CN101782615A - SFIF code pre-reading method for ICT testing station - Google Patents
SFIF code pre-reading method for ICT testing station Download PDFInfo
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- CN101782615A CN101782615A CN 201010119107 CN201010119107A CN101782615A CN 101782615 A CN101782615 A CN 101782615A CN 201010119107 CN201010119107 CN 201010119107 CN 201010119107 A CN201010119107 A CN 201010119107A CN 101782615 A CN101782615 A CN 101782615A
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Abstract
The invention relates to an SFIF code pre-reading method for an ICT testing station, which comprises an SMT-2.0 data information collector and an ICT tester, and is characterized by comprising the following steps that: (1) a code reader reads a bar code, and a DLICLient.dll file in testing software of the ICT tester pre-stores the bar code transferred by the code reader; (2) after the ICT tester tests, the DLICLient.dll file integrates the test result and the bar code and transfers back to the SFIS; (3) a pre-stored SN is marked as a current test state and transferred to ICT testing software to wait for the test result; and (4) the steps (2) and (3) are repeated. In the invention, the code is pre-read in a test wait time of an operator, thereby saving the code reading time, improving the production efficiency and increasing the yield.
Description
Technical field
The SFIF that the present invention relates to a kind of ICT of being used for testing station reads code method in advance.
Background technology
The function of ICT be the quality (that is: whether resistance, electric capacity, inductance, diode, electric crystal, FET, SCR and IC have Short Item, wrong part, part is bad or assemble bad) and the testing circuit printed line road of element on the measurement circuit plate whether short circuit is arranged, open circuit bad, and spell out bad position, promote defective products overhaul efficiency and product quality greatly.
The English full name of SFIS is: ShopFloorInformationSystem, Chinese implication is " an on-the-spot information integration system ".Can realize reviewing of procedure for producing monitoring and production quality.
Prior art is: M line operator is read bar code (SN) on the test board with reading yard rifle, be transferred to DCT(SMT-2.0 data information collector), DCT confirms bar code (SNOK) OK for the server that produces line and passes to ICT by com port, gives testing software by the DLIClient.dll file transfer of ICT.Operator is put into measurement jig to the test board order, testing software begins test, test the back result of test be returned to DLIClient.dll, then DLIClient.dll data whole and after pass to DCT from com port again, after the DCT decoding is uploaded to SFIS, show ICTOK.Then operator reads the bar code of the test board of next group again, repeats above content again.After these means need operator to read yard OK, wait for after ICT test OK and data are imported SFIS into and could continue to read sign indicating number that production efficiency is low.
Summary of the invention
In order to overcome the deficiency of above-mentioned technology, the SFIF that the purpose of this invention is to provide a kind of ICT of being used for testing station reads code method in advance, and this method can be read in advance at the SFIF of ICT testing station effectively to save in the sign indicating number and be read a yard time, enhances productivity, and increases output.
The present invention adopts following scheme to realize: the SFIF of a kind of ICT of being used for testing station reads code method in advance, comprises SMT-2.0 data information collector and ICT tester, it is characterized in that:
(1), utilize and to read sign indicating number and rob and read bar code, the DLICLient.dll file in the testing software of described ICT tester is robbed and is passed the bar code of coming and prestore reading sign indicating number;
(2), after the ICT tester tests, described DLICLient.dll file is integrated test result with bar code after, SFIS is given in passback;
(3), the SN that prestores is denoted as current test mode, and pass to ICT test software, wait for test result;
(4), repeating step (2), (3).
The present invention utilizes the test wait time of operator, reads sign indicating number in advance, has saved and has read a yard time, has improved production efficiency, has use value preferably.
Description of drawings
Fig. 1 is the schematic flow sheet of the embodiment of the invention.
Embodiment
The present invention will be further described below in conjunction with drawings and Examples.
As shown in Figure 1, the SFIF that the invention provides a kind of ICT of being used for testing station reads code method in advance, comprises SMT-2.0 data information collector and ICT tester, it is characterized in that:
(1), utilize and to read sign indicating number and rob and read bar code, the DLICLient.dll file in the testing software of described ICT tester is robbed and is passed the bar code of coming and prestore reading sign indicating number;
(2), after the ICT tester tests, described DLICLient.dll file is integrated test result with bar code after, SFIS is given in passback;
(3), the SN that prestores is denoted as current test mode, and pass to ICT test software, wait for test result;
(4), repeating step (2), (3).
In present embodiment, above-mentioned SMT-2.0 data information collector, be called for short DCT, be to be used for the image data data, and its terminal connection device .DCT that sends PC to can be served as the front end of the Style Product Information Management System under the factory automation work flow, to replace input and the control that computer is produced the various data messages of product.Above-mentioned DLICLient.dll file is the data processing file between the terminal connection devices such as the responsible DCT data acquisition unit of Xiang prestige company exploitation and PC.
