CN101751048A - Temperature control method and temperature control device for wavelength detecting device - Google Patents
Temperature control method and temperature control device for wavelength detecting device Download PDFInfo
- Publication number
- CN101751048A CN101751048A CN200810186639A CN200810186639A CN101751048A CN 101751048 A CN101751048 A CN 101751048A CN 200810186639 A CN200810186639 A CN 200810186639A CN 200810186639 A CN200810186639 A CN 200810186639A CN 101751048 A CN101751048 A CN 101751048A
- Authority
- CN
- China
- Prior art keywords
- temperature
- wavelength detecting
- desired value
- described device
- die
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Semiconductor Lasers (AREA)
Abstract
The invention discloses a temperature control method and a temperature control device for a wavelength detecting device, relates to the field of optical communication and can solve the problem of wavelength shift caused by inaccurate temperature control of the wavelength detecting device. The temperature control method comprises the following steps: acquiring a device temperature of the wavelength detecting device and an environmental temperature; setting a target value of a tube core temperature of the wavelength detecting device; and generating a refrigerating current to control the tube core temperature of the wavelength detecting device at the target value according to the device temperature, the environmental temperature and the target value. The temperature control device for the wavelength detecting device comprises a first thermal sensor, a second thermal sensor and a temperature control unit, wherein the first thermal sensor and the second thermal sensor are used for acquiring the device temperature of the wavelength detecting device and the environmental temperature respectively; and the temperature control unit is used for generating the refrigerating current to control the tube core temperature of the wavelength detecting device at the target value according to the device temperature, the environmental temperature and the preset target value of the tube core temperature of the wavelength detecting device. The method and the device are suitable for controlling the temperature of the wavelength detecting device.
Description
Technical field
The present invention relates to optical communication field, relate in particular to a kind of temperature-controlled process and device of device for wavelength detecting.
Background technology
Along with the development of optical communication technique, the wavelength interval of adjacency channel is changed to 25GHz by 50GHz in the wavelength-division multiplex system, thereby more and more higher to the stability requirement of wavelength.The wavelength locking overwhelming majority of optical module is by adopting Etalon PD (Etalon Photonic Detector, ether dragon device for wavelength detecting) to detect as negative feedback, wavelength being controlled in real time.This is that the light of different wave length is the ripple lock factor (1ock ratio) difference through the ratio of transmission behind the Etalon by the decision of the material behavior of Etalon, and is regular and changes.Can judge by the variation that detects the ripple lock factor whether wavelength changes.
The working curve of Etalon varies with temperature meeting generation drift, as shown in Figure 1.When thick lines represent respectively that with hachure Etalon is operated in different temperature T 1 and T2, wavelength and the corresponding relation of the ripple lock factor (lock ratio).Therefore wavelength is subjected to influencing jointly of the ripple lock factor and temperature.Determine relation between frequency and the ripple lock factor, the temperature by following formula particularly:
λ＝f((PD1/PD2)，T)； (1)
Wherein: PD1/PD2 represents the ripple lock factor, and T is the die temperature of Etalon device inside, and λ is a wavelength.Wherein, f is the function of the die temperature of the ripple lock factor and Etalon device inside.
If the die temperature T of Etalond changes, then the relation of wavelength and the ripple lock factor also changes, and judges whether wavelength changes thereby can not lock the factor by ripple.Therefore in the process of wavelength locking, require to guarantee the temperature stabilization of Etalon.
The synoptic diagram of the temperature control equipment of prior art Etalon as shown in Figure 2.In the prior art, use thermal sensor 21 to detect the temperature T eta of Etalon device A, relatively export the corresponding electric current that freezes in the back according to the temperature control signals of Teta generation and the target temperature control signal of Etalon device by comparer 22, through TEC (Thermal Electronic Cooler, thermoelectric refrigerating unit) temperature of 23 back control Etalon devices remains unchanged, because of TEC and Etalon device position approaching, thereby realize stablizing the temperature of Etalon device A by negative feedback control TEC electric current.
