CN102062793A - Probe card and structurally strengthened test socket therein - Google Patents
Probe card and structurally strengthened test socket therein Download PDFInfo
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- CN102062793A CN102062793A CN2009102220202A CN200910222020A CN102062793A CN 102062793 A CN102062793 A CN 102062793A CN 2009102220202 A CN2009102220202 A CN 2009102220202A CN 200910222020 A CN200910222020 A CN 200910222020A CN 102062793 A CN102062793 A CN 102062793A
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- reinforcement members
- housing
- accommodation space
- test jack
- lid
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Abstract
The invention discloses a probe card and a structurally strengthened test socket therein. The structurally strengthened test socket mainly comprises a plurality of test probes, a flat shell, a cover body, a plurality of first locking components, at least one first strengthening member, at least one second strengthening member and a plurality of second locking components, wherein the shell is provided with at least one first accommodating space and at least one second accommodating space for arranging the first strengthening member and the second strengthening member respectively; the plurality of second locking components penetrate through the first strengthening member, the shell and the second strengthening member, so the shell is stably clamped between the first strengthening member and the second strengthening member; and Young's modulus of the first strengthening member and the second strengthening member is greater than that of the shell.
Description
Technical field
The present invention system relates to probe and wherein test jack, particularly is applied to the probe of wafer sort and wherein structure-reinforced test jack relevant for a kind of.
Background technology
Now in order to make electronic product meet the multifunctionality and the light and handy propensity to consume of appearance and modeling, semiconductor packages tends to the technical development of wafer-level chip scale package (Wafer Level Chip Size Package/WLCSP) gradually, wafer-level chip scale package and traditional different being of chip size packages, wafer-level chip scale package is directly to carry out packaging technology on wafer, and then cutting, through promptly becoming the integrated circuit (IC) products that single encapsulation is finished after the cutting.The advantage of wafer-level chip scale package is, the finished-product volume that encapsulation is finished is less, can save the making of filler, lead frame and substrate, omit technologies such as sticking crystalline substance and routing, therefore significantly reduce outside material and the cost of labor, also shorten the process time of encapsulation and can improve production yield and production capacity.But wafer-level chip scale package is a kind of encapsulating structure of size microminiaturization, and its package dimension is approaching with chip size or equate that when therefore carrying out the wafer-level chip scale package test, the size of chip and quantity also can cause the difficulty of test.
128 test sections (Testing side) with while testing wafer level chip scale package are example, wherein each test section may be defined as the one chip (Chip) on the wafer-level chip scale package, and have 8 contacts on each one chip, need be equiped with 1024 spring probes so desire to test simultaneously in the test jack of 128 chips, test because of each contact need use 8 spring probes.But because of testing 1024 contacts simultaneously, distance can be dwindled between then being bound between contact and contact, relatively the distance of 1024 pins in the test jack also can be dwindled, but this moment is because the area and the volume of test jack there is no change, so also have under the situation of reduction in the diagonal distance of test specification relatively, 1024 spring probes in the test jack will be because of the inequality of acting force when testing, cause the bending (socket housing bending) of test jack, in addition, the contraposition difficulty that also can cause operating personnel to test, spended time is in the contraposition of chip and test jack, and can cause loose contact serious the time, test can't be carried out smoothly, or cause test result unreliable, even must resurvey, cause expending time in and expense.For the industry of paying attention to timeliness and desiring to reduce cost, still remain to be improved.
Summary of the invention
In order to solve the desirable not to the utmost part of above-mentioned prior art, the invention provides a kind of structure-reinforced test jack, mainly comprise housing, lid and a plurality of first lock-in component of a plurality of test probes, flat.Housing has first and second, and second face is offered a depressed part and is installed with wherein for lid, and a plurality of first lock-in components are connected to each other locking with housing and lid.Structure-reinforced test jack further comprises at least one first reinforcement members, at least one second reinforcement members and a plurality of second lock-in component, and the young's modulus of first reinforcement members and second reinforcement members is higher than the young's modulus of housing.First face of housing is concaved with at least one first accommodation space, and first accommodation space is in order to being provided with first reinforcement members, and makes first reinforcement members not protrude from first of housing.Be formed with at least one second accommodation space between housing and the lid, second accommodation space is in order to being provided with second reinforcement members, and makes second reinforcement members corresponding to first reinforcement members.Above-mentioned a plurality of second lock-in components penetrate first reinforcement members, housing and second reinforcement members, housing firmly is held between first reinforcement members and second reinforcement members, and interosculates.In addition, above-mentioned a plurality of test probes penetrate housing and lid simultaneously, and the one end is in order to the contact semiconductor device, and the other end is formed (PCB assembly) in order to the contact circuit plate.
