CN101923503B - Method for regulating internal parameters of internal storage and computer system using same - Google Patents
Method for regulating internal parameters of internal storage and computer system using same Download PDFInfo
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- CN101923503B CN101923503B CN200910147670A CN200910147670A CN101923503B CN 101923503 B CN101923503 B CN 101923503B CN 200910147670 A CN200910147670 A CN 200910147670A CN 200910147670 A CN200910147670 A CN 200910147670A CN 101923503 B CN101923503 B CN 101923503B
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Abstract
The invention relates to a method for regulating the internal parameters of an internal storage and a computer system using the same. In the invention, the computer system provides an embedded control unit for accumulating count values and sending reset signals to restart the computer system. The method comprises the following steps that: firstly the embedded control unit induces the parameter setting values of the internal storage, which correspond to the count values, according to the counted count values; then the computer system executes test programs of the internal storage; when the test programs of the internal storage are successful, a basic input output system stores the parameter setting values of the internal storage; on the contrary, when the test programs of the internal storage are failed, the embedded control unit accumulates the count values and sends the reset signals to restart the computer system, and the basic input output system renewedly induces another group of parameter setting values of the internal storage, which correspond to the count values, so as to execute the test programs of the internal storage again.
Description
Technical field
The invention relates to a kind of method of adjusting internal parameters of internal storage, and particularly relevant for the method for the internal parameters of internal storage in a kind of robotization adjustment computer system and use its computer system.
Background technology
The internal storage location that a lot of labels and kind are arranged on the market; If the computer system (different mainboards) of the label that collocation is different; In the time of can compatible problem occurring between mainboard and the memory modules, can cause the instability in the computer system running, even make computer system work as machine.
For reducing the problems referred to above, if suffer from internal storage location and computer system compatibility problem, the user then need adjust best parameter to indivedual internal storage locations.In addition, the user must look for suitable test procedure according to different operating system.Again, the user also must possess relevant knowledge, can adjust internal memory control correlation parameter, and all necessary participation of whole process school accent test, and it is consuming time again to require great effort.In addition, so repeatedly can expend a large amount of research and development and checking resource with " test ", and, still can't avoid the problem of compatibility if the user uses the internal storage location of adjusting inner parameter without crossing toward covering ground " adjustment ".
Summary of the invention
The present invention provides a kind of computer system; In Basic Input or Output System (BIOS) (BIOS), providing in mainboard tested an internal storage location test function; The user can not get under the situation of operating system; Internal storage location is carried out parameter setting and adjustment, make the more stable work of internal storage location and computer system, obtain best efficient.
The present invention provides the method for adjustment internal parameters of internal storage in a kind of computer system, provides the mode of robotization adjustment to adjust the internal parameters of internal storage setting value, saves the manual operation formality.
The present invention proposes a kind of computer system, comprises CPU, Basic Input or Output System (BIOS) and internal insertee control unit and an internal storage location.Wherein, Basic Input or Output System (BIOS) is coupled to CPU and internal insertee control unit respectively.Above-mentioned Basic Input or Output System (BIOS) inside provides the internal storage location test function, uses and carries out the MEMTEST program, and adjust the pre-set parameter of storage unit according to the result of MEMTEST program.Internal insertee control unit is then in order to add up a count value and send a reset signal so that computer system is started shooting again.Say that further Basic Input or Output System (BIOS) reads count value from internal insertee control unit, choose corresponding memory parameters setting value with the count value that imports, Basic Input or Output System (BIOS) is also carried out a MEMTEST program; When the success of MEMTEST program; Store the pre-set parameter of internal storage location through Basic Input or Output System (BIOS); And when the MEMTEST procedure failure; Add up this count values and sending one reset signal so that computer system is started shooting again through internal insertee control unit, make Basic Input or Output System (BIOS) import again and corresponding another group memory parameters setting value of count value, and carry out the MEMTEST program once more.
In one embodiment of this invention, above-mentioned internal insertee control unit includes a counting unit, replacement module and monitoring module.Counting unit is in order to the count value that adds up.The replacement module in order to send reset signal so that computer system start shooting again.Monitoring module couples counting unit and replacement module; In order to monitoring MEMTEST program; To drive counting unit and replacement module when the MEMTEST procedure failure; Make Basic Input or Output System (BIOS) import again and the corresponding memory parameters setting value of count value, and carry out the MEMTEST program once more.
