CN101770004A - Automatic detection method for electric instrument - Google Patents
Automatic detection method for electric instrument Download PDFInfo
- Publication number
- CN101770004A CN101770004A CN201010019358A CN201010019358A CN101770004A CN 101770004 A CN101770004 A CN 101770004A CN 201010019358 A CN201010019358 A CN 201010019358A CN 201010019358 A CN201010019358 A CN 201010019358A CN 101770004 A CN101770004 A CN 101770004A
- Authority
- CN
- China
- Prior art keywords
- electric instrument
- test
- instrument
- communication thread
- test board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Abstract
The invention relates to the technological field related to electric instrument, in particular to an automatic detection method for an electric instrument. The automatic detection method is realized by a test bench which adopts multithreading, the test bench is connected with a test board and multiple electric instruments, the multithreading comprises that a test board communication threading and an electric instrument communication threading simultaneously operate; the test board communication threading is used for processing parameter reading and writing and automatic testing value reading and writing of the test board; the electric instrument communication threading is used for processing communication and testing protocol transmission of the electric instrument. In the invention, the test board can be automatically controlled to adjust output parameter to test the electric instrument and batching testing can be realized; as a result, early failure period of products can be effectively reduced, debugging efficiency can be improved and labor resource costs can be reduced.
Description
Technical field
The present invention relates to the automatic testing method of the correlative technology field of electric instrument, particularly a kind of electric instrument.
Background technology
The electric instrument of present most of manufacturer production all adopts single-chip microcomputer as disposal system, realize functions such as sampling, data processing, keyboard demonstration, communications, general application is to adopt host computer (other systems such as PC or PLC) by certain passage such as serial ports, TCP/IP etc. data to be sent in the single-chip microcomputer, communication protocol according to a preconcerted arrangement, register in this sheet is carried out read-write operation, revise the purpose that data value carries out the adjustment of data and debugging to reach.
Generally when this method of employing is carried out data communication, be that the debugging software that adopts producer to write voluntarily carries out read-write operation to this relevant electric measuring instrument, the data of reading and the data of test board compare, then debug this instrument again, can only debug an instrument at every turn, and require the commissioning staff in the process of debugging, constantly to compare with test board, to obtain measurement data accurately, the false judgment that this debud mode causes easily, require the verification debugging as a large amount of electric measuring instruments, then usually will wait for for a long time.
Summary of the invention
The invention provides a kind of automatic testing method of electric instrument,, carry out the technical matters that the electric instrument debugging needs manual debugging to solve in the prior art.
The technical solution used in the present invention is as follows:
A kind of automatic testing method of electric instrument, test platform is connected with a plurality of electric instruments with test board, and described method adopts multithreading to realize that described multithreading comprises by test platform, test board communication thread and electric instrument communication thread, two thread synchronization operations:
The test board communication thread is used to handle and the parameter reading and writing of test board and the read-write of proof test value automatically;
The electric instrument communication thread is used to handle and the communicating by letter and the verification protocol transmission of electric instrument.
The application that above-mentioned test platform is general is to adopt host computer, as other systems such as PC or Programmable Logic Controllers.
As a kind of preferred version, the electric instrument communication thread of described method adopts the mode of formation to deposit the parameter of electric instrument.
As further preferred version, the step of described method is as follows:
(31) test platform and test board establish a communications link, if set up successfully, and execution in step (32) then, otherwise withdraw from;
(32) test platform and electric instrument establish a communications link, if set up successfully, and execution in step (33) then, otherwise withdraw from;
(33) carry out debugging checking procedure automatically.
As further preferred version again, the step of described automatic debugging checking procedure is as follows:
(41) the electric instrument communication thread read electric instrument instrument to be measured tuning parameter and parameter is placed in the formation;
(42) read test platform data (as input signal data, as electric current, voltage, frequency etc.) and pass to the electric instrument communication thread in the test board communication thread;
(43) action of debugging is judged and made to the electric instrument communication thread automatically by communicating with electric instrument;
(44) the electric instrument communication thread enters in the next formation, takes out the parameter in the debugging formation, carries out loop test, finish up to an electric instrument debugging,, then connect next instrument and test if also have next instrument, and execution in step (41), otherwise withdraw from.
