CN101865671B - Projection three-dimensional measurement method - Google Patents
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- CN101865671B CN101865671B CN2010101964735A CN201010196473A CN101865671B CN 101865671 B CN101865671 B CN 101865671B CN 2010101964735 A CN2010101964735 A CN 2010101964735A CN 201010196473 A CN201010196473 A CN 201010196473A CN 101865671 B CN101865671 B CN 101865671B
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Abstract
The invention relates to a projection three-dimensional measurement method, which comprises the following steps of: setting light source density, camera exposure time and gain value twice, respectively performing three-dimensional measurement on a bright part and a dark part of the surface, and screening measurement results according to a preset threshold; and finally, obtaining a three-dimensional result of the surface of an object to be measured. The invention develops and designs a three-dimensional measurement method capable of solving the problem that the object to be measured has big contrast of black and white. The dynamic range of PMP three-dimensional measurement is greatly improved; when the dark part is measured, because the light source density is improved, the diffuse reflection of the surface of the object to be measured is enhanced and the influence of a shade on the three-dimensional measurement can also be reduced.
Description
Technical field
The present invention relates to a kind of method for three-dimensional measurement, be specifically related to a kind of three-dimensional measurement of objects method of utilizing shadow casting technique.
Background technology
At present, existing phase modulation (PM) demodulation 3 dimension profilometries are white light scanning survey modes.Following technical characterictic is arranged: the directional light of light source generation before this; Structured light process lens lighting measuring object through the grating generation; After grating moved N time, image collecting device was gathered N width of cloth image successively, calculated two three-dimensional Fig. 3 through the phase modulation (PM) demodulating algorithm and tieed up measurement.When scanning and measuring apparatus is measured; The intensity of light source, the time shutter of camera and yield value keep constant, like this when the bright dark variation of measuring object surface color is obvious; As there is the surface of black and white simultaneously; Because CCD receives the restriction of sensitization dynamic range mutually, can exist under-exposure simultaneously and situation overexposure, the common white photoscanning can't obtain 3 dimension measurement results of entire image like this.
Summary of the invention
The present invention is directed to the deficiency of prior art, development and Design goes out a kind of method for three-dimensional measurement that can solve the big contrast measurand of black and white;
The present invention realizes through following technical scheme:
A kind of projection three-dimensional measurement method is set the intensity of light source at twice, and camera exposure time and yield value are done three-dimensional measurement to its surperficial bright parts and dark-part respectively, and measurement result is done screening according to reservation threshold, obtain testee surface three dimension result at last.
A kind of projection three-dimensional measurement method is the raster image of gathering reflection of testee dark-part and the reflection of testee bright parts respectively furtherly; Use identical phase modulation (PM) demodulating algorithm to calculate twice three-dimensional measuring result of testee then; Wherein once being benchmark; If the gray-scale value of pixel can't reach threshold values, the measurement result of another time of usefulness is done alternative, finally obtains the three-dimensional measuring result of measurand bright parts and dark-part.
A kind of projection three-dimensional measurement method may further comprise the steps furtherly:
(1) sets camera and be the long time shutter; The high-gain mode; Projection light source is a high brightness, successively projection with gather N and open the reflection picture of structured light on the measuring object surface, calculate three-dimensional result and mark the big pixel with the setting threshold values of in N time is measured average gray value simultaneously;
(2) setting camera is short exposure time; The low gain mode; Projection light source is low-light level, successively projection with gather N and open the reflection picture of structured light on the measuring object surface, calculate three-dimensional result mark simultaneously in N time is measured average gray value less than with the pixel of setting threshold values;
(3) be benchmark with once measurement data wherein at last, wherein the three-dimensional value of the pixel crossed of mark substitutes with the height value of another time measurement, draws the three-dimensional value of measuring object surface bright parts and dark-part at last.
A kind of projection three-dimensional measurement method may further comprise the steps furtherly:
(1) the projection structured light first time is set camera and is the long time shutter, and high-gain mode, projection light source are high brightness, gather the reflectogram image scale and put into one group; The setting camera is a short exposure time, and low gain mode, projection light source are low-light level, gathers the reflectogram image scale and puts into one group;
(2) from the set of diagrams picture, calculate three-dimensional result mark simultaneously in N time is measured average gray value big with the pixel of setting threshold values; From another picture group picture, calculate three-dimensional result mark simultaneously in N time is measured average gray value less than with the pixel of setting threshold values; Be benchmark at last with once measurement data wherein; Wherein the three-dimensional value of the pixel crossed of mark substitutes with the height value of another time measurement, draws the three-dimensional value of measuring object surface bright parts and dark-part at last.
