CN101958092A - Test conversion module and display screen test method - Google Patents
Test conversion module and display screen test method Download PDFInfo
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- CN101958092A CN101958092A CN2009101601033A CN200910160103A CN101958092A CN 101958092 A CN101958092 A CN 101958092A CN 2009101601033 A CN2009101601033 A CN 2009101601033A CN 200910160103 A CN200910160103 A CN 200910160103A CN 101958092 A CN101958092 A CN 101958092A
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Abstract
The invention relates to a test conversion module and a display screen test method. The test conversion module comprises a program-controlled switching circuit, a chip driving circuit, a driving chip and a short-circuited bar test circuit, wherein the program-controlled switching circuit inputs a simulation signal and a level signal; the chip driving circuit is electrically connected with the program-controlled switching circuit and inputs a low-pressure differential signal; the driving chip is electrically connected with the program-controlled switching circuit and the chip driving circuit and outputs a full test signal; the short-circuited bar test circuit is electrically connected with the program-controlled switching circuit, inputs the simulation signal and outputs a short-circuited bar test signal, and the signal output by the program-controlled switching circuit controls the output of the driving chip and the short-circuited bar test circuit. According to the invention, a short-circuited bar test mode and a full test mode can be switched to ensure that various tests aiming to a display screen are integrated into the same tester so as to improve the efficiency and save the cost.
Description
Technical field
The present invention is about a kind of test conversion module and display screen method of testing, particularly relevant for a kind of test conversion module of changeable testing mode and use the display screen method of testing of this test conversion module.
Background technology
Panel display apparatus is at present in widespread use and the various electronic product.With the liquid crystal indicator is example, in the manufacture process of liquid crystal panel, need carry out multiple test, as liquid crystal cells test (celltesting), driving circuit test, burn-in test, functional test etc., various test links all will be used corresponding tester table.
At present, the output parameter of tester table fixedly installs, and adjusting parameter needs hardware modification or burning test procedure, very trouble again.And also (ComputerIntegrated Manufacturing, CIM) system's line do not make information such as test pattern and position coordinates directly to upload or to download from the CIM system to tester table with computer integrated manufacturing system.In addition, the test board that some test link (as the liquid crystal cells test) is used only is suitable for short-circuiting bar (shorting bar) test, at different model product needed burning formula again, and can not use same set of tester table with the test of liquid crystal module section, these have more increased the complexity and the testing cost of test job.
Summary of the invention
At above-mentioned technical matters, test conversion module provided by the invention comprises program control commutation circuit, chip drive circuit, chip for driving and short-circuiting bar test circuit.Program control commutation circuit input simulating signal and level signal.Chip drive circuit electrically connects this program control commutation circuit, and the input Low Voltage Differential Signal.Chip for driving electrically connects this program control commutation circuit and this chip drive circuit, and exports full test signal.The short-circuiting bar test circuit electrically connects this program control commutation circuit, imports this simulating signal, and output short-circuit bar test signal.Wherein, the output signal of this program control commutation circuit is controlled the output of this chip for driving and this short-circuiting bar test circuit.
According to test conversion module of the present invention, chip for driving is for covering brilliant film.
According to test conversion module of the present invention, this short-circuiting bar test signal comprises odd gates signal, even number signal, common electric voltage signal and rgb signal.
According to test conversion module of the present invention, also comprise power supply unit, provide each circuit required power supply.
Display screen method of testing provided by the invention comprises following steps.Display screen integration testing machine is provided, and this test machine comprises above-mentioned test conversion module, and by this test conversion module, this test machine can switch between short-circuiting bar test pattern and full test pattern.Carry out liquid crystal cells first test, this test machine switches to this short-circuiting bar test pattern.Carry out liquid crystal cells second test, this test machine switches to this full test pattern.
According to display screen method of testing of the present invention, when test machine switched to the short-circuiting bar test pattern, the test conversion module was exported monochromatic pattern.Further, this monochrome pattern comprises red, green, blue, black and white pattern.
According to display screen method of testing of the present invention, when test machine switched to full test pattern, the test conversion module was exported panchromatic pattern.
According to display screen method of testing of the present invention, also comprise network and be connected in data bank, test required program or pattern are uploaded or downloaded to test machine.Further, this test machine also comprises parameter setting interface, sets required program of this test or pattern by this parameter setting interface editor.
By the present invention, short-circuiting bar test and full test pattern can switch, so the multiple test of display screen can be integrated same test machine of use.The network connectivity function makes things convenient for material upload and download, and output parameter can be set from edlin, has increased defective and has blocked the inspection success ratio.