As further preferred version:
In the described step (31), when test platform can't connect with test board, alarm prompt then;
In the described step (32), when test platform can't connect with electric instrument, alarm prompt then.
The present invention can control test board adjusting output parameter automatically electric instrument is carried out verification, and verification in batch, has reduced the debug time of producing product effectively, has improved debugging efficiency, has reduced the cost of human resources.
Description of drawings
Fig. 1 adopts debugging process flow diagram of the present invention;
Fig. 2 is the network chart of electric instrument communicator process;
Fig. 3 is the Organization Chart of software.
Embodiment
Below in conjunction with the drawings and specific embodiments the present invention is described in more detail.
Present embodiment adopts test platform to be connected with a plurality of electric instruments with test board.The debugging flow process before testing electric instrument, is connected test board earlier as shown in Figure 1 with test platform, link with this equipment by one tunnel communication, makes it can control test board, convenient later data manipulation, as read and write data, revise parameter etc.Definite test board connect and communicate by letter errorless after, should be being connected with test platform after the electric instrument networking to be measured, as shown in Figure 2, the dual communication of test platform employing so far is connected with electric instrument with test board and finishes.
Above equipment connect finish after, start special-purpose debugging software, utilize the function of initializing of this software, the ruuning situation of self diagnosis equipment can not successfully connect or connect wrong as discovering device in detection, then give prompt alarm.
As shown in Figure 3, before entering automatic debugging checking procedure, software starts and the test board communication thread earlier, read the tuning parameter of the instrument to be measured of electric instrument then, and the data transfer that will read from the test board communication thread is given in the electric instrument communication thread, so far, the action of debugging can be judged and make to software automatically, finish this debugging task then, and enter in the next formation, take out the parameter in the debugging formation, carry out loop test, finish up to an electric instrument debugging, connect next instrument then and test, repeat above process.
Communication thread is by reading the data of register in the electric instrument, can obtain and whether debug and parameters such as debugging progress, judge by the real time data that reads in the data obtained in the input signal from the test board communication thread and the electric instrument, whether consistent, whether tuning parameter meets, as meet then interrupt test platform communication thread, carry out the tuning parameter register read write operation of this electric instrument.And then start communication thread and obtain another level signal data, and carry out the verification of next tuning parameter.
Claims (5)
1. the automatic testing method of an electric instrument, test platform is connected with a plurality of electric instruments with test board, it is characterized in that, described method adopts multithreading to realize by test platform, described multithreading comprises, test board communication thread and electric instrument communication thread, two thread synchronization operations:
The test board communication thread is used to handle and the parameter reading and writing of test board and the read-write of proof test value automatically;
The electric instrument communication thread is used to handle and the communicating by letter and the verification protocol transmission of electric instrument.
2. electric instrument automatic testing method according to claim 1 is characterized in that, the electric instrument communication thread of described method adopts the mode of formation to deposit the parameter of electric instrument.
3. electric instrument automatic testing method according to claim 2 is characterized in that, the step of described method is as follows:
(31) test platform and test board establish a communications link, if set up successfully, and execution in step (32) then, otherwise withdraw from;
(32) test platform and electric instrument establish a communications link, if set up successfully, and execution in step (33) then, otherwise withdraw from;
(33) carry out debugging checking procedure automatically.
4. electric instrument automatic testing method according to claim 3 is characterized in that, the step of described automatic debugging checking procedure is as follows:
(41) the electric instrument communication thread read electric instrument instrument to be measured tuning parameter and parameter is placed in the formation;
(42) read test platform data and pass to the electric instrument communication thread in the test board communication thread;
(43) action of debugging is judged and made to the electric instrument communication thread automatically by communicating with electric instrument;
(44) the electric instrument communication thread enters in the next formation, takes out the parameter in the debugging formation, carries out loop test, finish up to an electric instrument debugging,, then connect next instrument and test if also have next instrument, and execution in step (41), otherwise withdraw from.
