CN101931566A - Test device of server - Google Patents
Test device of server Download PDFInfo
- Publication number
- CN101931566A CN101931566A CN2009101484504A CN200910148450A CN101931566A CN 101931566 A CN101931566 A CN 101931566A CN 2009101484504 A CN2009101484504 A CN 2009101484504A CN 200910148450 A CN200910148450 A CN 200910148450A CN 101931566 A CN101931566 A CN 101931566A
- Authority
- CN
- China
- Prior art keywords
- test
- module
- measured
- testing
- server
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a test device of a server, which comprises an embedded system, a control module, a plurality of test execution modules, a plurality of output interface modules, a system power unit and a plurality of test power units. The embedded system can output a plurality of test instructions, and the control module can receive the test instructions. When a plurality of server machines to be tested are respectively connected with the test device through the output interface modules, the control module can control each test execution module to perform a test program corresponding to each server machine to be tested according to one of the test instructions. In addition, the system power unit is connected with a direct voltage to supply power required by the operation of the test device. The test power units are respectively connected with a plurality of second power sources so as to supply power for each server machine to be tested during testing.
Description
Technical field
The present invention relates to a kind of testing apparatus, and be particularly related to a kind of testing apparatus of server.
Background technology
The automatic on/off test of computer of server is server basic test when dispatching from the factory.In this test, comprise the last electrical testing that carries out server, the switching on and shutting down test event of cutting off the power supply test, reset test etc.
The test macro of existing server though can realize automation to server switching on and shutting down tests, still has some technology points wait breakthroughs.For example, the main frame volume of existing test macro is too huge, causes moving inconvenience, and has reduced the efficient of test.In addition, the power consumption of existing test macro is also very big.In general, the power consumption of existing test macro all surpasses 100W.
Summary of the invention
Therefore, the invention provides a kind of testing apparatus, it has smaller volume, and lower power consumption.
Testing apparatus provided by the present invention comprises that embedded system, control module, a plurality of testing execution module, a plurality of output interface module, system are with power subsystem and a plurality of test power subsystem.Embedded system can be exported a plurality of test instructions, and control module then can receive these test instructions.Therefore, when a plurality of server boards to be measured are connected to testing apparatus by output interface module respectively, control module can control each testing execution module according to these test instructions one of them, and respectively each server board to be measured is carried out corresponding test program.In addition, system connects a direct current voltage with power subsystem, with the required power supply of supply testing apparatus running.Relatively, test then connects a plurality of second voltage sources respectively with power subsystem, to supply each server board to be measured required power supply when testing.
Among the embodiment, testing apparatus of the present invention also comprises an embedded display screen, buffer and a plurality of feedback input interface unit therein.Embedded display screen connects embedded system, to show a system information.In addition, buffer then is connected to embedded system and control module by a plurality of system buss, sends control module to the test instruction that embedded system is exported.And embedded system also is connected to server board to be measured by the feedback input interface unit, surveys test data that server boards are exported to analyze when testing to receive these.
And in certain embodiments, embedded system can comprise central processing unit, application software module and system's memory module.Central processing unit can be exported above-mentioned test instruction.On the other hand, application software module then can be set a plurality of parameters in the test program that carries out in response to test instruction.In addition, system's memory module can one of them connects central processing unit by system bus, carries out test instruction is delivered to control module.
Application software module comprises that main control module, configuration module, test module, trigger module, power-on time estimate module, test execution control module and test data read module.Main control module can connect configuration module, test module, trigger module and power-on time and estimate module.Wherein, configuration module is the setting of being responsible for carrying out the parameters of test program, and sends the parameter that configures to test module.Therefore, test module can be according to the parameter that configures, and plans above-mentioned test program, and can write down the state of each server board to be measured when server is tested according to the test data that is read.The operation that trigger module then allows the user in manual mode each server board to be measured to be powered on or cuts off the power supply.And before carrying out above-mentioned test program, power-on time is estimated module and can be counted each server to be measured and start the required time fully.In addition, test module can be controlled the running of testing execution module, and the test data read module is then by system bus and feedback input interface unit read test data.
Because the present invention utilizes embedded system to come the carrying out of master control test program, therefore testing apparatus of the present invention has smaller volume.In addition, the present invention also can reduce the consumption of power.
For above-mentioned feature and advantage of the present invention can be become apparent, embodiment cited below particularly, and conjunction with figs. is described in detail below.
Description of drawings
Fig. 1 is system's block schematic diagram of testing apparatus of a kind of server of a preferred embodiment of the present invention.
