CN102005149A - Light intensity test method of photovoltaic panel - Google Patents
Light intensity test method of photovoltaic panel Download PDFInfo
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- CN102005149A CN102005149A CN2010105292506A CN201010529250A CN102005149A CN 102005149 A CN102005149 A CN 102005149A CN 2010105292506 A CN2010105292506 A CN 2010105292506A CN 201010529250 A CN201010529250 A CN 201010529250A CN 102005149 A CN102005149 A CN 102005149A
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Abstract
The invention relates to teaching test equipment, in particular to a light intensity test method of a photovoltaic panel, which is characterized in that: a test stand consisting of an upper bracket, a lower bracket and a supporting rod is comprised; the upper bracket is provided with an LED (Light Emitting Diode) light source which provides a light source to the photovoltaic panel; and a cavity of the lower bracket is internally provided with the photovoltaic panel; the LED light source and the photovoltaic panel are opened relatively so that the LED light source provides the light source to the photovoltaic panel; the photovoltaic panel is arranged in the cavity of the lower bracket to control the intensity change of the LED light source through a control circuit and detect the photocurrent output of the photovoltaic panel; and the temperature, the light intensity of the LED light source and the photocurrent output are displayed through a display. The light intensity test method of the photovoltaic panel is suitable for the teaching of photoelectron major and common physical tests, and ensures that the students are convenient to learn about the solar power generation principle and the factors influencing the power generation efficiency so as to provide power generation efficiency.
Description
Technical field
The present invention relates to a kind of teaching experimental equipment, particularly a kind of photovoltaic panel light intensity experimental technique is applicable to photoelectron specialty, Lab of General Physics.
Background technology
In the solar electrical energy generation, temperature is too high influential to solar components, and output power can be reduced, and when 25 spent, solar components was an optimum working temperature, can normally use below 45 degree.Solar components generally is suitable for and can spends to 80 degree-40, and output power has negative temperature coefficient, and the chances are 0.5%/C that is to say that at 25 degree are assemblies of 100W, has had only the output of 90W in the time of 45 degree.Therefore in the existing solar electrical energy generation, the time solar components more than 80% is to be in extremely low or high temperature, has influenced the generating efficiency of sun power greatly.
And in existing education experiment, the experimental facilities that relates to the solar electrical energy generation specialty seldom, relating to the experimental facilities that influences solar energy generating efficiency does not have especially.
Summary of the invention
Order of the present invention provides a kind of a kind of photovoltaic panel light intensity experimental technique that is applicable to photoelectron specialty, Lab of General Physics teaching, so that allow the convenient understanding of student solar electrical energy generation principle, influences the factor of generating efficiency, and the method for generating efficiency is provided.
The object of the present invention is achieved like this, and a kind of photovoltaic panel light intensity experimental technique is characterized in that: it comprises that upper bracket, lower carriage and pole constitute experiment table, and upper bracket has led light source, and led light source provides the light source of photovoltaic panel, in the cavity of lower carriage photovoltaic panel is arranged; Split between led light source and the photovoltaic panel, provide light source to photovoltaic panel; Photovoltaic panel by the Strength Changes of control circuit control led light source, detects the photocurrent output of photovoltaic panel in the cavity of lower carriage, the light intensity of temperature and led light source, photocurrent output show by display.
Described control circuit comprises that the single-chip microcomputer of a band A/D input end connects display, voltage source, interface and temperature sensor simultaneously, the photovoltaic panel output current by sample resistance R1 be electrically connected, the size of the voltage of sample resistance R1 can provide the photovoltaic magnitude of current, and sample resistance R1 directly is connected electrically in a 3A/D end of single-chip microcomputer; Led light source can be that two one group of LED are connected in series and constitute one group, forms many group led array; Between led array and ground, be connected sample resistance R2,, the electric current of led light source measured by the 2A/D end that sample resistance R2 directly is connected electrically in single-chip microcomputer; Every group of LED separates by a switch and ground, by the disconnection of selector switch, forms the LED group pattern work of varying number; Determine size of current or light intensity magnitude by sample resistance R2; Temperature sensor detects its temperature by a sample resistance R3 equally, and temperature sensor can be used AD590.
Described single-chip microcomputer is electrically connected with computing machine by interface.
Advantage of the present invention is: because experiment table has the LED lighting mechanism, thermoregulation mechanism and photovoltaic panel, the LED lighting mechanism provides the light source of photovoltaic panel, light intensity by control LED lighting mechanism changes, make photovoltaic panel produce different electric current output, by the control thermoregulation mechanism, make photovoltaic panel be in different state of temperatures, the electric current output that photovoltaic panel produces and the light intensity of LED lighting mechanism change, environment temperature is presented on the display of pole, equally, light intensity variation under the situation of different temperatures under the electric current output of photovoltaic panel generation and the constant current state, temperature is presented on the display of pole.Help the photronic photovoltaic of the convenient understanding of student ground characteristic like this, temperature characterisitic allows the convenient understanding of student to the preliminary factor of understanding and influencing generating efficiency of solar electrical energy generation.
