CN101726644B - Digital storage oscilloscope with functions of waveform fast location and zooming - Google Patents
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Abstract
The invention discloses a digital storage oscilloscope with functions of waveform fast location and zooming, comprising a characteristic value detection module and a characteristic value storage FIFO. All sampling data is in buffer memory in a detail waveform memory with large capacity, and the characteristic value detection module simultaneously screens the sampling data so as to screen out characteristic value data in continuous N sampling data. When a waveform is observed, characteristic value data is firstly read and displayed. Because the characteristic value data is 1/N of all the sampling data, the response speed is fast, and the waveform capture rate is high. When a section of characteristic value data is abnormal, collection data corresponding to the detail waveform memory with large capacity is read in so as to be treated and displayed through a corresponding storage relationship of the sampling data of the detail waveform memory and the characteristic value data, and the corresponding waveform of the section of characteristic value data is observed in detail, therefore, fast location and zooming of the waveform are finished, and the problems of slow response speed, low waveform capture rate and difficult discovery of harmful signals including burrs under depth storage are solved.
Description
Technical Field
The invention relates to a digital storage oscilloscope, in particular to a digital storage oscilloscope with functions of quickly positioning and zooming waveforms in deep storage
Background
Since the advent of digital storage oscilloscopes in the seventies of the last century, their applications have become more and more widespread, and they have become one of the necessary tools for test engineers.
Sampling rate, memory depth (memory depth) and waveform capture rate are three major performance indicators of Digital Storage Oscilloscopes (DSOs). The sampling rate refers to the number of samples which are extracted from continuous signals and form discrete signals per second; storage depth refers to the ability to continuously collect and store sample points at the highest real-time sampling rate, usually expressed in terms of number of sample points (pts); the waveform capture rate represents the number of waveform amplitudes that the oscilloscope can capture and display per unit time, and is typically expressed in terms of waveform amplitudes per second (wfms/s). The sampling rate is directly related to the storage depth, because the digital storage oscilloscope must manage the memory according to the user's instructions regarding the length of the capture time. If the user sets the digital storage oscilloscope's time base control to 100us/div, and if the waveform display area has 10 x 8 cells, which means that the entire screen represents 1ms of time, then the digital storage oscilloscope must determine the highest sampling rate that can be used to capture signals up to 1ms without draining its memory resources. If the maximum sampling rate of the digital storage oscilloscope is 5GSPS and the storage space is 10k, the actual sampling rate cannot be higher than 10 MSPS. This sampling rate is much lower than the highest sampling rate, and the user's measurements will be susceptible to the adverse effects of undersampling (undersampling) -aliasing, loss of signal detail, and measurement error, among others. These are all serious problems for shallow storage oscilloscopes.
Digital storage oscilloscope manufacturers at home and abroad make breakthrough development in the aspect of improving the storage depth. TDS6000 series digital storage oscilloscope (Tektronix) of Taike corporation of America, when two channels are used, the storage depth of each channel is 64Mpts, and when four channels are used simultaneously, the storage depth of each channel is 32 Mpts; a 4000 series digital fluorescence oscilloscope (DPO) is calibrated to a 10 mbpts storage depth per channel to capture long signal windows while maintaining fine timing resolution. The Agilent 54642A DSO and 54642D MSO series have a storage depth of 8 Mpts; the storage depth standard of the DSO/DSA90000A series oscilloscope of Agilent corporation is 10Mpts, and the maximum is up to 1 Gpts. The storage depth of the LT342L series of the American Strength department company (LeCroy) is 1 Mpts. Taking the DS1000E series of the common source as an example in China, the single channel of the maximum storage depth reaches 1Mpts, and the double channel is 512 Kpts. It can be seen that the improvement of the storage depth is one of the development directions of the future digital storage oscillograph.
The application of mass storage, such as memories of DDR, DDR2, DDR3, LPDDR and the like, to the digital storage oscilloscope can greatly improve the storage depth of the digital storage oscilloscope, and meanwhile, the sampling rate of AD requires corresponding improvement. The higher the storage depth of the DSO, the more detailed waveforms can be recorded.