In one embodiment of this invention; Above-mentioned monitoring module more can be in order to carry out the start watchdog routine; With the start self test program in the monitoring MEMTEST program, and also can carry out stable memory degree watchdog routine, with the memory parameters degree of stability test in the monitoring MEMTEST program.
In one embodiment of this invention, the start watchdog routine of above-mentioned computer system comprises: whether receive the start success command in the time at booting wait through the monitoring module detecting; When receiving the start success command in the time at booting wait, monitoring module can stop to carry out the start watchdog routine; When not receiving the start success command in the time at booting wait; Then drive counting unit and replacement module; With the accumulated counts value and send reset signal so that computer system is started shooting again; Make the Basic Input or Output System (BIOS) basic number go into output system and import new memory parameters setting value again, and carry out the MEMTEST program again.
In one embodiment of this invention, above-mentioned stable memory degree watchdog routine comprises: whether in the test wait time, receive the MEMTEST status command through the monitoring module detecting; When in the test wait time, not receiving the test mode order; Drive counting unit and replacement module; With the accumulated counts value and send reset signal so that computer system is started shooting again; Make the Basic Input or Output System (BIOS) basic number go into output system and import corresponding internal storage location pre-set parameter again, and carry out the MEMTEST program again with count value; When in the test wait time, receiving the test mode order, judge the type that test mode is ordered through monitoring module, whether store this memory parameters setting value with decision.
In one embodiment of this invention, in the above-mentioned monitoring module, when the test mode order is that monitoring module stops stable memory degree watchdog routine when passing through order; When the test mode order is bad command, drive counting unit and replacement module; When in test mode is ordered to test, ordering, monitoring module continues to carry out stable memory degree watchdog routine.
In one embodiment of this invention, when above-mentioned monitoring module was judged the success of MEMTEST program, monitoring module comprised that more driving counting unit is with counting value returns.
In one embodiment of this invention, above-mentioned Basic Input or Output System (BIOS) comprises a parameter list, writes down many pre-set parameters and pairing separately count value thereof through parameter list.
The present invention proposes a kind of method of adjusting internal parameters of internal storage, is suitable for utilizing Basic Input or Output System (BIOS) to adjust the pre-set parameter of storage unit.The method comprises: internal insertee control unit is provided, with the accumulated counts value and send reset signal so that computer system is started shooting again; Import and count value corresponding parameter setting value; Carry out the MEMTEST program; When the success of MEMTEST program, the storage parameter setting value; When the MEMTEST procedure failure; Come the accumulated counts value and send reset signal through internal insertee control unit, go into output system with basic number and import again with corresponding another pre-set parameter of count value and carry out the MEMTEST program again so that computer system is started shooting again.
In one embodiment of this invention, above-mentioned MEMTEST program comprises start self test program and the test of memory parameters degree of stability, and the step of execution MEMTEST program comprises: carry out the start self test program; When the success of start self test program, carry out the test of memory parameters degree of stability, with when the memory parameters degree of stability is tested successfully, the storage parameter setting value.And when failure of start self test program or memory parameters degree of stability test crash; Equally all be to come the accumulated counts value and send reset signal, go into output system with basic number and import again with corresponding another pre-set parameter of count value and carry out the MEMTEST program again so that computer system is started shooting again through internal insertee control unit.
In one embodiment of this invention, in the step of carrying out above-mentioned start self test program, comprise notice internal insertee control unit execution start watchdog routine, use detecting and whether receive the start success command in the time at booting wait.If stop execution and start shooting watchdog routine and carry out stable memory degree watchdog routine; Otherwise, if not, come the accumulated counts value and send reset signal so that computer system is started shooting again by internal insertee control unit.
In one embodiment of this invention, in the step of carrying out above-mentioned memory parameters degree of stability test, comprise notice internal insertee control unit execution stable memory degree watchdog routine, use detecting and whether in the test wait time, receive the test mode order.If not, come the accumulated counts value and send reset signal by internal insertee control unit so that computer system is started shooting again; Otherwise, if, further judge the type that test mode is ordered, whether store the pre-set parameter of present importing with decision.When test mode order for through order the time, stop stable memory degree watchdog routine by internal insertee control unit, and by Basic Input or Output System (BIOS) storage parameter setting value; When the test mode order is bad command, comes the accumulated counts value and send reset signal so that computer system is started shooting again by internal insertee control unit; When in test mode is ordered to test, ordering, continue to carry out stable memory degree watchdog routine by internal insertee control unit.