A kind of projection three-dimensional measurement method is simultaneously all demarcated mean value that pixel gets twice measurement result as this pixel end product for twice measurement.
A kind of projection three-dimensional measurement method, the three-dimensional measurement that is carried out carries out at least twice, uses at least twice three-dimensional measurement, is integrated into final three-dimensional result at last.
When the present invention does three-dimensional measurement to testee; Set the intensity of light source at twice, camera exposure time and yield value are done three-dimensional measurement to its surperficial bright parts and dark-part respectively; Measurement result is done screening according to reservation threshold, obtain testee surface three dimension result at last.Use twice phase modulation (PM) demodulation three-D profile algorithm (PMP) to realize high precision and the repeatability of measuring, twice phase modulation (PM) demodulation three-D profile algorithm is existing algorithm.In practical application, can adapt to simultaneously the measurand of wide region, when there is the black and white part simultaneously in the measurand surface, still can obtain the high accuracy three-dimensional measurement result, improve the dynamic range of PMP three-dimensional measurement greatly.Because the intensity of light source increases, the diffuse reflection on testee surface also strengthens simultaneously, can also reduce the influence of shade to three-dimensional measurement when dark-part being done measurement.For the king-sized measured object of bright dark variation surface, like minute surface, the black and white ceramic surface also can use above three-dimensional measurement twice, is integrated into final three-dimensional result at last.
Description of drawings
Fig. 1 is the process flow diagram of embodiment 1 method.
Fig. 2 is the process flow diagram of embodiment 2 methods.
Embodiment,
Embodiment 1
Said referring to accompanying drawing 1.
At first gather the measuring object surface and be dark three-dimensional data:
Set the CCD camera and be the long time shutter; The high-gain mode; Projection light source is a high brightness, successively projection with gather N and open the reflection picture of structured light on the measuring object surface, calculate three-dimensional result and mark the big pixel with the setting threshold values of in N time is measured average gray value simultaneously.
Next is gathered the measuring object surface and is bright three-dimensional data, and method is following:
Setting the CCD camera is short exposure time; The low gain mode; Projection light source is low-light level, successively projection with gather N and open the reflection picture of structured light on the measuring object surface, calculate three-dimensional result mark simultaneously in N time is measured average gray value less than with the pixel of setting threshold values.
Be benchmark with once measurement data wherein at last, wherein the three-dimensional value of the pixel crossed of mark substitutes with the height value of another time measurement, draws the three-dimensional value of measuring object surface bright parts and dark-part at last.Simultaneously all demarcate mean value that pixel also can get twice measurement result as this pixel end product for twice measurement.For the king-sized measured object of bright dark variation surface, like minute surface, the black and white ceramic surface also can use above three-dimensional measurement twice, is integrated into final three-dimensional result at last.
This method is applicable to that projection light source switching required time is shorter than the camera occasion in every frame data transmission time.
Embodiment 2
Said referring to accompanying drawing 2.
Projection is structured light for the first time, sets camera and is the long time shutter, and high-gain mode, projection light source are high brightness, gather the reflectogram image scale and put into the A group; The setting camera is a short exposure time, and low gain mode, projection light source are low-light level, gathers the reflectogram image scale and puts into the A group.
From A picture group picture, calculate three-dimensional result mark simultaneously in N time is measured average gray value big with the pixel of setting threshold values; From B picture group picture, calculate three-dimensional result mark simultaneously in N time is measured average gray value less than with the pixel of setting threshold values; Be benchmark at last with once measurement data wherein; Wherein the three-dimensional value of the pixel crossed of mark substitutes with the height value of another time measurement, draws the three-dimensional value of measuring object surface bright parts and dark-part at last.Simultaneously all demarcate mean value that pixel also can get twice measurement result as this pixel end product for twice measurement.For the king-sized measured object of bright dark variation surface, like minute surface, the black and white ceramic surface also can use above three-dimensional measurement twice, is integrated into final three-dimensional result at last.
