CN101685207B - Measuring method and device - Google Patents
Measuring method and device Download PDFInfo
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- CN101685207B CN101685207B CN2008102234465A CN200810223446A CN101685207B CN 101685207 B CN101685207 B CN 101685207B CN 2008102234465 A CN2008102234465 A CN 2008102234465A CN 200810223446 A CN200810223446 A CN 200810223446A CN 101685207 B CN101685207 B CN 101685207B
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Abstract
The present invention discloses a test method and a test device, and the test method comprises setting a series of voltage values which are a first voltage value, a second voltage value, ..., a (N-1)th voltage value, an Nth voltage value from small to big, providing test voltages to a liquid crystal display panel, wherein, the test voltages are the Nth voltage value, the first voltage value, the (N-1)th voltage value, the second voltage value, ...; measuring a transmittance rate of the liquid crystal display panel under the test voltage value respectively. Under the function of the test voltage, liquid crystal molecules are alternately symmetric and deflected for/backward, deformation of the liquid crystal molecules can be recovered in a short time, data test error can be reduced, accuracy of a VT curve can be improved, and data with higher precision can be provided for Gamma tuning.
Description
Technical field
The present invention relates to the display panels performance test, particularly the method for testing of voltage and transmittance curve and device.
Background technology
Along with the arriving of digital Age, the universal comprehensively inexorable trend that will become the digital Age development of LCD (Liquid Crystal Display is called for short LCD).
At present, display panels is that liquid crystal is contained between two substrates of showing stria, makes two strias on the substrate intersect vertically into 90 degree mutually.Wherein top substrate layer is called color membrane substrates, and its inside surface deposit transparent conductive oxide (Transparent Conductive Oxide is called for short TCO) layer is as transparency electrode (also being public electrode); Following laminar substrate is called film transistor type (Thin Film Transistor is called for short TFT) substrate, and its inside surface deposition tin indium oxide (Indium Tin Oxide is called for short ITO) layer is as transparency electrode.After the common electric voltage (Vcom voltage) of upper strata color membrane substrates is fixing, by applying voltage to the ITO of underlying TFT substrate layer, make between the ITO layer of the tco layer of upper strata color membrane substrates and underlying TFT substrate and produce electric potential difference, and the corresponding generation electric field identical with voltage direction, under effect of electric field, liquid crystal molecule will be arranged according to the direction of current between two substrates in the stria of the TFT substrate of the color membrane substrates on upper strata and lower floor, passes on light; If after the ITO of underlying TFT substrate layer applies the voltage that equates with the Vcom voltage of upper strata color membrane substrates, producing electric potential difference between the ITO layer of the tco layer of upper strata color membrane substrates and underlying TFT substrate is 0V, then the Liquid Crystal Molecules Alignment confusion in the stria of the TFT substrate of the color membrane substrates on upper strata and lower floor can't be passed on light.Therefore, people utilize the characteristic of liquid crystal molecule according to the size adjustment light quantity of test voltage, and the gray scale of LCD is regulated.For understanding the light penetration under the different test voltages, usually need the variation relation between voltage and the transmitance (Voltage-Transmittance is called for short VT) is tested, to obtain the VT curve.
Obtain the voltage and transmitance relation curve (the Module VT Curve) method of testing of display panels in the prior art, be and on data line, apply test voltage, by light penetration testing apparatus CA210, measure the transmitance under the different test voltages, draw the VT curve, for the gamma tuning (Gamma tuning) that carries out on the circuit.In order to ensure the accuracy of data, in test process, should make test voltage from 0V-12V positive test and 12V-0V negative testing each one time, data are got the mean value of twice test result.
