JP5581690B2 - 厚み情報取得装置、厚み情報取得方法、厚み情報取得プログラム及び顕微鏡 - Google Patents

厚み情報取得装置、厚み情報取得方法、厚み情報取得プログラム及び顕微鏡 Download PDF

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Publication number
JP5581690B2
JP5581690B2 JP2009295380A JP2009295380A JP5581690B2 JP 5581690 B2 JP5581690 B2 JP 5581690B2 JP 2009295380 A JP2009295380 A JP 2009295380A JP 2009295380 A JP2009295380 A JP 2009295380A JP 5581690 B2 JP5581690 B2 JP 5581690B2
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JP
Japan
Prior art keywords
image
correlation
thickness
thickness information
phase difference
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2009295380A
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English (en)
Japanese (ja)
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JP2011133438A5 (https=
JP2011133438A (ja
Inventor
隆司 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP2009295380A priority Critical patent/JP5581690B2/ja
Priority to CN2010105931177A priority patent/CN102109329A/zh
Priority to US12/970,088 priority patent/US9127931B2/en
Publication of JP2011133438A publication Critical patent/JP2011133438A/ja
Publication of JP2011133438A5 publication Critical patent/JP2011133438A5/ja
Application granted granted Critical
Publication of JP5581690B2 publication Critical patent/JP5581690B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/04—Measuring microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2009295380A 2009-12-25 2009-12-25 厚み情報取得装置、厚み情報取得方法、厚み情報取得プログラム及び顕微鏡 Expired - Fee Related JP5581690B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009295380A JP5581690B2 (ja) 2009-12-25 2009-12-25 厚み情報取得装置、厚み情報取得方法、厚み情報取得プログラム及び顕微鏡
CN2010105931177A CN102109329A (zh) 2009-12-25 2010-12-16 厚度信息获取装置、方法和程序以及显微镜
US12/970,088 US9127931B2 (en) 2009-12-25 2010-12-16 Thickness-information acquisition apparatus, thickness-information acquisition method, thickness-information acquisition program and microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009295380A JP5581690B2 (ja) 2009-12-25 2009-12-25 厚み情報取得装置、厚み情報取得方法、厚み情報取得プログラム及び顕微鏡

Publications (3)

Publication Number Publication Date
JP2011133438A JP2011133438A (ja) 2011-07-07
JP2011133438A5 JP2011133438A5 (https=) 2012-12-20
JP5581690B2 true JP5581690B2 (ja) 2014-09-03

Family

ID=44173550

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009295380A Expired - Fee Related JP5581690B2 (ja) 2009-12-25 2009-12-25 厚み情報取得装置、厚み情報取得方法、厚み情報取得プログラム及び顕微鏡

Country Status (3)

Country Link
US (1) US9127931B2 (https=)
JP (1) JP5581690B2 (https=)
CN (1) CN102109329A (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5468178B2 (ja) * 2011-03-31 2014-04-09 富士フイルム株式会社 撮像装置、撮像装置の制御方法及びプログラム
JPWO2017026446A1 (ja) 2015-08-10 2018-07-05 日本電気株式会社 装着体、認証装置、認証方法およびプログラム
CN109764817A (zh) * 2019-01-14 2019-05-17 南京信息工程大学 非接触式透镜中心厚测量系统及方法
EP3941333A1 (en) * 2019-03-20 2022-01-26 Carl Zeiss Meditec, Inc. A patient tuned ophthalmic imaging system with single exposure multi-type imaging, improved focusing, and improved angiography image sequence display
CN110261320B (zh) * 2019-06-28 2020-10-30 浙江大学 一种荧光交错差分显微成像的方法和装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3037961B2 (ja) * 1990-05-15 2000-05-08 オリンパス光学工業株式会社 電子カメラ装置および画像データの符号化装置
JPH05127068A (ja) * 1991-10-09 1993-05-25 Fuji Photo Optical Co Ltd 双眼実体顕微鏡
JPH05181056A (ja) * 1992-01-06 1993-07-23 Canon Inc 焦点検出装置
JPH06265349A (ja) * 1993-03-16 1994-09-20 Nissan Motor Co Ltd 車間距離検出装置
JPH11133309A (ja) * 1997-10-29 1999-05-21 Nippon Telegr & Teleph Corp <Ntt> 顕微鏡装置、寸法測定方法及びその装置
US6661571B1 (en) * 1999-09-21 2003-12-09 Olympus Optical Co., Ltd. Surgical microscopic system
US20080002878A1 (en) * 2006-06-28 2008-01-03 Somasundaram Meiyappan Method For Fast Stereo Matching Of Images
JP4214160B2 (ja) * 2006-08-31 2009-01-28 フジノン株式会社 監視カメラシステム
JP4558047B2 (ja) 2008-01-23 2010-10-06 オリンパス株式会社 顕微鏡システム、画像生成方法、及びプログラム

Also Published As

Publication number Publication date
US9127931B2 (en) 2015-09-08
US20110157348A1 (en) 2011-06-30
JP2011133438A (ja) 2011-07-07
CN102109329A (zh) 2011-06-29

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