In real work, environment temperature can produce heat interchange with the Etalon device, influence the die temperature of Etalon device, when variation of ambient temperature, influence degree also changes thereupon, because the thermal sensor volume is less, and Etalon device volume and take up room relatively large, different local differences influenced by ambient temperature, therefore, the true temperature that existing scheme is used as the detected Etalon temperature of thermal sensor as Etalon is inaccurate.Because the prior art scheme do not consider environment temperature to Etalon component pipe core Temperature Influence, test findings shows, when environment temperature when-5 ℃ change to 75 ℃, can cause wave length shift 1～1.5GHz.
Summary of the invention
Embodiments of the invention provide a kind of temperature-controlled process of device for wavelength detecting, can solve the problem of the inaccurate wave length shift that causes of temperature control of device for wavelength detecting.
Embodiments of the invention adopt following technical scheme:
A kind of temperature-controlled process of device for wavelength detecting comprises:
Obtain the device temperature and the environment temperature of device for wavelength detecting;
Set the desired value of the die temperature of described device for wavelength detecting;
According to described device temperature, environment temperature and desired value, the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value.
Device temperature and the environment temperature of the temperature-controlled process of embodiments of the invention device for wavelength detecting by obtaining device for wavelength detecting, and set the desired value of the die temperature of described device for wavelength detecting, according to described device temperature, environment temperature and desired value, the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value, thereby can accurately control the temperature of device for wavelength detecting, the wave length shift that produces when avoiding wavelength measurement.
Embodiments of the invention also provide a kind of temperature control equipment of device for wavelength detecting, can solve the problem of the inaccurate wave length shift that causes of temperature control of device for wavelength detecting.
Embodiments of the invention adopt following technical scheme:
A kind of temperature control equipment of device for wavelength detecting comprises:
First thermal sensor is used to obtain the device temperature of device for wavelength detecting;
Second thermal sensor is used to obtain the environment temperature of described device for wavelength detecting;
Temperature control unit is used for the desired value according to the die temperature of described device temperature, environment temperature and predefined described device for wavelength detecting, and the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value;
Wherein, the output terminal of described thermoinduction unit is connected with the input end of described temperature control unit; Described temperature control unit and device for wavelength detecting are adjacent.
The temperature control equipment of embodiments of the invention device for wavelength detecting is measured the device temperature and the environment temperature of device for wavelength detecting respectively by first thermal sensor and second thermal sensor, temperature control unit is according to the desired value of the die temperature of described device temperature, environment temperature and predefined described device for wavelength detecting, the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value, thereby can accurately control the temperature of device for wavelength detecting, the wave length shift that produces when avoiding wavelength measurement.
Description of drawings
Fig. 1 varies with temperature the synoptic diagram that drift takes place for the working curve of Etalon;
Fig. 2 is the synoptic diagram of the temperature control equipment of prior art Etalon;
Fig. 3 is the temperature-controlled process process flow diagram of embodiments of the invention device for wavelength detecting;
Fig. 4 is the temperature-controlled process process flow diagram of embodiments of the invention one Etalon;
Fig. 5 is the temperature-controlled process process flow diagram of embodiments of the invention two Etalon;
Fig. 6 is the synoptic diagram of the temperature control equipment of embodiments of the invention device for wavelength detecting;
Fig. 7 is the synoptic diagram of the temperature control equipment of embodiments of the invention three Etalon;
Fig. 8 is the synoptic diagram of the temperature control equipment of another embodiment of the present invention Etalon.
Embodiment
Be described in detail below in conjunction with the temperature-controlled process and the device of accompanying drawing embodiment of the invention device for wavelength detecting.
Should be clear and definite, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills belong to the scope of protection of the invention not making the every other embodiment that is obtained under the creative work prerequisite.
The temperature-controlled process process flow diagram of embodiment of the invention device for wavelength detecting, as shown in Figure 3, the temperature-controlled process of embodiments of the invention device for wavelength detecting comprises:
S301, the device temperature that obtains device for wavelength detecting and environment temperature;
The desired value of the die temperature of S302, the described device for wavelength detecting of setting;
S303, according to described device temperature, environment temperature and desired value, the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value.
