CN101805927B - Grower of high-purity semi-insulating silicon carbide single crystal - Google Patents
Grower of high-purity semi-insulating silicon carbide single crystal Download PDFInfo
- Publication number
- CN101805927B CN101805927B CN2010101523944A CN201010152394A CN101805927B CN 101805927 B CN101805927 B CN 101805927B CN 2010101523944 A CN2010101523944 A CN 2010101523944A CN 201010152394 A CN201010152394 A CN 201010152394A CN 101805927 B CN101805927 B CN 101805927B
- Authority
- CN
- China
- Prior art keywords
- silicon carbide
- semi
- insulating silicon
- cooling water
- growing apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 229910010271 silicon carbide Inorganic materials 0.000 title claims abstract description 50
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title claims abstract description 46
- 239000013078 crystal Substances 0.000 title abstract description 29
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 38
- 239000010439 graphite Substances 0.000 claims abstract description 38
- 239000000498 cooling water Substances 0.000 claims abstract description 33
- 238000000034 method Methods 0.000 claims abstract description 11
- 239000011261 inert gas Substances 0.000 claims abstract description 8
- 241000209456 Plumbago Species 0.000 claims description 33
- 230000000740 bleeding effect Effects 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 8
- 239000002184 metal Substances 0.000 claims 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 abstract description 14
- 239000007789 gas Substances 0.000 abstract description 14
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract description 9
- 229910052786 argon Inorganic materials 0.000 abstract description 7
- 238000005516 engineering process Methods 0.000 abstract description 6
- 229910002804 graphite Inorganic materials 0.000 abstract description 5
- 229910052757 nitrogen Inorganic materials 0.000 abstract description 4
- 229910001873 dinitrogen Inorganic materials 0.000 abstract 1
- 230000006698 induction Effects 0.000 abstract 1
- 239000012466 permeate Substances 0.000 abstract 1
- 239000000843 powder Substances 0.000 description 10
- 239000011229 interlayer Substances 0.000 description 8
- 239000010410 layer Substances 0.000 description 8
- 239000002245 particle Substances 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 229910052720 vanadium Inorganic materials 0.000 description 3
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 3
- 239000002826 coolant Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 239000011863 silicon-based powder Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000032696 parturition Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010101523944A CN101805927B (en) | 2010-04-20 | 2010-04-20 | Grower of high-purity semi-insulating silicon carbide single crystal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010101523944A CN101805927B (en) | 2010-04-20 | 2010-04-20 | Grower of high-purity semi-insulating silicon carbide single crystal |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101805927A CN101805927A (en) | 2010-08-18 |
CN101805927B true CN101805927B (en) | 2012-05-30 |
Family
ID=42607878
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2010101523944A Active CN101805927B (en) | 2010-04-20 | 2010-04-20 | Grower of high-purity semi-insulating silicon carbide single crystal |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN101805927B (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102260934A (en) * | 2011-02-24 | 2011-11-30 | 西安诚瑞科技发展有限公司 | Continuous induction heating type fiber high-temperature carbonizing device |
CN202643822U (en) * | 2011-06-17 | 2013-01-02 | 天津津航技术物理研究所 | Device capable of preparing zinc selenide or zinc sulfide lamination polycrystal optical material |
JP5556761B2 (en) | 2011-07-28 | 2014-07-23 | 株式会社デンソー | Silicon carbide single crystal manufacturing equipment |
CN103320851A (en) * | 2013-06-05 | 2013-09-25 | 中国科学院上海硅酸盐研究所 | Large-size 15R silicon carbide crystal preparation method |
CN106048729B (en) * | 2016-06-28 | 2019-04-09 | 山东天岳先进材料科技有限公司 | A kind of PVT method major diameter silicon carbide monocrystal growth device |
CN107723798B (en) * | 2017-10-30 | 2020-06-02 | 中国电子科技集团公司第四十六研究所 | Growth device and method for efficiently preparing high-purity semi-insulating silicon carbide single crystal |
CN108130593A (en) * | 2017-12-20 | 2018-06-08 | 中国科学院上海硅酸盐研究所 | A kind of crystal growing furnace attemperator |
CN111074333A (en) * | 2018-10-19 | 2020-04-28 | 中国电子科技集团公司第四十八研究所 | Single crystal growth equipment and use method thereof |
CN111411401A (en) * | 2020-05-22 | 2020-07-14 | 北京北方华创微电子装备有限公司 | Silicon carbide crystal growing device |
CN113122923B (en) * | 2021-04-16 | 2022-07-12 | 上海天岳半导体材料有限公司 | High-quality silicon carbide crystal and growing method and device thereof |
CN113637953B (en) * | 2021-08-06 | 2023-09-01 | 苏州步科斯新材料科技有限公司 | Rapid cooling silicon carbide coating deposition device and use method |
