息获取装置、方法和程序以及显微镜 Download PDF

Info

Publication number
CN102109329A
CN102109329A CN2010105931177A CN201010593117A CN102109329A CN 102109329 A CN102109329 A CN 102109329A CN 2010105931177 A CN2010105931177 A CN 2010105931177A CN 201010593117 A CN201010593117 A CN 201010593117A CN 102109329 A CN102109329 A CN 102109329A
Authority
CN
China
Prior art keywords
picture
thickness information
sample
differs
correlativity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN2010105931177A
Other languages
English (en)
Chinese (zh)
Inventor
山本隆司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Publication of CN102109329A publication Critical patent/CN102109329A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN2010105931177A 2009-12-25 2010-12-16 厚度信息获取装置、方法和程序以及显微镜 Pending CN102109329A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009-295380 2009-12-25
JP2009295380A JP5581690B2 (ja) 2009-12-25 2009-12-25 厚み情報取得装置、厚み情報取得方法、厚み情報取得プログラム及び顕微鏡

Publications (1)

Publication Number Publication Date
CN102109329A true CN102109329A (zh) 2011-06-29

Family

ID=44173550

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010105931177A Pending CN102109329A (zh) 2009-12-25 2010-12-16 厚度信息获取装置、方法和程序以及显微镜

Country Status (3)

Country Link
US (1) US9127931B2 (https=)
JP (1) JP5581690B2 (https=)
CN (1) CN102109329A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109764817A (zh) * 2019-01-14 2019-05-17 南京信息工程大学 非接触式透镜中心厚测量系统及方法

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5468178B2 (ja) * 2011-03-31 2014-04-09 富士フイルム株式会社 撮像装置、撮像装置の制御方法及びプログラム
JPWO2017026446A1 (ja) 2015-08-10 2018-07-05 日本電気株式会社 装着体、認証装置、認証方法およびプログラム
EP3941333A1 (en) * 2019-03-20 2022-01-26 Carl Zeiss Meditec, Inc. A patient tuned ophthalmic imaging system with single exposure multi-type imaging, improved focusing, and improved angiography image sequence display
CN110261320B (zh) * 2019-06-28 2020-10-30 浙江大学 一种荧光交错差分显微成像的方法和装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0420190A (ja) * 1990-05-15 1992-01-23 Olympus Optical Co Ltd 電子カメラ装置および画像データの符号化装置
US20040070822A1 (en) * 1999-09-21 2004-04-15 Olympus Optical Co., Ltd. Surgical microscopic system
US20080002878A1 (en) * 2006-06-28 2008-01-03 Somasundaram Meiyappan Method For Fast Stereo Matching Of Images
CN101137014A (zh) * 2006-08-31 2008-03-05 富士能株式会社 监视照相机系统

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05127068A (ja) * 1991-10-09 1993-05-25 Fuji Photo Optical Co Ltd 双眼実体顕微鏡
JPH05181056A (ja) * 1992-01-06 1993-07-23 Canon Inc 焦点検出装置
JPH06265349A (ja) * 1993-03-16 1994-09-20 Nissan Motor Co Ltd 車間距離検出装置
JPH11133309A (ja) * 1997-10-29 1999-05-21 Nippon Telegr & Teleph Corp <Ntt> 顕微鏡装置、寸法測定方法及びその装置
JP4558047B2 (ja) 2008-01-23 2010-10-06 オリンパス株式会社 顕微鏡システム、画像生成方法、及びプログラム

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0420190A (ja) * 1990-05-15 1992-01-23 Olympus Optical Co Ltd 電子カメラ装置および画像データの符号化装置
US20040070822A1 (en) * 1999-09-21 2004-04-15 Olympus Optical Co., Ltd. Surgical microscopic system
US20080002878A1 (en) * 2006-06-28 2008-01-03 Somasundaram Meiyappan Method For Fast Stereo Matching Of Images
CN101137014A (zh) * 2006-08-31 2008-03-05 富士能株式会社 监视照相机系统

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
YANNICK MORVAN: "Acquisition, Compression and Rendering of Depth and Texture for Multi-View Video", 《GOOGLE SCHOLAR》, 9 June 2009 (2009-06-09) *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109764817A (zh) * 2019-01-14 2019-05-17 南京信息工程大学 非接触式透镜中心厚测量系统及方法

Also Published As

Publication number Publication date
JP5581690B2 (ja) 2014-09-03
US9127931B2 (en) 2015-09-08
US20110157348A1 (en) 2011-06-30
JP2011133438A (ja) 2011-07-07

Similar Documents

Publication Publication Date Title
US8576483B2 (en) Microscope and focusing method
CN102597842B (zh) 聚焦装置、聚焦方法和显微镜
CN102156976A (zh) 运算装置、运算方法、运算程序、以及显微镜
CN102313982B (zh) 显微镜及区域确定方法
EP2622397B1 (en) Calibration targets for microscope imaging
US9176311B2 (en) Microscope control device and optical distortion correction method
JP5293468B2 (ja) 蛍光像取得装置、蛍光像取得方法及び蛍光像取得プログラム
US12301990B2 (en) Deep learning model for auto-focusing microscope systems
US9465211B2 (en) Microscope and ghosting elimination method
CN102109329A (zh) 厚度信息获取装置、方法和程序以及显微镜
JP2022544292A (ja) ２段階明視野再構築を介したサンプル結像
WO2021024420A1 (ja) 屈折率分布推定システム
JP5471715B2 (ja) 合焦装置、合焦方法、合焦プログラム及び顕微鏡
CN117233947B (zh) 显微镜照明系统、控制方法及显微成像检测系统
EP4451035A1 (en) Two-photon synthetic aperture microscopy system and method based on focus-tunable lens
CN115375550B (zh) 一种起伏样本显微成像方法与系统

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
AD01 Patent right deemed abandoned

Effective date of abandoning: 20160217

C20 Patent right or utility model deemed to be abandoned or is abandoned