Device temperature and the environment temperature of the temperature-controlled process of embodiments of the invention device for wavelength detecting by obtaining device for wavelength detecting, and set the desired value of the die temperature of described device for wavelength detecting, according to described device temperature, environment temperature and desired value, the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value, thereby can accurately control the temperature of device for wavelength detecting, the wave length shift that produces when avoiding wavelength measurement.
Temperature-controlled process with Etalon is an example below, and the embodiment of the invention is described.
Embodiment one
Be illustrated in figure 4 as the temperature-controlled process process flow diagram of embodiments of the invention one Etalon, the temperature-controlled process of embodiment of the invention Etalon comprises:
The desired value T ' of the die temperature of S401, setting Etalon;
S402, obtain device temperature Teta and the environment temperature Tcase of Etalon respectively in the both sides of Etalon.
Particularly, can obtain device temperature Teta and the environment temperature Tcase of Etalon in the monosymmetric position of Etalon respectively, the temperature data that utilizes this mode to obtain can calculate the die temperature of Etalon comparatively accurately.
The present invention is not limited thereto, in other embodiments of the invention, also can obtain environment temperature in other zone around Etalon.
Device temperature and environment temperature that S403, basis record, the die temperature T of calculating Etalon.
Calculate the die temperature T of Etalon according to following method.If the function of the die temperature T of Etalon and device temperature Teta, environment temperature Tcase is f, and is as follows:
T＝f(Teta，Tcase) (2)
Near the ripple lock factor, setting Teta and Tcase are linear to the influence of T, then can get:
T＝C×Teta+D×Tcase+E (3)
Wherein, C, D, E are constant.Definite method of constant C, D, E is as follows:
When wavelength during in the ITU standard channel, the device temperature Tcase of change Etalon 4 times, guarantee in these 4 times that the wavelength to be measured and the ripple lock factor are constant, guarantee that by regulating TEC the die temperature T of Etalon is constant, write down the value of 4 groups of Teta and Tcase respectively, with the value substitution formula (3) of 4 groups of Teta, Tcase, form quaternary (four unknown numbers are respectively coefficient C, D, E and die temperature T) linear function group, can determine the value of constant C, D, E by separating this system of equations.
Can realize calculating by counter to the die temperature T of Etalon.
The desired value T ' of the die temperature of the Etalon that sets among die temperature T that S404, basis calculate and the step S401 produces the refrigeration electric current.
Particularly, target value set among the die temperature T that calculates and the step S401 is compared, according to described the two difference output refrigeration electric current.This step can realize by comparer.That is, the control signal of described die temperature T that calculates and desired value T ' generation is input to comparer, the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value.
Above-mentioned S403 and S404 step can also be finished by a control chip.Thereby the method that present embodiment provides both can be finished by software, also can finish by hardware.
S405, described refrigeration electric current is input to thermoelectric refrigerating unit TEC, TEC remains desired value T ' according to the die temperature of refrigeration Current Control Etalon.
TEC can judge that needs heat still refrigeration to Etalon according to the refrigeration electric current of input, and according to the size of refrigeration electric current, the amplitude of control heating or refrigeration, thus make the die temperature of Etalon remain on the desired value constant.
Present embodiment is by obtaining the die temperature T that environment temperature and device temperature calculate Etalon, desired value with the die temperature of the Etalon of the die temperature T that calculates and setting compares again, according to the two difference obtain the freezing increment of electric current, input refrigeration electric current remains on desired value to the temperature that TEC controls Etalon.Present embodiment can overcome the influence that variation of ambient temperature is brought, and the temperature variation that solves because of external environment causes the inaccurate problem of wavelength that the Etalon device detects.
Embodiment two
Be illustrated in figure 5 as the temperature-controlled process process flow diagram of embodiments of the invention two Etalon, the temperature-controlled process of embodiment of the invention Etalon comprises:
S501, obtain device temperature Teta1 and the environment temperature Tcase of Etalon respectively.
The desired value T ' of the die temperature of S502, setting Etalon;
It is desired value required device temperature Teta2 of T ' time that S503, calculating keep the die temperature of Etalon.