Description of drawings
Fig. 1 is the synoptic diagram of the test conversion module of one embodiment of the invention;
Fig. 2 is the principle schematic of display screen method of testing of the present invention;
Fig. 3 is the process flow diagram of the display screen method of testing of one embodiment of the invention.
Embodiment
For making purpose of the present invention, structure, feature and function thereof there are further understanding, cooperate embodiment to be described in detail as follows now.
See also Fig. 1, Fig. 1 is the synoptic diagram of the test conversion module 1 of one embodiment of the invention.Test conversion module 1 comprises program control commutation circuit 11, chip drive circuit 12, chip for driving 13 and short-circuiting bar test circuit 14.Program control commutation circuit 11 input simulating signal AS and level signal TTL.Chip drive circuit 12 electrically connects program control commutation circuit 11, and input Low Voltage Differential Signal LVDS.Chip for driving 13 electrically connects program control commutation circuit 11 and chip drive circuit 12, and exports full test signal FC.Short-circuiting bar test circuit 14 electrically connects program control commutation circuit 11, input simulating signal AS, and output short-circuit bar test signal SB.Wherein, the output signal controlling and driving chip 13 of program control commutation circuit 11 and the output of short-circuiting bar test circuit 14.
In one embodiment, chip for driving 13 for cover brilliant film (chip on film, COF).Short-circuiting bar test signal SB comprises odd gates signal GO, even number signal GE, common electric voltage signal Vcom and rgb signal.In actual applications, test conversion module 1 also comprises power supply unit 15, provides each circuit required power supply.
See also Fig. 2 and Fig. 3, Fig. 2 is the principle schematic of display screen method of testing of the present invention, and Fig. 3 is the process flow diagram of the display screen method of testing of one embodiment of the invention.Display screen method of testing provided by the invention comprises following steps.S31, display screen integration testing machine 2 is provided, this test machine 2 comprises above-mentioned test conversion module 1, by this test conversion module 1, this test machine 2 can switch between the first pattern M1 and the second pattern M2, this first pattern M1 is short-circuiting bar test (shorting bar) pattern, and this second pattern M2 is full test (full contact) pattern.S33 carries out liquid crystal cells (cell) first test, and this test machine 2 switches to this short-circuiting bar test pattern.S35 carries out liquid crystal cells (cell) second test, and this test machine 2 switches to this full test pattern.
In one embodiment, when test machine 2 switched to the short-circuiting bar test pattern, the test conversion module was exported monochromatic pattern.Further, this monochrome pattern comprises red (R), green (G), blue (B), black (black) and white (white) Color Pattern (pattern).When test machine 2 switched to full test pattern, the test conversion module was exported panchromatic pattern (full pattern).
In actual applications, also comprise network and be connected in data bank 3, test required program or pattern are uploaded or downloaded to test machine 2.Further, this test machine 2 also comprises parameter setting interface 21, and 21 editors set this test required program or pattern by this parameter setting interface.
By the present invention, short-circuiting bar test and full test pattern can switch, so the multiple test of display screen can be integrated same test machine of use.The network connectivity function makes things convenient for material upload and download, and output parameter can be set from edlin, has increased defective and has blocked the inspection success ratio.
The present invention is described by above-mentioned related embodiment, yet the foregoing description is only for implementing example of the present invention.Must be pointed out that the embodiment that has disclosed does not limit the scope of the invention.On the contrary, change of being done and retouching without departing from the spirit and scope of the present invention all belongs to scope of patent protection of the present invention.
Claims (10)
1. test conversion module is characterized in that comprising:
Program control commutation circuit, input simulating signal and level signal;
Chip drive circuit electrically connects this program control commutation circuit, and the input Low Voltage Differential Signal;
Chip for driving electrically connects this program control commutation circuit and this chip drive circuit, and exports full test signal;
The short-circuiting bar test circuit electrically connects this program control commutation circuit, imports this simulating signal, and output short-circuit bar test signal;
Wherein, the output signal of this program control commutation circuit is controlled the output of this chip for driving and this short-circuiting bar test circuit.
2. test conversion module as claimed in claim 1 is characterized in that: this chip for driving is for covering brilliant film.
3. test conversion module as claimed in claim 1 is characterized in that: this short-circuiting bar test signal comprises odd gates signal, even number signal, common electric voltage signal and rgb signal.
4. test conversion module as claimed in claim 1 is characterized in that also comprising: power supply unit provides each circuit required power supply.
