CN101702014A - Test method for basic error of zero-scale indication - Google Patents
Test method for basic error of zero-scale indication Download PDFInfo
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- CN101702014A CN101702014A CN200910311215A CN200910311215A CN101702014A CN 101702014 A CN101702014 A CN 101702014A CN 200910311215 A CN200910311215 A CN 200910311215A CN 200910311215 A CN200910311215 A CN 200910311215A CN 101702014 A CN101702014 A CN 101702014A
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Abstract
Description
技术领域technical field
本发明涉及一种电平类测试仪器校准的基本误差的试验方法。The invention relates to a test method for the basic error of level test instrument calibration.
背景技术Background technique
在电平类测试仪器校准试验中,零电平示值基本误差试验是一项必须的试验项目,现有零电平示值基本误差试验方法存在的问题是:In the calibration test of level test instruments, the basic error test of zero-level indication is a necessary test item. The existing problems in the basic error test method of zero-level indication are:
使用多台单一功能的标准试验仪器,试验系统结构复杂;The structure of the test system is complex due to the use of multiple standard test instruments with a single function;
在同一阻抗条件下,必须数次关机以改变试验系统的连接线,工序多;Under the same impedance condition, it must be shut down several times to change the connection line of the test system, and there are many procedures;
误差测量点数量多于10个,且在试验前不能确定具体数量,多余的测量点使工作量增加,而对试验结果影响甚微;The number of error measurement points is more than 10, and the specific number cannot be determined before the test. The redundant measurement points will increase the workload and have little effect on the test results;
每一频率点测量次数多于5个,且在试验前不能确定具体数量,多余的测量次数使工作量增加,而对试验结果影响甚微。The number of measurements for each frequency point is more than 5, and the specific number cannot be determined before the test. The redundant number of measurements increases the workload, but has little effect on the test results.
由于上述问题的存在,现有零电平示值基本误差试验方法工序多,效率低。Due to the existence of the above problems, the existing zero-level indication basic error test method has many procedures and low efficiency.
发明内容Contents of the invention
本发明要解决的技术问题是,提供一种零电平示值基本误差试验方法,以解决现有技术存在的试验系统结构复杂、在同一阻抗条件下,必须数次关机以改变试验系统的连接线、工序多等不足。The technical problem to be solved by the present invention is to provide a basic error test method for zero-level indication to solve the complex structure of the test system existing in the prior art, and under the same impedance condition, it must be shut down several times to change the connection of the test system There are too many lines and processes.
本发明的技术方案为:它包括以下过程:开机前,用测试线束将标准试验仪器与被校准的电平类测试仪器相应测试端孔连接;然后开机,按功能组合操作标准试验仪器和被校准的电平类测试仪器,测量包含工作频率最低端、最高端和基准频率在内的6个误差测量点数据,每一频率点测量3次并记录,再用所获取的全部18个原始数据进行计算,得出零电平示值基本误差试验结果。The technical solution of the present invention is as follows: it includes the following process: before starting up, connect the standard test instrument with the corresponding test port hole of the calibrated level test instrument with the test wire harness; The level test instrument measures the data of 6 error measurement points including the lowest end, the highest end and the reference frequency of the working frequency. Each frequency point is measured 3 times and recorded, and then all 18 original data obtained are used for measurement. Calculate and obtain the test results of the basic error of the zero-level indication.
以上技术方案中,本发明使用单台多功能标准试验仪器,以标准试验仪器上的操作功能组合来简化试验系统;以标准试验仪器上的操作功能组合来简化试验连接线,在同一阻抗条件下的试验连接线固定不变。In the above technical scheme, the present invention uses a single multifunctional standard test instrument to simplify the test system with the operation function combination on the standard test instrument; to simplify the test connection line with the operation function combination on the standard test instrument, under the same impedance condition The test connection line is fixed.
采用本方法的优点是:The advantages of using this method are:
使用单台多功能标准试验仪器,简化试验系统;Use a single multifunctional standard test instrument to simplify the test system;
同一阻抗条件下,采用固定的试验连接线一次连接完毕,在此试验阶段不必数次关机以改动试验连接线,简化试验连接线操作,减少试验工序;Under the same impedance condition, the fixed test connection line is used to complete the connection at one time. In this test stage, it is not necessary to shut down several times to change the test connection line, simplify the operation of the test connection line, and reduce the test process;
确定包含工作频率最低端、最高端和基准频率在内的6个误差测量点,减少试验时间;Determine 6 error measurement points including the lowest end, the highest end and the reference frequency of the working frequency to reduce the test time;
确定每一频率点测量3次,减少试验时间。Make sure to measure each
采用本方法后,整个试验时间缩短为现有试验方法的三分之一左右。After adopting the method, the whole test time is shortened to about one-third of the existing test method.
附图说明Description of drawings
图1为本发明的示意图。Figure 1 is a schematic diagram of the present invention.
具体实施方式Detailed ways
本发明的实施例:本发明包括以下过程:开机前,用与被校准的电平类测试仪器3所需校准阻抗对应的测试线束2将标准试验仪器1与被校准的电平类测试仪器3相应测试端孔连接,然后开机,按功能组合操作标准试验仪器1和被校准的电平类测试仪器3,测量包含工作频率最低端、最高端和基准频率在内的6个误差测量点数据,每一频率点测量3次并记录,再用所获取的全部18个原始数据进行计算,得出零电平示值基本误差试验结果。Embodiments of the present invention: the present invention includes the following process: before starting the machine, connect the standard test instrument 1 with the calibrated
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CN110045316A (en) * | 2019-04-10 | 2019-07-23 | 中国电力科学研究院有限公司 | A kind of error checking method and system reducing the DC voltage transformer that multimeter constant error influences |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN110045316A (en) * | 2019-04-10 | 2019-07-23 | 中国电力科学研究院有限公司 | A kind of error checking method and system reducing the DC voltage transformer that multimeter constant error influences |
CN110045316B (en) * | 2019-04-10 | 2022-07-01 | 中国电力科学研究院有限公司 | A Transformer Error Checking Method and System for Reducing Influence of Intrinsic Error |
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Application publication date: 20100505 |