CN101907511B - Light source measuring method - Google Patents

Light source measuring method Download PDF

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Publication number
CN101907511B
CN101907511B CN 200910302888 CN200910302888A CN101907511B CN 101907511 B CN101907511 B CN 101907511B CN 200910302888 CN200910302888 CN 200910302888 CN 200910302888 A CN200910302888 A CN 200910302888A CN 101907511 B CN101907511 B CN 101907511B
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CN
China
Prior art keywords
light source
measured pattern
measuring method
irradiation
lines
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Expired - Fee Related
Application number
CN 200910302888
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Chinese (zh)
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CN101907511A (en
Inventor
柯骏程
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Original Assignee
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
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Publication date
Application filed by Hongfujin Precision Industry Shenzhen Co Ltd, Hon Hai Precision Industry Co Ltd filed Critical Hongfujin Precision Industry Shenzhen Co Ltd
Priority to CN 200910302888 priority Critical patent/CN101907511B/en
Publication of CN101907511A publication Critical patent/CN101907511A/en
Application granted granted Critical
Publication of CN101907511B publication Critical patent/CN101907511B/en
Expired - Fee Related legal-status Critical Current
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Abstract

The invention relates to a light source measuring method which is used for measuring at least one light source. The light source measuring method comprises the following steps of: providing a drawing board, wherein at least one measuring pattern is predrawn on the drawing board, the measuring pattern comprises a central point and a plurality of lines, and the plurality of lines are distributed from the central point to the periphery; correspondingly irradiating one measuring pattern on the drawing board by using a light source; shooting the measuring pattern irradiated by the light source by utilizing a shooting device which can sense lights emitted from the light source; and in the shot images, acquiring the range of the light source irradiation area according to the occupied area and the corresponding lines when the lights irradiate in the measuring pattern. The light source measuring method provided by the invention does not need expensive devices and complex operations and can simply and rapidly acquire the size and the divergence angle of the light source irradiation area just by referencing the measuring pattern.

Description

Light source measuring method
Technical field
The present invention relates to optical measurement, particularly a kind of light source measuring method.
Background technology
Light emitting diode (LED) is a kind of solid luminescence device that electric energy is converted into luminous energy; Because of its have the life-span long, volume is little, vibration strength good, economize on electricity, efficient, the response time is fast, driving voltage low and advantage such as environmental protection, and have a wide range of applications at numerous areas such as indication, demonstration, decoration, illuminations.
When yet LED is in pack into display device or lighting device now, often need not obtain all parameters of LED, only need the size of its angle of divergence of measurement, the spot size that in certain light path, irradiates to get final product.Yet so simple parameters is measured and but often equally need be adopted expensive equipment such as spectrometer, integrating sphere and complicated measuring process.Low-cost, quick in the difficult adaptation industrialization of this measurement measuring process, as to be convenient for measuring demand.
Summary of the invention
In view of this, be necessary to provide a kind of low cost, quick, and the light source measuring method of convenient measurement.
A kind of light source measuring method; It is used to measure at least one light source, and said light source measuring method may further comprise the steps: a chart board is provided, is pre-painted with at least one measured pattern on the said chart board; Said measured pattern comprises central point and a plurality of lines, and said a plurality of lines are arranged in the center to the surrounding; With a measured pattern on the said chart board of the corresponding irradiation of a light source; Utilization can the said light emitted of sensing the filming apparatus of light take by the measured pattern of said light source irradiation; In the image of taking,, obtain the scope in the zone of light source irradiation according to rayed occupied zone and corresponding lines in measured pattern.
Light source measuring method provided by the invention need not expensive equipment and complicated operations, only needs just can obtain the size and the angle of divergence in the zone of light source irradiation simply, fast with reference to said measured pattern.
Description of drawings
The synoptic diagram of the light source measuring method that Fig. 1 provides for first embodiment of the invention.
Fig. 2 is the measured drawing of the light source hot spot of Fig. 1.
The synoptic diagram of the light source measuring method that Fig. 3 provides for second embodiment of the invention.
Fig. 4 is the measured drawing of the light source angle of divergence of Fig. 3.
Fig. 5 is the luminous intensity distribution plot of the light source of Fig. 3.
Embodiment
See also Fig. 1 and Fig. 2, a kind of light source measuring method that first embodiment of the invention provides.This light source measuring method is used for measuring the spot size that a light source 9 irradiates at certain light path.In this embodiment, said light source measuring method is used to measure an infrared light-emitting diode.Said light source measuring method may further comprise the steps:
The first step provides a chart board 10, is pre-painted with at least one measured pattern 11 on the said chart board 10.Can pre-rendered one or more measured patterns 11 on the said chart board 10.When needs in batches, when fast a plurality of light sources 9 being tested, can draw test when accomplishing a plurality of light source 9 of a plurality of measured patterns 11 on the said chart board 10.In this embodiment, said chart board 10 is pre-rendered to have a measured pattern 11.Said measured pattern 11 comprises central point O and a plurality of lines L, said a plurality of lines L with central point O to around arrange.In this embodiment, said measured pattern 11 is to be a plurality of concentric circless in the center of circle with central point O.In this embodiment, it is that a plurality of radiuses in the center of circle differ 1 millimeter concentric circles with central point O that said measured pattern 11 is 4, and wherein the diameter of the round 11a in bosom is 1 millimeter.
In second step, utilize the measured pattern 11 on the said chart board 10 of light source 9 irradiations.In this embodiment, with the center O of the said measured pattern 11 of said light source 9 vertical irradiations.
In the 3rd step, utilize the filming apparatus 20 of the light of can sensing said light source 9 emissions to take by the measured pattern 11 of said light source 9 irradiations.Said filming apparatus 20 can be digital camera, have the electronic installations such as mobile phone of camera function, also can be the CIS that is connected with display device, memory device.In this embodiment, for easy to use, said filming apparatus 20 adopts easily available digital camera.Though digital camera is loaded onto infrared filter in camera lens inside, sensed but still have infrared ray partly.This is because infrared filter can't be accomplished 100% filtering infrared ray, and just infrared ray is not easy to be perceived than visible wavelength range on reality is used.In this testing procedure, find that through taking said filming apparatus 20 can be shot the hot spot of said light source 9 very clearly, and is as shown in Figure 2.
In the 4th step, in the image of taking,, obtain the scope in the zone of light source irradiation according to light-struck zone and corresponding lines occupied in measured pattern.In this embodiment, said measured pattern 11 is concentric circless of 1 millimeter of 4 spacing, falls into the position of measured pattern 11 according to light source 9 irradiation areas, can draw the spot size of light source 9 fast.As can be seen from Figure 2, the hot spot of said light source 9 is fallen on second concentric circles 11b of said measured pattern 11, is 3 millimeters so the diameter of second the concentric circles 11b that directly draws out according to measured pattern 11 obtains the spot diameter size of said light source 9.
See also Fig. 3, be the light source measuring method that second embodiment of the invention provides, the size of these light source measuring method measurement light source 9 angles of divergence.The light source measuring method that this light source measuring method and first embodiment provide is basic identical, and its difference is, the measured pattern of drawing on the chart board 110 that this light source measuring method adopts 111 be by central point O ' send to around many ray L ' arranging.In this embodiment, said many ray L ' whenever are distributed in the 180 degree scopes at a distance from 5 degree isogonisms.
During the said measured pattern 111 of light source 9 irradiation; Central shaft MM ' by the said measured pattern in said central point O ' beginning edge shines said measured pattern; In this embodiment; Said light source 9 clings to the central point O ' on the chart board 110, and sidelight shines said measured pattern 110 to obtain the dispersion angle of said light source 9.
By can finding out among Fig. 4, said light source 9 shines 111 last times of said measured pattern, and the zone of light source 9 irradiations occupies 6 rays, and its angle of divergence is 30 degree, and this test result is identical with the angle of divergence of LED among specification Fig. 5 that the LED that tests usefulness provides.
Light source measuring method provided by the invention need not expensive equipment and complicated operations, only needs just can obtain the size and the angle of divergence in the zone of light source irradiation simply, fast with reference to said measured pattern.
Those skilled in the art will be appreciated that; Above embodiment only is to be used for explaining the present invention; And be not to be used as qualification of the present invention; As long as within connotation scope of the present invention, the appropriate change that above embodiment is done all drops within the scope that the present invention requires to protect with changing.