Under the perfect condition, in the method for testing of prior art, under the effect of test voltage, the deflecting of liquid crystal molecule, but, make the method for testing of prior art all have error because liquid crystal molecule can't be replied the characteristic of deformation at interval in the short period.Under perfect condition, when display panels is in the normal state down, be that liquid crystal molecule does not deflect, and when keeping static state, respectively to three identical display panels provide test voltage+6V, 0V ,+12V, be specially: the Vcom voltage of supposition upper strata color membrane substrates is set at+6V, when the test voltage value be+during 6V, (+electric potential difference between 6V) is 0V, and liquid crystal molecule keeps stationary state not deflect for the ITO layer (0V) of underlying TFT substrate and the tco layer of upper strata color membrane substrates; When the test voltage value was 0V, (+electric potential difference between 6V) was+6V, then liquid crystal deflecting element+θ degree for the ITO layer (0V) of underlying TFT substrate and the tco layer of upper strata color membrane substrates; When the test voltage value be+during 12V, the ITO layer of underlying TFT substrate (+12V) and the tco layer of upper strata color membrane substrates (+electric potential difference between 6V) is-6V, then liquid crystal deflecting element-θ degree.Under perfect condition, when the test voltage value was 0V, liquid crystal molecule should deflection+θ degree; The test voltage value is+during 12V, liquid crystal molecule should deflection-θ degree.Two pairs of data are included in the numerical range of VT curve, if increase the quantity of test, then can access the VT curve under the perfect condition, but the display panels that test voltage value of every adjustment just need more renew under perfect condition, can cause the significant wastage of resource.
In realizing process of the present invention, the inventor finds that there are the following problems at least in the prior art:
1, Fig. 6 is a part of detecting cross sectional representation in the prior art, Fig. 7 is a TFT fundamental diagram in the prior art, as shown in Figure 6 and Figure 7, in the prior art, at first coat elargol in a zone, wait elargol absolutely dry after, a area data alignment applies test voltage, grid line is opened to continuing, and after test voltage offers pcb board by the analog to digital conversion plate, uses the transmitance in CA210 testing of equipment b zone.When pcb board is continuously applied external voltage, electronics on the electric current moving direction c can constantly be assembled, as shown in Figure 8, be inner electric field and outer electric field synoptic diagram between the LCD two substrates in the prior art, when applying test voltage u on E → F direction, form external electric field d, internal electron between the LCD two substrates is assembled, after gathering some, the inner internal electric field e that forms of LCD two substrates on F → E direction, inner electric field and outer electric field e like this, the d effect of can cancelling out each other, thereby make the voltage decreases of the ITO layer of underlying TFT substrate, (+electric potential difference between 6V) increases, and causes liquid crystal to polarize easily, causes the liquid crystal molecule deformation quantity can't recover in blink to cause the tco layer of ITO layer and upper strata color membrane substrates, so Module VT Curve method of testing of display panels of the prior art, positive and negative twice test data exists than mistake, had a strong impact on the accuracy of VT curve, and high-precision difficulty data is provided for gamma is tuning; (+the electric potential difference increase between 6V) of layer and the tco layer of upper strata color membrane substrates, cause liquid crystal to polarize easily, cause the liquid crystal molecule deformation quantity in blink, can't recover, so Module VT Curve method of testing of display panels of the prior art, positive and negative twice test data exists than mistake, had a strong impact on the accuracy of VT curve, high-precision difficulty data is provided for gamma is tuning;
2, the reading and write down all and manually carry out of the adjusting of the test voltage in the method for testing of prior art, test data must a people be controlled pressurization, measurement, reading, and another people cooperates record data.Because different liquid crystal deflection characteristic differences, the response speed difference makes the change interval instability between data in the test process, causes mistake easily, has reduced the accuracy of test data.
Summary of the invention
The purpose of this invention is to provide a kind of method of testing and device, be implemented in the deformation quantity that reduces liquid crystal molecule in the short time interval, reduce the error rate of test data, improve the accuracy of test data.
For achieving the above object, the invention provides a kind of method of testing, comprising:
Set a series of test voltage values, described test voltage value be followed successively by from small to large first magnitude of voltage, second magnitude of voltage ..., N-1 magnitude of voltage, N magnitude of voltage, make liquid crystal molecule according to N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ... order provide under the effect of test voltage to display panels, replace symmetrical forward and reverse deflection;
Provide test voltage to display panels, the order that described test voltage is provided be N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ...;
Measure the transmitance of the described display panels under the described test voltage value respectively.