In one embodiment of this invention, when the success of MEMTEST program, more comprise counting value returns, and the forbidden energy internal insertee control unit.
Based on above-mentioned, the present invention is the stability of the pre-set parameter of test storage unit in the environment of Basic Input or Output System (BIOS) directly, and adjust only pre-set parameter automatically, and system can stably be operated.The formality of extra searching test procedure has not only been saved in this measure, more can save the time of artificial adjustment internal parameters of internal storage, and is quite convenient in the use.
For letting the above-mentioned feature and advantage of the present invention can be more obviously understandable, hereinafter is special lifts embodiment, and conjunction with figs. elaborates as follows.
Description of drawings
Fig. 1 is the calcspar according to the computer system shown in the first embodiment of the invention.
Fig. 2 is the process flow diagram according to the parameter regulation means shown in the first embodiment of the invention.
Fig. 3 is the calcspar according to the computer system shown in the second embodiment of the invention.
Fig. 4 is the process flow diagram according to the parameter regulation means shown in the second embodiment of the invention.
Embodiment
First embodiment
Fig. 1 is the calcspar according to the computer system shown in the first embodiment of the invention.Please with reference to Fig. 1, computer system comprises CPU 110, control chip group 120, storage unit 130, Basic Input or Output System (BIOS) (Basic Input Output System, BIOS) 140 and internal insertee control unit 150.Wherein, control chip group 120 normally is made up of north bridge chips 121 and 123 of South Bridge chips.North bridge chips 121 is coupled between CPU 110 and the South Bridge chip 123, and South Bridge chip 123 then is coupled to BIOS 140.North bridge chips 121 is responsible for receiving the instruction that CPU 110 is transmitted, and comes control peripheral devices via South Bridge chip 123.
In the present embodiment; BIOS 140 is connected to CPU 110 and passes through low pin position (Low Pin Count; LPC) bus, SPI (Serial Peripheral Interface; SPI) bus, System Management Bus (System Management Bus, SMBus) or general input and output (General Purpose Input Output, GPIO) bus etc. couples with internal insertee control unit 150.At this, BIOS 140 has the MEMTEST function, uses the pre-set parameter that loads internal memory, and carries out the MEMTEST program, adjusts the pre-set parameter of storage unit 130 according to the result of MEMTEST program.
And internal insertee control unit 150 is to be used for the accumulated counts value, and sends reset signal and make computer system start shooting again, to adjust the pre-set parameter of storage unit 130 through BIOS 140.At this, build a parameter list in can be in BIOS 140, with in this parameter list, write down many memory parameters setting values and pairing count value thereof.
For instance; Storage unit 130 generally has four main parameters; Comprise row address time delay (Column Address Strobe Latency, tCL), column address to row address time delay (RAS-to-CAS Del ay, tRCD), Column Address Strobe (RAS Precharge Time precharge time; TRP) and row valid till precharge time (RAS Activate to Precharge Time, tRAS).In view of the above, each count value all can corresponding one group of pre-set parameter (for example, only adjusting main parametric t CL, tRCD, tRP, tRAS) in parameter list, and BIOS 140 just can be according to importing one group of pre-set parameter in the count value autoregressive parameter table that is read.
Particularly, BIOS 140 can read the count value in the counting unit in internal insertee control unit 150, to import corresponding memory parameters setting value in the autoregressive parameter table according to count value, carries out the MEMTEST program afterwards again.And when BIOS 140 carries out the MEMTEST programs, can monitor through 150 couples of BIOS 140 of internal insertee control unit, with when BIOS 140 carries out the MEMTEST procedure failures, count value being added up, the reset signal of redispatching makes the computer system boots.In view of the above, BIOS 140 just can be according to the count value after adding up basic number go into output system and import another group memory parameters setting value again and come to carry out again the MEMTEST program.On the other hand, when the success of MEMTEST program, BIOS 140 can store the present memory parameters setting value that imports get off.