Claims (5)

1. a light source measuring method is characterized in that, it is used to measure at least one light source, and said light source measuring method may further comprise the steps:
One chart board is provided, is pre-painted with at least one measured pattern on the said chart board, said measured pattern comprises central point and a plurality of lines, and said a plurality of lines are arranged in the center to the surrounding;
With a measured pattern on the said chart board of the corresponding irradiation of a light source;
Utilization can the said light emitted of sensing the filming apparatus of light take by the measured pattern of said light source irradiation;
In the image of taking,, obtain the scope in the zone of light source irradiation according to rayed occupied zone and corresponding lines in measured pattern.
2. light source measuring method as claimed in claim 1 is characterized in that, the only infrared ray that said at least one light source sends.
3. light source measuring method as claimed in claim 1; It is characterized in that said measured pattern is a plurality of equally spaced concentric circless, said each light source is over against the center irradiation of said each measured pattern; According to the concentric circles that the rayed zone falls into, obtain the spot size of light source irradiation.
4. light source measuring method as claimed in claim 1; It is characterized in that; The ray that axisymmetric many isogonisms in center that said measured pattern is sent by central point are arranged is formed; Said each light source is begun to shine said measured pattern along the central shaft of said measured pattern by said central point, according to the ray that the rayed zone falls into, obtains the angle of divergence size of light source irradiation.
5. light source measuring method as claimed in claim 1 is characterized in that said light source is a light emitting diode.
CN 200910302888 2009-06-03 2009-06-03 Light source measuring method Expired - Fee Related CN101907511B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 200910302888 CN101907511B (en) 2009-06-03 2009-06-03 Light source measuring method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 200910302888 CN101907511B (en) 2009-06-03 2009-06-03 Light source measuring method

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CN101907511A CN101907511A (en) 2010-12-08
CN101907511B true CN101907511B (en) 2012-12-19

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1367663A (en) * 1999-09-08 2002-09-04 Amt技术公司 Ocular biometer
CN1673708A (en) * 2004-03-23 2005-09-28 九骅科技股份有限公司 Lens optical analysis measuring system

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09269278A (en) * 1996-04-02 1997-10-14 Olympus Optical Co Ltd Lens performance measuring method and measuring device
JP2005221365A (en) * 2004-02-05 2005-08-18 Olympus Corp Lens performance inspection device
JP2006266971A (en) * 2005-03-25 2006-10-05 Fujinon Corp Lens inspection device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1367663A (en) * 1999-09-08 2002-09-04 Amt技术公司 Ocular biometer
CN1673708A (en) * 2004-03-23 2005-09-28 九骅科技股份有限公司 Lens optical analysis measuring system

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
JP特开2005-221365A 2005.08.18
JP特开2006-266971A 2006.10.05
JP特开平9-269278A 1997.10.14

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