For achieving the above object, the invention provides a kind of proving installation, comprising:
Voltage is provided with module, be used to set a series of test voltage values, described test voltage value be followed successively by from small to large first magnitude of voltage, second magnitude of voltage ..., N-1 magnitude of voltage, N magnitude of voltage, make liquid crystal molecule according to N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ... order provide under the effect of test voltage to display panels, replace symmetrical forward and reverse deflection;
Voltage provides module, and being used for provides test voltage to display panels, the order that described test voltage is provided be N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ...;
Measurement module is used for measuring respectively the transmitance that described voltage provides the described display panels under the test voltage value that module provides.
As shown from the above technical solution, in the embodiment of the invention by setting first magnitude of voltage from small to large successively, second magnitude of voltage, ..., the N-1 magnitude of voltage, the N magnitude of voltage, and according to the N magnitude of voltage, first magnitude of voltage, the N-1 magnitude of voltage, second magnitude of voltage, ... order provide test voltage to display panels, make liquid crystal molecule under the effect of test voltage, replace symmetrical forward and reverse deflection, realized in the short time interval, reducing the deformation quantity of liquid crystal molecule, reduced the error rate of test data, improved the accuracy of VT curve, thereby the data of degree of precision can be provided for gamma is tuning.
Description of drawings
Fig. 1 is the schematic flow sheet of method of testing embodiment of the present invention;
Fig. 2 is a method of testing embodiment part of detecting cross sectional representation of the present invention;
Fig. 3 is a method of testing embodiment TFT fundamental diagram of the present invention;
Fig. 4 is inner electric field and outer electric field synoptic diagram between the method for testing embodiment LCD two substrates of the present invention;
Fig. 5 is the structural representation of proving installation embodiment of the present invention;
Fig. 6 is a part of detecting cross sectional representation in the prior art;
Fig. 7 is a TFT fundamental diagram in the prior art;
Fig. 8 is an inner electric field and outer electric field synoptic diagram between the LCD two substrates in the prior art.
Embodiment
Below by drawings and Examples, technical scheme of the present invention is described in further detail.
The embodiment of the invention is set first magnitude of voltage from small to large successively, second magnitude of voltage, ..., the N-1 magnitude of voltage, the N magnitude of voltage, and according to the N magnitude of voltage, first magnitude of voltage, the N-1 magnitude of voltage, second magnitude of voltage, ... order provide test voltage to display panels, make liquid crystal molecule under the effect of test voltage, replace symmetrical forward and reverse deflection, play the effect that in the short time interval, recovers liquid crystal molecule deformation, can reduce the error rate of test data, improved the accuracy of VT curve, and can provide the data of degree of precision for gamma is tuning, simultaneously, a tester is the drafting that the may command proving installation is finished the VT curve, both make things convenient for test, also saved manpower.
According to the mode of the embodiment of the invention to same display panels provide test voltage 0V and+during 12V, the liquid crystal deflecting element situation is as follows: the Vcom voltage of supposition upper strata color membrane substrates is set at+6V, when the test voltage value is 0V, (+electric potential difference between 6V) is+6V, then liquid crystal deflecting element+θ degree for the ITO layer (0V) of underlying TFT substrate and the tco layer of upper strata color membrane substrates; Afterwards, when the test voltage value that provides to display panels is 12V, the ITO layer of underlying TFT substrate (+12V) and the tco layer of upper strata color membrane substrates (+electric potential difference between 6V) is-6V, then liquid crystal deflecting element-θ ' degree.Because liquid crystal molecule is when the test voltage value is 0V, deflection+θ degree, can not recover deformation immediately in the short time interval, afterwards immediately when display panels provides 12V test voltage value, liquid crystal molecule can not accurately deflect into-the θ degree, but can only deflect into-θ ' degree, wherein-the θ degree with-θ ' degree difference is Δ θ, this Δ θ is error, and this error delta θ is far smaller than in the prior art error that produces from the method for testing of 0V-12V positive test and 12V-0V negative testing.
