CN101750036A - Method for detecting probe wear and probe - Google Patents

Method for detecting probe wear and probe Download PDF

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Publication number
CN101750036A
CN101750036A CN200810180776A CN200810180776A CN101750036A CN 101750036 A CN101750036 A CN 101750036A CN 200810180776 A CN200810180776 A CN 200810180776A CN 200810180776 A CN200810180776 A CN 200810180776A CN 101750036 A CN101750036 A CN 101750036A
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China
Prior art keywords
probe
detection layers
shock
resistant layer
abrasion
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CN200810180776A
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Chinese (zh)
Inventor
赵本善
陈家进
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King Yuan Electronics Co Ltd
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King Yuan Electronics Co Ltd
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Priority to CN200810180776A priority Critical patent/CN101750036A/en
Publication of CN101750036A publication Critical patent/CN101750036A/en
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Abstract

The invention relates to a method for detecting probe wear and a probe, in particular to a method for online real-time detecting probe wear, the probe and the manufacturing method of the probe. The probe comprises: a probe main body, which comprises at least one needle head; a detecting layer, which coats the needle head or the whole probe main body; and an impact-resistant layer, which is formed on the detecting layer and coats the detecting layer, in order to increase the degree of impact resistance of the probe. The detecting layer with eye-catching color is manufactured inside the probe, which leads the detecting layer of the probe to be exposed after the probe wears, while, the eye-catching color of the probe at the detecting layer serves as a mark, therefore, the online personnel can easily and instantly judge whether the probe wears.

Description

The method and the probe of detector probe abrasion
Technical field
The present invention relates to the method and the probe of the abrasion of a kind of detector probe, particularly relate to a kind of simple, be difficult for erroneous judgement and can line on the method and the probe of instant detector probe abrasion.
Background technology
Electronic component is after completing, usually need through wafer sort (circuit probetest), in order to distinguishing the good and the bad of crystal grain before encapsulation, the quality of confirming crystal grain to be to encapsulate, and avoids encapsulating and causing unnecessary waste for the bad crystal grain of quality.And after encapsulation, need to carry out finished product test (final test), be without damage with wafer in definite encapsulation process, and wafer is still up to specification after encapsulation.Yet no matter be above-mentioned which kind of test, when test, all need probe, and transmit the test signal as the electric connection between electronic component and the tester table.
In general in order to deal with a large amount of testing requirements and to increase tested performance, therefore, tester table in testing factory almost be with night and day, continual mode tests, thousands of with regard to having, up to ten thousand even amount hundreds of thousands of often a collection of electronic product needs test.Therefore, probe also must over and over again contact even collide with electronic product, and causes after testing through a large amount of electronic products, the probe particularly part of syringe needle can produce abrasion and damage, and influence the electric connection of probe and electronic product, cause test errors and mistake, even failure.
In view of this, generally when testing after a period of time or test the appearance mistake, often probe is detected to guarantee that it can continue to use.But the general present probe wear detection mode of using all is tester table need be shut down, and probe is taken off, and detects its abrasion situation, particularly probe tip, the i.e. degree of wear of syringe needle part by the artificial mode of optical microscope that cooperates again.Yet; because the tip of probe mostly is inscribe or circumscribed form; therefore; when the sharp sword place of irradiate light at probe; be easy to generate light refraction; add depth of field wide-angle unlike electron microscope of optical microscope, the probe that can also continue to use so usually have the situation generation of erroneous judgement is changed the lifting of moulding testing cost.In addition, probe also may be because be stained with dirty or tin sticky, and cause testing out error and wrong even failure equally, thereby increase and judge whether probe wears away and need the degree of difficulty changed, and need that spended time is further careful to be detected.Therefore, usually generation is judged by accident and is changed the probe that need not change, causes the increase of testing cost.