In the deep storage working mode, the data acquisition and storage are completed by trigger control. And recording a large amount of waveform data before and after the arrival of the trigger signal in the whole storage space by taking the trigger signal as a reference. The large storage depth ensures the waveform data acquisition time under a high sampling rate, provides sufficient data information for waveform analysis, and can ensure the acquisition and recording of detail signals. However, the DSO itself has a disadvantage of poor responsiveness as compared with an analog oscilloscope. As the storage depth increases, a slow response problem is bound to arise due to processing time issues with digital waveform recording. Some digital storage oscilloscopes with extremely large storage depths have 8 to 10 seconds per screen waveform refresh. Applying such a large memory to a DSO inevitably brings about a problem of slow response speed while increasing the storage depth. For example, the sampling rate of 1GSPS and the storage depth of 128Mpts, the time for storing one sample point data is 1ns, then 128ms is needed for full storage, 100ns is needed for the microprocessor to read one sample point data, and 128Mpts × 100ns is 12.8s for completely reading the stored data, and the response speed is necessarily slow. The higher the storage depth is, the longer the continuous capturing time of the waveform is, the longer the system processes data, the slower the response speed is, the larger the dead time is, the lower the capturing rate of the waveform is, and the more difficult harmful signals such as burrs are to be found.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide a digital storage oscilloscope with functions of quickly positioning and zooming a waveform, which solves the problems of low response speed, low waveform capture rate, difficult discovery of harmful signals such as burrs and the like while realizing deep storage.
In order to achieve the above object, the digital storage oscilloscope with the function of fast positioning and zooming waveform of the present invention comprises a signal conditioning channel, an analog-to-digital converter, a detailed waveform memory control module, a large-capacity detailed waveform memory, a microprocessor and a display, and is characterized by further comprising:
the characteristic value detection module is connected with the analog-to-digital converter and used for detecting a sampling data stream output by the analog-to-digital converter and screening out characteristic value data from continuous N sampling data;
the characteristic value storage FIFO is connected with the characteristic value detection module and used for storing the characteristic value data screened by the characteristic value detection module;
sending the conditioned analog signal output by the signal conditioning channel into an analog-to-digital converter for sampling, and simultaneously enabling the obtained sampling data stream which is a discrete signal to flow into a detailed waveform memory control module and a characteristic value detection module; the detailed waveform memory control module controls all sampling data of the sampling data stream to be stored in a large-capacity detailed waveform memory for deep cache, the characteristic value detection module detects the sampling data stream, and characteristic value data is screened from continuous N sampling data and stored in a characteristic value storage FIFO; the sampling data of the large-capacity detailed waveform memory and the characteristic value data of the characteristic value storage FIFO are correspondingly stored;
when a certain section of characteristic value data needs to be observed in detail, the address corresponding to the section of characteristic value data in the large-capacity detailed waveform memory is quickly found through the corresponding storage relation between the sampling data of the detailed waveform memory and the characteristic value data of the characteristic value storage FIFO, the sampling data corresponding to the large-capacity detailed waveform memory is read by the microprocessor for processing and is sent to the display for displaying, the waveform corresponding to the section of characteristic value data is observed in detail, and therefore rapid positioning and scaling of the waveform are achieved.
