CN101865671A - Projection three-dimensional measurement method - Google Patents
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- CN101865671A CN101865671A CN 201010196473 CN201010196473A CN101865671A CN 101865671 A CN101865671 A CN 101865671A CN 201010196473 CN201010196473 CN 201010196473 CN 201010196473 A CN201010196473 A CN 201010196473A CN 101865671 A CN101865671 A CN 101865671A
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Abstract
The invention relates to a projection three-dimensional measurement method, which comprises the following steps of: setting light source density, camera exposure time and gain value twice, respectively performing three-dimensional measurement on a bright part and a dark part of the surface, and screening measurement results according to a preset threshold; and finally, obtaining a three-dimensional result of the surface of an object to be measured. The invention develops and designs a three-dimensional measurement method capable of solving the problem that the object to be measured has big contrast of black and white. The dynamic range of PMP three-dimensional measurement is greatly improved; when the dark part is measured, because the light source density is improved, the diffuse reflection of the surface of the object to be measured is enhanced and the influence of a shade on the three-dimensional measurement can also be reduced.
Description
Technical field
The present invention relates to a kind of method for three-dimensional measurement, be specifically related to a kind of three-dimensional measurement of objects method of utilizing shadow casting technique.
Background technology
At present, existing phase modulation (PM) demodulation 3 dimension profilometries are white light scanning survey modes.Following technical characterictic is arranged: the directional light of light source generation before this, structured light process lens lighting measuring object through the grating generation, after grating moved N time, image collecting device was gathered N width of cloth image successively, calculated two three-dimensional Fig. 3 through the phase modulation (PM) demodulating algorithm and tieed up measurement.When scanning and measuring apparatus is measured, the intensity of light source, it is constant that the time shutter of camera and yield value keep, like this when the bright dark variation of measuring object surface color is obvious, as there being the surface of black and white simultaneously, because CCD is subjected to the restriction of sensitization dynamic range mutually, can exist under-exposure simultaneously and situation overexposure, the common white photoscanning can't obtain 3 dimension measurement results of entire image like this.
Summary of the invention
The present invention is directed to the deficiencies in the prior art, development and Design goes out a kind of method for three-dimensional measurement that can solve the big contrast measurand of black and white;
The present invention is achieved by the following technical solutions:
A kind of projection three-dimensional measurement method is set the intensity of light source at twice, and camera exposure time and yield value divide its surperficial highlights respectively and dark-part is done three-dimensional measurement, and measurement result is done screening according to reservation threshold, obtain testee surface three dimension result at last.
A kind of projection three-dimensional measurement method is the raster image of gathering reflection of testee dark-part and testee highlights sub reflector respectively furtherly; Use identical phase modulation (PM) demodulating algorithm to calculate twice three-dimensional measuring result of testee then, wherein once being benchmark, if the gray-scale value of pixel can't reach threshold values, make alternatively of the measurement result of another time, finally obtain the three-dimensional measuring result of measurand highlights branch and dark-part.
A kind of projection three-dimensional measurement method may further comprise the steps furtherly:
(1) sets camera and be the long time shutter, the high-gain mode, projection light source is a high brightness, and projection and gather N and open the reflection picture of structured light on the measuring object surface successively calculates three-dimensional result and marks the big pixel with the setting threshold values of in N time is measured average gray value simultaneously;
(2) setting camera is short exposure time, the low gain mode, projection light source is low-light level, projection and gather N and open the reflection picture of structured light successively on the measuring object surface, calculate three-dimensional result mark simultaneously in N time is measured average gray value less than with the pixel of setting threshold values;
(3) be benchmark with once measurement data wherein at last, wherein the three-dimensional value of the pixel crossed of mark substitutes with the height value of another time measurement, draws the three-dimensional value of measuring object surface highlights branch and dark-part at last.