In addition, because when whether detector probe wears away, need tester table to shut down, under optical microscope, detect one by one, to be detectedly intactly again it is reinstalled tester table and proceed test, and cause the reduction of tested performance and probe taken off.In addition, more cause needing the considerable time of cost, and easily judge by accident and change the probe that need not change, cause the increase of testing cost, or change the probe that has worn and torn, cause test errors or failure because of detecting with the difficulty of judging.Therefore, need a kind of simpler, easier judgement and the method that can instant on line detector probe abrasion wanted badly, or can judge the probe of its extent of deterioration easily, increasing correctness and the tested performance of judging, and reduce the time of detecting, the possibility and the testing cost of erroneous judgement.
This shows that the method for above-mentioned existing detector probe abrasion obviously still has inconvenience and defective, and demands urgently further being improved in method and use.In order to solve the problem of above-mentioned existence, relevant manufacturer there's no one who doesn't or isn't seeks solution painstakingly, but do not see always that for a long time suitable design finished by development, and conventional method does not have appropriate method to address the above problem, this obviously is the problem that the anxious desire of relevant dealer solves.Therefore how to found method, probe and its method for making that a kind of new detector probe wears away, real one of the current important research and development problem that belongs to, also becoming the current industry utmost point needs improved target.
Summary of the invention
The objective of the invention is to, overcome the defective of the method existence of existing detector probe abrasion, and the method that provides a kind of new detector probe to wear away, technical matters to be solved is to make its method that solves existing detector probe abrasion need spend the plenty of time and easily cause erroneous judgement, and existing probe is judged because of too tiny or be stained with the high problem of difficult judgment degree lifting that set-off dirt or tin sticky are caused, and, be very suitable for practicality because of the testing cost that the problems referred to above caused increases and problems such as test can reduce.
Another object of the present invention is to, overcome the defective that existing probe exists, and provide a kind of probe of new structure, technical matters to be solved is to make personnel on the line can judge the extent of deterioration of probe easily, and reduce the time of detecting, the possibility and the testing cost of erroneous judgement, be very suitable for practicality.
The present invention compared with prior art has tangible advantage and beneficial effect.By above technical scheme as can be known, major technique of the present invention thes contents are as follows:
For achieving the above object, the invention provides a kind of probe, it comprises the shock-resistant layer that probe body, coating syringe needle or the detection layers and of whole probe main body with at least one syringe needle are formed on the detection layers and coat detection layers.This probe can cause outer field shock-resistant layer wearing and tearing and expose the detection layers with conspicuous color when wearing and tearing by probe, whether personnel do not need probe is pulled down on the line and make, only need simply to judge the wear intensity of probe and need and change with human eye or collocation magnifier.
In addition, for achieving the above object, the present invention also provides a kind of method of making probe, makes a kind of probe that can simply judge its wear intensity.At first; one probe body that comprises a syringe needle at least is provided; then; form a detection layers with coating or plating mode and coat syringe needle or whole probe main body; at last again by electroplating or other modes; form a shock-resistant layer on detection layers and coat detection layers, avoid it that oxidation takes place in order to protection syringe needle or whole probe main body.This method is by forming the tangible detection layers of a color in probe interior, and by this detection layers on probe exposed degree and the wear intensity that can judge probe easily be to need to change.
Moreover for achieving the above object, the present invention provides a kind of method of detector probe abrasion again, and can simpler, easier judgement and the wear intensity of instant detector probe on line.At first, provide probe that an inside has one deck detection layers, then, test, whether the detection layers of inspecting each probe again is exposed, thereby judges the probe wear degree and judge whether change this probe.
Above-mentioned three kinds of technological means are all by make the eye-catching detection layers of a color in probe interior; and by the probe skin in various degree wearing and tearing and to cause detection layers to produce different exposed; and make probe present in various degree conspicuous color; promptly present the exposed detection layers zone of different sizes; and can be simply, be difficult for erroneous judgement and can line on detector probe wear intensity immediately, and need not shut down.