The invention aims to realize the following steps:
firstly, all the sampled data are cached by a large-capacity detailed waveform memory, meanwhile, a characteristic value detection module screens the sampled data, and characteristic value data are screened from N continuous sampled data and sent to a characteristic value storage FIFO for storage. The detected characteristic value data may include a maximum value, a minimum value, an inflection point, an average value, the number of characteristic values, and the like. When the waveform is observed, the characteristic value data in the characteristic value storage FIFO is read and processed, and is sent to a display for displaying, and the characteristic value data in the characteristic value storage FIFO is 1/N of all the sampling data, so that the response speed is very high and the waveform capture rate is high during displaying. When the abnormal characteristic value data of a certain section is found, for example, when the detected characteristic value is the maximum value, the characteristic value data can be suddenly increased or decreased by harmful signals such as burrs and the like, at the moment, the address corresponding to the characteristic value data of the large-capacity detailed waveform memory is quickly found through the corresponding storage relation between the sampling data of the detailed waveform memory and the characteristic value data of the characteristic value storage FIFO, the microprocessor reads the sampling data corresponding to the large-capacity detailed waveform memory for processing and sends the sampling data to the display for displaying, the waveform corresponding to the characteristic value data of the section, for example, a section of waveform with burrs, is observed in detail, so that the quick positioning and zooming of the waveform are completed, and the problems that the response speed is low, the waveform capture rate is low, and the harmful signals such as the burrs and the.
Drawings
FIG. 1 is a schematic diagram of an embodiment of a digital storage oscilloscope with fast positioning and zooming functions for waveforms according to the present invention;
FIG. 2 is a diagram of address mapping when data bits are equal in width according to the present invention;
FIG. 3 illustrates address mapping when data bits are not equal in width;
FIG. 4 is a characteristic value TiAnd Ti+mFast positioning and scaling of detailed waveform data;
FIG. 5 is a graph of the positioning and scaling effects of the waveforms.
Detailed Description
The following description of specific embodiments of the present invention is provided in order to better understand the present invention with reference to the accompanying drawings. It is to be expressly noted that in the following description, a detailed description of known functions and designs will be omitted when it may obscure the subject matter of the present invention.
Examples
FIG. 1 is a schematic diagram of an embodiment of a digital storage oscilloscope with fast positioning and zooming functions according to the present invention.
As shown in fig. 1, in the present embodiment, the digital storage oscilloscope with waveform fast positioning and scaling function includes a signal conditioning channel 1, an analog-to-digital converter 2, a detailed waveform memory control module 3, a large-capacity detailed waveform memory 4, a microprocessor 5 and a display 6. In order to realize the functions of quick positioning and zooming, a characteristic value detection module 7 and a characteristic value storage FIFO8 are added on the basis of the existing deep storage digital storage oscilloscope, the characteristic value detection module 7 is connected with the analog-to-digital converter 2, a sampling data stream output by the analog-to-digital converter 2 is detected, characteristic value data are screened from continuous N sampling data, and the characteristic value data are stored in the characteristic value storage FIFO 8.
The signal conditioning channel 1 conditions the input analog signal, outputs the analog signal in the input range of the analog-to-digital converter 2, and samples the analog signal in the analog-to-digital converter 2 to obtain a sampling data stream which is a discrete signal. The sampling data flow is divided into two paths, one path flows into the detailed waveform memory control module 3, and all sampling data of the sampling data flow are controlled to be stored into the large-capacity detailed waveform memory 4 for deep cache; and one path of inflow characteristic value detection module detects, and characteristic value data is screened from the continuous N sampling data and stored in the characteristic value storage FIFO.
The sample data of the large-capacity detailed waveform memory and the feature value data of the feature value storage FIFO are stored correspondingly, and this correspondence is put in the address mapping block 9 in the present embodiment. The address of the characteristic value data stored in the characteristic value storage FIFO8 and the address of the sample data stored in the large-capacity detailed waveform memory 4 have a certain correspondence relationship.
As shown in fig. 2, if the capacity of the large-capacity detailed waveform memory 4 used for storage is D and the capacity of the eigenvalue storage FIFO8 is D under the condition that the data bit width is equal, the eigenvalue detection module 7 follows the same rule
Is used to screen the characteristic value data (i.e. theThe storage spaces of the i-th to i + k-th in the characteristic value storage FIFO8 correspond to the detailed waveform memory
Segment storage space.
