The IC test card and the using method thereof that are used for prepayment meter
Technical field:
The present invention relates to the electric energy meter technical field, specifically is a kind of IC test card and using method thereof that is used for prepayment meter.
Background technology:
Prepayment meter is called quantitative electric energy meter, IC-card electric energy meter again, and the user buys electricity earlier, and buying behind the electricity could electricity consumption, does not continue to buy electricity if use up electricity back user, then cuts off the electricity supply automatically and stops power supply.Prepayment meter is generally write cassette, comprises power module, metering module, sampling module, data processing module, data memory module.Be about to purchase in advance the electric weight or the amount of money and write in the special electronic card (storer), the user holds electronics and snaps into the enterprising row communication of corresponding ammeter, and the forward purchasing value is sent in the ammeter automatically.Electronic cards or claim IC-card also claims to purchase the electricity card, all is that the IC chip by special use forms through after the special package, and the common electricity card of purchasing is divided into contact and contactless by communication modes.Before prepayment meter dispatches from the factory, often need to adopt the IC test card that it is tested, to guarantee the normal use of electric energy meter.The IC test card of prior art generally only has a SIM card, the IC test card is inserted in the slot of prepayment meter, and SIM card directly contacts with electric energy meter and carries out signal to be transmitted.Adopt above prior art, owing to need the different SIM card of test, so need ceaselessly extract test card, and replacing test card, IC test card after the replacing has new SIM card, the mode testing efficiency of replacing and plug IC test card is low repeatedly, and direct the contact with electric energy meter of SIM card tested easy damage SIM card.
Summary of the invention:
The technical problem to be solved in the present invention provides a kind of testing efficiency height, the non-damageable IC test card that is used for prepayment meter.
Technical solution of the present invention is, the IC test card that is used for prepayment meter of following structure is provided, it comprises the draw-in groove and the gauge tap of main panel, IC master card body, a plurality of SIM card that are used to peg graft, described IC master card body, draw-in groove all are fixed on the main panel, described a plurality of draw-in groove is electrically connected with IC master card body, and described gauge tap is electrically connected with IC master card body and draw-in groove.
As improvement, described gauge tap comprises touch-switch, and described touch-switch and draw-in groove number equate and be corresponding one by one.Like this, by when testing, Ce Shi SIM card is pressed corresponding gauge tap as required, realizes the switching between the different SIM card to be tested, controls convenient.
As improvement, described gauge tap also comprises self-lock switch and can realize the change-over switch that touch-switch and self-lock switch switch mutually that described self-lock switch and change-over switch are electrically connected with IC master card body and draw-in groove.In test, sometimes only need test the SIM card I, just can press change-over switch this moment, the IC test card just switches to self-lock switch control by gauge tap control, switch to gauge tap after, just giving tacit consent to IC master card body only has the signal transmission with the SIM card I, just can only test the SIM card I, after pressing self-lock switch, IC master card body only has the signal transmission with the SIM card II, that is to say and can only test the SIM card II this moment.Increase self-lock switch and change-over switch, tested aspect more.
Another technical matters that the present invention will solve provides a kind of testing efficiency height, the non-damageable using method that is used for the IC test card of prepayment meter.
Another kind of technical solution of the present invention is, a kind of using method that is used for the IC test card of prepayment meter is provided, and may further comprise the steps:
(1) many SIM card that have different information is inserted respectively in the corresponding draw-in groove;
(2) the IC test card is inserted in the slot of prepayment meter, IC master card body and electric energy meter carry out the signal transmission.
(3) SIM card of selecting needs to test by gauge tap;
(4) according to the selection of step (3), corresponding SIM card is tested.
As improvement, in the step (3), the selection mode of two kinds of SIM card is arranged:
A, the control of employing touch-switch:, press the gauge tap of this SIM card of control corresponding according to the SIM card that will test;
B, adopt self-lock switch control: acquiescence is selected the SIM card I, press self-lock switch after, switch to the SIM card II.
Realize the switching between controlling of touch-switch control and self-lock switch by change-over switch.So just can adopt corresponding switch to control, test convenient according to the needs of test.