By technique scheme, method, probe and its method for making of detector probe of the present invention abrasion have following advantage and beneficial effect at least: the method, probe and its method for making that provide a kind of detector probe to wear away is provided the effect that the present invention contrasts prior art, the method of can simpler, easier judgement and can instant on line detector probe abrasion, or can judge the probe of its extent of deterioration easily, with the correctness and the tested performance of increase judgement, and reduce the time of detecting, the possibility and the testing cost of erroneous judgement.
In sum, the invention relates to a kind of method and probe of detector probe abrasion, particularly method, probe and its method for making that wears away relevant for instant detector probe on the line.It is by making the eye-catching detection layers of a color in probe interior, so that can expose detection layers after the probe wear, and become a mark by the probe conspicuous color of detection layers, make on the line personnel can be easily and the time ground judge whether probe weares and teares.The present invention has obvious improvement technically, has tangible good effect, really is a new and innovative, progressive, practical new design.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, and for above-mentioned and other purposes, feature and advantage of the present invention can be become apparent, below especially exemplified by preferred embodiment, and conjunction with figs., be described in detail as follows.
Description of drawings
Fig. 1 is the diagrammatic cross-section of structure of the probe of one embodiment of the invention.
Fig. 2 A is the diagrammatic cross-section of structure of the probe of another embodiment of the present invention.
Fig. 2 B is the diagrammatic cross-section of structure of the probe of further embodiment of this invention.
Fig. 3 is the process flow diagram of method of the making probe of one embodiment of the invention.
Fig. 4 is the process flow diagram of method of the detector probe abrasion of one embodiment of the invention.
Fig. 5 A and Fig. 5 B are respectively that probe of the present invention is abrasion and the synoptic diagram that has worn away on test bench.
Fig. 6 A and Fig. 6 B are respectively the probe schematic perspective views that has worn away.
10,10A, 10B, 10a, 10b: probe
11: probe body 12: syringe needle
14: shock-resistant layer 15,16: detection layers
16 ': the second detection layers 18: protective seam
20: test bench 300: a probe body step is provided
302: form a detection layers and coat the probe body step
304: form a protective seam and coat the detection layers step
400: provide a probe step 402: carry out testing procedure
404: inspect this detection layers and whether expose step
406: stop testing procedure 408: continue testing procedure
Embodiment
Reach technological means and the effect that predetermined goal of the invention is taked for further setting forth the present invention, below in conjunction with accompanying drawing and preferred embodiment, the method and embodiment, method, step, structure, feature and the effect thereof of probe of the detector probe abrasion that foundation the present invention is proposed, describe in detail as after.
Some embodiments of the present invention are described in detail as follows.Yet except this was described in detail, the present invention can also be widely implements at other embodiment.That is scope of the present invention is not subjected to the restriction of the embodiment that proposed, and the claim that proposes with the present invention is as the criterion.Secondly, when each element in embodiments of the invention illustrate or structure illustrate with single element or structrual description, should be with this as the cognition that qualification is arranged, promptly following explanation not during the restriction on the lay special stress on number spirit of the present invention and range of application can spread on most elements or structure and structure of depositing and the method.Moreover in this manual, the different piece of each element is not drawn according to size fully, and some yardstick is compared with other scale dependents or had and exaggerated or simplify, to provide clearer description to promote the understanding of the present invention.And the existing skill that the present invention continued to use is only done quoting of emphasis formula at this, to help elaboration of the present invention.
See also shown in Figure 1,, be the sectional view of the probe structure of one embodiment of the invention, this probe 10 comprises a probe body 11, a shock-resistant layer 14, a detection layers 16 and a protective seam 18.
Above-mentioned at least one syringe needle of probe body 11 tools (plunger) 12, and probe 10 has two syringe needles (promptly two moving pin) in the present embodiment, but in other embodiments of the invention, probe also can only have a syringe needle (being independent needle).
Above-mentioned detection layers 16 is to be formed on the surface of probe 10, above-mentioned shock-resistant layer 14 then is formed on the surface of detection layers 16, in order to promote and the shock-resistant degree that increases probe, it typically is a nickel (Ni) layer, but also can use other can strengthening probe hardness or the material of shock-resistant degree, for example other hardness higher metal materials.