As shown in fig. 3, when the data bit width is not equal, if the capacity of the large-capacity detailed waveform memory 4 used for storage is D, the data bit width is M, the capacity of the feature value storage FIFO8 is D, and the data bit width is M, the number of storage addresses of the feature value storage FIFO8 is D
The number of addresses stored in the large-capacity detailed waveform memory 4 is
The characteristic value storage FIFO8 is in accordance with
By scaling the characteristic value data
The storage space of the i to i + k th in the eigenvalue storage FIFO8 corresponds to the detailed waveform memory 4 with large capacity
Segment storage space.
When a waveform corresponding to a certain segment of characteristic value data needs to be observed in detail, the microprocessor 5 outputs the address of the segment of characteristic value data, finds a corresponding address in the address mapping module 9, that is, a corresponding sampling data address in the large-capacity detailed waveform memory 4, and then according to the sampling data address, the microprocessor 5 reads the corresponding sampling data in the large-capacity detailed waveform memory 4 to the microprocessor 5 through the detailed waveform memory control module 3 for processing and sends the sampling data to the display 6 for displaying.
In this embodiment, on the basis of the existing deep storage digital storage oscilloscope, a data stream switching module 10 is further added, under the control of the microprocessor 5, the data stream of the characteristic value storage FIFO8 or the large-capacity detailed waveform memory 4 is switched to enter the microprocessor 5, the microprocessor 5 realizes the control and data processing functions, and the data processed by the microprocessor 5 is sent to the display for display.
When the waveform is observed, firstly, the characteristic value data in the characteristic value storage FIFO8 is selected for observation, namely, the data stream switching module 10 is switched to the characteristic value storage FIFO8, the characteristic value data stream of the characteristic value storage FIFO8 enters the microprocessor 5 for processing and is sent to the display 6 for displaying; when a certain section of characteristic value data needs to be observed in detail, the microprocessor 5 outputs the address of the section of characteristic value data to find a corresponding address in the address mapping module 9, namely a corresponding sampling data address in the large-capacity detailed waveform memory 4; under the control of the microprocessor 5, the data stream switching module 10 switches to the data stream of the large-capacity detailed waveform memory 4, and the sampled data stream of the large-capacity detailed waveform memory 4 enters the microprocessor 5 for processing and is sent to the display 6 for displaying, so that the waveform is rapidly positioned and scaled.
As shown in fig. 1, in this embodiment, the detailed waveform memory control module 3, the eigenvalue detection module 7, the eigenvalue storage FIFO8, the address mapping module 9, and the data stream switching module 10 are designed by one field programmable gate array.
In a specific implementation process, the analog-to-digital converter generally adopts a parallel time alternative sampling analog-to-digital converter to increase a sampling rate, the number of the adopted ADs is a, then after each AD sampling data is subjected to H: 1 characteristic value detection and screening, two-stage characteristic value detection and screening is performed on the screened a characteristic value data, and a characteristic value data is screened in a final screening ratio of (a × H): 1(N ═ a × H), then the sampling data in the detailed waveform memory 4 corresponding to the ith characteristic value data in the characteristic value storage FIFO8 can be represented by formula (1):
Ani(n ═ 1, 2., a) denotes a sample data stream made up of H data of the nth AD sample stored in the detailed waveform memory 4 corresponding to the ith characteristic value data in the characteristic value storage FIFO 8. When W pieces of feature value data are stored in the feature value storage FIFO8, a large capacity of detailed waveform storageThe memory 4 is full, and the data amount stored in the large-capacity detailed waveform memory 4 can be expressed by equation (2):
the storage of the sampled data of the storage space of the large-capacity detailed waveform memory 4 can be represented by equation (3):
the eigenvalue data storage of the eigenvalue storage FIFO8 is represented by equation (4):
(T1，T2，…，Ti，…，Tw) (4)