Can get according to above-mentioned formula (3):
Teta2＝(T′-D×Tcase-E)/C (4)
Detected Wavelength stabilized in order to guarantee, that is, guarantee that the die temperature T ' of Etalon is invariable, then need adjust device temperature T eta2.Therefore, in the process of wavelength locking, need should utilize formula (4) to control TEC in real time according to the variation of environment temperature Tcase, stable with the true die temperature T ' that realizes the Etalon device, thus reach Wavelength stabilized purpose.
This step can be finished by counter, according to described environment temperature Tcase and desired value, and the die temperature that calculate to keep described device for wavelength detecting by counter required device temperature when described desired value T '.
Device temperature Teta1 that S504, basis record and the device temperature Teta2 that calculates produce the refrigeration electric current.
This step can be finished by comparer, described device temperature Teta1 that records and the control signal that keeps die temperature required device temperature Teta2 when the described desired value to produce are input to comparer, and the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value.
Above-mentioned steps S502 can be provided with module by temperature and finish, and S503 and S504 also can realize by control chip.
S505, be desired value T ' according to the die temperature of described Control current control Etalon.
In the present embodiment, the die temperature by refrigeration Current Control Etalon is that the method for desired value T ' is with reference to embodiment one.
The foregoing description one and embodiment two are not limited to described step, can adjust the order of each step according to actual conditions.For example, can obtain device temperature Teta and the environment temperature Tcase of Etalon among the embodiment one earlier respectively in the both sides of Etalon, and then set the desired value T ' of the die temperature of Etalon.Embodiment two also can set the desired value T ' of the die temperature of Etalon earlier, and then obtains device temperature Teta1 and the environment temperature Tcase of Etalon respectively.
Be illustrated in figure 6 as the synoptic diagram of the temperature control equipment of embodiments of the invention device for wavelength detecting, the temperature control equipment of embodiments of the invention device for wavelength detecting A comprises:
First thermal sensor 601 is used to obtain the device temperature of device for wavelength detecting;
Second thermal sensor 602 is used to obtain the environment temperature of described device for wavelength detecting;
Wherein, the output terminal of described thermoinduction unit is connected with the input end of described temperature control unit; Described temperature control unit is adjacent with device for wavelength detecting A.
The temperature control equipment of embodiments of the invention device for wavelength detecting is measured the device temperature and the environment temperature of device for wavelength detecting respectively by first thermal sensor and second thermal sensor, temperature control unit is according to the desired value of the die temperature of described device temperature, environment temperature and predefined described device for wavelength detecting, the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value, thereby can accurately control the temperature of device for wavelength detecting, the wave length shift that produces when avoiding wavelength measurement.
Below be example with the temperature control equipment of Etalon, embodiments of the invention are described.
Embodiment three
Be illustrated in figure 7 as the synoptic diagram of the temperature control equipment of embodiments of the invention three Etalon.The temperature control equipment of embodiments of the invention Etalon device A comprises: first thermal sensor 71, second inductor 72, refrigeration current generating module 73, thermoelectric refrigerating unit 74.Wherein, thermoelectric refrigerating unit is TEC.
Wherein, first thermal sensor 71 is used to measure the device temperature Teta of Etalon.Second thermal sensor 72 is used to measure the environment temperature Tcase of described Etalon device A.Usually, second thermal sensor 72 and first thermal sensor 71 are respectively in the both sides of Etalon device, are respectively applied for measuring element temperature and environment temperature.
Second thermal sensor also can have more than one, is used for measuring the environment temperature of Etalon everywhere around the thermoelectric refrigerating unit TEC74 of Etalon, and obtains the mean value of environment temperature.
Refrigeration current generating module 73 is used for according to described device temperature, and the desired value of the die temperature of environment temperature and predefined described Etalon produces the refrigeration electric current.Particularly, refrigeration current generating module 73 comprises:
Temperature is provided with module 731, is used to be provided with the desired value T ' of the die temperature of Etalon.
TEC74, being used for keeping the die temperature of Etalon under the control of described refrigeration electric current is desired value T '.TEC can judge that it still is refrigeration that needs heat Etalon according to the refrigeration electric current of input, and according to the size of refrigeration electric current, the amplitude of control heating or refrigeration, thus keep the die temperature of Etalon constant on desired value T '.