In Fig. 1, detection layers 16 is formed on the surface of syringe needle 12, and coat syringe needle 12 syringe needle 12 is not exposed, perhaps in other embodiments of the invention, detection layers can be formed on the whole probe surface and (comprise on the surface of probe body and syringe needle), or only coats the part that syringe needle contacts with electronic component or tester table.
18 of above-mentioned protective seams are formed on the shock-resistant layer 14 and coat shock-resistant layer 14 and it is not exposed; avoid probe 10 that oxidative phenomenas take place in order to protection probe 10 and influence the fiduciary level and the serviceable life of probe; protective seam 18 can have the material of good resistance oxidation characteristic for one; for example gold (Au) etc. has the metal of good resistance oxidation characteristic, or other materials.
In addition; detection layers 16 has with shock-resistant layer 14 and has different colors; or even present the color of huge contrast even contrast with shock-resistant layer 14 colors; and be preferably an eye-catching color; for example red; but not as limit, so long as can make the clear difference of naked eyes itself and surrounding environment, probe color, shock-resistant layer 14 colors, or even the color of the difference of protective seam 18 can be used.Therefore, detection layers 16 can be a coloured dye coating, or is one can send the fluorescent dye layer of fluorescent, perhaps also can be a nano paint layer, or the nano paint layer that can present different colours according to particle size, for example a titania (TiO 2), even can for example have the nickel dam of dye particles, so long as have conspicuous color but the material that can not influence probe function and fiduciary level all can be used in the probe of the present invention for a rete with dye particles.
As shown in Figure 1, though the detection layers 16 of probe 10 is between shock-resistant layer 14 and syringe needle 12 in this embodiment, but also can on demand detection layers be arranged between shock-resistant layer and the detecting probe surface, even in other embodiments of the invention, shown in Fig. 2 A, detection layers 15 is same one deck with shock-resistant layer, for example be all rete with dye particles or the retes such as nickel dam with dye particles, promptly detection layers 15 has simultaneously as the detection target of probe 10A abrasion and as the rete that increases the shock-resistant degree of probe.Perhaps; in other embodiments; shown in Fig. 2 B; probe 10B more comprises one second detection layers 16 ' between shock-resistant layer 14 and protective seam 18; second detection layers 16 ' can have identical or different colors with detection layers 16; but itself and shock-resistant layer 14 have different colours with 18 of protective seams, and second detection layers 16 ' can adopt aforementioned detection layers 16 employed arbitrary materials, so do not repeat them here.In addition, though detection layers is to avoid influencing the electric conductivity and the fiduciary level of probe, to have lead be preferable selection and use one, but because the very thin thickness of detection layers, therefore, to degree of accuracy and the not higher low order electronic product of precision requirement, also can use a material of not having electric conductivity at some, because of its for the electric conductivity of probe and fiduciary level influence not quite within the acceptable range.
Yet; no matter be Fig. 1, Fig. 2 A, Fig. 2 B or the probe that other embodiments of the invention disclosed; all (when shock-resistant layer and protective seam wear away fixed thickness) can expose detection layers when the fixed thickness of probe wear; and make the zone that wears away on the probe to a certain degree present the color or the fluorescent of detection layers itself, the zone that refers to wear away aforementioned fixation thickness even surpass this fixed thickness.Therefore; conspicuous color or fluorescent because of detection layers; make the probe of existing abrasion have a macroscopic sign; and personnel can be pulled down probe by tester table not needing; not even under the state that need shut down (be on the line immediately (on-line)); can be directly by the naked eyes abrasion situation that simple magnifier observes probe of can only arranging in pairs or groups; and need not use optical microscope; and time and cost that minimizing detects; and then reduce testing cost and promote tested performance, and be difficult for because of probe tin sticky again or be stained with that set-off is dirty to cause erroneous judgement.
In addition, in the present invention, detection layers on the probe body can have the different colours or the rete of different colours fluorescent by several layers, on the surface of probe body, pile up in regular turn and form, make probe present different colours producing the abrasion zone in various degree abrasion meeting, therefore, personnel can learn the wear intensity of probe easily on the line.