The above-mentioned computer system of below promptly arranging in pairs or groups specifies each step of method of adjustment internal parameters of internal storage.Fig. 2 is the process flow diagram according to the parameter regulation means shown in the first embodiment of the invention.In the present embodiment, set of option (for example " Memory Auto Tune ") for example can be set in the setting menu of BIOS 140 supplies the user to come activation memory parameters adjustment program.After option " Memory Auto Tune " was enabled, BIOS 140 just can get into internal memory memory parameters adjustment program.
Please be simultaneously with reference to Fig. 1 and Fig. 2, after BIOS 140 began to carry out memory parameters adjustment program, shown in step S205, BIOS 140 can be with internal insertee control unit 150 activations.At this, come the accumulated counts value through internal insertee control unit 150.For example, the initial value of count value is 0, and after getting into memory parameters adjustment program, internal insertee control unit 150 just adds 1 with count value.
Then, in step S210, import the corresponding memory parameters setting value of count value by BIOS 140.Particularly, BIOS 140 can read count value (for example being 1) from internal insertee control unit 150, and in its parameter list, searching count value more afterwards is 1 pairing memory parameters setting value, so that the memory parameters setting value is imported.
Afterwards, in step S215, carry out the MEMTEST program through BIOS 140.And BIOS 140 is before carrying out the MEMTEST program, and BIOS 140 can monitor by notice internal insertee control units 150.Then, shown in step S215, BIOS 140 carries out the MEMTEST program.Afterwards, whether in step S220, it is successful to monitor the MEMTEST program through internal insertee control unit 150.
When the success of MEMTEST program; Represent that this group memory parameters setting value can let system stability ground operate; In view of the above, shown in step S225, the memory parameters setting value is stored by BIOS 140; For example be stored to CMOS (Complementary Metal Oxide Semiconductor, CMOS) in.Otherwise, when the MEMTEST procedure failure, represent this group memory parameters setting value and be not suitable for this system, just shown in step S230, come the accumulated counts value this moment through internal insertee control unit 150.Afterwards, in step S235, send reset signal through internal insertee control unit 150, so that computer system is started shooting again.Then; Return step S210; BIOS 140 reads count value from internal insertee control unit 150 again, goes into output system with basic number and imports with the new count value corresponding memory parameters setting value of institute execution in step S215 once more again, till the success of MEMTEST program.In view of the above, just can automatically adjust the inner memory parameters setting value of internal memory through above-mentioned steps S205～step S235.
Second embodiment
Fig. 3 is the calcspar according to the computer system shown in the second embodiment of the invention.Please with reference to Fig. 3, in the present embodiment, control chip group 320, storage unit 330, BIOS 340 and internal insertee control unit 350 that computer system comprises CPU 310, is made up of north bridge chips 321 and South Bridge chip 323.Wherein, The relation of coupling between CPU 310, control chip group 320, storage unit 330, BIOS 340 and the internal insertee control unit 350 and the CPU 110 of the function separately and first embodiment, control chip group 120, storage unit 130, BIOS 140 and internal insertee control unit 150 are same or similar, so repeat no more at this.And in the present embodiment, internal insertee control unit 350 comprises replacement module 351, monitoring module 353 and counting unit 355.Wherein, monitoring module 353 is coupled to counting unit 355 and replacement module 351 respectively.
Say that at length in the present embodiment, monitoring module 353 can be carried out start watchdog routine and stable memory degree watchdog routine.Above-mentioned start watchdog routine is to be used for monitoring start self test program (Power On Self Test, POST), stable memory degree watchdog routine then is to be used for monitoring the test of memory parameters degree of stability.At this, the program of memory parameters degree of stability test is built among the BIOS 340 in being, for example is to test through the action of a succession of access memory cell 330.
During general the start, BIOS 340 can begin the self test program of starting shooting.And the main task of start self test program is exactly some key equipments in the detection system, and whether for example storage unit 330, display card (not shown), hard disk (not shown) etc. can normal operations.That is to say, in the present embodiment, after the start self test program can normally be moved, just begin to carry out the test of memory parameters degree of stability.
The above-mentioned computer system of below promptly arranging in pairs or groups specifies each step of method of adjustment internal parameters of internal storage.Fig. 4 is the process flow diagram according to the parameter regulation means shown in the second embodiment of the invention.In the present embodiment, set of option being set in the setting menu of BIOS 340 supplies the user to come activation memory parameters adjustment program.