Fig. 2 is system's block schematic diagram of a kind of embedded system of a preferred embodiment of the present invention.
Fig. 3 is system's block schematic diagram of a kind of application software module of a preferred embodiment of the present invention.
Fig. 4 is system's block schematic diagram of a kind of system memory module of a preferred embodiment of the present invention.
Fig. 5 is system's block schematic diagram of a kind of control module of a preferred embodiment of the present invention.
Fig. 6 is the testing execution module of a preferred embodiment of the present invention and system's block schematic diagram of output interface module.
The main element symbol description:
102: embedded system 104: control module
106[1:m], 106k: testing execution module 108[1:m], 108k: output interface module
110: buffer 112[1:m], 112k: feedback input interface unit
114: the power subsystem 118[1:n of system]: the test power subsystem
122: data/address bus 140[1:m], 140k: server board to be measured
202: central processing unit (CPU) 204 application software modules
206: video interface unit 208: USB (USB) interface unit
210,412,414: system bus 212: system's memory module
300: core layer 302: main control module
310: data analysis layer 312: configuration module
314: test module 316: trigger module
318: power-on time is estimated module 320: the hardware controls layer
322: test execution control module 324: the test data read module
402: random-access memory (ram) 404: flash memory
502: decoder 504: latch
506: current driver 602: exchange control unit
604: DC control unit 606: control unit resets
612: AC power interface unit 614: the DC power supply interface unit
616: reset test interface unit CODES: command code string
DATA: test data Id: drive current
PWR: working power end RST: reseting controling end
SWH: mains switch end TEST: test instruction
Vtest1: ac supply signal Vtest2: switch testing signal
Vtest3: reset test signal
Embodiment
Fig. 1 is system's block schematic diagram of testing apparatus of a kind of server of a preferred embodiment of the present invention.Please refer to Fig. 1, the testing apparatus 100 that present embodiment provided comprises embedded system 102, control module 104, a plurality of testing execution module 106[1:m at least] and a plurality of output interface module 108[1:m], wherein m is the positive integer greater than 1.In the present embodiment, testing apparatus 100 can pass through output interface module 108[1:m], be connected to a plurality of server board 140[1:m to be measured].
In certain embodiments, testing apparatus 100 also comprises buffer 110, a plurality of feedback input interface unit 112[1:m], system is with power subsystem 114, a plurality of test power subsystem 118[1:n].Wherein, embedded system 102 can connect buffer 110, and buffer 110 then can be connected to control module 104.
Please continue with reference to Fig. 1,104 of control modules can be connected to testing execution module 106[1:m], and each testing execution module 106[1:m] can be connected to corresponding output interface module 108[1:m].Therefore, as a plurality of server board 140[1:m to be measured] be connected to output interface module 108[1:m respectively] time, each testing execution module 106[1:m then] can be by corresponding output interface module electrically connect with corresponding server board to be measured.In addition, as a plurality of server board 140[1:m to be measured] be connected to output interface module 108[1:m] time, can also be connected to feedback input interface unit 112[1:m respectively], feedback input interface unit 112[1:m] then can be connected to buffer 110 by data/address bus 122.
In addition, the system among Fig. 1 can be connected to one first voltage source V DD with power subsystem 114, and it can be the mains supply of 220V.Therefore, system can supply testing apparatus 100 in required system power supply of when running with power subsystem 114.Similarly, power subsystem 118[1:n is used in each test] then can be connected to respectively a plurality of second voltage source V [1:n] one of them.And these second voltage source V [1:n] comprise mains supplies such as 110V, 220V....Test power subsystem 118[1:n] can also be connected to testing execution module 106[1:m], its function will have detailed narration in following each section.
In certain embodiments, testing apparatus 100 can also comprise an embedded display screen 120, and it can be connected to embedded system 102.Therefore, embedded system 102 can show that a system information is to the user by display screen 120.Embedded system 102 can also produce a plurality of test instruction TEST except can control display screen 120 display system information.Therefore, as a plurality of server 140[1:m to be measured] when being connected to testing apparatus 100, testing execution module 106[1:m] just can be according to these test instructions, respectively by output interface module 108[1:m] to each server 140[1:m to be measured] carry out corresponding test program.Detailed explanation will be narrated in following each section.