Aforementioned fixation thickness is the thickness summation (probe 10 as shown in Figure 1) of shock-resistant layer and protective seam on the probe; or the thickness (the probe 10A shown in Fig. 2 A) of protective seam on the probe, or coat the thickness summation of all retes except test layer thereon on the detection layers.In addition, can be by exposed degree of detection layers on this probe or exposed surface area, and judge the wear intensity of probe easily, and can be according to the characteristic of different probe, whether decision is as long as probe exposes detection layers and promptly need change, or surpass a default critical value according to detection layers on the probe exposed degree or exposed surface area, and probe is changed in decision.
The invention provides a method of making aforementioned probe, see also shown in Figure 3ly, it is the process flow diagram of method of the making probe of one embodiment of the invention.This probe manufacturing method at first, provides a probe body (step 300), and this probe body has at least one syringe needle; Then, form a detection layers again and coat syringe needle or only coat the part that syringe needle and electronics contact with other elements or device when test, for example part that contacts such as electronic product and tester table, or coating whole probe main body (step 302); Then, on detection layers, form a shock-resistant layer and coat detection layers (step 304), for example form a nickel dam, even coat whole syringe needle or probe body, and itself and detection layers have color inequality.Even, detection layers can be made into have simultaneously as the detection target of probe wear with as the rete that increases the shock-resistant degree of probe, and do not need additionally to make a shock-resistant layer.
Form a detection layers step (step 302) and be the rete that forms a coloured dye coating, fluorescent dye layer, nano paint layer or have a dye particles by coating, electroless plating mode, immersion plating, spin coating, evaporation or composite plating mode on syringe needle or probe body.Wherein, employed material of detection layers and color are described at preamble, and do not repeat them here.
In addition; this method of making probe more can comprise one and form the protective seam step; in order to form a protective seam (for example gold layer) on this shock-resistant layer and coat this shock-resistant layer, avoid it that oxidation takes place in order to protect this syringe needle or whole probe main body, as shown in Figure 1.In addition, more can comprise the making detection layers of several layers of different colours in regular turn in formation one detection layers step (step 302), make probe present different colours in various degree abrasion meeting producing the abrasion zone, therefore, personnel can learn the wear intensity of probe easily on the line.And in other embodiments of the invention, more can form one second detection layers between shock-resistant layer and protective seam (shown in Fig. 2 B), in order to indicate in various degree abrasion respectively with detection layers.Second detection layers can have identical or different colors with detection layers, but itself and shock-resistant layer and protective seam then have different colours, and second detection layers can adopt the employed arbitrary material of aforementioned detection layers, so do not repeat them here.
The present invention more provides the method for detector probe abrasion, and the personnel on the line of making can be with simpler, accurately and be difficult for the method for erroneous judgement, immediately the wear intensity of probe is made judgement with whether changing on the line.See also shown in Figure 4ly, it is the process flow diagram of method of the detector probe abrasion of one embodiment of the invention.In the method for these detector probe abrasion, at first, provide at least one in order to electronic product is carried out the probe (step 400) of test, this probe interior has one deck detection layers, therefore its structure and material do not repeat them here as previously described probe structure.
Then; use above-mentioned probe that electronic product is tested (step 402); whether the detection layers of inspecting then in the probe has exposed (step 404); have the conspicuous color different by detection layers with the protective seam color; or the fluorescent that sends of detection layers; make the probe of existing abrasion have a macroscopic sign, whether the abrasion situation is arranged and inspect probe.
Then, if detect the existing abrasion of probe, and because of the exposed color that present detection layers itself of detection layers in the subregion, the probe 10b shown in Fig. 5 B, then stop test (step 406), in order to the replacing of carrying out probe or judge further whether probe can continue to use.Otherwise if do not have the probe of discovery because of the exposed color that present detection layers itself of detection layers in the subregion, i.e. representative detects probe and there is no abrasion, and the probe 10a shown in Fig. 5 A then proceeds test (step 408).