5. display screen method of testing is characterized in that comprising:
Display screen integration testing machine is provided, and this test machine comprises as each described test conversion module among the claim 1-4, and by this test conversion module, this test machine can switch between short-circuiting bar test pattern and full test pattern;
Carry out liquid crystal cells first test, this test machine switches to this short-circuiting bar test pattern;
Carry out liquid crystal cells second test, this test machine switches to this full test pattern.
6. display screen method of testing as claimed in claim 5 is characterized in that: when this test machine switched to this short-circuiting bar test pattern, this test conversion module was exported monochromatic pattern.
7. display screen method of testing as claimed in claim 6 is characterized in that: this monochrome pattern comprises red, green, blue, black or white pattern.
8. display screen method of testing as claimed in claim 5 is characterized in that: when this test machine switched to this full test pattern, this test conversion module was exported panchromatic pattern.
9. display screen method of testing as claimed in claim 5, it is characterized in that also comprising: network is connected in data bank, and test required program or pattern are uploaded or downloaded to this test machine.
10. display screen method of testing as claimed in claim 9 is characterized in that: this test machine also comprises parameter setting interface, sets required program of this test or pattern by this parameter setting interface editor.
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| Application Number | Priority Date | Filing Date | Title |
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| CN2009101601033A CN101958092A (en) | 2009-07-17 | 2009-07-17 | Test conversion module and display screen test method |
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| CN2009101601033A CN101958092A (en) | 2009-07-17 | 2009-07-17 | Test conversion module and display screen test method |
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| CN101958092A true CN101958092A (en) | 2011-01-26 |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102509532A (en) * | 2011-09-20 | 2012-06-20 | 友达光电股份有限公司 | Detection circuit, driving chip, display module and detection method of transmission interface |
| CN102646382A (en) * | 2012-04-27 | 2012-08-22 | 深圳市华星光电技术有限公司 | Method and device for detecting anomaly of liquid crystal display module differential signal receiving terminal |
| CN104034995A (en) * | 2014-05-15 | 2014-09-10 | 武汉精测电子技术股份有限公司 | LVDS signal open-circuit and short-circuit detection device and open-circuit and short-circuit detection method |
| CN104181373A (en) * | 2014-07-23 | 2014-12-03 | 武汉精测电子技术股份有限公司 | ShortingBar voltage output automation acquisition method and device of OLED |
| US8907695B2 (en) | 2012-04-27 | 2014-12-09 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Detecting method and detecting device of abnormality of differential signal receiving terminal of liquid crystal displaying module |
| CN108039140A (en) * | 2017-11-21 | 2018-05-15 | 友达光电股份有限公司 | Display panel test system and display panel test method |
-
2009
- 2009-07-17 CN CN2009101601033A patent/CN101958092A/en active Pending
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102509532A (en) * | 2011-09-20 | 2012-06-20 | 友达光电股份有限公司 | Detection circuit, driving chip, display module and detection method of transmission interface |
| CN102509532B (en) * | 2011-09-20 | 2014-04-16 | 友达光电股份有限公司 | Detection circuit, driving chip, display module and detection method of transmission interface |
| CN102646382A (en) * | 2012-04-27 | 2012-08-22 | 深圳市华星光电技术有限公司 | Method and device for detecting anomaly of liquid crystal display module differential signal receiving terminal |
| WO2013159421A1 (en) * | 2012-04-27 | 2013-10-31 | 深圳市华星光电技术有限公司 | Method and device for detecting anomaly in differential signal receiving terminal of liquid crystal display module |
| US8907695B2 (en) | 2012-04-27 | 2014-12-09 | Shenzhen China Star Optoelectronics Technology Co., Ltd. | Detecting method and detecting device of abnormality of differential signal receiving terminal of liquid crystal displaying module |
| CN104034995A (en) * | 2014-05-15 | 2014-09-10 | 武汉精测电子技术股份有限公司 | LVDS signal open-circuit and short-circuit detection device and open-circuit and short-circuit detection method |
| CN104034995B (en) * | 2014-05-15 | 2016-09-21 | 武汉精测电子技术股份有限公司 | LVDS signal is opened short-circuit detecting device and opens method for detecting short circuit |
| CN104181373A (en) * | 2014-07-23 | 2014-12-03 | 武汉精测电子技术股份有限公司 | ShortingBar voltage output automation acquisition method and device of OLED |
| CN108039140A (en) * | 2017-11-21 | 2018-05-15 | 友达光电股份有限公司 | Display panel test system and display panel test method |
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Application publication date: 20110126 |