the large-capacity detailed waveform memory 4 stores data in the row of equation (3), starting with the address count from the first position in the first row, and storing the data in the next row, and the address count value corresponding to the stored data indicates the storage position of the data. The number of elements in expression (3) is the capacity used for storing the detailed waveform memory 4 having a large capacity, and expression (4) indicates the feature value data stored in the feature value storage FIFO8 and the storage position of the feature value data.The ith eigenvalue T of the eigenvalue storage FIFO is showniThe storage data and the storage position of the corresponding large-capacity detailed waveform memory 4, wherein the element in the formula represents the corresponding storage data in the large-capacity detailed waveform memory 4, the position of the element represents the storage position of the corresponding data in the large-capacity detailed waveform memory 4, and the storage position of the corresponding data is N (i-1) +1 to Ni, wherein i is more than or equal to 1 and less than or equal to W. When the characteristic value T needs to be observediAnd Ti+mWhen the detailed waveform data is adopted, as shown in fig. 4, when the rapid positioning and zooming are adopted, the microprocessor 5 sends the initial storage position N x (i-1) +1 of the waveform to be observed to the addressing counter to be used as the initial address of the addressing counter to start counting, and the required m x N data are rapidly read and then sent to the display to be displayed, so that the irrelevant data do not need to be read, and the reading and processing time of the data is greatly saved; if the fast positioning and scaling is not used, the microprocessor 5 reads all the data in the detailed waveform memory from the initial address of the memory, and then processes and displays the data, and obviously, the data reading amount is far larger than that of the fast positioning and scaling technology, and the time required for the data reading is far larger than that of the fast positioning and scaling technology. Characteristic value data TiAnd Ti+mThe detailed waveform data in between and the storage position of the detailed waveform data in the large-capacity detailed waveform memory 4 can be represented by equation (5).
In the present embodiment, the feature value detection module 7 is configured by a field programmable gate array. The eigenvalue data may be screened by a field programmable gate array and stored into an eigenvalue storage FIFO 8. The eigenvalue configuration has two methods: one method is that the hardware language is directly used to carry out the characteristic value screening configuration to the field programmable logic gate array, and the software does not participate in the selection of the characteristic value; the other method is that all the characteristic values are used for carrying out characteristic value screening configuration on the field programmable gate array through a hardware language, and then the selection of the characteristic value data detection is realized through software control according to the user requirements.
In this embodiment, the storage and addressing of the detailed waveform data in the large-capacity detailed waveform memory 4 are implemented by a field programmable gate array, and a storage data addressing counter is configured inside the field programmable gate array to implement the correct storage of the detailed waveform storage data. The microprocessor 5 sends the first address signal and the number of the read data to be read when the detailed waveform data of a certain part of the detailed waveform memory needs to be displayed, the desired detailed waveform data is quickly read from the large-capacity detailed waveform memory 4, and then the detailed waveform data is sent to the display 5 to be displayed.
By adopting the waveform fast positioning and scaling technology, we can easily find the harmful signals such as the glitch, as shown in fig. 5. As shown in the lower graph of fig. 5, the waveform displayed is the waveform data in the characteristic value storage FIFO, and the waveform has a glitch, and a detailed waveform at the glitch needs to be observed. The data stream is switched, the waveform is rapidly positioned and amplified, the detailed waveform at the burr is observed, and the upper diagram of fig. 5 shows the detailed waveform in the range of the marked line around the burr in the lower diagram.
Although illustrative embodiments of the present invention have been described above to facilitate the understanding of the present invention by those skilled in the art, it should be understood that the present invention is not limited to the scope of the embodiments, and various changes may be made apparent to those skilled in the art as long as they are within the spirit and scope of the present invention as defined and defined by the appended claims, and all matters of the invention which utilize the inventive concepts are protected.