Adopt after above structure and the method compared with prior art, the present invention has the following advantages: adopt the present invention, IC test card is integrated at least two SIM cards, when test, test SIM card by Switch Control, promptly the IC test card once inserts prepayment meter and just can test at least two SIM cards, the testing efficiency height, and SIM card carries out signal transmission by IC master card body and electric energy meter, directly do not contact with electric energy meter, prevented the situation of damage SIM card in test.
Description of drawings:
Fig. 1 is the structural representation that is used for the IC test card of prepayment meter of the present invention.
Fig. 2 is the FB(flow block) of the using method of the IC test card that is used for prepayment meter of the present invention.
Shown in the figure: 1, main panel, 2, IC master card body, 3, draw-in groove, 4, touch-switch, 5, self-lock switch, 6, change-over switch.
Embodiment:
The invention will be further described below in conjunction with the drawings and specific embodiments:
As shown in Figure 1, the IC test card that is used for prepayment meter of the present invention, it comprises the draw-in groove 3 and the gauge tap of main panel 1, IC master card body 2, a plurality of SIM card that are used to peg graft, described IC master card body 2, draw-in groove 3 all are fixed on the main panel 1, described a plurality of draw-in groove 3 is electrically connected with IC master card body 2, and described gauge tap is electrically connected with IC master card body 2 and draw-in groove 3; Describedly a plurality ofly be meant two or more.
Described gauge tap comprises touch-switch 4, and described touch-switch 4 and draw-in groove 3 numbers equate and be corresponding one by one.Each draw-in groove 3 corresponding touch-switchs 4 that is to say the SIM card of a correspondence of a touch-switch 4 controls, when test, Ce Shi SIM card as required, press corresponding touch-switch 4, realize the switching between the different SIM card to be tested, control convenient; Described pressing is convenience in order to describe, and according to the heterogeneity of switch, the mode of operation is just different, as rotating, pulling, extract or the like.
Described gauge tap also comprises self-lock switch 5 and can realize the change-over switch 6 that touch-switch 4 and self-lock switch 5 switch mutually that described self-lock switch 5 and change-over switch 6 are electrically connected with IC master card body 2 and draw-in groove 3; In test, sometimes only need test the SIM card I, just can press change-over switch 6 this moment, the IC test card just switches to self-lock switch control by touch-switch control, switch to self-lock switch after, just giving tacit consent to IC master card body only has the signal transmission with the SIM card I, just can only test the SIM card I, after pressing self-lock switch 5, IC master card body only has the signal transmission with the SIM card II, that is to say and can only test the SIM card II this moment; Described self-lock switch 5 is meant the test of acquiescence locking SIM card I, switches to the SIM card II after pressing; Described SIM card also can be more than 2.
As shown in Figure 2, the using method that is used for the IC test card of prepayment meter of the present invention may further comprise the steps:
(1) many SIM card that have different information is inserted respectively in the corresponding draw-in groove 3;
(2) the IC test card is inserted in the slot of prepayment meter, IC master card body 2 carries out the signal transmission with electric energy meter; Described slot is meant the groove that is used to insert IC-card on the electric energy meter.
(3) SIM card of selecting needs to test by gauge tap;
(4) according to the selection of step (3), corresponding SIM card is tested.
In the step (3), the selection mode of two kinds of SIM card is arranged:
A, 4 controls of employing touch-switch:, press the gauge tap of this SIM card of control corresponding according to the SIM card that will test;
B, adopt self-lock switch 5 controls: acquiescence is selected the SIM card I, press self-lock switch 5 after, switch to the SIM card II.
Realize the switching between controlling of touch-switch (4) control and self-lock switch (5) by change-over switch (6).
Below only just preferred embodiment of the present invention be described, but can not be interpreted as it is restriction to claim.The present invention not only is confined to above embodiment, and its concrete structure and method allow variation, and draw-in groove 3 as described can be for more than two, and according to the quantity of draw-in groove 3 corresponding touch-switch is set.In a word, all various variations of being done in the protection domain of independent claims of the present invention are all in protection scope of the present invention.