Therefore, fundamental purpose of the present invention is to provide a kind of structure-reinforced test jack, have first reinforcement members and second reinforcement members, utilize second lock-in component to penetrate first reinforcement members, housing and second reinforcement members, housing firmly is held between first reinforcement members and second reinforcement members, by this intensity that can increase test jack, make test jack be difficult for causing bending.
Secondary objective of the present invention is to provide a kind of structure-reinforced test jack, have first reinforcement members and second reinforcement members, and the young's modulus of first reinforcement members and second reinforcement members is higher than the young's modulus of housing, therefore test jack can be under outward appearance, constancy of volume, increase the intensity of test jack, make test jack be difficult for causing bending, reduce the test jack cost of manufacture.
Another object of the present invention is to provide a kind of structure-reinforced test jack, have first reinforcement members and second reinforcement members, and the young's modulus of first reinforcement members and second reinforcement members is higher than the young's modulus of housing, when the quantity of the test probe in the test jack increases, still can keep the intensity of test jack, make test jack be difficult for causing bending, and then promote tested productivity.
A further object of the present invention is to provide a kind of structure-reinforced test jack, have first reinforcement members and second reinforcement members, when carrying out high temperature or low-temperature test, for example, probe temperature is between-40 ℃ to 120 ℃, and this structure-reinforced test jack can avoid producing because of temperature variation the problem of distortion, makes in the contraposition of chip to be measured and test jack, keep the excellent electrical property contact, improve the fiduciary level of test result.
In addition, the present invention further provides a kind of probe, consist predominantly of the structure-reinforced test jack that a circuit board is formed and is locked in circuit board composition central part.Wherein structure-reinforced test jack mainly comprises housing, lid and a plurality of first lock-in component of a plurality of test probes, flat.Housing has first and second, and second face is offered a depressed part and is installed with wherein for lid, and a plurality of first lock-in components are connected to each other locking with housing and lid.Structure-reinforced test jack further comprises at least one first reinforcement members, at least one second reinforcement members and a plurality of second lock-in component, and the young's modulus of first reinforcement members and second reinforcement members is higher than the young's modulus of housing.First face of housing is concaved with at least one first accommodation space, and first accommodation space is in order to being provided with first reinforcement members, and makes first reinforcement members not protrude from first of housing.Be formed with at least one second accommodation space between housing and the lid, second accommodation space is in order to being provided with second reinforcement members, and makes second reinforcement members corresponding to first reinforcement members.Above-mentioned a plurality of second lock-in components penetrate first reinforcement members, housing and second reinforcement members, housing firmly is held between first reinforcement members and second reinforcement members, and interosculates.
Therefore, a further object of the present invention is to provide a kind of probe, wherein employed structure-reinforced test jack, have first reinforcement members and second reinforcement members, utilize second lock-in component to penetrate first reinforcement members, housing and second reinforcement members, housing firmly is held between first reinforcement members and second reinforcement members,, makes test jack be difficult for causing bending by this intensity that can increase test jack.
A further object of the present invention is to provide a kind of probe, wherein employed structure-reinforced test jack, have first reinforcement members and second reinforcement members, and the young's modulus of first reinforcement members and second reinforcement members is higher than the characteristic of the young's modulus of housing, therefore test jack can be under outward appearance, constancy of volume, can increase the intensity of test jack, make test jack be difficult for causing bending, reduce the test jack cost of manufacture.
A further object of the present invention is to provide a kind of probe, wherein employed structure-reinforced test jack, have first reinforcement members and second reinforcement members, and the young's modulus of first reinforcement members and second reinforcement members is higher than the characteristic of the young's modulus of housing, when the quantity of the test probe in the test jack increases, still can keep the intensity of test jack, make test jack be difficult for causing bending, and then promote tested productivity.
A further object of the present invention is to provide a kind of probe, wherein employed structure-reinforced test jack, have first reinforcement members and second reinforcement members, when carrying out high temperature or low-temperature test, for example, probe temperature is between-40 ℃ to 120 ℃, this structure-reinforced test jack can avoid producing because of temperature variation the problem of distortion, make in the contraposition of chip to be measured and test jack, keep the excellent electrical property contact, improve the fiduciary level of test result.