Description of drawings
The present invention will be further described below in conjunction with the embodiment accompanying drawing:
Fig. 1 is an embodiment of the invention structural representation;
Fig. 2 is an embodiment of the invention circuit theory diagrams;
Fig. 3 provides photovoltaic panel temperature control synoptic diagram.
Among the figure, 1, upper bracket; 2, led light source; 3, ventilation bidirectional electromagnetic valve; 4, bleeder vent; 5, lower carriage; 6, temperature sensor; 7, cavity; 8, semiconductor cooler; 9, cold house; 10, hot cell; 11, display; 12, latch mechanism; 13, removable demonstration frame; 14, pole; 15, photovoltaic panel; 16, single-chip microcomputer; 17, voltage source; 18, interface; 19, computing machine; 20, LED group.
Embodiment
As shown in Figure 1, a kind of photovoltaic panel light intensity experimental technique is characterized in that: it comprises that upper bracket 1, lower carriage 5 and pole 14 constitute experiment table, and upper bracket 1 has led light source 2, and led light source 2 provides the light source of photovoltaic panel 15, in the cavity 7 of lower carriage 5 photovoltaic panel 15 is arranged; Split between led light source 2 and the photovoltaic panel 15, provide light source to photovoltaic panel 15; Photovoltaic panel 15 has temperature sensor 6 in the cavity 7 in the cavity 7 of lower carriage 5; Cavity 7 temperature can be regulated by attemperating unit, and display 11 can during rotation, be beaten in latch mechanism 12 around pole 14 turned positions, rotate back locking latch mechanism 12.
As shown in Figure 3, in cavity 7 one sides a semiconductor cooler 8 is arranged, semiconductor cooler 8 forms cold junction and hot junction, cold junction and hot junction are in cold house 9 and hot cell 10, cold house 9 and hot cell 10 communicate with cavity 7 by ventilation bidirectional electromagnetic valve 3, there are bleeder vent 4 and exterior in cavity 7 lower ends, and the temperature by cavity 7 can be regulated in control ventilation bidirectional electromagnetic valve 3 position of the switch makes the temperature that photovoltaic panel 15 is operated in needs experiment.The light intensity of temperature and led light source 2 shows by display 11.Display 11 and control circuit can be fixed on the removable demonstration frame 13 of pole 14.Observe temperature and parameter is set by removable demonstration frame 13.
Fig. 2 provides the control circuit schematic diagram of Fig. 1, control circuit comprises that the single-chip microcomputer 16 of a band A/D input end connects display 11, voltage source 17, interface 18 and temperature sensor 6 simultaneously, photovoltaic panel 15 output current ends by sample resistance R1 be electrically connected, 3A/D that sample resistance R1 directly is connected electrically in single-chip microcomputer 16 holds; Led light source 2 is that one group of a LED or two LED are connected in series for one group and constitute one group, forms many group led array; Be connected sample resistance R2 between led array and ground, sample resistance R2 voltage output end directly is connected electrically in a 2A/D end of single-chip microcomputer 16, and the electric current of led light source 2 is measured; Every group of LED separates by a switch and ground, by the disconnection of selector switch, forms the LED group pattern work of varying number; Determine size of current or light intensity magnitude by sample resistance R2; Temperature sensor 6 is same by a sample resistance 3 its temperature of detection, and temperature sensor 6 can be used AD590.Single-chip microcomputer 16 is electrically connected with computing machine by interface 18.By regulating the light intensity variation that light source intensity switch or regulator potentiometer change LED, the changing value of number of switches or potentiometer, light intensity value are presented at display and are stored in the memory, display can be used for the observation experiment data, and the data that are stored in memory can be read by computing machine 19 by interface 18 circuit to be handled.
Also can be designed to the experimental technique of temperature separately for the present invention, save light source and change control the opto-electronic conversion influence.Its structure is with identical as Fig. 1.And in Fig. 2 be equally: the single-chip microcomputer 16 of a band A/D input end connects display 11, voltage source 17, interface 18 and temperature sensor 6 simultaneously, photovoltaic panel 15 output currents by sample resistance R1 be electrically connected, the size of the voltage of sample resistance R1 can provide the photovoltaic magnitude of current, and sample resistance R1 directly is connected electrically in a 3A/D end of single-chip microcomputer 16.Led light source 2 can be the former or many groups of a constant pressure source control led array of constant current.Because the voltage constant of voltage source 17, during each LED group 20 work, electric current is identical.Temperature sensor 6 detects its temperature by a sample resistance R3 equally, and temperature sensor 6 can be used AD590.Single-chip microcomputer 16 is electrically connected with computing machine by interface 18.By regulating the light intensity variation that light source intensity switch or regulator potentiometer change LED, the changing value of number of switches or potentiometer, light intensity value are presented at display and are stored in the memory, display can be used for the observation experiment data, and the data that are stored in memory can be read by computing machine 19 by interface 18 circuit to be handled.