A kind of projection three-dimensional measurement method may further comprise the steps furtherly:
(1) the projection structured light first time is set camera and is the long time shutter, and high-gain mode, projection light source are high brightness, gather the reflectogram image scale and put into one group; The setting camera is a short exposure time, and low gain mode, projection light source are low-light level, gathers the reflectogram image scale and puts into one group;
(2) from the set of diagrams picture, calculate three-dimensional result mark simultaneously in N time is measured average gray value big with the pixel of setting threshold values, from another group calculate image three-dimensional result mark simultaneously in N time is measured average gray value less than with the pixel of setting threshold values, be benchmark at last with once measurement data wherein, wherein the three-dimensional value of the pixel crossed of mark substitutes with the height value of another time measurement, draws at last that measuring object surface highlights divides and the three-dimensional value of dark-part.
A kind of projection three-dimensional measurement method is not all demarcated pixel for twice measurement simultaneously and is got the mean value of twice measurement result as this pixel end product.
A kind of projection three-dimensional measurement method, the three-dimensional measurement that is carried out carries out at least twice, uses at least twice three-dimensional measurement, is integrated into final three-dimensional result at last.
When the present invention does three-dimensional measurement to testee, set the intensity of light source at twice, camera exposure time and yield value divide its surperficial highlights respectively and dark-part is done three-dimensional measurement, measurement result is done screening according to reservation threshold, obtain testee surface three dimension result at last.Use twice phase modulation (PM) demodulation three-D profile algorithm (PMP) to realize high precision and the repeatability of measuring, twice phase modulation (PM) demodulation three-D profile algorithm is existing algorithm.Can adapt to simultaneously the measurand of wide region in actual applications, when there is the black and white part simultaneously in the measurand surface, still can obtain the high accuracy three-dimensional measurement result, improve the dynamic range of PMP three-dimensional measurement greatly.Because the intensity of light source increases, the diffuse reflection on testee surface also strengthens simultaneously, can also reduce the influence of shade to three-dimensional measurement when dark-part being done measurement.For the king-sized measured object of bright dark variation surface, as minute surface, the black and white ceramic surface also can use above three-dimensional measurement twice, is integrated into final three-dimensional result at last.
Description of drawings
Fig. 1 is the process flow diagram of embodiment 1 method.
Fig. 2 is the process flow diagram of embodiment 2 methods.
Embodiment,
Embodiment 1
Described referring to accompanying drawing 1.
At first gather the measuring object surface and be dark three-dimensional data:
Set the CCD camera and be the long time shutter, the high-gain mode, projection light source is a high brightness, and projection and gather N and open the reflection picture of structured light on the measuring object surface successively calculates three-dimensional result and marks the big pixel with the setting threshold values of in N time is measured average gray value simultaneously.
Next is gathered the measuring object surface and is bright three-dimensional data, and method is as follows:
Setting the CCD camera is short exposure time, the low gain mode, projection light source is low-light level, projection and gather N and open the reflection picture of structured light successively on the measuring object surface, calculate three-dimensional result mark simultaneously in N time is measured average gray value less than with the pixel of setting threshold values.
Be benchmark with once measurement data wherein at last, wherein the three-dimensional value of the pixel crossed of mark substitutes with the height value of another time measurement, draws the three-dimensional value of measuring object surface highlights branch and dark-part at last.All do not demarcate pixel for twice measurement simultaneously and can get the mean value of twice measurement result yet as this pixel end product.For the king-sized measured object of bright dark variation surface, as minute surface, the black and white ceramic surface also can use above three-dimensional measurement twice, is integrated into final three-dimensional result at last.
This method is applicable to that projection light source switching required time is shorter than the camera occasion in every frame data transmission time.
Embodiment 2
Described referring to accompanying drawing 2.
Projection is structured light for the first time, sets camera and is the long time shutter, and high-gain mode, projection light source are high brightness, gather the reflectogram image scale and put into the A group; The setting camera is a short exposure time, and low gain mode, projection light source are low-light level, gathers the reflectogram image scale and puts into the A group.
From A group image, calculate three-dimensional result and mark the big pixel with the setting threshold values of in N time is measured average gray value simultaneously, from B group image, calculate three-dimensional result mark simultaneously in N time is measured average gray value less than with the pixel of setting threshold values, be benchmark at last with once measurement data wherein, wherein the three-dimensional value of the pixel crossed of mark substitutes with the height value of another time measurement, draws at last that measuring object surface highlights divides and the three-dimensional value of dark-part.All do not demarcate pixel for twice measurement simultaneously and can get the mean value of twice measurement result yet as this pixel end product.For the king-sized measured object of bright dark variation surface, as minute surface, the black and white ceramic surface also can use above three-dimensional measurement twice, is integrated into final three-dimensional result at last.