Description of drawings
Fig. 1 is an explosive view, and first preferred embodiment that proposes according to the present invention is a kind of structure-reinforced test jack;
Fig. 2 is a synoptic diagram, and first preferred embodiment that proposes according to the present invention is a kind of second icon of structure-reinforced test jack;
Fig. 3 is a cut-open view, and first preferred embodiment that proposes according to the present invention is a kind of structure-reinforced test jack.
[main element symbol description]
Structure-reinforced test jack 100
First 21
Second 22
Depressed part 221
Through hole 23
First lock-in component 4
Screw 51
Through hole 61
Second lock-in component 7
Circuit board forms 9
Embodiment
Because the present invention discloses required probe of a kind of wafer sort and structure-reinforced test jack wherein, the wherein use principle of probe of being utilized and test jack and basic function, for having, correlative technology field knows that usually the knowledgeable can understand, so with explanation hereinafter, no longer complete description.Simultaneously, graphic with what hereinafter contrasted, express the structural representation relevant with feature of the present invention, also do not need formerly to chat bright according to the complete drafting of physical size.
At first please refer to Fig. 1, be according to first preferred embodiment provided by the present invention, be a kind of explosive view of structure-reinforced test jack 100, mainly comprise housing 2, the lid 3 and a plurality of first lock-in components 4 of a plurality of test probes 1, flat, housing 2 has first 21 and second 22.Please refer to Fig. 2, is second 22 of housing 2, and the depressed part 221 that second 22 central part of its middle shell 2 is offered a strip groove is installed with wherein for lid 3.Please continue with reference to figure 1, above-mentioned a plurality of first lock-in components 4 are that housing 2 and lid 3 are connected to each other locking, and the material of housing 2 and lid 3 all is to be good with ambroin.A plurality of test probes 1 penetrate housing 2 and lid 3 simultaneously, and the one end is in order to contact semiconductor device (not icon), and the other end is formed 9 (PCB assembly) in order to contact a circuit board.
Be attached to circuit board (PCB) when going up for fear of test jack, the acting force of the spring probe on the test probe will cause test jack to produce bending (Bending), make contraposition difficulty, loose contact.Structure-reinforced test jack 100 of the present invention further comprises at least one first reinforcement members 5, at least one second reinforcement members 6 and a plurality of second lock-in components 7, wherein the young's modulus of first reinforcement members 5 and second reinforcement members 6 is higher than the young's modulus of housing 2, and the material of first reinforcement members 5 and second reinforcement members 6, configuration and size homogeneous phase are all good.In this preferred embodiment, the material of first reinforcement members 5 and second reinforcement members 6 is metal and is 2.First 21 of housing 2 is concaved with at least one first accommodation space 211, this first accommodation space 211 is the groove of strip, in order to first reinforcement members 5 to be set, and make the reinforcement members 5 of winning not protrude from first 21 of housing 2, can keep and not increase the overall dimensions of structure-reinforced test jack 100 by this.Please continue with reference to figure 2, be formed with at least one second accommodation space 8 between housing 2 and the lid 3 in order to second reinforcement members 6 to be set, second accommodation space 8 is arranged with in the one side (as shown in Figure 2) of lid 3 in the face of housing 2, certainly this second accommodation space 8 also can be arranged with in the one side (not shown) of housing 2 in the face of lid 3, and this second accommodation space 8 is in order to be provided with second reinforcement members 6.
Be that second reinforcement members 6 that is arranged at second accommodation space 8 will be corresponding to first reinforcement members 5 that is arranged at first accommodation space 211 what this will give special heed to.In this preferred embodiment, the quantity of first accommodation space 211 and second accommodation space 8 is 2, and be horizontal arrangement, and 2 first accommodation spaces 211 are the symmetry shape setting with respect to first 21 of housing 2,2 second accommodation spaces 8 also are the setting of symmetry shape with respect to lid 3, and 2 first accommodation spaces 211 and second accommodation space 8 all are arranged at the periphery of a plurality of test probes 1.