In addition, because of the exposed color that present detection layers itself of detection layers in the subregion, probe is existing to be worn away and detect, more comprise a determination step afterwards, in order to judge whether the probe that has exposed detection layers can't bear to use, and need change, this step can inspected detection layers to exposed and stop to carry out after the test, or directly carries out (carrying out when electronic product is picked on it) in test.The wear intensity that degree that this determination step exposes by detection layers in the probe or exposed surface area are judged probe; on the probe that has worn away shown in Fig. 6 A and Fig. 6 B, because of protective seam 18 and shock-resistant layer 14 by the worn detection layers surface area that exposes of part.And judge whether detection layers is exposed on this probe degree or exposed surface area surpass a default critical value or a critical value range, and the judgement probe has worn away excessively and unbearably use and has needed replacing, if surpass critical value or critical value range, then carry out a probe and change step, change and will wear away excessive probe.Wherein, the demand of the product of the mode of the kind that aforementioned default critical value or critical value range can probes, test, test and test and different.
In addition, this method more comprise one with probe unit in test bench step (shown in Fig. 5 A), it carries out identical arrangement at test bench (socket) 20 according to the arrangement of electronic product electrical contact probe 10.More comprise the step that a test bench 20 that will install probe 10 is installed on tester table in addition.
The method of probe of the present invention and detector probe abrasion is made the eye-catching detection layers of a color by probe interior; make probe may wear to a certain degree; can expose detection layers and make the zone of abrasion present the conspicuous color or the fluorescent of detection layers itself from reason; make the probe of existing abrasion have a macroscopic sign; and personnel can be pulled down probe by tester table not needing; not even under the state that need shut down (be on the line immediately (on-line)); can be directly by the naked eyes abrasion situation that simple magnifier observes probe of can only arranging in pairs or groups; and need not use optical microscope; and time and cost that minimizing detects; and then reduce testing cost and promote tested performance, and be difficult for because of probe tin sticky again or be stained with that set-off is dirty to cause erroneous judgement.Therefore, the method of can simpler, easier judgement and can instant on line detector probe abrasion, or can judge the probe of its extent of deterioration easily, increasing correctness and the tested performance of judging, and reduce the time of detecting, the possibility and the testing cost of erroneous judgement.
The above, it only is preferred embodiment of the present invention, be not that the present invention is done any pro forma restriction, though the present invention discloses as above with preferred embodiment, yet be not in order to limit the present invention, any those skilled in the art, in not breaking away from the technical solution of the present invention scope, when the technology contents that can utilize above-mentioned announcement is made a little change or is modified to the equivalent embodiment of equivalent variations, in every case be not break away from the technical solution of the present invention content, according to technical spirit of the present invention to any simple modification that above embodiment did, equivalent variations and modification all still belong in the scope of technical solution of the present invention.

Claims (12)

1. probe is characterized in that it comprises:
One probe body, this probe body comprises a syringe needle at least;
One detection layers coats this syringe needle or whole probe main body; And
One shock-resistant layer is formed on this detection layers and coats this detection layers, in order to increase the shock-resistant degree of this probe.
2. probe according to claim 1 is characterized in that wherein said detection layers has the color inequality with this shock-resistant layer.
3. probe according to claim 1 is characterized in that wherein said detection layers is a coloured dye coating, fluorescent dye layer, nano paint layer or the rete with dye particles.
4. probe according to claim 1 is characterized in that it more comprises a protective seam and is formed on this shock-resistant layer and coats this shock-resistant layer, avoids it that oxidation takes place in order to protect this syringe needle or whole this probe body.
5. probe according to claim 4 is characterized in that it more comprises one second detection layers, between this protective seam and this shock-resistant layer.
6. probe according to claim 1 is characterized in that wherein said shock-resistant layer and this detection layers are same one deck.