Please be simultaneously with reference to Fig. 3 and Fig. 4, after BIOS 340 begins to carry out memory parameters adjustment program, shown in step S405, just BIOS 340 can be with internal insertee control unit 350 activations, to begin the accumulated counts values through counting unit 355.
Then, at step S410, BIOS 340 can get into memory parameters adjustment program by notice internal insertee control unit 350, and starts the start watchdog routine through monitoring module 353.Afterwards, in step S415, BIOS 340 can read the count value of counting unit 355, to import the corresponding memory parameters setting value of count value.
Then, in step S420, BIOS 340 just begins to carry out the start self test program.At this moment, monitoring module 353 is monitored through the start watchdog routine.The start watchdog routine is shown in step S425, and whether internal insertee control unit 350 can be detected at booting wait in the time (for example, 30 seconds in) through monitoring module 353 and receive the start success command from BIOS 340.
If monitoring module 353 is received the start success command from BIOS 340 in 30 seconds (booting wait time), just execution in step S440; Otherwise; If monitoring module 353 is not received the start success command from BIOS 340 yet after 30 seconds; Represent that this group memory parameters setting value suffers from when mistakes such as machines in the start self test program, thereby execution in step S430, drive counting unit 355 by monitoring module 353 count value is added up.Afterwards, shown in the step S435, drive replacement module 351 by monitoring module 353 and send reset signal for another example, make computer system start shooting again.Return step S410 then, execution in step S410～425 can make BIOS 340 successfully carry out the start self test program until the memory parameters setting value that is imported again.
After the success of start self test program; BIOS 340 can send start success command to internal insertee control unit 350; Carry out stable memory degree watchdog routine with notice internal insertee control unit 350; Shown in step S440, internal insertee control unit 350 stops through monitoring module 353 watchdog routine of will starting shooting, and carries out stable memory degree watchdog routine.
Then, in step S445, BIOS 340 carries out the test of memory parameters degree of stability.At this, for example be to build among the BIOS 340 in the program with the test of memory parameters degree of stability, through storage unit 330 is carried out the degree of stability that a series of access comes the test memory pre-set parameter.And when BIOS 340 carries out the test of memory parameters degree of stability; BIOS 340 can continue to send test mode always to be ordered to internal insertee control unit 350; For example just send the order of test mode p.s., inform the test status that internal insertee control unit 350 is present through test mode order.
At this moment, internal insertee control unit 350 is carried out stable memory degree watchdog routine through monitoring module 353, carries out the test of memory parameters degree of stability with monitoring BIOS 340.Stable memory degree watchdog routine is shown in step S450, and whether internal insertee control unit 350 can be detected in the test wait time (for example, in 10 seconds) through monitoring module 353 and receive the test mode order from BIOS 340.This is to order to internal insertee control unit 350 because BIOS 340 whenever just can send test mode at a distance from a set time; Therefore if internal insertee control unit 350 was not all received the test mode order in continuous 10 seconds; Represent that present memory parameters setting value is inapplicable, and this moment, system possibly take place when problems such as machines.At this moment; Execution in step S430 and step S435; Come the accumulated counts value and send reset signals through replacement module 351 and come to start shooting again through counting unit 355, go into that output system imports new memory parameters setting value again and repeated execution of steps S410 once more with basic number.
And if monitoring module 353 receives the test mode order in the test wait time, shown in step S455, judge the type of test mode order through monitoring module 353.At this, the type of test mode order comprises through order in order, bad command and the test.Particularly, when memory parameters degree of stability EOT, BIOS 340 can send through order; In addition, in the process of memory parameters degree of stability test, occur wrong (representing that promptly present memory parameters setting value is inapplicable), BIOS 340 can send bad command; In addition, when the test of memory parameters degree of stability still continued to carry out, 340 of BIOS sent order in the test.
In view of the above, if internal insertee control unit 350 receives when ordering in the test, expression BIOS 340 still carrying out the test of memory parameters degree of stability, returns step S450, and internal insertee control unit 350 continues to carry out stable memory degree watchdog routine through monitoring module 353.
In addition; When if internal insertee control unit 350 receives bad command; Execution in step S430 and step S435; Come the accumulated counts value and send reset signals through replacement module 351 and come to start shooting again through counting unit 355, go into that output system imports new memory parameters setting value again and repeated execution of steps S410 once more with basic number.