Fig. 2 is system's block schematic diagram of a kind of embedded system of a preferred embodiment of the present invention.Please refer to Fig. 2, embedded system 102 comprises central processing unit (CPU) 202, application software module 204 and system's memory module 212.In addition, in certain embodiments, embedded system 102 can also comprise video interface unit 206 and USB (USB) interface unit 208.Central processing unit 202 can be connected to application software module 204, and connects video interface unit 206, usb interface unit 208 and system's memory module 212 by system bus 210.Wherein, the embedded display screen 120 of video interface unit 206 in can connection layout 1, usb interface unit 208 then can connect some outside equipment, for example is slide-mouse or keyboard (not shown).
In the present embodiment, central processing unit 202 makes embedded system 102 produce test instruction TEST by carrying out application software module 204.Fig. 3 is system's block schematic diagram of a kind of application software module of a preferred embodiment of the present invention.Please refer to Fig. 3, application software module 204 has a core layer 300, a data analysis layer 310 and a hardware controls layer 320.Wherein, core layer 300 is connected to data analysis layer 310, and data analysis layer 310 then can be connected to hardware controls layer 320.
After configuration module 312 configures parameter, these parameters can be delivered to test module 314.Therefore, test module 314 can be planned each server board 140[1:m to be measured according to these parameters that configures] pairing test program, and write down each server board 140[1:m to be measured according to many test data DATA being read] state when testing.In the present embodiment, test data DATA is by each server board 140[1:m to be measured] data that when carrying out test program, produced.These test datas DATA can be oneself's start test patterns (POST Code).When testing apparatus 100 read these oneself's start test patterns, embedded system 102 can be used as system information with these oneself's start test patterns, knows and be shown to the user from display screen 120.
Please continue with reference to Fig. 3, trigger module 316 can allow the user to utilize manual mode, and to being connected the server board 140[1:m to be measured on the testing apparatus 100] operation that powers on or cut off the power supply.In addition, power-on time is estimated 318 of modules and can be counted these server 140[1:m to be measured before carrying out above-mentioned test program] start the required time fully.
In addition, in hardware controls layer 320, then comprise test execution control module 322 and test data read module 324.Wherein, test execution control module 322 can control chart 1 in testing execution module 106[1:m] running.In addition, 324 of test data read modules can be controlled testing apparatus 100, by feedback input interface unit 112[1:m] and data/address bus 122, read by server 140[1:m to be measured] the test data DATA that exported, and it is delivered to data analysis layer 310 handle and analyze.
Please refer to Fig. 2, as mentioned above, when central processing unit 202 when carrying out application software module 204, can make embedded system 102 produce test instruction TEST.This test instruction TEST can deliver to buffer 110 by system bus 210, and delivers to control module 104 by buffer 110.In the present embodiment, system bus 210 is advanced high-effect buses (AHB Bus).On the other hand, when some data, for example above-mentioned test data DATA need be sent to central processing unit 202 in the embedded system 102 when handling, and it is temporary to be sent to system's memory module 212 earlier.
Fig. 4 is system's block schematic diagram of a kind of system memory module of a preferred embodiment of the present invention.Please refer to Fig. 4, system's memory module 212 comprises random-access memory (ram) 402 and flash memory 404, and the two can be connected to central processing unit 202 and buffer 110 by system bus 210.On the other hand, buffer 110 can also be connected to feedback input interface unit 112[1:m by data/address bus 122 except being connected to the embedded system 102 by system bus 210], and be connected to control module 104 by system bus 412 and 414.In the present embodiment, system bus 412 and 414 can be respectively data/address bus and address bus.
When above-mentioned data need be temporarily stored in system's memory module 212, can be temporarily stored in earlier in the flash memory 404.For example, when test data DATA from server board 140[1:m to be measured] after the output, can be by feeding back input interface unit 112[1:m] and data/address bus 112 and system bus 210 deliver to flash memory 404.Then, the data that are temporarily stored in the flash memory 404 can be sent to random access memory 402.Therefore, central processing unit 202 just can be from the random access memory access data to analyze.
In addition, after central processing unit 202 was assigned test instruction TEST, it was temporary also can to deliver to system's memory module 212 by system bus 210.Then, by system's memory module 212 test instruction TEST is delivered to buffer 110 again.Therefore, buffer 110 just can pass through system bus 414 and 412, handles and test instruction TEST is delivered to control module 104.
Fig. 5 is system's block schematic diagram of a kind of control module of a preferred embodiment of the present invention.Please refer to Fig. 5, in the present embodiment, control module 104 comprises decoder 502, latch 504 and current driver 506.Decoder 502 and latch 504 can be connected to buffer 110 by system bus 412 and 414 respectively.In addition, decoder 502 also can connect latch 504, and is connected to corresponding feedback input interface unit 112[1:m].Latch 504 then can be connected to current driver 506.