Please refer to Fig. 3, be the cut-open view of Fig. 2 along A to A, key character of the present invention is, utilize a plurality of second lock-in components 7 to penetrate first reinforcement members 5, housing 2 and second reinforcement members 6, by this housing 2 firmly is held between first reinforcement members 5 and second reinforcement members 6, and interosculates.In a preferred embodiment, be equipped with through hole 61 and 23 on second reinforcement members 6 and the housing 2, first reinforcement members 5 is provided with screw 51, second lock-in component 7 can be bolt, can pass second reinforcement members 6 and housing 2 and then locking on first reinforcement members 5, by this intensity that can increase structure-reinforced test jack 100 of the present invention, make test jack be difficult for causing bending.And because utilize the young's modulus of first reinforcement members 5 and second reinforcement members 6 to be higher than the characteristic of the young's modulus of housing, therefore structure-reinforced test jack 100 of the present invention can be under outward appearance, constancy of volume, can increase the intensity of test jack, reach test jack and be difficult for causing bending, and then reduce the cost of manufacture of test jack.If when further making housing 2 volumes of test jack become big if will increase the quantity of the test probe in the test jack, structure-reinforced test jack 100 of the present invention still can utilize a plurality of second lock-in components 7 to penetrate first reinforcement members 5, housing 2 and second reinforcement members 6, and keep suitable intensity, and then promote tested productivity.
The present invention further provides second preferred embodiment, be a kind of probe, consist predominantly of circuit board composition 9 and be locked in the structure-reinforced test jack 100 that circuit board is formed 9 central parts, wherein structure-reinforced test jack 100 mainly comprises housing 2, the lid 3 and a plurality of first lock-in components 4 of a plurality of test probes 1, flat.Housing 2 has to be offered a depressed part 221 for first 21 and second 22, the second 22 and is installed with wherein for lid 3, and a plurality of first lock-in component 4 is connected to each other locking with housing 2 and lid 3.Wherein, first preferred embodiment is described as described above for the further feature of structure-reinforced test jack 100.
Moreover, probe of the present invention and structure-reinforced test jack wherein, its first accommodation space and second accommodation space, more can be located on demand first of housing with second periphery, by this first reinforcement members and second reinforcement members can frame be located at housing around; Or first accommodation space and second accommodation space can form I font or groined type or and the geometric configuration of combination, with ccontaining first reinforcement members of difference and second reinforcement members, first reinforcement members like this and second reinforcement members can with I font or groined type or and the geometric configuration of combination distribute and be arranged on the housing,, reduce probe and produce the chance of deformation in the probe of different model or size and wherein test jack with suitable configuration first reinforcement members and second reinforcement members with test jack wherein.
On the other hand, probe of the present invention and structure-reinforced test jack wherein, have first reinforcement members and second reinforcement members, when carrying out high temperature or low-temperature test, for example, probe temperature is between-40 ℃ to 120 ℃, this structure-reinforced test jack can avoid producing because of temperature variation the problem of distortion, make in the contraposition of chip to be measured and test jack, keep the excellent electrical property contact, improve the fiduciary level of test result.
The above is preferred embodiment of the present invention only, is not in order to limit interest field of the present invention.Simultaneously above description should be understood and be implemented for the special personage who knows the present technique field, so other does not break away from the equivalence of being finished under the disclosed spirit and change or modification, all should be included in the claim.
Claims (10)
1. structure-reinforced test jack, the housing, a lid and a plurality of first lock-in component that comprise a plurality of test probes, a flat, this housing has first and second, this second face is offered a depressed part and is installed with wherein for this lid, described a plurality of first lock-in component is that this housing and this lid are connected to each other locking, it is characterized in that:
This structure-reinforced test jack further comprises at least one first reinforcement members, at least one second reinforcement members and a plurality of second lock-in component, and wherein the young's modulus of this first reinforcement members and second reinforcement members is higher than the young's modulus of this housing;
First face of this housing is concaved with at least one first accommodation space, and this first accommodation space is in order to being provided with this first reinforcement members, and makes this first reinforcement members not protrude from first of this housing;
Be formed with at least one second accommodation space between this housing and this lid, this second accommodation space is in order to being provided with this second reinforcement members, and makes this second reinforcement members corresponding to this first reinforcement members;
These a plurality of second lock-in components penetrate this first reinforcement members, this housing and this second reinforcement members, this housing firmly is held between this first reinforcement members and this second reinforcement members, and interosculates; And
Each test probe penetrates this housing and this lid simultaneously, and the one end is in order to contact semiconductor device, and the other end is formed in order to contact a circuit board.
2. according to the described structure-reinforced test jack of claim 1, it is characterized in that this second accommodation space is arranged with in the one side of this lid in the face of this housing.
3. according to the described structure-reinforced test jack of claim 1, it is characterized in that the quantity of this first accommodation space and this second accommodation space is 2 and be horizontal arrangement.
4. according to the described structure-reinforced test jack of claim 3, it is characterized in that, described a plurality of first accommodation space is the setting of symmetry shape with respect to first face of this housing, described a plurality of second accommodation space is the setting of symmetry shape with respect to this lid, and described a plurality of first accommodation spaces and described a plurality of second accommodation space are arranged at the periphery of described a plurality of test probes.