In addition; If when internal insertee control unit 350 received through order, shown in step S460, internal insertee control unit 350 can stop stable memory degree watchdog routine through monitoring module 353; Then shown in step S465, present memory parameters setting value is stored by BI OS 340.And internal insertee control unit 350 can return 0 with count value through counting unit 355, and afterwards, BIOS 340 adjusts program forbidden energy and forbidden energy internal insertee control unit 350 with memory parameters, gets into memory parameters adjustment program in the time of can preventing to start shooting next time in view of the above once again.
In sum; The present invention is arranged at test function among the BIOS, directly utilizes BIOS to adjust the memory parameters setting value of storage unit, need not extra searching test procedure; Also need not get in the operating system and just can carry out the MEMTEST program, more convenient in the use.In addition, more can be directly by BIOS whole-course automation adjustment internal parameters of internal storage setting value, till finding only memory parameters setting value, can save the people is the time of adjusting.
Though the present invention discloses as above with embodiment; Right its is not in order to limit the present invention; Has common knowledge the knowledgeable in the technical field under any; Do not breaking away from the spirit and scope of the present invention, when doing a little change and retouching, so protection scope of the present invention is as the criterion when looking claims person of defining.
Claims (18)
1. computer system of adjusting internal parameters of internal storage is characterized in that comprising:
CPU;
Basic Input or Output System (BIOS) is coupled to above-mentioned CPU, comprises that test function is used to carry out the MEMTEST program, and adjusts the memory parameters setting value of storage unit according to the result of test procedure;
Internal insertee control unit is coupled to above-mentioned Basic Input or Output System (BIOS), in order to the accumulated counts value and send reset signal so that computer system is started shooting again; And
Internal storage location connects above-mentioned CPU;
Wherein, above-mentioned Basic Input or Output System (BIOS) reads above-mentioned count value from above-mentioned internal insertee control unit, importing the corresponding memory parameters setting value of above-mentioned count value, and carries out above-mentioned MEMTEST program; When above-mentioned MEMTEST program is successful; Store above-mentioned memory parameters setting value through above-mentioned Basic Input or Output System (BIOS); And when above-mentioned MEMTEST procedure failure; Add up the above-mentioned reset signal of above-mentioned count values and sending so that computer system is started shooting again through above-mentioned internal insertee control unit, make above-mentioned Basic Input or Output System (BIOS) basic number go into output system and import again and corresponding another memory parameters setting value of above-mentioned count value, and carry out above-mentioned MEMTEST program again.
2. computer system according to claim 1 is characterized in that wherein above-mentioned internal insertee control unit comprises:
Counting unit is in order to the above-mentioned count value that adds up;
The replacement module is in order to send described reset signal so that computer system is started shooting again; And
Monitoring module; Couple above-mentioned counting unit and above-mentioned replacement module; In order to monitor above-mentioned MEMTEST program; To drive above-mentioned counting unit and above-mentioned replacement module when the above-mentioned MEMTEST procedure failure, make above-mentioned Basic Input or Output System (BIOS) import again and corresponding another memory parameters setting value of above-mentioned count value, and carry out above-mentioned MEMTEST program again.
3. computer system according to claim 2; It is characterized in that wherein above-mentioned monitoring module is in order to carry out the start watchdog routine; To monitor the start self test program in the above-mentioned MEMTEST program; And in order to carry out stable memory degree watchdog routine, to monitor the memory parameters degree of stability test in the above-mentioned MEMTEST program.
4. computer system according to claim 3 is characterized in that wherein above-mentioned start watchdog routine comprises;
Whether receive the start success command in the time through above-mentioned monitoring module detecting at booting wait;
When receive above-mentioned start success command in the time at above-mentioned booting wait, above-mentioned monitoring module stops to carry out above-mentioned start watchdog routine; And
When do not receive above-mentioned start success command in the time at above-mentioned booting wait; Drive above-mentioned counting unit and above-mentioned replacement module;, make above-mentioned Basic Input or Output System (BIOS) import and carry out above-mentioned MEMTEST program again so that computer system is started shooting again with the above-mentioned reset signal of above-mentioned count values and sending that adds up with corresponding another memory parameters setting value of above-mentioned count value.