Present embodiment obtains the device temperature of Etalon by first thermal sensor, obtain the environment temperature of Etalon by second thermal sensor, thereby the device that can pass budgets calculates Etalon die temperature accurately, and be desired value by the die temperature that TEC controls Etalon, thereby can stablize the die temperature of Etalon, the wave length shift of having avoided Etalon when wavelength measurement, to produce owing to temperature variation.
The present invention is not limited thereto, and as shown in Figure 8, above-mentioned refrigeration current generating module 73 can comprise that temperature is provided with module 731 and control chip 734.The die temperature that control chip is used for by calculating maintenance Etalon is desired value required device temperature Teta2 of T ' time, and by comparing the relation output refrigeration electric current of Teta1 and Teta2.Embodiments of the invention have been considered the influence of environment temperature to die temperature, thereby when the die temperature that calculate to keep Etalon is desired value T during required device temperature Teta2 based on environment temperature, and the device temperature Teta1 that obtains according to the device temperature Teta2 that calculates and thermal sensor, output refrigeration electric current, keeping the die temperature of Etalon by TEC according to the refrigeration electric current again is desired value T '.
Control chip can also produce the refrigeration electric current as follows: calculate die temperature T according to device temperature Teta and environment temperature Tcase, formula (3), die temperature T and desired value T ' are compared, according to the relation output Control current of the two.
Embodiments of the invention not only can be realized by hardware, also can realize by software.
One of ordinary skill in the art will appreciate that all or part of flow process that realizes in the foregoing description method, be to instruct relevant hardware to finish by computer program, described program can be stored in the computer read/write memory medium, this program can comprise the flow process as the embodiment of above-mentioned each side method when carrying out.Wherein, described storage medium can be magnetic disc, CD, read-only storage memory body (Read-Only Memory, ROM) or at random store memory body (Random Access Memory, RAM) etc.
The above; only be the specific embodiment of the present invention, but protection scope of the present invention is not limited thereto, anyly is familiar with those skilled in the art in the technical scope that the present invention discloses; the variation that can expect easily or replacement all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of claim.
Claims (11)
1. the temperature-controlled process of a device for wavelength detecting is characterized in that, comprising:
Obtain the device temperature and the environment temperature of device for wavelength detecting;
Set the desired value of the die temperature of described device for wavelength detecting;
According to described device temperature, environment temperature and desired value, the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value.
2. temperature-controlled process according to claim 1 is characterized in that, described device temperature and the environment temperature of obtaining device for wavelength detecting comprises:
Obtain the device temperature and the environment temperature of described device for wavelength detecting respectively in the both sides of device for wavelength detecting.
3. temperature-controlled process according to claim 1 is characterized in that, according to described device temperature, environment temperature and desired value, the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value, comprising:
According to described device temperature and environment temperature, calculate the die temperature of described device for wavelength detecting by counter;
The control signal of described die temperature that calculates and desired value generation is input to comparer, and the die temperature of the described device for wavelength detecting of generation refrigeration Current Control is described desired value.
4. temperature-controlled process according to claim 1 is characterized in that, according to described device temperature, environment temperature and desired value, the die temperature that produces the described device for wavelength detecting of refrigeration electric current is described desired value, comprising:
According to described environment temperature and desired value, the die temperature that calculate to keep described device for wavelength detecting by counter required device temperature when described desired value;
Described device temperature that records and the control signal that keeps die temperature required device temperature when the described desired value to produce are input to comparer, and the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value.
5. according to claim 3 or 4 described temperature-controlled process, it is characterized in that the die temperature of the described device for wavelength detecting of described generation refrigeration Current Control is that described desired value comprises:
Produce the refrigeration electric current, it is described desired value that described refrigeration Current Control thermoelectric refrigerating unit keeps the die temperature of described device for wavelength detecting.
6. the temperature control equipment of a device for wavelength detecting is characterized in that, comprising:
First thermal sensor is used to obtain the device temperature of device for wavelength detecting;
Second thermal sensor is used to obtain the environment temperature of described device for wavelength detecting;
Temperature control unit is used for the desired value according to the die temperature of described device temperature, environment temperature and predefined described device for wavelength detecting, and the die temperature that produces the described device for wavelength detecting of refrigeration Current Control is described desired value;
Wherein, the output terminal of described thermoinduction unit is connected with the input end of described temperature control unit.