Also can be designed to a kind of photovoltaic panel light intensity experimental technique separately for the present invention, save the part of Fig. 3 among Fig. 1.Its circuit diagram is identical with Fig. 2 part of embodiment 1.
Claims (3)
1. photovoltaic panel light intensity experimental technique, it is characterized in that: it comprises that upper bracket (1), lower carriage (5) and pole (14) constitute experiment table, upper bracket (1) has led light source (2), led light source (2) provides the light source of photovoltaic panel (15), in the cavity (7) of lower carriage (5) photovoltaic panel (15) is arranged; Split between led light source (2) and the photovoltaic panel (15), provide light source to photovoltaic panel (15); Photovoltaic panel (15) is in the cavity (7) of lower carriage (5), Strength Changes by control circuit control led light source (2), detect the photocurrent output of photovoltaic panel (15), the light intensity of temperature and led light source (2), photocurrent output show by display (11).
2. a kind of photovoltaic panel light intensity experimental technique according to claim 1, it is characterized in that: described control circuit comprises that the single-chip microcomputer (16) of a band A/D input end connects display (11), voltage source (17), interface (18) and temperature sensor (6) simultaneously, photovoltaic panel (15) output current end by sample resistance R1 be electrically connected, 3A/D that sample resistance R1 directly is connected electrically in single-chip microcomputer (16) holds; Led light source (2) is that one group of a LED or two LED are connected in series for one group and constitute one group, forms many group led array; Be connected sample resistance R2 between led array and ground, sample resistance R2 voltage output end directly is connected electrically in a 2A/D end of single-chip microcomputer (16), and the electric current of led light source (2) is measured; Every group of LED separates by a switch and ground, by the disconnection of selector switch, forms the LED group pattern work of varying number; Determine size of current or light intensity magnitude by sample resistance R2; Temperature sensor (6) detects its temperature by a sample resistance R3 equally, the available AD590 of temperature sensor (6).
3. a kind of temperature according to claim 2 is characterized in that the experimental technique of opto-electronic conversion influence: described single-chip microcomputer (16) is electrically connected with computing machine by interface (18).
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| Application Number | Priority Date | Filing Date | Title |
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| CN2010105292506A CN102005149A (en) | 2010-11-03 | 2010-11-03 | Light intensity test method of photovoltaic panel |
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| CN2010105292506A CN102005149A (en) | 2010-11-03 | 2010-11-03 | Light intensity test method of photovoltaic panel |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102122174A (en) * | 2011-04-11 | 2011-07-13 | 南京康尼科技实业有限公司 | Light source simulation tracking device |
| CN105609026A (en) * | 2016-01-07 | 2016-05-25 | 京东方科技集团股份有限公司 | Performance detection apparatus and method for panel drive circuit |
| CN106571776A (en) * | 2015-10-13 | 2017-04-19 | 财团法人工业技术研究院 | Measuring device for solar cell characteristics and measuring method using same |
-
2010
- 2010-11-03 CN CN2010105292506A patent/CN102005149A/en active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102122174A (en) * | 2011-04-11 | 2011-07-13 | 南京康尼科技实业有限公司 | Light source simulation tracking device |
| CN106571776A (en) * | 2015-10-13 | 2017-04-19 | 财团法人工业技术研究院 | Measuring device for solar cell characteristics and measuring method using same |
| CN106571776B (en) * | 2015-10-13 | 2018-12-28 | 财团法人工业技术研究院 | Measuring device for solar cell characteristics and measuring method using same |
| CN105609026A (en) * | 2016-01-07 | 2016-05-25 | 京东方科技集团股份有限公司 | Performance detection apparatus and method for panel drive circuit |
| WO2017118066A1 (en) * | 2016-01-07 | 2017-07-13 | 京东方科技集团股份有限公司 | Performance detection apparatus and method for panel drive circuit |
| CN105609026B (en) * | 2016-01-07 | 2018-12-14 | 京东方科技集团股份有限公司 | A kind of device for detecting performance and method of panel drive circuit |
| US10235915B2 (en) | 2016-01-07 | 2019-03-19 | Boe Technology Group Co., Ltd. | Device and method for detecting performance of panel driving circuit |
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Application publication date: 20110406 |