CN101776709B - 一种用于表征铁电薄膜光电流的测量方法 - Google Patents
一种用于表征铁电薄膜光电流的测量方法 Download PDFInfo
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- CN101776709B CN101776709B CN2010100181600A CN201010018160A CN101776709B CN 101776709 B CN101776709 B CN 101776709B CN 2010100181600 A CN2010100181600 A CN 2010100181600A CN 201010018160 A CN201010018160 A CN 201010018160A CN 101776709 B CN101776709 B CN 101776709B
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CN2010100181600A CN101776709B (zh) | 2010-01-15 | 2010-01-15 | 一种用于表征铁电薄膜光电流的测量方法 |
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CN101776709B true CN101776709B (zh) | 2012-04-04 |
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CN101915878B (zh) * | 2010-07-16 | 2012-07-25 | 苏州大学 | 一种铁电薄膜退极化时间的测量方法 |
CN107621567B (zh) * | 2017-09-13 | 2020-12-29 | 吉林大学 | 一种半导体光电材料瞬态光电流测量系统及测量方法 |
CN110231525A (zh) * | 2019-06-05 | 2019-09-13 | 东南大学 | 一种适用于铁电光伏材料的测量系统 |
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CN1117134A (zh) * | 1994-08-16 | 1996-02-21 | 中国科学院上海硅酸盐研究所 | 铁电薄膜电光系数测试方法 |
CN101483198A (zh) * | 2009-02-03 | 2009-07-15 | 苏州大学 | Ag/硅复合结构紫外光探测器及其制备方法 |
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CN1117134A (zh) * | 1994-08-16 | 1996-02-21 | 中国科学院上海硅酸盐研究所 | 铁电薄膜电光系数测试方法 |
CN101483198A (zh) * | 2009-02-03 | 2009-07-15 | 苏州大学 | Ag/硅复合结构紫外光探测器及其制备方法 |
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