Before the test of display panels being carried out the VT curve, need to carry out following preliminary work, at first, the processing that the test zone of tested display panels is correlated with, and on test zone, be coated with elargol.By the time elargol absolutely dry after, power-supply unit is installed is one by one comprised: (inverter) is connected the backlight voltage power supply unit with backlight by inverter, lights backlight; By printed circuit board (PCB) (the Printed Circuit Board of analog to digital conversion plate (ADboard) with display panels, be called for short PCB) be connected with proving installation, test voltage is offered display panels, display panels is lighted, and obtain normal picture.Simultaneously proving installation is installed: the CA210 probe is installed to the test zone top,, passes through the proving installation reading of data again, and obtain the VT curve according to test voltage value and transmitance by this probe test transmitance.
Fig. 1 is the schematic flow sheet of method of testing embodiment of the present invention, and as shown in Figure 1, present embodiment can may further comprise the steps:
Wherein, the test voltage value be followed successively by from small to large first magnitude of voltage, second magnitude of voltage ..., N-1 magnitude of voltage, N magnitude of voltage.Minimum voltage value in the test voltage value is first magnitude of voltage, maximum voltage value is the N magnitude of voltage, minimum voltage value and maximum voltage value are determined according to the characteristic of dissimilar display panels, for example: test voltage is set at: 0V, 0.1V, 0.2V ..., a series of magnitudes of voltage from small to large of 11.9V, 12V.
Further, the relative electric potential difference between two adjacent test voltage values can be set according to the precision of test request, when relative electric potential difference hour, the VT curve accuracy height that obtains, the length but test job expends time in, the data volume of record is bigger, has reduced work efficiency; When relative electric potential difference is big, the VT curve poor accuracy of acquisition, but test required consumed time weak point, record quantity is little, has improved work efficiency.
When the test voltage value is set, can be manual adjustments, also can be by the Control of Voltage program being set in advance on computers, making computer set a series of test voltages according to Control of Voltage programmed control proving installation;
Wherein, test voltage provide order be N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ....Test voltage offers the pcb board of display panels by the analog to digital conversion plate, and under the effect of test voltage, display panels is lighted, and obtains normal picture.Test voltage can be manual adjustments, also can be by the Control of Voltage program being set in advance on computers, computer being set according to Control of Voltage programmed control proving installation.For example: test voltage provide order can for: 0V, 12V, 0.1V, 11.9V, 0.2V, 11.8V ....
When test voltage according to 0V, 12V, 0.1V, 11.9V, 0.2V, 11.8V ... order, when offering the display panels pcb board by the analog to digital conversion plate, liquid crystal molecule can replace forward and reverse deflection of symmetry, plays the effect that recovers liquid crystal molecule deformation in the short time interval.Fig. 2 is a method of testing embodiment part of detecting cross sectional representation of the present invention, Fig. 3 is a method of testing embodiment TFT fundamental diagram of the present invention, as shown in Figures 2 and 3, in the present embodiment, at first coat elargol in a zone, wait elargol absolutely dry after, a area data alignment applies test voltage, grid line is opened to continuing, and after test voltage offers pcb board by the analog to digital conversion plate, uses the transmitance in CA210 testing of equipment b zone.When pcb board is continuously applied external voltage, electronics on the electric current moving direction c can constantly be assembled, as shown in Figure 4, be inner electric field and outer electric field synoptic diagram between the method for testing embodiment LCD two substrates of the present invention, when applying test voltage u on E → F direction, form external electric field d, internal electron between the LCD two substrates is assembled, after gathering some, inner internal electric field e, the inner electric field and outer electric field e like this of forming of LCD two substrates on F → E direction, the d effect of can cancelling out each other, thus make the voltage decreases of the ITO layer of underlying TFT substrate, (+electric potential difference between 6V) increases, and causes liquid crystal to polarize easily to cause the tco layer of ITO layer and upper strata color membrane substrates.Test mode according to present embodiment provides test voltage, after applying test voltage u on E → F direction, the inner internal electric field e that forms of LCD two substrates on F → E direction, proving installation applies negative testing voltage u ' immediately on F → E direction, the inner reversed electric field e ' that forms of LCD two substrates makes it the effect of cancelling out each other with electric field e on E → F direction, has guaranteed that the voltage of ITO layer remains unchanged as far as possible, liquid crystal can't polarize, and can recover deformation quantity at short notice;
Wherein, the equipment of measurement display panels transmitance is the CA210 probe.