After the buffer among Fig. 4 110 was delivered to control module 104 with test data, decoder 502 can be decoded test instruction TEST earlier, and produced a command code string CODES.It is temporary that this command code string CODES can send latch 504 to.On the other hand, decoder 502 also can be according to this command code string CODES, and Control and Feedback input interface unit 112[1:m] export each self-corresponding test data DATA in regular turn and give buffer 110.
After latch 504 receives command code string CODES from decoder 502, can the Control current driver 506 drive output one drive current Id and give corresponding testing execution module 106[1:m], to drive testing execution module 106[1:m] each server board 140[1:m to be measured in Fig. 1] carry out corresponding test program.
Fig. 6 is the control module of a preferred embodiment of the present invention and system's block schematic diagram of output interface module.Please refer to Fig. 6, the testing execution module 106k in the present embodiment can be testing execution module 106[1:m among Fig. 1] one of them.Relatively, output interface module 108k then can be output interface module 108[1:m] one of them, it can connect server board 140[1:m to be measured] in a 140k.
Testing execution module 106k comprises interchange control unit 602, the DC control unit 604 and the control unit 606 that resets.Wherein, exchange control unit 602 and can be connected to the working power end PWR on the server 140k to be measured corresponding to the AC power interface unit 612 among the output interface module 108k; 604 of DC control unit are connected to the mains switch end SWH of server 140k to be measured corresponding to the direct current power interface unit 614 among the output interface module 108k; The control unit 606 that resets then is corresponding to the reset test interface unit 616 among the output interface module 108k, and is connected to (Reset) control end RST that resets of server 140k to be measured.In the present embodiment, exchanging control unit 602, DC control unit 604 and the control unit 606 that resets can utilize relay to realize.
In Fig. 6, exchange control unit 602 except connecting AC power interface unit 612, also be connected to test power subsystem 118[1:n].Therefore, when control module 104 drives when exchanging 602 couples of server 140k to be measured of control units and carrying out on one electrical testing, the tester can be according to the specification of server 140k to be measured, selects test power subsystem 118[1:n] in the second corresponding voltage source of an output give interchange control unit 602.At this moment, exchange control unit 602 and can pass through AC power interface unit 612, and output AC power source signal Vtest1 is to the working power end PWR of server 140k to be measured.On the other hand, control module 104 also can drive the mains switch end SWH of 604 outputs, one switch testing signal Vtest2 in DC control unit to server 140k to be measured, and switch testing signal Vtest2 can be a pulse signal.At this moment, server 140k to be measured just can carry out the test program that powers on.
When testing apparatus 100 will carry out a reset test to server 140k to be measured, control module 104 continued to drive the working power end PWR of interchange control unit 602 output AC power source signal Vtest1 to server 140k to be measured.In addition, control module 104 can also drive the control unit 606 that resets by reset test interface unit 616, and export the reseting controling end RST of a reset test signal Vtest3 to server 140k to be measured, and this reset test signal Vtest3 also can be a pulse signal.Therefore, after server 140k to be measured receives reseting controling signal Vtest3, can carry out reset test operation.
On the other hand, when testing apparatus 100 will carry out an outage test to server 140k to be measured, then the control module 104 lasting interchange control unit 602 output AC power source signal Vtest1 that drive gave server 140k to be measured.And with like the test class that powers on, control module 104 also can drive DC control unit 604, and output switch testing signal Vtest2 is to the mains switch end SWH of server 140 to be measured.And in certain embodiments, in the time will cutting off the power supply test to server 140k to be measured, the work period of switch testing signal Vtest2 need arrive a Preset Time.Therefore, server 140k to be measured can carry out an outage test operation.
In sum, the present invention can utilize embedded system to control the program that whole testing device is tested a plurality of server boards to be measured.Therefore volume of the present invention is less, and power consumption is lower.On reality, power consumption of the present invention is approximately 15W.In addition, because the present invention can utilize the application software module in the embedded system to carry out the planning of test program, and tests a plurality of testing service boards, so the present invention can promote the efficient of execution effectively.
It should be noted that at last: above embodiment only in order to technical scheme of the present invention to be described, is not intended to limit; Although with reference to previous embodiment the present invention is had been described in detail, those of ordinary skill in the art is to be understood that: it still can be made amendment to the technical scheme that aforementioned each embodiment put down in writing, and perhaps part technical characterictic wherein is equal to replacement; And these modifications or replacement do not make the essence of appropriate technical solution break away from the spirit and scope of various embodiments of the present invention technical scheme.