5. computer system according to claim 3 is characterized in that wherein above-mentioned stable memory degree watchdog routine comprises:
Whether in the test wait time, receive the test mode order through above-mentioned monitoring module detecting;
When in the above-mentioned test wait time, not receiving the order of above-mentioned test mode; Drive above-mentioned counting unit and above-mentioned replacement module;, make above-mentioned Basic Input or Output System (BIOS) import and carry out above-mentioned MEMTEST program again so that computer system is started shooting again with the above-mentioned reset signal of above-mentioned count values and sending that adds up with corresponding another memory parameters setting value of above-mentioned count value; And
When in the above-mentioned test wait time, receiving the order of above-mentioned test mode, judge the type of above-mentioned test mode order whether to store above-mentioned memory parameters setting value with decision through above-mentioned monitoring module.
6. computer system according to claim 5 is characterized in that wherein in above-mentioned monitoring module,
When above-mentioned test mode order is that above-mentioned monitoring module stops above-mentioned stable memory degree watchdog routine when passing through order;
When above-mentioned test mode order is bad command, drive above-mentioned counting unit and above-mentioned replacement module, make above-mentioned Basic Input or Output System (BIOS) import again and corresponding another memory parameters setting value of above-mentioned count value; And
When in above-mentioned test mode is ordered to test, ordering, above-mentioned monitoring module continues to carry out above-mentioned stable memory degree watchdog routine.
7. computer system according to claim 2 is characterized in that wherein when above-mentioned monitoring module is judged above-mentioned MEMTEST program success, and monitoring module also comprises and drives above-mentioned counting unit with above-mentioned counting value returns.
8. computer system according to claim 1 is characterized in that wherein above-mentioned Basic Input or Output System (BIOS) comprises parameter list, in order to write down many memory parameters setting values and pairing separately count value thereof.
9. a method of adjusting internal parameters of internal storage is suitable for utilizing Basic Input or Output System (BIOS) to adjust the memory parameters setting value of storage unit, it is characterized in that said method comprises:
Internal insertee control unit is provided, with the accumulated counts value and send reset signal so that computer system is started shooting again;
Import and the corresponding memory parameters setting value of above-mentioned count value;
Carry out the MEMTEST program;
When above-mentioned MEMTEST program is successful, store above-mentioned memory parameters setting value; And
When above-mentioned MEMTEST procedure failure; Add up the above-mentioned reset signal of above-mentioned count values and sending so that computer system is started shooting again through above-mentioned internal insertee control unit, import again with corresponding another memory parameters setting value of above-mentioned count value with above-mentioned Basic Input or Output System (BIOS) and carry out above-mentioned MEMTEST program again.
10. the method for adjustment internal parameters of internal storage according to claim 9 is characterized in that wherein above-mentioned MEMTEST program comprises the test of start self test program and memory parameters degree of stability, and the step of carrying out above-mentioned MEMTEST program comprises:
Carry out above-mentioned start self test program;
When above-mentioned start self test program is successful, carry out above-mentioned memory parameters degree of stability test;
When above-mentioned memory parameters degree of stability test crash; Add up the above-mentioned reset signal of above-mentioned count values and sending so that computer system is started shooting again through above-mentioned internal insertee control unit, import again with corresponding another memory parameters setting value of above-mentioned count value with above-mentioned Basic Input or Output System (BIOS) and carry out above-mentioned MEMTEST program again; And
When above-mentioned memory parameters degree of stability is tested successfully, store above-mentioned memory parameters setting value.
11. the method for adjustment internal parameters of internal storage according to claim 10; It is characterized in that wherein when above-mentioned start self test program is failed; Add up the above-mentioned reset signal of above-mentioned count values and sending so that computer system is started shooting again through above-mentioned internal insertee control unit, import again with corresponding another memory parameters setting value of above-mentioned count value with above-mentioned Basic Input or Output System (BIOS) and carry out above-mentioned MEMTEST program again.
12. the method for adjustment internal parameters of internal storage according to claim 10 is characterized in that wherein in the step of carrying out above-mentioned start self test program, comprising:
Notify above-mentioned internal insertee control unit to carry out the start watchdog routine, and above-mentioned start watchdog routine comprises:
Whether above-mentioned internal insertee control unit detecting receives the start success command at booting wait in the time;
When receive above-mentioned start success command in the time at above-mentioned booting wait, above-mentioned internal insertee control unit stops to carry out above-mentioned start watchdog routine; And
When do not receive above-mentioned start success command in the time at above-mentioned booting wait; Add up the above-mentioned reset signal of above-mentioned count values and sending so that computer system is started shooting again through above-mentioned internal insertee control unit, import again with corresponding another memory parameters setting value of above-mentioned count value with above-mentioned Basic Input or Output System (BIOS) and carry out above-mentioned MEMTEST program again.