Further, when measuring the transmitance of the display panels under the test voltage value, measurement result can be that the tester carries out record by hand, also testing apparatus can be linked to each other with computer, test result is sent in the computer store.
In the present embodiment according to N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ... order provide test voltage to display panels, make liquid crystal molecule under the effect of test voltage, replace symmetrical forward and reverse deflection, play the effect that in the short time interval, recovers liquid crystal molecule deformation, reduce the error of test data, improve the accuracy of VT curve, the data of degree of precision can be provided for gamma is tuning.
Further, also comprise in the present embodiment, be specifically as follows: obtain test voltage value-transmittance curve according to test voltage value and transmitance to drawing the step of VT curve.
Fig. 5 is the structural representation of proving installation embodiment of the present invention, and as shown in Figure 5, the present embodiment proving installation comprises that the voltage that order links to each other is provided with module 1, voltage provides module 2 and measurement module 3.Wherein, voltage is provided with module 1 and is used to set a series of test voltage values, this test voltage value be followed successively by from small to large first magnitude of voltage, second magnitude of voltage ..., N-1 magnitude of voltage, N magnitude of voltage; Voltage provides module 2 to be used for providing test voltage to display panels, the order that test voltage is provided be N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ...; Measurement module 3 is used for the transmitance that measuring voltage respectively provides the display panels under the test voltage value that module 2 provides.
Wherein, voltage is provided with module is determined test voltage according to dissimilar display panels minimum test voltage value and full test magnitude of voltage, and determine relative electric potential difference between two adjacent test voltage values according to the precision of test request, at last between minimum test voltage value and full test magnitude of voltage according to relative electric potential difference, set successively from small to large first magnitude of voltage, second magnitude of voltage ..., N-1 magnitude of voltage, N magnitude of voltage.
Voltage provides module to provide test voltage to display panels, the order that test voltage is provided be N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ....The control enclosure that voltage provides module can be to adjust by manual control voltage swing also can be the control enclosure of the voltage swing that is connected with the computer that the Control of Voltage program is installed.The order of this test voltage can be adjusted the correspondent voltage size in order for the tester, manually the control control enclosure offers display panels in order with test voltage, also can cross and transmit control signal to control enclosure for the computer expert that the Control of Voltage program is installed, adjust the correspondent voltage size according to order, test voltage is offered display panels in order by control enclosure.
Present embodiment can be carried out the flow process of method of testing embodiment of the present invention.
Measurement module can be popped one's head in for CA210, and when test voltage offered display panels in order, the CA210 probe can be measured the transmitance of display panels when display panels is lighted.This metering system can manually be controlled for the tester, carries out reading, also can the transmitance data transmission be stored to computer or memory device for measurement module is connected with computer with memory function or memory device.These transmitance data are corresponding one by one with the test voltage value of importing display panels at that time, form one group of voltage-transmitance data set, when a plurality of voltages-transmitance data set is used in the same coordinate system, can draw out the VT curve of tested display panels, voltage-the light transmission rate that shows this display panels, can be from this VT curve extracting part component voltage-transmitance data set the data foundation of degree of precision is provided for gamma is tuning.
In the present embodiment voltage provide module according to N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ... order provide test voltage to display panels, make liquid crystal molecule under the effect of test voltage, replace symmetrical forward and reverse deflection, played the effect that in the short time interval, recovers liquid crystal molecule deformation, thereby reduced the error of test data, improved the accuracy of VT curve, the data of degree of precision can be provided for gamma is tuning.Simultaneously, operating personnel can control required reading by proving installation, have both made things convenient for test, have also saved manpower.
Further, the measurement mechanism in the present embodiment also comprises the graphics module (not shown), is used for obtaining test VT curve according to test voltage value and transmitance.
It should be noted that at last: above embodiment is only in order to technical scheme of the present invention to be described but not limit it, although the present invention is had been described in detail with reference to preferred embodiment, those of ordinary skill in the art is to be understood that: it still can make amendment or be equal to replacement technical scheme of the present invention, and these modifications or be equal to replacement and also can not make amended technical scheme break away from the spirit and scope of technical solution of the present invention.