In above-mentioned ICT software test process, ICT continues to accept SMT-2.0 data information collector and passes the bar code of coming.
The above only is preferred embodiment of the present invention, and all equalizations of being done according to the present patent application claim change and modify, and all should belong to covering scope of the present invention.
Claims (2)
1. a SFIF who is used for the ICT testing station reads code method in advance, comprises SMT-2.0 data information collector and ICT tester, it is characterized in that:
(1), utilize and to read sign indicating number and rob and read bar code, the DLICLient.dll file in the testing software of described ICT tester is robbed and is passed the bar code of coming and prestore reading sign indicating number;
(2), after the ICT tester tests, described DLICLient.dll file is integrated test result with bar code after, SFIS is given in passback;
(3), the SN that prestores is denoted as current test mode, and pass to ICT test software, wait for test result;
(4), repeating step (2), (3).
2. the SFIF of the ICT of being used for according to claim 1 testing station reads code method in advance, it is characterized in that: in described ICT software test process, ICT continues to accept SMT-2.0 data information collector and passes the bar code of coming.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010119107XA CN101782615B (en) | 2010-03-08 | 2010-03-08 | SFIF code pre-reading method for ICT testing station |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201010119107XA CN101782615B (en) | 2010-03-08 | 2010-03-08 | SFIF code pre-reading method for ICT testing station |
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| Publication Number | Publication Date |
|---|---|
| CN101782615A true CN101782615A (en) | 2010-07-21 |
| CN101782615B CN101782615B (en) | 2012-06-20 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201010119107XA Expired - Fee Related CN101782615B (en) | 2010-03-08 | 2010-03-08 | SFIF code pre-reading method for ICT testing station |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104142450A (en) * | 2014-08-07 | 2014-11-12 | 环鸿电子（昆山）有限公司 | In-circuit testing method |
| CN104680096A (en) * | 2013-11-26 | 2015-06-03 | 英业达科技有限公司 | Reading system of corresponding detection script of circuit board and method thereof |
| CN108226744A (en) * | 2016-12-22 | 2018-06-29 | 比亚迪股份有限公司 | Board test method, device and board |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1354620A (en) * | 2000-11-17 | 2002-06-19 | 由田新技股份有限公司 | Quality maintenance and backtracking system in course of manufacturing printed circuit board |
| US6453435B1 (en) * | 1998-12-29 | 2002-09-17 | Fujitsu Network Communications, Inc. | Method and apparatus for automated testing of circuit boards |
| US20030136840A1 (en) * | 2002-01-23 | 2003-07-24 | Wu Ming Mei | Method and system for managing integrated circuit test programs using bar codes |
| CN1967275A (en) * | 2005-11-18 | 2007-05-23 | 鸿富锦精密工业（深圳）有限公司 | PCB Online testing and maintain system and method thereof |
| CN101210952A (en) * | 2006-12-27 | 2008-07-02 | 中茂电子(深圳)有限公司 | Multi-test point semiconductor test machine station automated setting method |
-
2010
- 2010-03-08 CN CN201010119107XA patent/CN101782615B/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6453435B1 (en) * | 1998-12-29 | 2002-09-17 | Fujitsu Network Communications, Inc. | Method and apparatus for automated testing of circuit boards |
| CN1354620A (en) * | 2000-11-17 | 2002-06-19 | 由田新技股份有限公司 | Quality maintenance and backtracking system in course of manufacturing printed circuit board |
| US20030136840A1 (en) * | 2002-01-23 | 2003-07-24 | Wu Ming Mei | Method and system for managing integrated circuit test programs using bar codes |
| CN1967275A (en) * | 2005-11-18 | 2007-05-23 | 鸿富锦精密工业（深圳）有限公司 | PCB Online testing and maintain system and method thereof |
| CN101210952A (en) * | 2006-12-27 | 2008-07-02 | 中茂电子(深圳)有限公司 | Multi-test point semiconductor test machine station automated setting method |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104680096A (en) * | 2013-11-26 | 2015-06-03 | 英业达科技有限公司 | Reading system of corresponding detection script of circuit board and method thereof |
| CN104142450A (en) * | 2014-08-07 | 2014-11-12 | 环鸿电子（昆山）有限公司 | In-circuit testing method |
| CN108226744A (en) * | 2016-12-22 | 2018-06-29 | 比亚迪股份有限公司 | Board test method, device and board |
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| Publication number | Publication date |
|---|---|
| CN101782615B (en) | 2012-06-20 |
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