7. temperature control equipment according to claim 6 is characterized in that, described first thermal sensor and described second thermal sensor are respectively in the both sides of described device for wavelength detecting.
8. temperature control equipment according to claim 6 is characterized in that, described temperature control unit comprises:
The refrigeration current generating module is used for according to described device temperature, and the desired value of the die temperature of environment temperature and predefined described device for wavelength detecting produces the refrigeration electric current;
Thermoelectric refrigerating unit, being used for keeping the die temperature of described device for wavelength detecting under the control of described refrigeration electric current is described desired value.
9. temperature control equipment according to claim 8 is characterized in that, described refrigeration current generating module comprises:
Temperature is provided with module, is used to set the desired value of the die temperature of described device for wavelength detecting;
Arithmetical unit is used for calculating according to described device temperature and environment temperature the die temperature of described device for wavelength detecting;
Comparer is used for according to die temperature that calculates and described temperature the desired value that module is provided with being set, output refrigeration electric current.
10. temperature control equipment according to claim 8 is characterized in that, described refrigeration current generating module comprises:
Temperature is provided with module, is used to set the desired value of the die temperature of described device for wavelength detecting;
Control chip is used for calculating according to described device temperature and environment temperature the die temperature of described device for wavelength detecting, according to die temperature that calculates and described desired value output refrigeration electric current; Or
Be used for according to described environment temperature and desired value, the device temperature the when die temperature that calculates described device for wavelength detecting is described desired value, and according to device temperature that calculates and the device temperature output refrigeration electric current that records.
11., it is characterized in that described device for wavelength detecting is an ether dragon device for wavelength detecting according to each described temperature control equipment of claim 6 to 10.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810186639A CN101751048A (en) | 2008-12-11 | 2008-12-11 | Temperature control method and temperature control device for wavelength detecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200810186639A CN101751048A (en) | 2008-12-11 | 2008-12-11 | Temperature control method and temperature control device for wavelength detecting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101751048A true CN101751048A (en) | 2010-06-23 |
Family
ID=42478109
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200810186639A Pending CN101751048A (en) | 2008-12-11 | 2008-12-11 | Temperature control method and temperature control device for wavelength detecting device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101751048A (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105305977A (en) * | 2015-10-28 | 2016-02-03 | 深圳市金溢科技股份有限公司 | Temperature compensation power amplifying method, radio-frequency amplifier circuit and reader-writer |
| CN105652379A (en) * | 2016-03-03 | 2016-06-08 | 青岛海信宽带多媒体技术有限公司 | Optical module optical power regulation method and device |
| WO2018001374A1 (en) * | 2016-06-30 | 2018-01-04 | 中兴通讯股份有限公司 | Heater-based method and apparatus for temperature control and optical module |
| CN108604933A (en) * | 2016-07-21 | 2018-09-28 | 华为技术有限公司 | A kind of control method and system of wave length shift |
| CN110445007A (en) * | 2019-07-10 | 2019-11-12 | 深圳市迅特通信技术有限公司 | The method and device of laser dense wave division multipurpose wavelength stabilization control |
| CN115096455A (en) * | 2022-08-22 | 2022-09-23 | 度亘激光技术（苏州）有限公司 | Laser wavelength measuring device and method |
| CN116026301A (en) * | 2023-03-24 | 2023-04-28 | 中国船舶集团有限公司第七〇七研究所 | Wavelength self-compensation method and device of fiber optic gyroscope, electronic equipment and storage medium |
-
2008
- 2008-12-11 CN CN200810186639A patent/CN101751048A/en active Pending