5. electric instrument automatic testing method according to claim 3 is characterized in that:
In the described step (31), when test platform can't connect with test board, alarm prompt then;
In the described step (32), when test platform can't connect with electric instrument, alarm prompt then.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201010019358A CN101770004A (en) | 2010-01-12 | 2010-01-12 | Automatic detection method for electric instrument |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201010019358A CN101770004A (en) | 2010-01-12 | 2010-01-12 | Automatic detection method for electric instrument |
Publications (1)
Publication Number | Publication Date |
---|---|
CN101770004A true CN101770004A (en) | 2010-07-07 |
Family
ID=42502984
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201010019358A Pending CN101770004A (en) | 2010-01-12 | 2010-01-12 | Automatic detection method for electric instrument |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN101770004A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103048634A (en) * | 2012-11-29 | 2013-04-17 | 安徽徽宁电器仪表集团有限公司 | Power instrument detecting method |
CN110225048A (en) * | 2019-06-19 | 2019-09-10 | 腾讯科技(成都)有限公司 | Data transmission method, device, first terminal and storage medium |
CN113514093A (en) * | 2021-04-21 | 2021-10-19 | 北京锐达仪表有限公司 | Safety instrument debugging terminal |
-
2010
- 2010-01-12 CN CN201010019358A patent/CN101770004A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103048634A (en) * | 2012-11-29 | 2013-04-17 | 安徽徽宁电器仪表集团有限公司 | Power instrument detecting method |
CN110225048A (en) * | 2019-06-19 | 2019-09-10 | 腾讯科技(成都)有限公司 | Data transmission method, device, first terminal and storage medium |
CN110225048B (en) * | 2019-06-19 | 2022-09-23 | 腾讯科技(成都)有限公司 | Data transmission method and device, first terminal and storage medium |
CN113514093A (en) * | 2021-04-21 | 2021-10-19 | 北京锐达仪表有限公司 | Safety instrument debugging terminal |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN108226751B (en) | System and method for evaluating performance of multi-processor cooperative chip | |
CN107037352B (en) | Capacitive touch key chip detection calibration system and method | |
CN202770933U (en) | High-precision multichannel analog quantity automatic test system | |
CN107908507B (en) | double-CPU multichannel FT (FT) mass production test system and method | |
CN106054058B (en) | One kind can be to multiple sigma-delta ADC chip testings and temperature controlled system and method | |
CN103033738A (en) | Automatic test system for circuit board | |
CN107544018A (en) | A kind of more site semaphores detections and fail-ure criterion system and method | |
US20110202894A1 (en) | Method and Apparatus for Versatile Controllability and Observability in Prototype System | |
CN109582525A (en) | Test code verification method, verifying device, equipment and storage medium | |
CN101957428B (en) | Automatic test method and tool of monitoring circuit board | |
CN107797928B (en) | Instrument control system platform logic algorithm block testing device and method | |
CN202794491U (en) | Test equipment automatic calibration instrument and calibration system | |
CN109596973A (en) | The test method of chip parameter under different temperatures | |
CN108346404B (en) | Parameter debugging method for time schedule controller and screen driving circuit | |
CN102214132A (en) | Method and device for debugging Loongson central processing unit (CPU), south bridge chip and north bridge chip | |
CN103631688A (en) | Method and system for testing interface signal | |
CN200997633Y (en) | Automatic testing system based on graphic testing platform | |
CN101770004A (en) | Automatic detection method for electric instrument | |
CN111520191A (en) | Testing device and testing method for digital coal mine safety monitoring system | |
CN114281624A (en) | Method, system, device and equipment for testing I2C signal integrity | |
CN104614659A (en) | Automatic test system and automatic test method | |
CN108319516B (en) | Test system and test method | |
CN101408771A (en) | Software automatic test system and method applicable to electronic type refrigerator | |
CN203616419U (en) | Automatic testing device of VME board card | |
CN101650655A (en) | Method for analyzing test data of chip |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C12 | Rejection of a patent application after its publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20100707 |