5. according to the described structure-reinforced test jack of claim 1, it is characterized in that this first reinforcement members and this second reinforcement members are metal, and this first reinforcement members is all identical with material, configuration and the size of this second reinforcement members.
6. according to the described structure-reinforced test jack of claim 1, it is characterized in that this housing and this lid are ambroin.
7. according to the described structure-reinforced test jack of claim 1, it is characterized in that, each second lock-in component is a bolt, this first reinforcement members is provided with screw, this second reinforcement members and this housing are equipped with through hole, and each bolt passes this second reinforcement members and this housing and locks in this first reinforcement members.
8. according to the described structure-reinforced test jack of claim 1, it is characterized in that, first of this housing with this periphery of second, cave in respectively forming this first accommodation space and this second accommodation space, with ccontaining this first reinforcement members and this second reinforcement members respectively.
9. according to the described structure-reinforced test jack of claim 1, it is characterized in that, first of this housing with second, cave in respectively to form this first accommodation space and this second accommodation space, and have I font or groined type or and the geometric configuration of combination, with ccontaining this first reinforcement members and this second reinforcement members respectively.
10. probe, include the structure-reinforced test jack that a circuit board is formed and is locked in this circuit board composition central part, this structure-reinforced test jack comprises housing, a lid and a plurality of first lock-in component of a plurality of test probes, a flat, this housing has first and second, this second face is offered a depressed part and is installed with wherein for this lid, described a plurality of first lock-in component is connected to each other locking with this housing and this lid, it is characterized in that:
This structure-reinforced test jack further comprises at least one first reinforcement members, at least one second reinforcement members and a plurality of second lock-in component, and wherein the young's modulus of this first reinforcement members and second reinforcement members is higher than the young's modulus of this housing;
First face of this housing is concaved with at least one first accommodation space, and this first accommodation space is in order to being provided with this first reinforcement members, and makes this first reinforcement members not protrude from first of this housing;
Be formed with at least one second accommodation space between this housing and this lid, this second accommodation space is in order to being provided with this second reinforcement members, and makes this second reinforcement members corresponding to this first reinforcement members;
These a plurality of second lock-in components penetrate this first reinforcement members, this housing and this second reinforcement members, this housing firmly is held between this first reinforcement members and this second reinforcement members, and interosculates; And
Each test probe penetrates this housing and this lid simultaneously, and the one end is in order to contact semiconductor device, and the other end is formed in order to contact this circuit board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200910222020 CN102062793B (en) | 2009-11-13 | 2009-11-13 | Probe card and structurally strengthened test socket therein |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200910222020 CN102062793B (en) | 2009-11-13 | 2009-11-13 | Probe card and structurally strengthened test socket therein |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102062793A true CN102062793A (en) | 2011-05-18 |
| CN102062793B CN102062793B (en) | 2013-04-17 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200910222020 Active CN102062793B (en) | 2009-11-13 | 2009-11-13 | Probe card and structurally strengthened test socket therein |
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|---|---|
| CN (1) | CN102062793B (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200415355A (en) * | 2003-02-07 | 2004-08-16 | Leadtek Research Inc | Test socket and its combined test member |
| US20060186905A1 (en) * | 2005-02-22 | 2006-08-24 | Fujitsu Limited | Contactor for electronic parts and a contact method |
| CN1922495A (en) * | 2004-04-27 | 2007-02-28 | 日本麦可罗尼克斯股份有限公司 | Electric connector |
| CN101334425A (en) * | 2007-06-29 | 2008-12-31 | 京元电子股份有限公司 | Integrated circuit element test jack, socket substrate and test machine platform and method of manufacture |
-
2009
- 2009-11-13 CN CN 200910222020 patent/CN102062793B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200415355A (en) * | 2003-02-07 | 2004-08-16 | Leadtek Research Inc | Test socket and its combined test member |
| CN1922495A (en) * | 2004-04-27 | 2007-02-28 | 日本麦可罗尼克斯股份有限公司 | Electric connector |
| US20060186905A1 (en) * | 2005-02-22 | 2006-08-24 | Fujitsu Limited | Contactor for electronic parts and a contact method |
| CN101334425A (en) * | 2007-06-29 | 2008-12-31 | 京元电子股份有限公司 | Integrated circuit element test jack, socket substrate and test machine platform and method of manufacture |
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| Publication number | Publication date |
|---|---|
| CN102062793B (en) | 2013-04-17 |
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