This method is applicable to that every frame data transmission time of camera is shorter than the occasion that projection light source is switched required time.
Claims (6)
1. projection three-dimensional measurement method; It is characterized in that: set the intensity of light source at twice; Camera exposure time and yield value; Respectively the bright parts and the dark-part on testee surface are done three-dimensional measurement, promptly gather the raster image of reflection of testee dark-part and the reflection of testee bright parts respectively; Use identical phase modulation (PM) demodulating algorithm to calculate twice three-dimensional measuring result of testee then; Wherein once being benchmark; Measurement result is done screening according to predetermined threshold; If the gray-scale value of pixel can't reach threshold value, the measurement result of another time of usefulness is done alternative, finally obtains the three-dimensional measuring result of testee bright parts and dark-part; That is:
(1) sets camera and be the long time shutter; The high-gain mode; Projection light source is a high brightness, successively projection with gather N and open the reflection picture of structured light on the testee surface, calculate three-dimensional result and mark in N measurement average gray value simultaneously greater than the pixel of setting threshold;
(2) setting camera is short exposure time; The low gain mode; Projection light source is low-light level, successively projection with gather N and open the reflection picture of structured light on the testee surface, calculate three-dimensional result and mark in N measurement average gray value simultaneously less than the pixel of setting threshold;
(3) be benchmark with once measurement data wherein at last, wherein the height value of the pixel crossed of mark substitutes with the height value of another time measurement, draws the three-dimensional value of testee surface bright parts and dark-part at last.
2. a kind of projection three-dimensional measurement method according to claim 1 is characterized in that: the mean value that the pixel of all not demarcating for twice measurement is simultaneously got twice measurement result is as this pixel end product.
3. a kind of projection three-dimensional measurement method according to claim 1, it is characterized in that: the three-dimensional measurement that is carried out carries out twice, uses twice three-dimensional measurement, is integrated into final three-dimensional result at last.
4. projection three-dimensional measurement method; It is characterized in that: set the intensity of light source at twice; Camera exposure time and yield value; Respectively the bright parts and the dark-part on testee surface are done three-dimensional measurement, promptly gather the raster image of reflection of testee dark-part and the reflection of testee bright parts respectively; Use identical phase modulation (PM) demodulating algorithm to calculate twice three-dimensional measuring result of testee then; Wherein once being benchmark; Measurement result is done screening according to predetermined threshold; If the gray-scale value of pixel can't reach threshold value, the measurement result of another time of usefulness is done alternative, finally obtains the three-dimensional measuring result of testee bright parts and dark-part; That is:
(1) the projection structured light first time is set camera and is the long time shutter, and high-gain mode, projection light source are high brightness, and collection reflectogram image scale is put into A and organized; The setting camera is a short exposure time, and low gain mode, projection light source are low-light level, gathers the reflectogram image scale and puts into the B group; Projection N aggregated(particle) structure light repeats this step successively;
(2) from the set of diagrams picture, calculate three-dimensional result and mark in N time is measured average gray value simultaneously greater than the pixel of setting threshold; From another picture group picture, calculate three-dimensional result and mark in N time is measured average gray value simultaneously less than the pixel of setting threshold; Be benchmark at last with once measurement data wherein; Wherein the height value of the pixel crossed of mark substitutes with the height value of another time measurement, draws the three-dimensional value of testee surface bright parts and dark-part at last.
5. a kind of projection three-dimensional measurement method according to claim 4 is characterized in that: the mean value that the pixel of all not demarcating for twice measurement is simultaneously got twice measurement result is as this pixel end product.
6. a kind of projection three-dimensional measurement method according to claim 4, it is characterized in that: the three-dimensional measurement that is carried out carries out twice, uses twice three-dimensional measurement, is integrated into final three-dimensional result at last.
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| CN104236482B (en) * | 2014-09-11 | 2016-09-28 | 四川大学 | Phase measuring profilometer mission nonlinear bearing calibration in conjunction with geometric calibration |
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| CN110702031B (en) * | 2019-11-19 | 2021-08-27 | 四川长虹电器股份有限公司 | Three-dimensional scanning device and method suitable for dark surface |
| CN111174704B (en) * | 2019-11-26 | 2022-04-19 | 武汉华工激光工程有限责任公司 | Method for measuring height of tin ball by gray image |
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