This method is applicable to that every frame data transmission time of camera is shorter than the occasion that projection light source is switched required time.
Claims (6)
1. projection three-dimensional measurement method, set the intensity of light source at twice, camera exposure time and yield value divide its surperficial highlights respectively and dark-part is done three-dimensional measurement, measurement result is done screening according to reservation threshold, obtain testee surface three dimension result at last.
2. a kind of projection three-dimensional measurement method according to claim 1 is characterized in that: the raster image of gathering reflection of testee dark-part and testee highlights sub reflector respectively; Use identical phase modulation (PM) demodulating algorithm to calculate twice three-dimensional measuring result of testee then, wherein once being benchmark, measurement result is done screening according to reservation threshold, if the gray-scale value of pixel can't reach threshold values, make alternatively of the measurement result of another time, obtain finally that the measurand highlights divides and the three-dimensional measuring result of dark-part.
3. a kind of projection three-dimensional measurement method according to claim 2 is characterized in that:
(1) sets camera and be the long time shutter, the high-gain mode, projection light source is a high brightness, and projection and gather N and open the reflection picture of structured light on the measuring object surface successively calculates three-dimensional result and marks the big pixel with the setting threshold values of in N time is measured average gray value simultaneously;
(2) setting camera is short exposure time, the low gain mode, projection light source is low-light level, projection and gather N and open the reflection picture of structured light successively on the measuring object surface, calculate three-dimensional result mark simultaneously in N time is measured average gray value less than with the pixel of setting threshold values;
(3) be benchmark with once measurement data wherein at last, wherein the three-dimensional value of the pixel crossed of mark substitutes with the height value of another time measurement, draws the three-dimensional value of measuring object surface highlights branch and dark-part at last.
4. a kind of projection three-dimensional measurement method according to claim 2 is characterized in that:
(1) the projection structured light first time is set camera and is the long time shutter, and high-gain mode, projection light source are high brightness, gather the reflectogram image scale and put into one group; The setting camera is a short exposure time, and low gain mode, projection light source are low-light level, gathers the reflectogram image scale and puts into one group;
(2) from the set of diagrams picture, calculate three-dimensional result mark simultaneously in N time is measured average gray value big with the pixel of setting threshold values, from another group calculate image three-dimensional result mark simultaneously in N time is measured average gray value less than with the pixel of setting threshold values, be benchmark at last with once measurement data wherein, wherein the three-dimensional value of the pixel crossed of mark substitutes with the height value of another time measurement, draws at last that measuring object surface highlights divides and the three-dimensional value of dark-part.
5. according to claim 3 or 4 described a kind of projection three-dimensional measurement methods, it is characterized in that: all do not demarcate pixel for twice measurement simultaneously and get the mean value of twice measurement result as this pixel end product.
6. according to each described a kind of projection three-dimensional measurement method of claim 2～4, it is characterized in that: the three-dimensional measurement that is carried out carries out at least twice, uses at least twice three-dimensional measurement, is integrated into final three-dimensional result at last.