Claims (10)
1. testing apparatus be suitable for testing at least one server board to be measured, and this testing apparatus comprises:
One embedded system is exported a plurality of test instructions;
One control module receives described a plurality of test instruction;
A plurality of testing execution module connect this control module, with when this testing apparatus is tested a plurality of server boards to be measured, respectively described a plurality of server boards to be measured are carried out corresponding test program according to described a plurality of test instructions;
A plurality of output interface modules connect described a plurality of testing execution module respectively, and each described a plurality of output interfaces unit all respectively in order to connect described a plurality of server board to be measured one of them;
One system's power subsystem connects one first voltage source, and supplies this testing apparatus running required power supply; And
A plurality of test power subsystems, connect a plurality of second voltage sources respectively, and connect described a plurality of testing execution module, make each described a plurality of testing execution module select required power supplys and one of them carries out corresponding test program to described a plurality of server boards to be measured.
2. testing apparatus according to claim 1 also comprises:
One embedded display screen connects this embedded system, to show a system information;
One buffer is connected to this embedded system and this control module by a plurality of system buss, to send described a plurality of test instructions to this control module; And
A plurality of feedback input interface units, connect described a plurality of server board to be measured respectively, to receive the test data that described a plurality of server board to be measured is exported when testing, described a plurality of test data then sends this buffer to by described a plurality of feedback input interface units respectively, and this buffer is also delivered to this embedded system to analyze with described a plurality of test datas.
3. testing apparatus according to claim 2, wherein this control module comprises:
One decoder connects this buffer, produces a command code string to decode described a plurality of test instruction, and this decoder also specifies described a plurality of feedback input interface unit to export described a plurality of test data respectively according to described a plurality of test instructions in regular turn;
One latch connects this buffer and this decoder, in order to export this command code string; And
One current driver connects this latch and described a plurality of testing execution module, with drive according to this command code string described a plurality of testing execution module one of them one of them is tested to described a plurality of server boards to be measured.
4. testing apparatus according to claim 1, wherein each described a plurality of testing execution module comprises:
One exchanges control unit, connect this control module and described a plurality of test with power subsystem one of them, and export an ac supply signal according to described a plurality of test instructions, with supply described a plurality of server board to be measured one of them test required working power;
Stream control unit connects this control module always, in order to export a switch testing signal according to this control command, so that one of them carries out electrical testing on to described a plurality of server boards to be measured; And
One control unit that resets connects this control module, in order to export a reset test signal according to this control command, so that one of them carries out a reset test to described a plurality of server boards to be measured.
5. testing apparatus according to claim 4, wherein this interchange control unit, this DC control unit and this control unit that resets are respectively relays.
6. testing apparatus according to claim 4, wherein each described a plurality of output interface module comprises:
One AC power interface unit connects this interchange control unit, with this ac supply signal is delivered to described a plurality of server board to be measured one of them;
One direct current power interface unit connects this DC control unit, with this switch testing signal is delivered to described a plurality of server board to be measured one of them; And
One reset test interface unit connects this control unit that resets, with this reset test signal is delivered to described a plurality of server board to be measured one of them.
7. testing apparatus according to claim 1, wherein this embedded system comprises:
One central processing unit is exported described a plurality of test instruction;
One application software module connects this central processing unit, to set a plurality of parameters in described a plurality of test program; And
One system's memory module, one of them connects this central processing unit by described a plurality of system buss, carries out this test instruction is delivered to control module.
8. testing apparatus according to claim 7, wherein this system's memory module comprises:
One random access memory, one of them is connected to this central processing unit by described a plurality of system buss; And
One flash memory, one of them is connected to this central processing unit by described a plurality of system buss, and the test data memory space is provided.
9. testing apparatus according to claim 8, wherein this application software module comprises:
One main control module;
One configuration module connects this main control module, is responsible for carrying out the setting of the parameters of described a plurality of test programs;
One test module, connect this configuration module and this main control module, with the described a plurality of test programs of finishing according to described a plurality of tests of parametric programming, and the test data that foundation is read when described a plurality of servers are tested writes down the state of each described a plurality of server board to be measured;
One trigger module connects this main control module, and allows described a plurality of server boards to be measured to be powered on or to cut off the power supply in manual mode;
One power-on time is estimated module, before carrying out described a plurality of test program, counts described a plurality of server board to be measured and starts the required time fully;
One test execution control module is in order to control the running of this testing execution module; And
One test data read module reads described a plurality of test data by described a plurality of system buss and described a plurality of feedback input interface unit.