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105305977A (en) * | 2015-10-28 | 2016-02-03 | 深圳市金溢科技股份有限公司 | Temperature compensation power amplifying method, radio-frequency amplifier circuit and reader-writer |
| CN105305977B (en) * | 2015-10-28 | 2018-09-07 | 深圳市金溢科技股份有限公司 | A kind of temperature-compensating power-magnifying method, radio frequency amplifying circuit and reader |
| CN105652379A (en) * | 2016-03-03 | 2016-06-08 | 青岛海信宽带多媒体技术有限公司 | Optical module optical power regulation method and device |
| WO2018001374A1 (en) * | 2016-06-30 | 2018-01-04 | 中兴通讯股份有限公司 | Heater-based method and apparatus for temperature control and optical module |
| CN107562087A (en) * | 2016-06-30 | 2018-01-09 | 南京中兴软件有限责任公司 | Temprature control method and device, optical module based on heater |
| CN107562087B (en) * | 2016-06-30 | 2024-04-02 | 中兴通讯股份有限公司 | Temperature control method and device based on heater and optical module |
| CN108604933A (en) * | 2016-07-21 | 2018-09-28 | 华为技术有限公司 | A kind of control method and system of wave length shift |
| CN108604933B (en) * | 2016-07-21 | 2020-04-21 | 华为技术有限公司 | Control method and system for wavelength drift |
| CN110445007A (en) * | 2019-07-10 | 2019-11-12 | 深圳市迅特通信技术有限公司 | The method and device of laser dense wave division multipurpose wavelength stabilization control |
| CN110445007B (en) * | 2019-07-10 | 2020-06-02 | 深圳市迅特通信技术有限公司 | Method and device for stable wavelength control of laser dense wavelength division multiplexing |
| CN115096455A (en) * | 2022-08-22 | 2022-09-23 | 度亘激光技术（苏州）有限公司 | Laser wavelength measuring device and method |
| CN116026301A (en) * | 2023-03-24 | 2023-04-28 | 中国船舶集团有限公司第七〇七研究所 | Wavelength self-compensation method and device of fiber optic gyroscope, electronic equipment and storage medium |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101751048A (en) | Temperature control method and temperature control device for wavelength detecting device | |
| US9024698B2 (en) | Temperature compensation method and crystal oscillator | |
| US7460572B2 (en) | Optical module and method for monitoring and controlling wavelengths | |
| CN104242051B (en) | External cavity tunable laser and cavity mode locking method thereof | |
| CN101573599B (en) | Fluid physical quantity measuring method and control method | |
| EP1571743A1 (en) | Method and apparatus for wavelength stabilization of a laser by means of temperature compensation. | |
| CN102594459A (en) | Dual laser-power-level control and calibration system for burst-mode and continuous-mode transmitter | |
| CN100545665C (en) | Semiconductor laser temperature characteristic parameter instant testing device and method | |
| CN106027157A (en) | Current compensation method for optical module and optical module | |
| CN104729748A (en) | Method for determining the ambient temperature of a mobile device | |
| CN105467242A (en) | A production testing system of digital temperature compensated crystal oscillators and a debugging method thereof | |
| CN105045308B (en) | A kind of semiconductor cooler closed loop control method applied to space environment | |
| CN103712709A (en) | Multi-channel high-precision temperature measurement system | |
| JP4986407B2 (en) | LASER MODULE, ITS CONTROL METHOD, CONTROL DATA GENERATION METHOD FOR CONTROL, AND CONTROL DATA | |
| US8537955B1 (en) | System and method for compensating for loop filter delay | |
| CN107479138B (en) | A kind of device and method improving the sensitivity of the receiving end TWDM | |
| CN1863014B (en) | Temperture compensating method and apparatus for extinction ratio parameter without cooling laser | |
| JP5956997B2 (en) | Design and control of multi-temperature micro-oven for MEMS devices | |
| US20090141755A1 (en) | Method for controlling laser power of an optical pickup unit | |
| CN106644139A (en) | Temperature measurer based on platinum resistor | |
| CN103033287A (en) | Optical assembly temperature detecting device of BOB system and method of BOB system and system calibrating method | |
| CA3032288A1 (en) | Distributed temperature sensing over extended temperature ranges | |
| Nygaard et al. | Underbalanced drilling: improving pipe connection procedures using automatic control | |
| US11506883B2 (en) | Optical wavelength selecting filter-module and optical wavelength selecting method | |
| CN220419860U (en) | PET temperature control device and PET system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20100623 |