CN101819030A - 磁控溅射靶材表面粗糙度的监测方法和系统 - Google Patents
磁控溅射靶材表面粗糙度的监测方法和系统 Download PDFInfo
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- CN101819030A CN101819030A CN200910078644A CN200910078644A CN101819030A CN 101819030 A CN101819030 A CN 101819030A CN 200910078644 A CN200910078644 A CN 200910078644A CN 200910078644 A CN200910078644 A CN 200910078644A CN 101819030 A CN101819030 A CN 101819030A
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CN2009100786441A CN101819030B (zh) | 2009-02-27 | 2009-02-27 | 磁控溅射靶材表面粗糙度的监测方法和系统 |
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CN2009100786441A CN101819030B (zh) | 2009-02-27 | 2009-02-27 | 磁控溅射靶材表面粗糙度的监测方法和系统 |
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CN101819030A true CN101819030A (zh) | 2010-09-01 |
CN101819030B CN101819030B (zh) | 2012-05-30 |
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Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103328957A (zh) * | 2011-01-26 | 2013-09-25 | 西门子公司 | 用于检查对象以检测表面破损的方法和设备 |
CN103620338A (zh) * | 2011-06-29 | 2014-03-05 | 维尔贝莱特集团公司 | 表面测量系统以及方法 |
CN104867822A (zh) * | 2015-06-07 | 2015-08-26 | 上海华虹宏力半导体制造有限公司 | 一种锗层及半导体器件的制作方法 |
CN109416247A (zh) * | 2016-04-26 | 2019-03-01 | 芬兰国家技术研究中心股份公司 | 与薄膜层分析有关的设备及其制造方法 |
CN111876746A (zh) * | 2020-07-09 | 2020-11-03 | Tcl华星光电技术有限公司 | 防着板 |
CN113483702A (zh) * | 2021-07-26 | 2021-10-08 | 宁波江丰电子材料股份有限公司 | 一种靶材表面粗糙度的无痕检测方法 |
CN115595544A (zh) * | 2022-10-31 | 2023-01-13 | 宁波工程学院(Cn) | 检测金属靶材溅射性能的方法 |
CN116275600A (zh) * | 2023-05-19 | 2023-06-23 | 济南邦德激光股份有限公司 | 一种激光切割机的智能化切割数据处理方法、装置及设备 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW484039B (en) * | 1999-10-12 | 2002-04-21 | Asm Lithography Bv | Lithographic projection apparatus and method |
EP1329770A1 (en) * | 2002-01-18 | 2003-07-23 | ASML Netherlands B.V. | Lithographic apparatus and device manufacturing method |
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- 2009-02-27 CN CN2009100786441A patent/CN101819030B/zh not_active Expired - Fee Related
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103328957A (zh) * | 2011-01-26 | 2013-09-25 | 西门子公司 | 用于检查对象以检测表面破损的方法和设备 |
CN103620338A (zh) * | 2011-06-29 | 2014-03-05 | 维尔贝莱特集团公司 | 表面测量系统以及方法 |
CN103620338B (zh) * | 2011-06-29 | 2017-02-15 | 维尔贝莱特集团公司 | 表面测量系统以及方法 |
CN104867822A (zh) * | 2015-06-07 | 2015-08-26 | 上海华虹宏力半导体制造有限公司 | 一种锗层及半导体器件的制作方法 |
CN109416247B (zh) * | 2016-04-26 | 2021-07-13 | 芬兰国家技术研究中心股份公司 | 与薄膜层分析有关的设备及其制造方法 |
CN109416247A (zh) * | 2016-04-26 | 2019-03-01 | 芬兰国家技术研究中心股份公司 | 与薄膜层分析有关的设备及其制造方法 |
US11385049B2 (en) | 2016-04-26 | 2022-07-12 | Teknologian Tutkimuskeskus Vtt Oy | Apparatus associated with analysis of thin film layer and manufacturing method thereof |
US11668561B2 (en) | 2016-04-26 | 2023-06-06 | Chipmetrics Oy | Apparatus associated with analysis of thin film layer and manufacturing method thereof |
CN111876746A (zh) * | 2020-07-09 | 2020-11-03 | Tcl华星光电技术有限公司 | 防着板 |
CN111876746B (zh) * | 2020-07-09 | 2023-02-03 | Tcl华星光电技术有限公司 | 清洁装置 |
CN113483702A (zh) * | 2021-07-26 | 2021-10-08 | 宁波江丰电子材料股份有限公司 | 一种靶材表面粗糙度的无痕检测方法 |
CN115595544A (zh) * | 2022-10-31 | 2023-01-13 | 宁波工程学院(Cn) | 检测金属靶材溅射性能的方法 |
CN115595544B (zh) * | 2022-10-31 | 2024-05-28 | 宁波工程学院 | 检测金属靶材溅射性能的方法 |
CN116275600A (zh) * | 2023-05-19 | 2023-06-23 | 济南邦德激光股份有限公司 | 一种激光切割机的智能化切割数据处理方法、装置及设备 |
CN116275600B (zh) * | 2023-05-19 | 2023-09-29 | 济南邦德激光股份有限公司 | 一种激光切割机的智能化切割数据处理方法、装置及设备 |
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CN101819030B (zh) | 2012-05-30 |
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