Claims (4)
1. method of testing is characterized in that comprising:
Set a series of test voltage values, described test voltage value be followed successively by from small to large first magnitude of voltage, second magnitude of voltage ..., N-1 magnitude of voltage, N magnitude of voltage, make liquid crystal molecule according to N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ... order provide under the effect of test voltage to display panels, replace symmetrical forward and reverse deflection;
Provide test voltage to display panels, the order that described test voltage is provided be N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ...;
Measure the transmitance of the described display panels under the described test voltage value respectively.
2. method of testing according to claim 1 is characterized in that the described transmitance of measuring the described display panels under the described test voltage value respectively also comprises afterwards:
Obtain voltage-transmittance curve according to described test voltage value and described transmitance.
3. proving installation is characterized in that comprising:
Voltage is provided with module, be used to set a series of test voltage values, described test voltage value be followed successively by from small to large first magnitude of voltage, second magnitude of voltage ..., N-1 magnitude of voltage, N magnitude of voltage, make liquid crystal molecule according to N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ... order provide under the effect of test voltage to display panels, replace symmetrical forward and reverse deflection;
Voltage provides module, and being used for provides test voltage to display panels, the order that described test voltage is provided be N magnitude of voltage, first magnitude of voltage, N-1 magnitude of voltage, second magnitude of voltage ...;
Measurement module is used for measuring respectively the transmitance that described voltage provides the described display panels under the test voltage value that module provides.
4. proving installation according to claim 3 is characterized in that also comprising: graphics module is used for obtaining voltage-transmittance curve according to described test voltage value and described transmitance.
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Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102213848B (en) * | 2010-04-09 | 2013-03-13 | 北京京东方光电科技有限公司 | Method and system for measuring transmissivity of liquid crystal display panel |
| CN102542959B (en) * | 2010-12-07 | 2014-08-06 | 北京京东方光电科技有限公司 | Method for measuring voltage transmittance under influence of direct-current bias voltage and equipment |
| CN102708814B (en) * | 2011-07-29 | 2015-04-29 | 京东方科技集团股份有限公司 | Alternating-current test method and system for relation curve of voltage and transmittance of liquid crystal display (LCD) module |
| CN104282249B (en) * | 2014-10-23 | 2017-02-15 | 京东方科技集团股份有限公司 | Method for testing voltage-transmittance curve |
| CN104464674B (en) * | 2014-12-26 | 2017-12-08 | 小米科技有限责任公司 | Liquid crystal display method of adjustment and device |
| CN104777636B (en) * | 2015-04-20 | 2018-06-12 | 合肥鑫晟光电科技有限公司 | Test system and test method |
| CN105717674B (en) | 2016-04-18 | 2018-11-20 | 深圳市华星光电技术有限公司 | Liquid crystal layer is measured to the method for the liquid crystal efficiency of incident light |
| CN107393453B (en) * | 2017-08-03 | 2019-09-10 | 深圳市华星光电半导体显示技术有限公司 | The method for obtaining liquid crystal display panel charge rate |
| CN108387837B (en) * | 2018-02-24 | 2020-07-31 | 上海华力微电子有限公司 | Chip testing method |
| CN109559707B (en) * | 2018-12-26 | 2020-11-24 | 惠科股份有限公司 | Gamma value processing method and device of display panel and display equipment |
| CN110875001A (en) * | 2019-11-29 | 2020-03-10 | 京东方科技集团股份有限公司 | Test circuit, display substrate, display panel and test method |
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| CN101021655A (en) * | 2006-12-19 | 2007-08-22 | 上海广电光电子有限公司 | Multi-domain vertical orientation mode liquid crystal display device |
| CN101178488A (en) * | 2006-11-09 | 2008-05-14 | 华生科技股份有限公司 | Optical parameter measurement mechanism and methods of LCD device |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101178488A (en) * | 2006-11-09 | 2008-05-14 | 华生科技股份有限公司 | Optical parameter measurement mechanism and methods of LCD device |
| CN101021655A (en) * | 2006-12-19 | 2007-08-22 | 上海广电光电子有限公司 | Multi-domain vertical orientation mode liquid crystal display device |
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