10. testing apparatus according to claim 1, wherein this first voltage source and the described a plurality of second voltage source mains supply that is 110V or 220V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101484504A CN101931566A (en) | 2009-06-26 | 2009-06-26 | Test device of server |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101484504A CN101931566A (en) | 2009-06-26 | 2009-06-26 | Test device of server |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101931566A true CN101931566A (en) | 2010-12-29 |
Family
ID=43370500
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009101484504A Pending CN101931566A (en) | 2009-06-26 | 2009-06-26 | Test device of server |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101931566A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103823132A (en) * | 2012-11-19 | 2014-05-28 | 英业达科技有限公司 | Current testing method, system and power supply control device |
| CN106713037A (en) * | 2016-12-27 | 2017-05-24 | 北京奇虎科技有限公司 | Test method, test server and test system of data path |
| CN106933709A (en) * | 2015-12-31 | 2017-07-07 | 北京金山云网络技术有限公司 | A kind of method of testing and device |
| CN108052423A (en) * | 2017-11-24 | 2018-05-18 | 英业达科技有限公司 | The test method and device of server |
| CN110226095A (en) * | 2016-10-20 | 2019-09-10 | Y软股份公司 | The general automation of embedded system is tested |
-
2009
- 2009-06-26 CN CN2009101484504A patent/CN101931566A/en active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103823132A (en) * | 2012-11-19 | 2014-05-28 | 英业达科技有限公司 | Current testing method, system and power supply control device |
| CN103823132B (en) * | 2012-11-19 | 2016-09-07 | 英业达科技有限公司 | Current test method, system and power control |
| CN106933709A (en) * | 2015-12-31 | 2017-07-07 | 北京金山云网络技术有限公司 | A kind of method of testing and device |
| CN106933709B (en) * | 2015-12-31 | 2020-07-24 | 北京金山云网络技术有限公司 | Test method and device |
| CN110226095A (en) * | 2016-10-20 | 2019-09-10 | Y软股份公司 | The general automation of embedded system is tested |
| CN106713037A (en) * | 2016-12-27 | 2017-05-24 | 北京奇虎科技有限公司 | Test method, test server and test system of data path |
| CN108052423A (en) * | 2017-11-24 | 2018-05-18 | 英业达科技有限公司 | The test method and device of server |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107632219B (en) | Automatic startup and shutdown test system and test method thereof | |
| CN101931566A (en) | Test device of server | |
| CN106201963A (en) | A kind of system of PCI E card hot plug in server | |
| CN102081567B (en) | Server | |
| CN104731678A (en) | RAID storage mode test system and method and electronic device | |
| CN101846998B (en) | Redundant digital electric-hydraulic control system for turbine | |
| CN106708686A (en) | Mainboard power supply debugging and maintenance method for multichannel server | |
| TWI756769B (en) | Powering method and powering system for power over ethernet | |
| CN101741577A (en) | Method and system for testing baseboard management controller | |
| CN105653482A (en) | Super USB controller as well as working method and system | |
| CN213024377U (en) | Automatic test system of flexible direct current control protection device mainboard | |
| Dissanayaka et al. | Smart meter based inverter controlling network for demand response applications in smart grids | |
| CN205210675U (en) | Train central control unit's test platform | |
| CN102478950B (en) | Method for electrifying server | |
| CN112732498B (en) | Test method, device, equipment and storage medium for simulating single-point power-on and power-off of equipment | |
| CN114675699A (en) | Control method, device, equipment and medium applied to multi-channel numerical control power supply | |
| CN114123457A (en) | Power supply method, device and equipment | |
| CN114416187A (en) | ARM server and starting method of ARM core board | |
| CN203838545U (en) | Electric performer control system based on internal bus | |
| CN103983864A (en) | Device used for graphic-card testing | |
| CN107766183B (en) | Disk online and offline method and device based on test mechanism | |
| CN1453708A (en) | Automatic periodic test system and method for power switch of computer equipment | |
| CN201247291Y (en) | Plug and play test equipment | |
| CN102522753B (en) | Plant-level load optimization distribution test system of thermal power plant and load optimization distribution method thereof | |
| CN1277201C (en) | Computer main board power source stardard conformity measuring system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20101229 |