Claims (4)
1. The utility model provides a digital storage oscilloscope with quick location of wave form and scaling function, includes signal conditioning channel, adc, detailed waveform memory control module, the detailed waveform memory of large capacity, microprocessor and display, its characterized in that still includes:
the characteristic value detection module is connected with the analog-to-digital converter and used for detecting a sampling data stream output by the analog-to-digital converter and screening out characteristic value data from continuous N sampling data;
the characteristic value storage FIFO is connected with the characteristic value detection module and used for storing the characteristic value data screened by the characteristic value detection module;
sending the conditioned analog signal output by the signal conditioning channel into an analog-to-digital converter for sampling, and simultaneously enabling the obtained sampling data stream which is a discrete signal to flow into a detailed waveform memory control module and a characteristic value detection module; the detailed waveform memory control module controls all sampling data of the sampling data stream to be stored in a large-capacity detailed waveform memory for deep cache, the characteristic value detection module detects the sampling data stream, and characteristic value data is screened from continuous N sampling data and stored in a characteristic value storage FIFO; the sampling data of the large-capacity detailed waveform memory and the characteristic value data of the characteristic value storage FIFO are correspondingly stored;
when a waveform is observed, the microprocessor firstly reads the characteristic value data in the characteristic value storage FIFO for processing and sends the characteristic value data to the display for displaying, when a certain section of characteristic value data needs to be observed in detail, the address corresponding to the section of characteristic value data in the large-capacity detailed waveform storage is quickly found through the corresponding storage relation between the sampling data of the detailed waveform storage and the characteristic value data of the characteristic value storage FIFO, the microprocessor reads the sampling data corresponding to the large-capacity detailed waveform storage for processing and sends the sampling data to the display for displaying, and the detailed waveform corresponding to the section of characteristic value data is observed in detail, so that the waveform is positioned and zoomed quickly.
2. The digital storage oscilloscope with the functions of waveform rapid positioning and zooming according to claim 1, further comprising an address mapping module for storing a corresponding storage relationship between the sampled data of the large-capacity detailed waveform memory and the characteristic value data of the characteristic value storage FIFO;
when a detailed waveform corresponding to a certain section of characteristic value data needs to be observed in detail, the microprocessor outputs the address of the section of characteristic value data, finds a corresponding address in the address mapping module, namely a corresponding sampling data address in the large-capacity detailed waveform memory, and then reads the corresponding sampling data in the large-capacity detailed waveform memory into the microprocessor through the detailed waveform memory control module for processing according to the sampling data address, and sends the sampling data to the display for displaying.
3. The digital storage oscilloscope with the functions of waveform fast positioning and zooming according to claim 2, further comprising a data stream switching module, wherein under the control of the microprocessor, the data stream of the characteristic value storage FIFO or the large-capacity detailed waveform memory is switched to enter the microprocessor, and the data processed by the microprocessor is sent to the display for display.
When the waveform is observed, firstly, the characteristic value data in the characteristic value storage FIFO is selected for observation, namely, the data stream switching module is switched to the characteristic value storage FIFO, and the characteristic value data stream of the characteristic value storage FIFO enters the microprocessor for processing and is sent to the display for displaying; when a certain section of characteristic value data needs to be observed in detail, the microprocessor outputs the address of the section of characteristic value data to find out the corresponding address in the address mapping module; under the control of the microprocessor, the data flow switching module switches to the data flow of the large-capacity detailed waveform memory, and the sampled data flow of the large-capacity detailed waveform memory enters the microprocessor for processing and is sent to the display for displaying.
4. The digital storage oscilloscope with the function of rapidly positioning and scaling the waveform according to claim 1, wherein the analog-to-digital converter is a parallel time-interleaved sampling analog-to-digital converter, the number of AD is a, and a large-capacity detailed waveform memory stores the waveforms in the following manner:
wherein,
is AniTransposed matrix of AniIndicating the ith in the eigenvalue storage FIFOCharacteristic value data TiA sample data stream composed of H data of the nth AD sample stored in the corresponding detailed waveform memory, where n is 1, 2, a, i is 1, 2, and W is the number of eigenvalue data stored in the eigenvalue storage FIFO;
the eigenvalue data storage FIFO stores eigenvalue data as:
(T1，T2，…，Ti，…，Tw)
wherein, TiIs the characteristic value data at the time of the i-th characteristic value detection.
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| CN112763778A (en) * | 2020-12-23 | 2021-05-07 | 北京普源精电科技有限公司 | Waveform display method, device, equipment and storage medium |
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