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| CN104049447A (en) * | 2013-03-14 | 2014-09-17 | 科视数字系统加拿大股份有限公司 | System and method for zonal switching for light steering to produce an image having high dynamic range |
| CN104236482A (en) * | 2014-09-11 | 2014-12-24 | 四川大学 | Phase measuring profilometry system nonlinear correction method combining geometric calibration |
| CN104769388A (en) * | 2012-11-14 | 2015-07-08 | 高通股份有限公司 | Dynamic adjustment of light source power in structured light active depth sensing systems |
| CN107144239A (en) * | 2016-03-01 | 2017-09-08 | 杭州腾聚科技有限公司 | A kind of Gain Automatic adjusting method of handheld structure light spatial digitizer |
| CN108332720A (en) * | 2014-11-12 | 2018-07-27 | 原相科技股份有限公司 | Optical ranging system |
| CN108613637A (en) * | 2018-04-13 | 2018-10-02 | 深度创新科技（深圳）有限公司 | A kind of structured-light system solution phase method and system based on reference picture |
| CN108616727A (en) * | 2016-12-23 | 2018-10-02 | 光宝电子(广州)有限公司 | Exposal control method based on structure light and exposure-control device |
| CN110702031A (en) * | 2019-11-19 | 2020-01-17 | 四川长虹电器股份有限公司 | Three-dimensional scanning device and method suitable for dark surface |
| CN111174704A (en) * | 2019-11-26 | 2020-05-19 | 武汉华工激光工程有限责任公司 | Method for measuring height of tin ball by gray image |
| CN112082513A (en) * | 2020-09-09 | 2020-12-15 | 易思维（杭州）科技有限公司 | Multi-laser-array three-dimensional scanning system and method |
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| CN104769388B (en) * | 2012-11-14 | 2018-11-27 | 高通股份有限公司 | The dynamic of light source power is adjusted in structure light active depth sense system |
| US11509880B2 (en) | 2012-11-14 | 2022-11-22 | Qualcomm Incorporated | Dynamic adjustment of light source power in structured light active depth sensing systems |
| CN104769388A (en) * | 2012-11-14 | 2015-07-08 | 高通股份有限公司 | Dynamic adjustment of light source power in structured light active depth sensing systems |
| CN109612404B (en) * | 2012-11-14 | 2021-02-26 | 高通股份有限公司 | Dynamic adjustment of light source power in structured light active depth sensing systems |
| US10368053B2 (en) | 2012-11-14 | 2019-07-30 | Qualcomm Incorporated | Structured light active depth sensing systems combining multiple images to compensate for differences in reflectivity and/or absorption |
| CN109612404A (en) * | 2012-11-14 | 2019-04-12 | 高通股份有限公司 | The dynamic of light source power is adjusted in structure light active depth sense system |
| CN104049447B (en) * | 2013-03-14 | 2017-10-13 | 科视数字系统加拿大股份有限公司 | The region of signal light control is used to switch with the system and method for the image for generating HDR |
| CN104049447A (en) * | 2013-03-14 | 2014-09-17 | 科视数字系统加拿大股份有限公司 | System and method for zonal switching for light steering to produce an image having high dynamic range |
| CN104236482B (en) * | 2014-09-11 | 2016-09-28 | 四川大学 | Phase measuring profilometer mission nonlinear bearing calibration in conjunction with geometric calibration |
| CN104236482A (en) * | 2014-09-11 | 2014-12-24 | 四川大学 | Phase measuring profilometry system nonlinear correction method combining geometric calibration |
| US11221207B2 (en) | 2014-11-04 | 2022-01-11 | Pixart Imaging Inc. | Optical distance measurement system |
| CN108332720A (en) * | 2014-11-12 | 2018-07-27 | 原相科技股份有限公司 | Optical ranging system |
| CN107144239A (en) * | 2016-03-01 | 2017-09-08 | 杭州腾聚科技有限公司 | A kind of Gain Automatic adjusting method of handheld structure light spatial digitizer |
| CN108616727A (en) * | 2016-12-23 | 2018-10-02 | 光宝电子(广州)有限公司 | Exposal control method based on structure light and exposure-control device |
| CN108613637B (en) * | 2018-04-13 | 2020-04-07 | 深度创新科技（深圳）有限公司 | Structured light system dephasing method and system based on reference image |
| CN108613637A (en) * | 2018-04-13 | 2018-10-02 | 深度创新科技（深圳）有限公司 | A kind of structured-light system solution phase method and system based on reference picture |
| CN110702031A (en) * | 2019-11-19 | 2020-01-17 | 四川长虹电器股份有限公司 | Three-dimensional scanning device and method suitable for dark surface |
| CN111174704A (en) * | 2019-11-26 | 2020-05-19 | 武汉华工激光工程有限责任公司 | Method for measuring height of tin ball by gray image |
| CN111174704B (en) * | 2019-11-26 | 2022-04-19 | 武汉华工激光工程有限责任公司 | Method for measuring height of tin ball by gray image |
| CN112082513A (en) * | 2020-09-09 | 2020-12-15 | 易思维（杭州）科技有限公司 | Multi-laser-array three-dimensional scanning system and method |
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