13. the method for adjustment internal parameters of internal storage according to claim 10 is characterized in that wherein in the step of carrying out above-mentioned memory parameters degree of stability test, comprising:
Notify above-mentioned internal insertee control unit to carry out stable memory degree watchdog routine, and above-mentioned stable memory degree watchdog routine comprises:
Whether above-mentioned internal insertee control unit detecting receives the test mode order in the test wait time;
When in the above-mentioned test wait time, not receiving the order of above-mentioned test mode; Add up the above-mentioned reset signal of above-mentioned count values and sending so that computer system is started shooting again through above-mentioned internal insertee control unit, import again with corresponding another memory parameters setting value of above-mentioned count value with above-mentioned Basic Input or Output System (BIOS) and carry out above-mentioned MEMTEST program again; And
When in the above-mentioned test wait time, receiving the order of above-mentioned test mode, judge the type of above-mentioned test mode order, whether store above-mentioned memory parameters setting value with decision.
14. the method for adjustment internal parameters of internal storage according to claim 13; It is characterized in that wherein when above-mentioned test mode order is bad command; Add up the above-mentioned reset signal of above-mentioned count values and sending so that computer system is started shooting again through above-mentioned internal insertee control unit, import again and corresponding another memory parameters setting value of above-mentioned count value with above-mentioned Basic Input or Output System (BIOS).
15. the method for adjustment internal parameters of internal storage according to claim 13; It is characterized in that wherein when above-mentioned test mode order for through order the time; Stop above-mentioned stable memory degree watchdog routine through above-mentioned internal insertee control unit, and store above-mentioned memory parameters setting value by above-mentioned Basic Input or Output System (BIOS).
16. the method for adjustment internal parameters of internal storage according to claim 13 when it is characterized in that wherein in above-mentioned test mode is ordered to test, ordering, continues to carry out above-mentioned stable memory degree watchdog routine through above-mentioned internal insertee control unit.
17. the method for adjustment internal parameters of internal storage according to claim 9 is characterized in that wherein when above-mentioned MEMTEST program success, also comprising above-mentioned counting value returns, and the above-mentioned internal insertee control unit of forbidden energy.
18. the method for adjustment internal parameters of internal storage according to claim 9 is characterized in that also comprising:
Provide parameter list to write down above-mentioned memory parameters setting value and pairing above-mentioned count value thereof.
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| CN107301103A (en) * | 2017-06-22 | 2017-10-27 | 济南浪潮高新科技投资发展有限公司 | A kind of method and device for the memory parameters for adjusting domestic processor |
| CN109508262B (en) * | 2017-09-14 | 2022-05-27 | 佛山市顺德区顺达电脑厂有限公司 | Method for automatically testing functional items of basic input and output unit |
| CN108920198B (en) * | 2018-06-29 | 2020-08-21 | 苏州浪潮智能科技有限公司 | Method, system and server for changing system energy efficiency mode in BIOS |
| CN111221582B (en) * | 2020-01-02 | 2024-04-12 | 深圳中电长城信息安全系统有限公司 | Memory training method and system |
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| EP1426859A1 (en) * | 2001-08-22 | 2004-06-09 | Legend (Beijing) Limited | Method of computer rapid start-up |
| CN1760838A (en) * | 2004-10-16 | 2006-04-19 | 鸿富锦精密工业（深圳）有限公司 | ROM of BIOS data detection system and method |
| CN101359306A (en) * | 2008-09-26 | 2009-02-04 | 华硕电脑股份有限公司 | Detecting method for internal memory regulating result and computer system thereof |
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| EP1426859A1 (en) * | 2001-08-22 | 2004-06-09 | Legend (Beijing) Limited | Method of computer rapid start-up |
| CN1760838A (en) * | 2004-10-16 | 2006-04-19 | 鸿富锦精密工业（深圳）有限公司 | ROM of BIOS data detection system and method |
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