CN116815001A (en) * | 2023-08-31 | 2023-09-29 | 西安聚能超导线材科技有限公司 | Preparation method of tin-titanium alloy rod, tin-titanium alloy rod and superconducting wire |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5683507A (en) * | 1995-09-05 | 1997-11-04 | Northrop Grumman Corporation | Apparatus for growing large silicon carbide single crystals |
CN1247831C (en) * | 2003-11-14 | 2006-03-29 | 中国科学院物理研究所 | Silicon carbide crystal growth apparatus |
-
2010
- 2010-04-20 CN CN2010101523944A patent/CN101805927B/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN101805927A (en) | 2010-08-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101805927B (en) | Grower of high-purity semi-insulating silicon carbide single crystal | |
CN107723798B (en) | Growth device and method for efficiently preparing high-purity semi-insulating silicon carbide single crystal | |
US20150361580A1 (en) | Device and method for producing multi silicon carbide crystals | |
CN104562206B (en) | It is a kind of to improve the method that physical vapor transport grows 4H SiC crystal habit stability | |
JP2010006699A (en) | LOW BASAL PLANE DISLOCATION BULK GROWN SiC WAFER | |
CN102197168A (en) | Method and apparatus for manufacturing SiC single crystal film | |
CN106048729B (en) | A kind of PVT method major diameter silicon carbide monocrystal growth device | |
CN108946735B (en) | Synthesis method of large-particle-size silicon carbide powder for silicon carbide crystal growth | |
CN101812723A (en) | Method and device for growing silicon carbide signal crystals based on physical vapor transport technology | |
CN206244919U (en) | A kind of grower of semi-insulation SiC monocrystalline | |
CN104947182A (en) | Method for rapidly growing large-size high-purity semi-insulating silicon carbide single crystal | |
CN102703966A (en) | Device for growing carbonization silicon single crystal by using seed crystal temperature gradient method | |
CN109825875A (en) | Carrier gas auxiliary PVT method prepares the device and method of wide bandgap semiconductor monocrystal material | |
US20240183063A1 (en) | Method for sic step flow growth by regulating growth monmoers using chemical potential under non-equilibrium condition | |
CN109137077A (en) | A kind of preparation facilities and method of high-purity silicon carbide | |
CN115094514B (en) | Composite material crucible and preparation method thereof | |
CN112553694A (en) | Method and device for high-temperature annealing of silicon carbide single crystal | |
WO2019095632A1 (en) | Method for preparing semi-insulating silicon carbide single crystal | |
CN108987257A (en) | Ga is grown on a si substrate using halide vapor phase epitaxy2O3The method of film | |
CN111962152A (en) | Preparation method of silicon carbide single crystal for reducing crystal defects | |
JP2002249376A (en) | Low nitrogen concentration carbonaceous material and method for producing the same | |
CN206244923U (en) | A kind of SiC single crystal grower of closing | |
CN211420368U (en) | Apparatus for growing large diameter silicon carbide crystals | |
CN109183143A (en) | A method of AlN single crystal purity is improved using reducing gas | |
CN206266235U (en) | A kind of device for quickly preparing SiC powders |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: SHANGHAI SILICATES INSTITUTE, THE CHINESE ACADEMY Owner name: PILOT TEST BASE OF SHANGHAI INSTITUTE OF CERAMICS Free format text: FORMER OWNER: SHANGHAI SILICATES INSTITUTE, THE CHINESE ACADEMY OF SCIENCES Effective date: 20111013 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 200050 CHANGNING, SHANGHAI TO: 201800 JIADING, SHANGHAI |
|
TA01 | Transfer of patent application right |
Effective date of registration: 20111013 Address after: 201800 Shanghai City, north of the city of Jiading District Road No. 215 Applicant after: Research and Design center, Shanghai Institute of Ceramics Co-applicant after: Shanghai Silicates Institute, the Chinese Academy of Sciences Address before: 200050 Dingxi Road, Shanghai, Changning District, No. 1295 Applicant before: Shanghai Silicates Institute, the Chinese Academy of Sciences |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20201116 Address after: No. 1814, Lianshan District, Shanghai Patentee after: SHANGHAI SHENHE THERMO-MAGNETICS ELECTRONICS Co.,Ltd. Address before: 201800 No. 215 Chengbei Road, Shanghai, Jiading District Patentee before: R&D CENTER OF SHANGHAI INSTITUTE OF CERAMICS Patentee before: SHANGHAI INSTITUTE OF CERAMICS, CHINESE ACADEMY OF SCIENCES |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20210914 Address after: 244000 Xihu 3rd road, Tongling Economic Development Zone, Anhui Province Patentee after: Anhui microchip Changjiang semiconductor materials Co.,Ltd. Address before: No. 181, Shanlian Road, Baoshan District, Shanghai 200444 Patentee before: SHANGHAI SHENHE THERMO-MAGNETICS ELECTRONICS Co.,Ltd. |