7. probe according to claim 2, it is characterized in that wherein said probe can expose this detection layers of part to the fixed thickness wearing away, and present the color of this detection layers, exposed degree of this detection layers or the surface area wear intensity of representing this probe wherein, and degree that this detection layers is exposed or surface area surpass a default critical value, and this probe can not re-use.
8. the method for detector probe abrasion is characterized in that comprising following steps:
One probe is provided, and in order to carry out test, this probe interior has one deck detection layers;
Test; And
Whether inspect this detection layers exposed.
9. the method for detector probe abrasion according to claim 8 is characterized in that wherein said probe comprises:
One probe body, this probe body comprises a syringe needle at least;
One detection layers coats this syringe needle or whole probe main body; And
One shock-resistant layer is formed on this detection layers and coats this detection layers, and in order to increase the shock-resistant degree of this probe, wherein this detection layers has the color inequality with this shock-resistant layer.
10. the method for detector probe according to claim 9 abrasion is characterized in that it more comprises a protective seam and is formed on this shock-resistant layer and coats this shock-resistant layer, avoids it that oxidation takes place in order to protect this syringe needle or whole this probe body.
11. the method for detector probe abrasion according to claim 8, it is characterized in that wherein said whether exposed inspect this detection layers step be with naked eyes or whether manifest the color of this detection layers with this detecting probe surface of magnifier Direct observation, if find that this probe has exposed this detection layers and then stopped test, otherwise, then continue test.
12. the method for detector probe abrasion according to claim 11, it is characterized in that it more comprises a determination step, the wear intensity of judging this probe by the exposed degree of this detection layers or surface area, and compare the exposed degree of this detection layers or whether surface area exceeds a default critical value, and judge whether this probe need be changed.
CN200810180776A 2008-12-02 2008-12-02 Method for detecting probe wear and probe Pending CN101750036A (en)

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CN105559231A (en) * 2016-03-02 2016-05-11 温州传奇新材料有限公司 Method for distinguishing termination of peculiar smell prevention function of shoe material and product thereof
CN106482613A (en) * 2016-12-01 2017-03-08 株洲中航动力精密铸造有限公司 Blade measuring instrument self-inspection frock and self checking method
CN106610250A (en) * 2016-12-01 2017-05-03 重庆渝青机械配件制造有限公司 Combined type suit bond
CN106700370A (en) * 2016-12-07 2017-05-24 重庆渝青机械配件制造有限公司 Sectional band
CN106871838A (en) * 2017-02-19 2017-06-20 郑州云海信息技术有限公司 A kind of method for testing golden finger order of contact
CN109253715A (en) * 2017-07-13 2019-01-22 株式会社三丰 Measuring Device Management System and computer-readable medium
CN111392223A (en) * 2020-03-23 2020-07-10 重庆小锋包装袋有限责任公司 Difficult-slippage high-strength woven bag and manufacturing process thereof

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105559231A (en) * 2016-03-02 2016-05-11 温州传奇新材料有限公司 Method for distinguishing termination of peculiar smell prevention function of shoe material and product thereof
CN106482613A (en) * 2016-12-01 2017-03-08 株洲中航动力精密铸造有限公司 Blade measuring instrument self-inspection frock and self checking method
CN106610250A (en) * 2016-12-01 2017-05-03 重庆渝青机械配件制造有限公司 Combined type suit bond
CN106482613B (en) * 2016-12-01 2019-04-26 株洲中航动力精密铸造有限公司 Blade measuring instrument self-test tooling and self checking method
CN106700370A (en) * 2016-12-07 2017-05-24 重庆渝青机械配件制造有限公司 Sectional band
CN106871838A (en) * 2017-02-19 2017-06-20 郑州云海信息技术有限公司 A kind of method for testing golden finger order of contact
CN109253715A (en) * 2017-07-13 2019-01-22 株式会社三丰 Measuring Device Management System and computer-readable medium
CN111392223A (en) * 2020-03-23 2020-07-10 重庆小锋包装袋有限责任公司 Difficult-slippage high-strength woven bag and manufacturing process thereof

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